The fabrication of layer‐by‐layer mode LaCoO3 film by pulsed laser deposition

The relationship between strain and growth conditions in LaCoO₃ thin film was obtained to control the magnetic‐electric characteristics. The LaCoO₃ thin films on the SrTiO₃ substrates have been achieved by the pulsed laser deposition method, and the reflection high‐energy electron diffraction method (RHEED) was applied to monitor the growth process in situ; the layer‐by‐layer growth mode was discovered. The X‐ray diffraction and atomic force microscopy were applied to the phase analysis, and the layer thickness and the layer‐by‐layer growth mode were uncovered. Compared with the 100‐nm LaCoO₃ thin films, the strain in the layer‐by‐layer ultra thin film was more controllable. The enhanced magnetic properties of the layer‐by‐layer mode ultra‐thin films could be tested in future work.     

Influence of thermal annealing on the microstructure,hardness and corrosion behavior of TiAlSiCuN nanocomposite films

Nanocomposite TiAlSiCuN films were deposited on high speed steels by filtered magnetic arc ion plating. Detailed properties of the films annealed at various temperatures are studied. After thermal annealing at different temperatures ranging from 400 to 800 °C, changes in the film micro‐structure, chemical and phase composition, surface morphology, hardness and polarization curve properties were systematically characterized by X‐ray diffraction, X‐ray photoelectron spectroscopy, scanning electron microscopy, nano‐indenter and electrochemical workstation, respectively. It was found that the TiAlSiCuN films could be fully oxidized at 800 °C, Al and Ti atoms all diffused outwards and formed dense protective Al₂O₃ and TiO₂ layer. Simultaneously, the TiAlN phase gradually disappeared. The films annealed at 400 °C obtained the highest hardness because of the certain grain growth and little generated oxides. Besides, the certain formation of dense protective Al₂O₃ layer made the TiAlSiCuN film annealed at 600 °C present the least corrosion current density and the corrosion voltage. Copyright © 2016 John Wiley & Sons, Ltd.     

Effects of CNT‐film Pretreatment on the Characteristics of NiCo2O4/CNT Core‐shell Hybrids as Electrode Material for Electrochemistry Capacitor

NiCo₂O₄/CNT nanocomposite films were fabricated by in‐situ growing ultrafine NiCo₂O₄ nanoparticles on acid‐modified carbon nanotube (CNT) films. The effects of CNT‐film pretreatment were investigated thoroughly by various characterization outfits including Fourier Transform Infrared spectroscopy (FT‐IR), X‐ray photoelectron spectroscopy (XPS), Raman spectroscopy, RTS‐9 four‐point probes resistivity measurement system, X‐ray powder diffraction (XRD), scanning electron microscopy (SEM) and CHI660D electrochemical workstation. These results suggested that carbon nanotubes were uniformly wrapped by NiCo₂O₄ nanoparticles forming a hierarchical core‐shell structure. And the crystallinity, conductivity of the CNTs and detail structure (both morphology and size) of the NiCo₂O₄ nanoparticles varied with prolonged acid treatment time which resulted in increased functional groups and defects on CNT films and further affected the electrochemical properties. The composite film composed of the CNT film pretreated by mixed acid for 12 h exhibited excellent electrochemical properties: 828 F/g at 1 A/g and 656 F/g at 20 A/g, and maintained over 99 % of its capacitance after 3000 cycles of charge/discharge at 5 A/g. Acid treatment for either too long or too short is detrimental to the electrochemical properties of the composite films. Such work should be of fundamental importance for tailoring electrochemical properties by elaborate design of acid treatment on CNTs.     

Characterization of PET films modified by tetraethylenepentamine (TTEPA)

Tetraethylenepentamine, a long‐chained multifunctional amine, was used to attach nitrogen (N) groups to the surface of a polyethylene terephthalate film. The N content of the modified films was determined by X‐ray photoelectron spectroscopic analysis as well as titration measurements. The physical properties of the modified films were studied using weight‐loss measurements, X‐ray diffraction, and environmental scanning electron microscopy. Contact‐angle measurements were used to establish the changes in wettability of the modified films. The applicability of the surface‐tension‐component theory and the equation‐of‐state approach to this system is briefly discussed. © 2001 John Wiley & Sons, Inc. J Polym Sci B: Polym Phys 39: 623–633, 2001     

