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71.
高伟建  朱士群 《光学学报》1998,18(3):95-298
理论上分析了双向环形气体激光中背散射和饱和效应对光场统计性质的影响,求出了强度相关函数的有效本征值。与实验测量值比较表明,具有背散射的全饱和激光模型与实验吻合得更好,而其它激光模型偏差较大  相似文献   
72.
Using a series of bi-layer samples, we show how Conversion Electron Mössbauer Spectroscopy (CEMS) and X-ray Backscatter Mössbauer Spectroscopy (XBS) can be done with the same experimental set up. The penetration depths of the K and L conversion electrons are measured as 51(6) and 330(240) nm, respectively, with relative contributions of 88(9) and 12(9)%. The penetration depth of the Fe-K α X-ray signal is determined to be 3.6(2) μm. As a demonstration we show data on surface damage effects in electropolished TRIP steels, and by comparing CEMS and XBS Mössbauer patterns we estimate the thickness of a damaged layer (created by sanding) to be 550(50) nm.  相似文献   
73.
RK Singh  RK Mohanta  R Hippler  R Shanker 《Pramana》2002,58(3):499-519
Development of a new lectron-recoil ion/photon coincidence setup for investigating some of the electron induced collision processes, such as electron bremsstrahlung, electron backscattering, innershell excitation and multiple ionization of target atoms/molecules in bombardment of electrons having energies from 2.0 keV to 30.0 keV with solid and gaseous targets is described. The new features include the use of a compact multipurpose scattering chamber, a time-of-flight spectrometer for detection of multiply charged target ions, a 45°-parallel plate electrostatic analyzer for measuring energy and angle of the ejected electrons, a room temperature high resolution Si-PIN photo diode X-ray detector for counting the collisionally induced photons, a coincidence data acquisition system consisting of a 200 MHz Pentium based 8K-multichannel analyzer and a standard network of a fast/slow coincidence electronics. In particular, the details of design, fabrication and assembly of indigenous components employed in the setup are presented. Selected experiments planned with the setup are mentioned and briefly discussed. A report on performance, optimization, efficiency, time resolution etc. of the time-of-flight (TOF) spectrometer and that of the 45°-parallel plate electrostatic analyzer (PPEA) is presented. Test spectra of electron-recoil ion coincidences, energy distribution of ejected electrons and characteristic plus non-characteristic X-ray spectrum are illustrated to exhibit the satisfactory performance of the developed setup.  相似文献   
74.
This paper describes the second part of a study devoted to the growth of thin Ni-Al alloys after deposition of Al on Ni(1 1 1). In the previous paper [S. Le Pévédic, D. Schmaus, C. Cohen, Surf. Sci. 600 (2006) 565] we have described the results obtained for ultra-thin Al deposits, leading, after annealing at 750 K, to an epitaxial layer of Ni3Al(1 1 1). In the present paper we show that this regime is only observed for Al deposits smaller than 8 × 1015 Al/cm2 and we describe the results obtained for Al deposits exceeding this critical thickness, up to 200 × 1015 Al/cm2. Al deposition was performed at low temperature (around 130 K) and the alloying process was followed in situ during subsequent annealing, by Auger electron spectroscopy, low energy electron diffraction and ion beam analysis-channeling measurements, in an ultra-high vacuum chamber connected to a Van de Graaff accelerator. We evidence the formation, after annealing at 750 K, of a crystallographically and chemically well-ordered NiAl(1 1 0) layer (whose thickness depends on the deposited Al amount), over a Ni3Al “interfacial” layer (whose thickness—about 18 (1 1 1) planes—is independent of the deposited Al amount). The NiAl overlayer is composed of three variants, at 120° from each other in the surface plane, in relation with the respective symmetries of NiAl(1 1 0) and Ni3Al(1 1 1). The NiAl layer is relaxed (the lattice parameters of cc-B2 NiAl and fcc-L12 Ni3Al differ markedly), and we have determined its epitaxial relationship. In the case of the thickest alloyed layer formed the results concerning the structure of the NiAl layer have been confirmed and refined by ex situ X-ray diffraction and information on its grain size has been obtained by ex situ Atomic Force Microscopy. The kinetics of the alloying process is complex. It corresponds to an heterogeneous growth leading, above the thin Ni3Al interfacial layer, to a mixture of Al and NiAl over the whole Al film, up to the surface. The atomic diffusion is very limited in the NiAl phase that forms, and thus the progressive enrichment in Ni of the Al film, i.e. of the mean Ni concentration, becomes slower and slower. As a consequence, alloying is observed to take place in a very broad temperature range between 300 K and 700 K. For annealing temperatures above 800 K, the alloyed layer is decomposed, Al atoms diffusing in the bulk of the substrate.  相似文献   
75.
