Carrier transport in III–V quantum-dot structures for solar cells or photodetectors

According to the well-established light-to-electricity conversion theory,resonant excited carriers in the quantum dots will relax to the ground states and cannot escape from the quantum dots to form photocurrent,which have been observed in quantum dots without a p–n junction at an external bias.Here,we experimentally observed more than 88% of the resonantly excited photo carriers escaping from In As quantum dots embedded in a short-circuited p–n junction to form photocurrent.The phenomenon cannot be explained by thermionic emission,tunneling process,and intermediate-band theories.A new mechanism is suggested that the photo carriers escape directly from the quantum dots to form photocurrent rather than relax to the ground state of quantum dots induced by a p–n junction.The finding is important for understanding the low-dimensional semiconductor physics and applications in solar cells and photodiode detectors.     

基于p-n结中反常光电转换现象的新型带间跃迁量子阱红外探测器

实验发现p-n结中局域载流子具有极高抽取效率,同时伴随着吸收系数的大幅度增加.本文报道上述现象的发现和验证过程,以及基于此现象的新型带间跃迁量子阱红外探测器(interband transition quantum well infrared detector,IQWIP)原型器件的性能.采用共振激发光致发光光谱技术,在InGaN量子阱、InGaAs量子阱、InAs量子点等多个材料体系中均观察到了在p-n结电场作用下的载流子高效逃逸现象,抽取效率分别为95%,87.5%,88%.利用含有InGaAs/GaAs多量子阱的PIN二极管,实验尝试了制备新型的IQWIP原型器件.在无表面减反射膜的实验条件下,利用仅100 nm的有效吸收厚度,实现了31%的外量子效率.基于这个数值推算得到量子阱的光吸收系数达到3.7×10~4cm~(-1),该数值高于传统透射实验测量体材料和量子阱结果.此外,还利用InAsSb/GaSb量子阱材料体系进行了2μm以上波长红外探测的探索.利用上述现象,有望在提高现有器件性能的同时开发出新颖的光-电转换器件.