Molecular dynamics studies of brittle fracture in vitreous silica: Review and recent progress

The dynamics of brittle fracture in vitreous silica has been a subject of many molecular dynamics (MD) simulations and experiments. A striking similarity between both simulations and experiments is the observation of nanoscale voids that eventually coalesce leading to failure. In this work, we review the above MD simulations and carry out further MD investigations using two variations of classical 2-body potentials. We study the effect of charge-transfer, an important aspect neglected by previous simulations. Further, we examine the growth of ‘critical’ voids and characterize regions surrounding the voids.     

Nanoscale surface heterogeneities and glass durability

The surface of a high quality soda-lime silicate glass is found to be inhomogeneous, consisting of nanometer-high ridges that extend for tens of microns. Exposure to mild and aggressive environments results in an increase in the ridge heights as they dissolve much more slowly than the rest of the glass. The ridges also exhibit enrichment of sodium, magnesium, aluminum and oxygen. The parallel nature of the ridges suggests that they originate from compositional heterogeneity during the glass processing.     

Characterization of ALCVD-Al2O3 and ZrO2 layer using X-ray photoelectron spectroscopy

The atomic layer chemical vapor deposition (ALCVD) deposited Al₂O₃ and ZrO₂ films were investigated by ex situ X-ray photoelectron spectroscopy. The thickness dependence of band gap and valence band alignment was determined for these two dielectric layers. For layers thicker than 0.9 nm (Al₂O₃) or 0.6 nm (ZrO₂), the band gaps of the Al₂O₃ and ZrO₂ films deposited by ALCVD are 6.7±0.2 and 5.6±0.2 eV, respectively. The valence band offsets at the Al₂O₃/Si and ZrO₂/Si interface are determined to be 2.9±0.2 and 2.5±0.2 eV, respectively. Finally, the escape depths of Al 2p in Al₂O₃ and Zr 3p3 in ZrO₂ are 2.7 and 2.0 nm, respectively.     

Characterization of cordierite-based glass-ceramics produced from fly ash

The cordierite-based glass-ceramics have been developed using fly ash as one of the starting raw materials. On the basis of DTA analysis, nucleation experiments were carried out at 840 °C for 2 h and crystallization experiments were performed at 1020 °C for 2 h. X-ray diffraction analysis revealed that the major phase of the synthesized glass-ceramics was cordierite along with a trace of anorthite and iron cordierite. The properties of the synthesized cordierite-based glass-ceramics compared well with the values of industrial cordierite. Results indicate an interesting potential for fly ash to produce useful materials.     

A molecular dynamics study on vibration spectra of a-SiO2 surface

The charge equilibration (QEq) method was used in the molecular dynamics study of the vibration spectra on the a-SiO₂ surface. The vibrational density of states (VDOS) of a silica glass surface and partial contribution of Si and O atoms were compared with those obtained from the fixed-charge (FQ) model. The VDOS in each of the samples has two groups of vibrational bands, i.e., wide-lower-frequency band (WB) between 0-25 THz and narrow-higher-frequency band (NB) between 25 and 40 THz, which is similar to the bulk VDOS obtained experimentally. The QEq surface exhibits a peak and two shoulders while two peaks are found for the FQ surface. At the surface, an excess peak (at 1-2 THz) was observed by substracting the Debye VDOS from the calculated VDOS, which is regarded as the experimentally observed the boson peak (BP). The position of the BP is shorter than that in the case of the bulk. In the FQ surface, the VDOS consists of narrower bands, while in the QEq sample, wider bands exist due to charge variation.     

Highly regioselective photodimerization of 1,4-dihydropyridines: An efficient synthesis of novel 3,6-diazatetraasteranes

Conventional photocycloaddition of 1,4-dihydropyridines does not afford novel head-to-head 3,6-diazatetraasteranes. Herein, we describe a highly regioselective method to synthesize 3,6-diazatetraasteranes via an intramolecular photodimerization of 1,4-dihydropyridines. First, the 1,4-dihydropyridines were tethered by phthaloyl to direct a proximate parallel arrangement in head-to-head orientation by the rotation of CC single bonds in solution. An intramolecular [2 + 2] photocycloaddition proceeded subsequently to give desired 3,6-diazatetraasteranes in high yield (92–97%) and excellent regioselectivity. Furthermore, two different 1,4-dihydropyridines can also be regiocontrolled by this strategy and produce polysubstituted 3,6-diazatetraasteranes via a cross-photodimerization in a concise and efficient way. In addition, this approach can provide direct access to other polysubstituted polyhedron scaffolds from 1,4-dihydropyridine analogues.     

