温度对普通硬磁泡的影响

实验研究了温度对外延石榴石磁泡薄膜中硬磁泡及其相应硬条畴的影响。发现了一个与材料参量有关的临界温度T₀当试验温度T0时,硬条畴畴壁中的VBL链在升降温后不变;而当T>T₀时,VBL链消失,所有硬磁泡都软化为正常磁泡。当畴壁中的VBL处于压缩态时,较硬的硬磁泡在较低的温度下软化。软化时,VBL消失的方式是整个VBL链的解体。 关键词：     

面内场和静态偏磁场作用下条畴和泡畴的稳定性

实验研究面内场H_in和静态偏磁场H_b作用下,(111)面磁泡膜内条畴的消失过程。保持H_b恒定,增加H_in,测量条畴消失场H_s^*和泡畴消失场H_k^*与面内场方向β的变化关系。计及立方磁晶各向异性的影响,建立H_in和H_b共同存在时的条畴稳定性理论。定性解释了实验的主要特点。导出黑、白条畴同时消失时的角度 β_n=1/3(2nπ±arc cos│3/(2^1/2)(M_sH_b)/K₁│)(n=0,±1,±2,…)与实验基本符合。 关键词：     

温度对垂直布洛赫线链解体临界面内磁场区间的影响

实验研究了温度对液相外延石榴石磁泡薄膜中条状普通硬磁畴壁内的垂直布洛赫线（ＶＢＬ）链解体临界面内磁场区间的影响。发现存在一对特征温度T⁽¹⁾₀ 和 T⁽²⁾₀（前者比后者略低但均高于室温），在从室温到T⁽²⁾₀的每个温度Ｔ下，使ＶＢＬ逐渐消失的面内磁场Ｈ_ip都分布于一个与Ｔ有关的区间[H_ip⁽¹⁾(T), H_ip⁽²⁾(T)]内，称为临界面内磁场区间：H_ip^{＜H_ip(1)(T)时，ＶＢＬ链保持不变;H_ip(1)(T)< H_ip < H_ip(2)(T)时，随着Ｈ_ip的增加，越来越多的ＶＢＬ消失;H_ip > H_ip(2)(T)时，所有ＶＢＬ都消失。H_ip(1)(T),H_ip(2)(T)及H_ip(2)(T)-H_ip(1)(T)均随Ｔ的升高而下降，前二者分别于T(1)₀ 和 T(2)₀降为零。比值H_ip(2)(T)/H_ip(1)(T)随Ｔ的升高而升高，在低温段（包括室温）升高缓慢且约为21/2,在T(1)₀附近急剧升高且至T(1)₀时趋于∞。对以上结果做了理论分析。 关键词：}     

INFLUENCE OF IN-PLANE FIELD ON THE CRITICAL TEMPERATURE FOR THE BREAKDOWN OF VERTICAL BLOCH LINE CHAINS

The influence of in-plane field H_ip on the critical temperature T₀ for the breakdown of vertical Bloch line (VBL) chains of hard domains in garnet bubble films has been inves-tigated experimentally. It was found that T₀ can be significantly reduced by the increase of H_ip. Besides, the critical in-plane field H′_ip for the breakdown of VBL chains was measured as a function of temperature T for the same sample. As a result, the correlation between these two critical parameters, T₀ and H′_ip, was found. By introducing an effective in-plane field (H_ip)_e, the positive definiteness of the system of VBL pairs with two-dimemsional magnetization distribution was analyzed, giving rise to a theoretical expression of H′_ip(T): H′_ip(T) =|4πM_sQ(a₀+a₁Q +a₂Q²+a₃Q³+ a₄Q⁴)|^T_(T0(Hip=0)), where a_i are constants. It agrees well with the experiments.