100kV直流高温超导电缆终端应力锥设计

本文提出了一种新的单直线应力锥设计方法,根据PPLP材料的绝缘特性,结合超导电缆的本体尺寸和设计电压,给出了增饶绝缘厚度和应力锥轴向长度的设计数据,其中增饶绝缘厚度为3.5 mm,应力锥轴向长度为38.5 mm,并对单直线应力锥进行电场数值分析,结果表明,所设计的单直线应力锥满足100 kV直流高温超导电缆运行要求。     

基于SWT方法的钢绞线索微动疲劳特性分析

为得到钢绞线索丝间接触区的应力场分布并预测微动疲劳裂纹萌生位置和微动疲劳寿命，本文利用参数化方法建立了精细化的钢绞线拉索有限元模型，包括整索模型和不同层丝间接触区域的局部精细化子模型．分析了钢绞线索在两种交变荷载工况下的应力场变化情况，并基于多轴疲劳SWT(Smith-Watson-Topper)临界平面法进行了疲劳特性分析和疲劳寿命预测．主要结论如下：钢绞线索内接触区边缘处的微动幅值较大，中心处几乎没有相对滑动，微动疲劳的初始裂纹萌生点位于接触区域边缘；经不同区域子模型分析比较，在轴向循环荷载作用下，外层钢丝的接触区域比内层钢丝更易发生微动疲劳损伤；在横向位移循环荷载作用下，同层钢丝因位置角度不同而产生了较大的疲劳特性差异，且相比轴向循环拉伸，该工况下最不利单丝的微动疲劳寿命更低；与非接触区域相比，接触区的疲劳寿命大幅降低，微动现象对钢绞线索的抗疲劳性能有明显降低作用．     

Quantum Dots Microstructural Metrology: From Time-Resolved Spectroscopy to Spatially Resolved Electron Microscopy

Colloidal quantum dots (QDs) have unique optical and electrical properties with promising applications in next-generation semiconductor technologies, including displays, lighting, solar cells, photodetectors, and image sensors. Advanced analytical tools to probe the optical, morphological, structural, compositional, and electrical properties of QDs and their ensemble solid films are of paramount importance for the understanding of their device performance. In this review, comprehensive studies on the state-of-the-art metrology approaches used in QD research are introduced, with particular focus on time-resolved (TR) and spatially resolved (SR) spectroscopy and microscopy. Through discussing these analysis techniques in different QD system, such as various compositions, sizes, and shell structures, the critical roles of these TR-spectroscopic and SR-microscopic techniques are highlighted, which provide the structural, morphological, compositional, optical, and electrical information to precisely design QDs and QD solid films. The employment of TR and SR analysis in integrated QD device systems is also discussed, which can offer detailed microstructural information for achieving high performance in specific applications. In the end, the current limitations of these analytical tools are discussed, and the future development of the possibility of interdisciplinary research in both QD fundamental and applied fields is prospected.     

Spatially restricted Double Z-Simplified Box Orbital basis sets: Optimization and comparison with some standard basis sets

As part of previous studies, we introduced a new type of basis function named Simplified Box Orbitals (SBOs) that belong to a class of spatially restricted functions which allow the zero differential overlap (ZDO) approximation to be applied with complete accuracy. The original SBOs and their Gaussian expansions SBO-3G form a minimal basis set, which was compared to the standard Slater-type orbital basis set (STO-3G). In the present paper, we have developed the SBO basis functions at double-zeta (DZ) level, and we have assessed the option of expanding the SBO-DZ as a combination of Gaussian functions. Finally, we have determined the quality of the new basis set by comparing the molecular properties calculated with SBO-nG with those achieved with some standard basis sets.     

Electrochromic Detection of Latent Fingermarks on Metal Surface Using 1,1′-Dibenzyl-4,4′-bipyridinium Dichloride

The electrochromic detection of latent fingermarks on polished or unpolished, flat or curved metal surfaces is described using electrochromic material, 1,1’-dibenzyl-4,4’-bipyridinium dichloride. The surface area covered by fingermarks acts as an insulating mask, causing 1,1’-dibenzyl-4,4’-bipyridinium dichloride to change color and produce inversed images of the fingermark. By changing the applied potential, the optical properties of 1,1’-dibenzyl-4,4’-bipyridinium dichloride can be continuously and reversibly adjusted to optimize the visual contrast of fingermarks, so as to realize the detection of latent fingermarks on stainless steel surface. It is demonstrated that the fabricated electrochromic devices can detect the fingermarks on these types of surfaces within twenty seconds at −1.0∼−2.0 V. This work can qualify as a tangible improvement in fingermark detection of the natural fingermarks on the never-cleaned (more than 3 years) and curved surfaces of daily-used container, e. g. cup, and the handle of cleaning tool, mop.     

质谱分子成像技术与应用进展

该文总结了二次离子质谱、基质辅助激光解吸电离质谱和常压敞开式离子化质谱三大类型质谱分子成像（MSI）技术的概况、技术与方法及其应用新进展。MSI技术作为免标记、高覆盖、高灵敏、检测范围广的可视化分析手段,不局限于生物组织或细胞中某种特定分子的检测,可对已知和未知多种分子进行同时成像分析,获得不同分子的空间分布、相对含量及结构信息,实现其分子的定性、定量与定位分析;还可提供不同生理及病理过程中功能分子的动态时空变化信息等。因此,MSI技术成为质谱领域以及分析化学等领域的研究前沿与热点方向之一,并在化学、医学、生命科学、药学和环境科学等领域显示出重大应用前景。此外,MSI技术是单细胞可视化分析和空间分辨代谢组学的强有力分析手段,可从动物或器官组织的整体、微区、单细胞等不同空间尺度,获取具有空间分布特征、时空动态变化的功能分子全景轮廓信息等而备受关注。     

Exploring the effect of radiation crosslinking on the physico‐mechanical,dynamic mechanical and dielectric properties of EOC–PDMS blends for cable insulation applications

This work focuses on the effect of electron beam irradiation on the physico‐mechanical, dynamic mechanical and dielectric properties of blends based on ethylene octene copolymer (EOC) and poly dimethyl siloxane (PDMS) rubber. It is found that electron beam irradiation caused considerable improvement in the physico‐mechanical properties; the tensile strength was enhanced by nearly 35% for 70:30 EOC:PDMS blend. Phase morphology of the blends analyzed before irradiation by scanning electron microscopy (SEM) exhibited droplet/matrix morphology with sizes of the PDMS rubber domain varying from 0.55 µm to 0.47 µm as the amount of PDMS rubber decreased from 30 wt% to 10 wt%. This reduction in the PDMS rubber domain has been correlated with the physico‐mechanical properties of the blends. Further, the dynamic mechanical properties and creep behavior of these EOC:PDMS blends before and after irradiation has been studied. It is inferred that the 70:30 blend after radiation crosslinking shows a 17% decrease in the creep compliance, i.e. higher creep resistance compared to neat blends. All the radiation crosslinked blends exhibited lower dielectric constant, lower dielectric loss and higher electrical resistivity as compared to the virgin blends which makes it suitable for cable insulating application. Copyright © 2016 John Wiley & Sons, Ltd.