‘Best-case’ noise performance of feedback interferometers, potential for micromachine applications

We present a theoretical analysis of the noise performance of phase measuring feedback interferometers. We first analyse the operation of this kind of instrument and note that under certain circumstances bistability can occur. The bistable region should be avoided if possible when using feedback interferometry for high-accuracy measurement with low-input powers, as it can give rise to very high-noise levels. We then go on to investigate the effects of shot noise (on the interferometer output signal) and thermal noise (in the feedback loop), and relate these to the phase measurement accuracy of the interferometer. A ‘best-case’ calculation indicates that phase noise of about 0.005λ is possible at input powers in the nanowatt region. In practice, we expect that noise levels will be higher than predicted (particularly at high-input powers) due to the effects of vibration and air turbulence.     

A semi-automatic method for measuring interferometry fringes: prototype design and first results

A device for automatically obtaining the information contained in holographic interferometry fringes is proposed. The method may be applied to any kind of interferometric fringes. Accuracy has been demonstrated by contrasting the results obtained with our prototype system and those with the single-beam speckle interferometry technique for the measurement of displacements in a plane. The results show good correlation between the two series of measurements.     

Non-contacting laser based displacement measurements from solid objects

This note reports a laser Doppler interferometer for measuring the axial motion of solid targets which have had no prior preparation. Both magnitude and sense of motion are measured to a resolution at least 0.316 μm usinga passive optical system and simple signal processing, making the device relatively cheap to construct. Results indicate that the LDI is capable of good linearity over a substantial range of target amplitudes and has a reasonable degree of immunity from speckle effects.     

Entanglement and Non-Locality in Quantum Protocols with Identical Particles

We study the role of entanglement and non-locality in quantum protocols that make use of systems of identical particles. Unlike in the case of distinguishable particles, the notions of entanglement and non-locality for systems whose constituents cannot be distinguished and singly addressed are still debated. We clarify why the only approach that avoids incongruities and paradoxes is the one based on the second quantization formalism, whereby it is the entanglement of the modes that can be populated by the particles that really matters and not the particles themselves. Indeed, by means of a metrological and of a teleportation protocol, we show that inconsistencies arise in formulations that force entanglement and non-locality to be properties of the identical particles rather than of the modes they can occupy. The reason resides in the fact that orthogonal modes can always be addressed while identical particles cannot.     

Phase-stepped ESPI and moiré interferometry for measuring stress-intensity factor andJ integral

Electronic-speckle-pattern interferometry and moiré interferometry have been used to calculateK ₁ andJ for compact tension specimens. Automated-fringe-pattern analysis enables the full-field of data to be used with the minimum of operator intervention. Measurements are shown to be accurate to within 10 percent. TheJ-measurement procedure employed could form the basis of an automatic-fault detection system.     

夹层全息干涉法的残余应力测试

本文用夹层全息干涉法做了模拟残余应力的标定实验,测试了焊缝、铸件的残余应力,并且利用数值方法进行了定量分析,实验结果与理论值比较吻合。     

剪切散斑干涉与有限元优化计算相结合实现缺陷参数的定量求解

本文将剪切散斑干涉与有限元优化分析相结合，对薄壁压力容器缝缺陷进行了定量检测，通过对优化计算结果和已知的缺陷参数所构成的目标函数的求解，获得了较为精确的缺陷参数识别结果。     

Study of thermal deformation of microelectronics packaging product by interferometric technique

In this paper, the out-of-plane deformation of silicon surface of Direct Chip Attachment (DCA) assembly, under thermal loading, was measured in real-time by Twyman/Green interferometry. The contour maps of the out-of-plane displacement fields of silicon surface under thermal loading and cycling of various temperature were obtained. Experimental results show that the relation between the out-of-plane displacement and temperature is nonlinear and varies with temperature cycling, due to nonlinear mechanical behavior of the materials used in electronic packaging. A comparison of the out-of-plane displacement fields of silicon surface measured by T/G interferometry in real-time and replicating technique of high temperature specimen grating of moire interferometry was made.     

部分相干光云纹干涉法测三维位移场

本文提出了一种用部分相干光可同时获得面内位移和离面位移场的云纹干涉法。该法具有装置简单,无需防震,可用于观场测量等特点。文中论述了此法的基本原理,应用波前干涉理论和付里叶光学理论对变形前后波前的干涉、记录和再观进行了分析,导出了计算公式。实现了透射物体和反射物体表面的面内位移分量(U_0,V_(45),U_(90))和离面位移(w)的全场同时测量,典型实验证明,实验值与计算结果符合较好。     

Dispersion measurement of liquids with a fiber optic probe based on a bi-functional lensed photonic crystal fiber

We report a fiber optic probe suitable for measuring the wavelength dispersion of liquids. The measuring probe is made from an extrinsic fiber-optic cavity formed by a lensed photonic crystal fiber (PCF) and a micro-mirror. The custom-designed lensed PCF plays a dual role of collimator to help realize a long cavity length of the order of millimeters and as an efficient reflector to form the reference beam. The length of the cavity used in the experiment is about 1620 μm. In this article, we present the analytical method of obtaining dispersion of the liquid sample from the spectral interferogram of a single-arm or common path interferometer. Sodium chloride salt solutions with varied concentrations are used as an example to demonstrate the efficacy of the instrument. The index change with concentration is found to be linear at low concentrations and deviates from linearity as it approaches saturation.