Effects of gold‐induced crystallization process on the structural and electrical properties of germanium thin films

Gold‐induced (Au‐) crystallization of amorphous germanium (α‐Ge) thin films was investigated by depositing Ge on aluminum‐doped zinc oxide and glass substrates through electron beam evaporation at room temperature. The influence of the postannealing temperatures on the structural properties of the Ge thin films was investigated by employing Raman spectra, X‐ray diffraction, and scanning electron microscopy. The Raman and X‐ray diffraction results indicated that the Au‐induced crystallization of the Ge films yielded crystallization at temperature as low as 300°C for 1 hour. The amount of crystallization fraction and the film quality were improved with increasing the postannealing temperatures. The scanning electron microscopy images show that Au clusters are found on the front surface of the Ge films after the films were annealed at 500°C for 1 hour. This suggests that Au atoms move toward the surface of Ge film during annealing. The effects of annealing temperatures on the electrical conductivity of Ge films were investigated through current‐voltage measurements. The room temperature conductivity was estimated as 0.54 and 0.73 Scm⁻¹ for annealed samples grown on aluminum‐doped zinc oxide and glass substrates, respectively. These findings could be very useful to realize inexpensive Ge‐based electronic and photovoltaic applications.     

Analysis of thermal parameters and factors acting on thermal conduction of low‐k films

The thermal properties of a silicon oxide‐based low‐k film and a thermally oxidized silicon film were investigated using the 3‐omega and laser thermo‐reflectance (LTR) methods. Thermal conductivity and effusivity were successfully estimated by the 3‐omega and LTR methods, respectively. It was confirmed that the combination of thermal effusivity and conductivity can successfully provide the heat capacity and thermal diffusivity of the films. The thermal parameters thus obtained suggested that the lower thermal conductivity of the examined low‐k film comes mainly from the rather low level of thermal diffusivity. Based on an analysis of the X‐ray diffraction profiles of the films, it was found that the low thermal diffusivity of the low‐k film can be attributed to the discontinuity of the network structure of their clusters. The heat resistance at the interface between the film and Si substrate was also evaluated. We found that the low‐k film exhibited, interestingly, negative interfacial heat resistance, although interfacial heat resistance should have a positive value in general. In order to determine the origin of the negative interfacial heat resistance, the interface state of the films was analyzed in detail on the basis of X‐ray reflectivity (XRR) measurements. The XRR results showed clearly that a thin, high‐density layer was present at the interface of the low‐k films. This high‐density layer presumably promoted heat flow to the substrate, resulting in the apparent negative interfacial heat resistance. Copyright © 2008 John Wiley & Sons, Ltd.     

50 keV H+ ion beam irradiation of Al doped ZnO thin films: Studies of radiation stability for device applications

Thin films of Al doped ZnO (Al:ZnO) were deposited on two substrates (Si and glass) at room temperature and 300°C using DC magnetron sputtering. These films were bombarded with 50 keV H⁺ beam at several fluences. The pristine and ion beam irradiated films were analysed by X‐ray diffraction, Raman spectroscopy, scanning electron microscopy, and UV‐Vis spectroscopy. The X‐ray diffraction analysis, Hall measurements, Raman and UV‐Vis spectroscopy confirm that the structural and transport properties of Al:ZnO films do not change substantially with beam irradiation at chosen fluences. However, in comparison to film deposited at room temperature, the Al:ZnO thin film deposited at 300°C shows increased transmittance (from 70% to approximately 90%) with ion beam irradiation at highest fluence. The studies of surface morphology by scanning electron microscopy reveal that the ion irradiation yields smoothening of the films, which also increases with ion fluences. The films deposited at elevated temperature are smoother than those deposited at room temperature. In the paper, we discuss the interaction of 50 keV H⁺ ions with Al:ZnO films in terms of radiation stability in devices.     

