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41.
An interferometer having accuracy in displacement measurement of <1 nm is necessary in nanometrology. To meet the requirement, the periodic nonlinearity mainly caused by polarization and frequency mixings should be less than deep sub-nanometer. In this paper, two spatial-separated polarization beams are used to avoid mixings and then the periodic nonlinearity. The developed interferometer demonstrates a periodic nonlinearity of about 25 pm and a 2 pm/Hz in displacement noise level. 相似文献
42.
43.
Feedback interferometers are described with specific reference to potential applications in micro-machines. A theoretical analysis is developed to determine the linearity, stability, and noise performance of this type of interferometer. The theoretical analysis was tested using a prototype high-precision feedback interferometer which showed that, at a feedback loop gain which enabled the system to track 6 fringes, the linearity of the interferometer was better than λ/100 and single phase measurements could be made with an accuracy of λ/80. 相似文献
44.
M. Lawrence 《Optics & Laser Technology》1984,16(3):137-140
The general design, operating principles, and accuracy limitations of cw laser wavemeters based on the Michelson interferometer are discussed. Device construction and operating practicalities are illustrated by reference to an automatic system built to monitor the wavelength of a Coherent 599-21 single-mode dye laser. 相似文献
45.
46.
R. S. Sirohi 《Optics & Laser Technology》1984,16(5):251-254
A number of speckle shear methods and their applications to ndt are discussed. Experiments using multiple apertures with custom-made optical elements have shown that in-plane displacement, slope and curvature patterns can be obtained by filtering through appropriate haloes. 相似文献
47.
Yande Xu 《Optical Review》2004,11(5):303-307
This paper proposes a new measuring method called two-period interference fringe interferometry, for a step-profile altitude difference measurement. The principle of the method is different from that of the two-wavelength interferometry which is widely known. The two interference fringes with only slight difference between their spatial periods are obtained by turning a binary step-grating, and they produce a synthetic equivalent period much longer than either of the two periods alone. The interference fringes are produced by the ±1st-order beams diffracted from the grating. The intensity distribution of the interference pattern is independent of the wavelength of the laser-diode light source used. The measuring range of this method is much larger than that of the two-wavelength interferometery. Sinusoical phase modulating technique is easily applied to detect the phase distribution of the interference pattern by vibrating the grating sinusoidally. A plane reflector of 3mm thickness is measured to verify this novel method. 相似文献
48.
49.
Measurement Accuracy in Phase-Shifting Point Diffraction Interferometer with Two Optical Fibers 总被引:1,自引:0,他引:1
Toshiaki Matsuura Satoru Okagaki Takaaki Nakamura Yasushi Oshikane Haruyuki Inoue Motohiro Nakano Toshihiko Kataoka 《Optical Review》2007,14(6):401-405
A phase-shifting point diffraction interferometer (PS/PDI) with point sources of two single mode optical fibers has been developed,
which will be appropriate for the surface figure measurement of large aperture optics on a sub-nanometer scale. To reduce
the measurement error factors, a fiber optic plate (FOP) is used as a projection plane for interference pattern. Errors caused
by imperfection of optical alignment, such as position of point sources and tilt of FOP, are minimized by analyzing the measured
phase data with an original method. Measurement accuracy in the PS/ PDI is estimated with the interference pattern produced
by the two optical fiber sources. If inhomogeneity of the FOP and a systematic error of the PS/PDI are eliminated, the measurement
accuracy of the present system is estimated to be less than 4nm P-V and 0.7nm rms, respectively, at a measurement wavelength
of 632.8 nm. 相似文献
50.