We are exploring to process nuclear waste through nuclear transmutation method with ray irradiation. The ray employed for transmutation is generated in the way of Compton backscattering. Preliminary experiment is being developed on the NewSUBARU storage ring providing an electron beam with energy of 1 GeV, and 17.6 MeV ray will be generated through a head-on collision of the electron beam and a 1.064 m laser light. ray flux about the present experiment is predicted theoretically. A planned scheme for promoting the flux is also introduced, As well as the maximum laser power available for the storage ring is discussed.  相似文献   
76.
针对频域OCT中背向散射光的强度随探测深度加深而急剧减弱,从而导致最后的组织成像模糊不清的现象,提出了一种对不同探测深度图像灰度补偿的方法。该方法通过补偿样品每层析面的入射光功率与背向功率散射率,来得到样品每层析面图像的真实灰度,提高了OCT图像质量。以理想的、由多层均匀介质组成的组织模型为基础,深入剖析了影响深度图像灰度的主要因素。通过建立以多层盖玻片为被测物体的频域OCT系统,得到多层盖玻片的深度图像。在对以盖玻片为被测物体的前提下,得出逐层深度图像灰度补偿的公式。并将理论补偿和实验系统的复杂情况相结合,对深度灰度图像进行入射和出射光强的补偿。实验结果证明这种补偿法是一种有效可行的补偿方法。  相似文献   
77.
简单叙述了采用康普顿背散射技术精确测量电子束能量的技术,并指出建立辐射标准实验站对精确电子束能量测量的需求. The technique to measure the electron beam energy accurately with Compton backscattering technique is introduced and requirements for the experimental stations of radiometry are also described in the paper.  相似文献   
78.
Voruntersuchungen ergaben, daß sich der Dichteeinfluß bei der Neutronenfeuchtemessung kompensieren läßt. Eine Meßanordnung muß dazu zwei Zählraten liefern, die jede für sich linear nur vom Wassergehalt je Volumeneinheit bzw. von der Dichte abhängt. Mit Hilfe eines Datenverarbeitungsgerätes sind dann Angaben der Feuchte in Gewichtsprozenten in bestimmten Zeitabständen möglich. Es wurden ein kombinierter Feuchte-Dichte-Meßkopf und ein Datenverarbeitungsgerät aufgebaut und an Modellsubstanzen erprobt. Es konnte gezeigt werden, daß die Meßwerte weitgehend dichteunabhängig sind. Allerdings sind häufige Eichkontrollen notwendig.  相似文献   
79.
Direct computer simulations of electromagnetic scattering by discrete random media have become an active area of research. In this progress review, we summarize and analyze our main results obtained by means of numerically exact computer solutions of the macroscopic Maxwell equations. We consider finite scattering volumes with size parameters in the range [20] and [59], composed of varying numbers of randomly distributed particles with different refractive indices. The main objective of our analysis is to examine whether all backscattering effects predicted by the low-density theory of coherent backscattering (CB) also take place in the case of densely packed media. Based on our extensive numerical data we arrive at the following conclusions: (i) all backscattering effects predicted by the asymptotic theory of CB can also take place in the case of densely packed media; (ii) in the case of very large particle packing density, scattering characteristics of discrete random media can exhibit behavior not predicted by the low-density theories of CB and radiative transfer; (iii) increasing the absorptivity of the constituent particles can either enhance or suppress typical manifestations of CB depending on the particle packing density and the real part of the refractive index. Our numerical data strongly suggest that spectacular backscattering effects identified in laboratory experiments and observed for a class of high-albedo Solar System objects are caused by CB.  相似文献   
80.
The beam energy is measured in the e+e-collision by using Compton backscattering. The uncertainty of this measurement process is studied by virtue of analytical formulas, and the special effects of variant energy spread and energy drift on the systematic uncertainty estimation are also studied with the Monte Carlo sampling technique. These quantitative conclusions are especially important for understanding the uncertainty of the beam energy measurement system.  相似文献   
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