Effect of Film Thickness on the Columnar Packing Structures of Discotic Supramolecules in Thin Films

The effects of film thickness on the columnar packing structure of discotic supramolecules in a thin supported film have been investigated by grazing‐incidence small‐angle X‐ray scattering technique using magnetically aligned cobalt octa(n‐decylthio)porphyrazine (CoS10) films on octadecyltrichlorosilane (OTS)‐functionalized substrates as model systems. Magnetically aligned CoS10 films with a range of film thicknesses (49–845 nm) form uniaxially oriented ‘edge‐on’ columnar superstructures with their columnar directors perpendicular to the applied magnetic field. However, the orientational ordering of the columnar packing in the plane perpendicular to the applied magnetic field is strongly dependent on the film thickness. While being damped by the elasticity of the side chains of CoS10, the strong interfacial interaction at the film‐substrate interface propagates up to 50–100 nm from the substrate, maintaining the orientation of columnar packing in the plane perpendicular to the applied magnetic field. When the distance from the film‐substrate interface becomes larger than about 100 nm, symmetric tilting of columnar layer orientation, which saturates at 11.5°, occurs due to longitudinal edge dislocations induced by accumulated elastic deformation.     

Thickness dependence of the structural,mechanical and electrical properties of Ni films deposited on polyimide by ion beam‐assisted deposition (IBAD)

Ni thin films with different thicknesses were deposited on pre‐treated polyimide substrates by ion beam‐assisted deposition. Dependence of structural, mechanical and electrical properties of the Ni films on their thickness was investigated. The results showed a clear correlation between film properties and film thickness. The inter‐diffusion at the interface regions of the films with different deposition time were demonstrated by transmission electron microscopy and X‐ray photoelectron spectroscopy. With increasing film thickness, surface roughness of the Ni films firstly decreased and then increased, while the grain size gradually increased. Residual stress of the Ni thin films decreased with increasing Ni film thickness up to 202 nm and then slightly increased as the film thickness further increased. Resistivity decreased, and temperature coefficient of resistivity (TCR) increased with increasing film thickness due to the enhancement of crystallization degree and the increase in grain size. The decrease in surface roughness and residual stress also contributed to the decrease of resistivity and the increase of TCR of the films. An optimal film thickness is suggested, which yielded a relatively high TCR value and low levels of both surface roughness and residual stress. Copyright © 2012 John Wiley & Sons, Ltd.     

Characterization of a Robust CoII Fluorescent Complex Deposited Intact On HOPG

The new diimine fluorescent ligand ACRI‐1 based on a central acridine yellow core is reported along with its coordination complex [Co₂( ACRI‐1 )₂] ( 1 ), a fluorescent weak ferromagnet. Due to the strong fluorescence of the acridine yellow fluorophore, it is not completely quenched when the ligand is coordinated to Co^II. The magnetic properties of bulk complex 1 and its stability in solution have been studied. Complex 1 has been deposited on highly ordered pyrolitic graphite (HOGP) from solution. The thin films prepared have been characterized by AFM, time‐of‐flight secondary ion mass spectrometry (TOF‐SIMS), grazing incidence X‐ray diffraction (GIXRD), X‐ray absorption spectroscopy (XAS), X‐ray magnetic circular dichroism (XMCD) and theoretical calculations. The data show that the complex is robust and remains intact on the surface of graphite.     

Integrated mechanism for the morphological structure development in HDPE melt‐blown and machine‐direction‐oriented films

The morphologies of a series of blown films and machine‐direction‐oriented (MDO) films, all produced from high density polyethylene, were characterized. In the blown film process, the crystalline morphology develops while the melt is under extensional stress. In the MDO process, drawing takes place in the solid state and deforms the crystalline morphology of the starting film. The films were characterized by wide‐angle X‐ray scattering (WAXS), small‐angle X‐ray scattering (SAXS) and atomic force microscopy to determine the lamellar morphology. The effect of the type of deformation on the lamellar morphology was studied and relationships were developed between the lamellar and polymer chain morphology using SAXS and WAXS. Blown and MDO films were found to have very different morphologies. However, an integrated mechanism was developed linking the sequential events in the deformation and morphology development in blown and MDO films. © 2007 Wiley Periodicals, Inc. J Polym Sci Part B: Polym Phys 45: 1834–1844, 2007     

Reversible Wettability of Tungsten Trioxide Films with Novel Dandelion‐like Structures

Tungsten trioxide (WO₃) films with novel dandelion‐like structures were prepared by spin‐coating a sol of WO₃ with CTAB (cetyltrimethyl ammonium bromides) on quartz substrates. The resultant WO₃ films were characterized by X‐ray diffraction (XRD), FT‐IR spectroscopy, scanning electron microscopy (SEM), and X‐ray photoelectron spectroscopy (XPS). The wettabilities of the WO₃ films were evaluated by contact angle (CA) measurements. It was found that the WO₃ film exhibited superhydrophilicity under UV light irradiation, whereas after storage in the dark for a certain time, it turned to be superhydrophobic.     

