Co掺杂对ZnO薄膜结构和性能的影响

采用PVA溶胶-凝胶方法，在玻璃衬底上制备了Zn_1-xCo_xO薄膜，利用X射线衍射仪(XRD)研究了不同Co含量对其微结构的影响.采用振动样品磁强计(VSM)测量了Zn_0.88Co_0.12O样品室温下的磁性.采用荧光光谱仪研究了Zn_1-xCo_xO样品室温下的发光特性，分析掺杂含量对其发光性能的影响，发现随着掺杂含量的增加，蓝光发光峰有一定的红移现象. 关键词： PVA方法 ZnO 掺杂     

High mobility ultrathin ZnO p–n homojunction modulated by Zn_(0.85)Mg_(0.15)O quantum barriers

The adding of ZnMgO asymmetric double barriers(ADB) in p-ZnO:(Li, N)/n-ZnO homojunction affects the p–n junction device performance prominently. Two different homojunctions are fabricated on Si(100) substrates by pulsed laser deposition; one is the traditional p-ZnO:(Li, N)/n-ZnO homojunction with different thicknesses named as S_1 (250 nm) and S_2 (500 nm), the other is the one with ADB embedded in the n-layer named as Q (265 nm). From the photoluminescence spectra, defect luminescence present in the S-series devices is effectively limited in the Q device. The current–voltage curve of the Q device shows Zener-diode rectification property because the two-dimensional electron gas tunnels through the narrow ZnMgO barrier under a reverse bias, thus decreasing the working p–n homojunction thickness from 500 nm to265 nm. The ADB-modified homojunction shows higher carrier mobility in the Q device. The electroluminescence of the ZnO homojunction is improved in Q compared to S_2, because the holes in p-type ZnO(Li, N) can cross the wide ZnMgO barrier under a forward bias voltage into the ZnO quantum well. Therefore, electron–hole recombination occurs in the narrow bandgap of n-type ZnO, creating an ultraviolet light-emitting diode using the ZnO homojunction.     

采用PVA方法制备ZnO基发光稀磁半导体

不同的制备工艺对ZnO薄膜的微结构和性能有很大的影响,为了得到成本较低,样品具有较好特性的实验方法,对于制备手段进行了探索。使用PVA溶胶-凝胶法制备了Zn_0.88Co_0.12O薄膜,研究了不同退火工艺对其微结构的影响。对于Zn_0.88Co_0.12O样品的微结构和室温下的铁磁性和发光特性,具体比较分析了产生原因。对比了Co掺杂和复合Co、Fe掺杂Zn_0.88(Co_0.5Fe_0.5)_0.12O样品的微结构,采用振动样品磁强计(VSM)测量了样品的磁特性,发现单一掺杂的薄膜具有更好的晶体质量和更强的磁性。     

Sr/Si(100)表面TiSi2纳米岛的扫描隧道显微镜研究

为了解半导体衬底与氧化物之间存在的相互作用,以及量子尺寸效应对不同再构体的影响,制备了1—2个原子层厚的TiSi₂/Si(100)纳米岛,并使用扫描隧道显微镜(STM)表征手段详细地研究了TiSi₂ /Si(100)纳米岛的电子和几何特性. 结果发现:这些纳米岛表面显示出明显的金属性;其空态STM图像具有典型的偏压依赖性:在高偏压下STM 图像由三聚物形成的单胞构成,并在低偏压下STM 图像显示为密堆积的图案,这些不同的图案反映出不同能量位的态密度有明显差异. 关键词： 2纳米岛')" href="#">TiSi₂纳米岛 Sr/Si(100)表面 扫描隧道显微镜     

One-dimensional diffusion of vacancies on an Sr/Si(100)-c(2×4) surface

An Sr/Si(100)-c(2×4) surface is investigated by high-resolution scanning tunneling microscopy(STM) and scanning tunneling spectroscopy(STS).The semiconductor property of this surface is confirmed by STS.The STM images of this surface shows that it is bias-voltage dependent and an atomic resolution image can be obtained at an empty state under a bias voltage of 1.5 V.Furthermore,one-dimensional(1D) diffusion of vacancies can be found in the room-temperature STM images.Sr vacancies diffuse along the valley channels,which are constructed by silicon dimers in the surface.Weak interaction between Sr and silicon dimers,low metal coverage,surface vacancy,and energy of thermal fluctuation at room temperature all contribute to this 1D diffusion.     

One-dimensional diffusion of vacancies on Sr/Si(100)-c(2×4) surface

An Sr/Si(100)-c(2×4) surface is investigated by high-resolution scanning tunneling microscopy (STM) and scanning tunneling spectroscopy (STS). The semiconductor property of this surface is confirmed by STS. The STM images of this surface shows that it is bias-voltage dependent and an atomic resolution image can be obtained at an empty state under a bias voltage of 1.5 V. Furthermore, one-dimensional (1D) diffusion of vacancies can be found in the room-temperature STM images. Sr vacancies diffuse along the valley channels, which are constructed by silicon dimers in the surface. Weak interaction between Sr and silicon dimers, low metal coverage, surface vacancy, and energy of thermal fluctuation at room temperature all contribute to this 1D diffusion.