高频电压下交联聚乙烯电缆绝缘中电树枝生长的动力学模型

针对高压交联聚乙烯电缆绝缘试样,在1000—2000Hz 10kV峰值正弦电压下,采用计算机实时显微数字摄像技术进行了电树枝培养实验.基于半结晶绝缘材料中电树枝生长机理和电树枝结构的分形特征,提出了一个在高频范围定量预测电应力驱动下交联聚乙烯电缆绝缘中电树枝生长特性的动力学模型,获得了电树枝生长率方程和从电树枝生长到击穿过程的寿命公式.将该模型预测值与实验中获得的电树枝生长规律实验数据进行比较,其结果有较好的一致性,表明提出的模型化方法可以应用到交联聚乙烯电缆绝缘中电树枝老化规律的定量分析研究中. 关键词： 交联聚乙烯电缆绝缘 电树枝 施压频率 动力学模型     

环氧树脂高温分子链松弛与玻璃化转变特性

环氧树脂是电力设备中广泛应用的一种绝缘材料, 其介电性能受到分子链运动特性的影响. 本文制备了直径为50 mm、厚度为1 mm的环氧树脂试样, 采用差示扫描量热仪和宽频介电谱仪测试了环氧树脂的玻璃化转变温度和介电特性. 实验结果表明, 环氧树脂的玻璃化转变温度为105 ℃, 在玻璃化转变温度以上, 高频段出现了由分子链段运动造成的松弛过程, 低频段出现了由载流子在材料中迁移造成的直流电导过程. 发现环氧树脂不同尺寸分子链段的松弛时间不同, 其松弛时间分布较宽, 计算得到了分子链段在不同温度下的松弛时间分布特性. 分子链松弛峰频率和直流电导随温度的变化关系服从Vogel-Tammann-Fulcher公式. 拟合实验结果得到分子链松弛峰频率和直流电导的Vogel温度和强度系数. 由Vogel温度计算得到了与差示扫描量热测试结果一致的玻璃化转变温度, 约为102 ℃. 结果表明玻璃化转变温度以上环氧树脂的自由体积增大, 分子链段有足够的空间来响应外电场从而产生分子链松弛极化, 载流子有足够的能量在材料中迁移形成电导.     

NiTi合金势能面的第一性原理研究

采用模守恒赝势(Lin方案)和平面波超软赝势对两种NiTi异构体超晶胞势能面进行了理论研究，结果表明：由于在绝对零度下B19′相总能量低于B2相总能量，B19′相更为稳定.对于B2相，合金化元素Au和Fe在Ni原子位处于势能面平衡点而Ni(Ni位)及位于Ti原子位的Ti，Zr 和Al并非处于平衡位置.在B19′相，Ni，Au，Fe，Ti，Zr，Al均处于势能面平衡点.NiTi合金的马氏体相变应该主要是来自Ni、Ti原子位于势能面非平衡位置所致. 关键词： 密度泛函 势能面 NiTi 合金     

Electronic relaxation of deep bulk trap and interface state in ZnO ceramics

This paper investigates the electronic relaxation of deep bulk trap and interface state in ZnO ceramics based on dielectric spectra measured in a wide range of temperature, frequency and bias, in addition to the steady state response. It discusses the nature of net current flowing over the barrier affected by interface state, and then obtains temperature-dependent barrier height by approximate calculation from steady I--V (current--voltage) characteristics. Additional conductance and capacitance arising from deep bulk trap relaxation are calculated based on the displacement of the cross point between deep bulk trap and Fermi level under small AC signal. From the resonances due to deep bulk trap relaxation on dielectric spectra, the activation energies are obtained as 0.22 eV and 0.35 eV, which are consistent with the electronic levels of the main defect interstitial Zn and vacancy oxygen in the depletion layer. Under moderate bias, another resonance due to interface relaxation is shown on the dielectric spectra. The DC-like conductance is also observed in high temperature region on dielectric spectra, and the activation energy is much smaller than the barrier height in steady state condition, which is attributed to the displacement current coming from the shallow bulk trap relaxation or other factors.