Effects of Ni-Doping on Microstructures and Properties of Zn-20Sn High-Temperature Lead-Free Solders

In the present work, the effect of Ni doping on the microstructures and properties of Zn-20 Sn high temperature lead-free solder has been investigated. Interestingly,Ni was present as the form of Ni-Zn compounds in the microstructure of Zn-20 Sn-xNi alloy.When the Ni-doping amount was 0.2～0.4 wt.%, the presence of δ phase was found, and when the doping amoun was 0.8 wt.%, the presence of γ phase was observed. With the increase of Ni content, the liquidus temperature increased but the solidus temperature did not change obviously. In addition, the microhardness and electrical resistivities of Zn-20 Sn-xNi solder increased gradually. And the spreading area and shear strength increased firstly but decreased afterwards. When the content of Ni was 0.4 wt.%, the spreading area and shear strength of solder reached to be maximum. After the addition of 0.4 wt.% Ni, the microstructure of the interfacial intermetallic compound(IMC) layer of the interface didn't change, but the total thickness of the IMC layer reduced. The δ-phase was embedded in the grain boundary of ε-Cu Zn5, which hindered the diffusion of atoms. The thickness of IMC layer at the interface reduced, which led to the improvement of the shear strength of the interface.