微纳米加工技术对La2/3Ca1/3MnO3材料性能影响的研究

利用脉冲激光沉积(PLD)方法制备了La2/3Ca1/3MnO3(LCMO)外延薄膜.然后利用微纳米加工技术对LCMO薄膜材料进行了局部改造,制造出宽度仅为83纳米的弱联接结构,并对此进行了一系列的物性改变研究.发现在测量电流不变(1μA)的情况下,R～T曲线在120K附近有一个尖锐的跳变,跳变的温度区间很窄.此外,测量电流和外加磁场的增加,都能对跳变现象产生抑制作用.目前认为这种现象的产生是由于相分离的原因导致的.     

Field-induced insulator-metal-insulator transitions in low-energy H2- ion-irradiated epitaxial La2/3Cal/3MnO3 thin films

Epitaxial La2/3Cal/3MnO3 thin films grown on LaA103 （001） substrates were irradiated with low-energy 120-keV H＋ ions over doses ranging from 1012 ions/cm2 to 1017 ions/cm2. The irradiation suppresses the intrinsic insulator-metal （I-M） transition temperature and increases the resistance by reducing the crystallographic symmetry of the films. No irradiation-induced columnar defects were observed in any of the samples. The specific film irradiated at a critical dose around 8 x 1015 ions/cm2 is in a threshold state of the electric insulator where the I-M transition is absent. In an external field of 4 T or higher, the I-M transition is restored and thus an enormous magnetoresistance is observed, while a negative temperature coefficient resumes as the temperature is reduced further. Magnetic relaxation behavior is confirmed in this and other heavily irradiated samples. The results are interpreted in terms of the displacement of oxygen atoms provoked by ion irradiation and the resulting magnetic glassy state, which can be driven into a phase coexistence of metallic ferromagnetic droplets and the insulating glass matrix in a magnetic field.     

氢离子注入对La2/3Sr1/3MnO3薄膜性能影响的研究

利用脉冲激光沉积(PLD),制备了La2/3Sr1/3MnO3(LSMO)薄膜.然后在120 keV的能量下,进行了不同剂量(1.0×1012 ion/cm2～1.0×1017 ion/cm2)的H2 离子对LSMO薄膜的注入研究.随着注入剂量的增加,膜的电阻逐渐变大,其Tp转变温度往低温方向变化.当剂量大于等于3.0×1016 ion/cm2时,LSMO薄膜具有了类似半导体的导电行为.X射线衍射(XRD)分析发现:特征峰的位置随着剂量的增加而往低的角度偏移,并且当剂量增加到一定程度时,出现双峰现象.最后研究了LSMO薄膜其磁阻(MR)随温度和磁场的变化关系.     

纳米金属掩膜和离子辐照技术制备高温超导约瑟夫森结

研究了一种利用纳米金属掩膜和离子辐照技术在高温超导YBCO薄膜上制备Josephson结的方法.首先用在YBCO薄膜甩上一层800nm左右的光刻胶(PMMA),继而在光刻胶上用直流磁控溅射的方法镀上一层大约300nm左右的Cr膜,利用紫外曝光和离子刻蚀的方法在YBCO薄膜上形成覆盖有Cr膜的微桥,然后,利用聚焦离子束系统(FIB)在微桥上刻出一个50nm左右的狭缝,最后利用120keV的H2 对狭缝内的材料进行辐照,从而使狭缝部分的材料超导电性减弱,形成类似SNS型的Josephson结.     

Field-induced insulator-metal-insulator transitions in low-energy H_2~+ ion-irradiated epitaxial La_(2/3)Ca_(1/3)MnO_3 thin films

Epitaxial La 2/3 Ca 1/3 MnO 3 thin films grown on LaAlO 3 (001) substrates were irradiated with low-energy 120-keV H 2 + ions over doses ranging from 10 12 ions/cm 2 to 10 17 ions/cm 2 . The irradiation suppresses the intrinsic insulator-metal (I-M) transition temperature and increases the resistance by reducing the crystallographic symmetry of the films. No irradiation-induced columnar defects were observed in any of the samples. The specific film irradiated at a critical dose around 8 × 10 15 ions/cm 2 is in a threshold state of the electric insulator where the I-M transition is absent. In an external field of 4 T or higher, the I-M transition is restored and thus an enormous magnetoresistance is observed, while a negative temperature coefficient resumes as the temperature is reduced further. Magnetic relaxation behavior is confirmed in this and other heavily irradiated samples. The results are interpreted in terms of the displacement of oxygen atoms provoked by ion irradiation and the resulting magnetic glassy state, which can be driven into a phase coexistence of metallic ferromagnetic droplets and the insulating glass matrix in a magnetic field.