High resolution patterning of silica aerogels

Three-dimensional metallic structures are fabricated with high spatial resolution in silica aerogels. In our method, silica hydrogels are prepared with a standard base-catalyzed route, and exchanged with an aqueous solution typically containing Ag⁺ ions (1 M) and 2-propanol (0.2 M). The metal ions are reduced photolytically with a table-top ultraviolet lamp, or radiolytically, with a focused X-ray beam. We fabricated dots and lines as small as 30 × 70 μm, protruding for several mm into the bulk of the materials. The hydrogels are eventually supercritically dried to yield aerogels, without any measurable change in the shape and spatial resolution of the lithographed structures. Transmission electron microscopy shows that illuminated regions are composed by Ag clusters with a size of several μm, separated by thin layers of silica.     

Ablation and compaction of amorphous SiO2 irradiated with ArF excimer laser

The structure of amorphous SiO₂ exposed to ArF excimer laser irradiation was examined. Threshold fluence for causing ablation with a single pulse depended on sample preparation: more specifically, 1 J/cm² for thermally grown SiO₂ films on silicon and 2.5 J/cm² for bulk SiO₂. It was found that the bond angle of Si-O-Si was reduced by irradiation near the interface of thermally grown SiO₂ films. In contrast, evolution of the bond angle by irradiation was absent in both the bulk SiO₂ and SiO₂ film-near the top surface, even though the concentration of puckered four-membered rings deduced from Raman spectra dramatically increased. It is assumed that planar three-membered rings were generated in the SiO₂ thin layer near the interface, and puckered four-membered rings were generated in the bulk SiO₂. The concentration of both the Si³⁺ and Si²⁺ structure was increased at a fluence of 800 mJ/cm² with an increasing number of pulses, although generation of both was absent at higher fluence for a single pulse. The author proposes that the structure of SiO₂ is created by flash heating and quenching by pulse laser irradiation. Structural similarities were found between the irradiated SiO₂ and SiO₂ at high temperatures.     

Concentration quenching of fluorescence from the (P0 + P1) manifold in heavily-doped Pr: ZBAN glasses

Fluorescence waveforms from the (³P₀ + ³P₁) manifold in Pr³⁺ doped ZBAN glass at wavelengths of 520, 635 and 695 nm were measured for Pr³⁺ concentrations from 4 to 12 mol%. The waveforms were found to be non-exponential with decay rates rapidly increasing with Pr³⁺ concentration and independent of whether the ³P₀ or the ³P₁ level was excited. The multipolar energy transfer model was used to analyse the waveforms and this showed that concentration quenching was due to cross-relaxation by dipole-dipole interaction. The critical concentration, at which the cross-relaxation rate equals the intrinsic decay rate, was found to be of 2.06 × 10²⁶ m⁻³ (1.20 mol%). There was no evidence of excitation diffusion for Pr³⁺ concentrations of up to 12 mol%.     

Si(0 0 1) surface oxidation by N2O

Ultra-thin homogeneous oxynitride films are prepared on Si(0 0 1). The Si surface is cleaned in UHV by heating (flashing) and is exposed to different pressures of N₂O at altered temperatures. Thus oxynitride layers of different thickness and different properties are grown depending on the N₂O pressure and the Si temperature. This is illustrated by a schematic diagram. The properties of the different oxynitride layers were studied by a combined photoemission electron microscopy (PEEM) and photoelectron spectroscopy (PES) investigation using highly monochromatic synchrotron radiation. The amount of oxygen and nitrogen incorporated in the oxynitride layers is determined from the PES measurements. The typical surface morphology for different preparation conditions is shown in PEEM images.