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K-shell ionization cross sections for Fe by electron impact were measured by detecting the characteristic X-rays emitted from the thin solid film target of known mass thickness with a Si(Li) detector. Reflection correction of the substrate was done using a bipartition model of electron transport. The experimental results are satisfactory as compared with the theoretical calculation and empirical formula. 相似文献
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用Si(Li)探测器测量薄Ni靶在9—46KcV的电子轰击下产生的K壳层特征X射线,以确定其K壳层电子的电离截面。测量结果与前人的实验和理论计算以及经验公式的计算结果作了比较。 相似文献
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Electron-induced Hf-, W-L-shell partial, total production cross sections, mean ionization cross sections and Hf-L_3-shell ionization cross sections (at two energies) have been measured as functions of electron energies (from near threshold to 36keV). The influence of electrons reflected from the backing of the thin targets on measured results was corrected using a model to relate to the electron transport process. The mean paths of electron multi-scattered in the target itself (including forward and backward scattering) were calculated by means of Monte Carlo program (EGS4) and they were used to correct measured results. A comparison with both theoretical predictions was given. 相似文献
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L-shell ionization cross sections of Nb by electron impact in the energy range from 3 to 40 keV have been determined with a Si(Li) X-ray detector. Influence of reflected electrons from backing on the measurement was corrected using an electron transport model. The experimental results are compared with theoretical calculations of Gryzinski and McGuire. 相似文献
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L-shell partial production cross sections of Lα-, Lβ-, Lγ- rays by electron impact were measured by observing the counts of X-ray from impacted thin tungsten target. Total production cross sections and mean ionization cross sections were deduced from these measured results. The electron beam energy range was from 11 to 36 keV. Tungsten was sputtered onto a carbon backing to reduce bremsstrahlung of the backing. The effect of electrons reflected by the backing has been corrected. Comparison with two theoretical calculations has performed. The experimental results agree rather well with the theoretical predications. 相似文献
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用Si(Li)探测器测量薄Ni靶在9-46keV的电子轰击下产生的K壳层特征X射线,以确定其K壳层电子的电离截面。测量结果与前人的实验和理论计算以及经验公式的计算结果作了比较。 相似文献
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9—28keV电子引起的Cu的K壳层电子电离截面 总被引:1,自引:0,他引:1
用高分辨的St(Li)探测器测量Cu靶在9—28keV的电子轰击下产生的K壳层特征X射线,以确定其K壳层电子的电离截面。运用用电子输运双群模型对衬底的反射对电离的贡献进行了修正。测量结果与前人的实验和经验公式计算结果作了比较。 相似文献