Experimental determination of the electron elastic backscattering probability and the surface excitation parameter for Si,Ni, Cu and Ag at 0.5 and 1 keV energies

Electron spectra are generally presented in arbitrary units. The experimental elastic peak intensity I_espec(E) is determined by the elastic backscattering probability I_e(E) of electrons backscattered elastically within the solid angle of the spectrometer. The experimental elastic peak I_espec(E) is converted to I_e(E) backscattering probability using our new procedure based on the Goto i_e(E) elastic backscattering current database. The elastic backscattering probability I_c(E) was calculated applying the EPESWIN software of Jablonski. I_e(E) < I_c(E) due to the surface losses of electrons, characterized by the surface excitation parameter P_se (SEP). P_se(E) was determined experimentally using the Goto database and the relationship of Tanuma. Our new procedure is applied to angular‐resolved (AREPES) spectra of Jablonski and Zemek presented in arbitrary units. In their AREPES experiments, the experimental elastic peak intensity I_espec = I_e(E, α_d, ΔΩ) was measured at α_d angle of detection (35–74°) with a small HSA, with ΔΩ solid angle. The experimental value at 42° $I_{e}(E, {\it{42}}\deg{\hbox{}}, {\Delta}\Omega)$ was converted to probability with the Goto database. It was corrected with a SEP parameter P_se, determined by trial and error method for Si, Ni, Cu and Ag for E = 0.5 and 1 keV primary energies. Copyright © 2010 John Wiley & Sons, Ltd.     

利用FEL康普顿背散射实现对NSRL辐射波段的扩展

针对NSRL同步辐射光源不能开展硬X射线领域实验研究的缺点,提出了利用FEL康普顿背散射产生高亮度极化的硬X射线,并利用FEL波长可调的特点来连续调节硬X射线的波长。同时还针对NSRL光源的参数,提出了一个初步可行的远红外FEL参数和背散射工作方式,并给出了理论结果。     

Fiber-Optic Backscattering Profile Measurements for Determination of the Optical Coefficients of Turbid Media

The necessity of using anisotropic approximation in techniques for determining optical parameters from the backscattered radiation profile is shown. A fiber-optic technique for simultaneous determination of the anisotropy parameter as well as the scattering and absorption coefficients of turbid media is proposed. It is based on the comparison of the experimental backscattered radiation profiles and those obtained by the numerical Monte Carlo method.     

基于VXI总线的电离层探测系统信号源的设计

根据新型电离层斜向返回探测系统的编码调相脉冲压缩、间隔收发体制，采用FPGA和数字上变频器实现了一种适合该体制的、基于VXI总线的信号源模块．具体描述了该模块的设计方法、主要逻辑和时序关系，试验表明，该模块运行可靠，工作方式和参数调整灵活，实现了符合体制要求的射频信号和时序控制信号，满足了新型电离层斜向返回探测系统抗干扰、开放性和易升级的要求。     

The first-order perturbed SBS equations

Summary Using standard multiscale techniques, a first-order perturbation theory for SBS is developed. In the presence of small damping, we find that there is a stationary solution for a soliton which is a fixed point. The velocity of this soliton is determined by the damping coefficients. In addition, there is also a constant shift in the pump intensity in the region between the front of the backward moving soliton and the forward light cone of the pump.     

Growth of Ni-Al alloys on Ni(1 1 1): (I) Formation of epitaxial Ni3Al from ultra-thin Al deposits

In this paper we describe the alloying process of ultra-thin Al layers (below 8 × 10¹⁵ Al/cm²) deposited on Ni(1 1 1). For this purpose Auger electron spectroscopy, low energy electron diffraction, and ion beam analysis-channelling measurements have been performed in situ in an ultra-high vacuum chamber. Al deposits formed at low temperature (about 130 K) are strained defective crystalline layers retaining the substrate orientation. Alloying takes place, with very progressive Ni enrichment, in a very broad temperature range between 250 K and 570 K. This feature shows that diffusion of the alloy species is more and more difficult when the Ni concentration increases. At 570 K a crystallographically and chemically ordered Ni₃Al phase is formed, and its order continuously improves upon annealing, up to 750 K. We have shown by ion beam methods that this alloy is three-dimensional, extending up to 16 (1 1 1) planes for the thickest deposits. The Ni₃Al phase can also be obtained directly by Al deposition at 750 K, but its crystalline quality is lower and the layer is probably formed of grains elongated along 〈1 1 −2〉 directions. The Al content of the thin Ni₃Al layers formed mostly dissolves in the bulk above 800 K. However a small amount of Al remains segregated at the Ni crystal surface.     

Determination of photoelectron attenuation lengths in calcium phosphate ceramic films using XPS and RBS

Calcium phosphate (CaP) coatings are used to improve the biological performance of an implant. A technique that is often used to measure the composition of this material is XPS. When extremely thin coatings are measured, for example to study the interface between CaP and a substrate, the quantification of the XPS results is complicated by the varying attenuation lengths (ALs) of the photoelectrons at different energies. To correct for this, AL data are needed. In this work we measured these ALs by comparing XPS yields with the coating coverage (as measured by Rutherford backscattering spectrometry). We were able to determine the AL for several calcium and phosphorus peaks. Determination of the oxygen ALs was not possible owing to diffusion of oxygen into the polymeric substrates. For the peaks that are most often used for quantification of XPS yields (the Ca 2p and the P 2p peak), we found ALs of 21.8 × 10¹⁵ atoms cm^?2 and 26.8 × 10¹⁵ atoms cm^?2, respectively. Concentration profiles near the interface, growth mode and interfacial roughness appeared to have no measurable effect on the measured ALs. For the ALs, an energy dependence with an exponent of 0.55 was found. The measured ALs are best predicted by the empirical CS1 equation of Cumpson and Seah. Copyright © 2003 John Wiley & Sons, Ltd.     

Improvements in Carrier-to-Noise-Ratio (CNR) of Lightwave Amplitude Modulated Vestigial-Sideband (AM-VSB) Transmission Systems by the Use of Optical Isolators

In lightwave community antena television (CATV) systems as well as other optical fiber communication networks, a transmitted optical signal is known to be degraded by an intensity noise produced within the fiber due to the interference between the signal and doubly reflected light. We report on the improvements to the signal degradation due to the double Rayleigh backscattering by inserting optical isolators in the trunk lines of the systems. A carrier-to-noise ratio (CNR) has been calculated as a function of the number and the insertion loss of the isolators. The calculated results indicate that there is an optimum number of isolators, and if the insertion loss is less than 0.3 dB, the CNR degradation can be restored by more than 60%. To test the calculated results, we conducted experiments for the specific case of employing one isolator, and obtained good agreements between the two.     

Grundlagen der Mehrstoffanalyse mit Elektronen- und ß-Strahlung,II. Experimentelle Untersuchungen zur effektiven Kernladungszahl für den Rückstreuprozeß

Messungen un Bleiverbindungen und wassersloffhaltigen stoffen mit β-Strahlung im Energiebereich von 0,2 bis 3 MeV zeigen, daβ die in Teil I abgeleitete Formel für die Ermittlung der Effektiven Kernladungszahl selbst bei Medien extremer Zusammensetzung anwendbar ist. Die in der Literatur häufig erwāhnten Abweichungen der errechneten Kernladungszahlen von den experimentell ermittelten Ergebnissen sind hauptsächlich auf unterschiedliche Probendichte und auf die Korngröβe der Proben zurückzuführen. In der vorliegenden Arbeit sind derartige Störungen durch entsprechende Auswahl der Meβbedingungen vermieden oder durch empirische korrekturen eliminiert worden.     

Untersuchungen zur Ermittlung der Tiefenverteilung der primären Ionisationen in dicken Zwei-Element-Targets bei Beschuß mit Elektronen aus dem Energiebereich unterhalb 30 keV. Teil 1

Es werden methodische Untersuchungen zur Entwicklung eines Monte-Carlo-Programmes zur Berechnung der Tiefen-verteilung der primären Ionisationen auf der Grundlage der Vielfachstreutheorie von Molière beschrieben. Anhand aus-gewählter Zwei-Element-Targets wird die Leistungsfähigkeit von drei Varianten eines entsprechenden Elektronentrans-portmodells untersucht. Unter Benutzung der entwickelten Elektronentransportmodelle werden für die Elektronenstrahl-mikroanalyse interessierende Größen, wie Rückstreukoeffizient, Rückstreufaktor und Absorptionskorrektion, berechnet.