Formation and tribological properties of two‐component ultrathin ionic liquid films on Si

Several single‐component and two‐component imidazolium ionic liquids (ILs) ultrathin films were formed on Si substrates by a dip‐coating and heat treatment process. The formation and surface properties of the films were analyzed by means of ellipsometric thickness measurement, X‐ray photoelectron spectra and atomic force microscope. The adhesive and nanotribological behaviors of the films were evaluated by a homemade colloidal probe. A ball‐on‐plate tribometer was used to test the microtribological performances of these films. As a result, the two‐component ILs ultrathin film containing 80% solid‐like ILs phase shows more homogenous surface morphologies and optimal micro/nano‐tribological properties as compared to single‐component ILs films, which is ascribed to a synergic effect between the steady solid‐like ILs phase as the backbone and the proper amount of flowable liquid‐like ILs phase. By studying the influence of various solid/liquid ILs ratios on tribological properties of the two‐component ILs films, we might find the way to design ILs films with excellent comprehensive tribological properties. Copyright © 2010 John Wiley & Sons, Ltd.     

The influence of initial surface conditions on field crystallization of anodic aluminum oxide films determined by synchrotron X‐ray diffraction

X‐ray diffraction measurements were performed using synchrotron radiation at the SPring‐8 facility and electrochemical techniques to investigate the effect of polishing methods and storage conditions on the crystal structure of air‐formed oxide films and anodic oxide films formed on highly pure aluminum. Storage in an N₂ environment hinders local film breakdown during anodizing, and it was established that the X‐ray diffraction measurements showed the presence of a γ‐Al₂O₃ in the anodic oxide film formed on mechanically polished (MP) specimens. Formation of γ‐Al₂O₃ during anodizing was inhibited by electropolishing because of the removal of the work‐hardened layer that was formed on the MP by electro‐polishing. The X‐ray diffraction results do not show clear differences in the influence of the polishing method on the crystal structure of air formed oxide film. This is due to the very fast oxidation rate of the air‐formed oxide film and very long storage times for the X‐ray measurements. The anodic oxide film formed on aluminum, which has a very flat surface, shows color and the color depended on grain orientation. The electrochemical impedance of the MP specimen is slightly lower than that of the mechanically and then electrochemically polished specimen at the middle frequency range. This impedance difference may be due to formation of γ‐Al₂O₃ in the amorphous anodic oxide film and the thickness of the film. Copyright © 2010 John Wiley & Sons, Ltd.     

Enhanced Thermoelectric Properties of Polyaniline Nanofilms Induced by Self‐Assembled Supramolecules

Polyaniline (PANI) is one of the most promising candidates for flexible organic thermoelectric (TE) applications owing to its relatively low cost and high stability. Herein, the self‐assembled supramolecule (SAS) (3,6‐dioctyldecyloxy‐1,4‐benzenedicarboxylic acid) was used as an additive and was introduced into PANI films as a template. Raman spectroscopy, X‐ray diffraction, and conductive atomic force microscopy analyses demonstrated that the highly ordered chain structure of PANI was achieved by chemical interactions between PANI and the SAS. Moreover, the ordered regions in the PANI‐SAS film increased with a decrease in the film thickness. Consequently, the TE properties of PANI‐SAS films were not only much higher than those of PANI films, but they also increased with a decrease in film thickness. The maximum TE power factor of the PANI‐SAS film reached 31 μW m^?1 K^?2, which is approximately six times higher than the power factor of a PANI film with a similar thickness. This work offers a promising way to prepare PANI thin films with enhanced TE properties.     

Nanostructured black cobalt coatings for solar absorbers

Nanocrystalline black cobalt electrically deposited onto a steel substrate from aqueous solution was investigated. The influence of electrolyte composition and operating parameters on the appearance and optical properties of the coat was studied. The deposition conditions that ensure the highest solar absorptance were optimized. The chemical composition of fabricated thin films before and after annealing at 400 °C was determined by energy dispersive X‐ray analysis (EDS) and XPS technique. The crystal structure analysis showed that the bulk composition of the films was mainly cobalt oxide. The surface analysis reveals that the topmost surface layers of the films are made of different cobalt compounds confirming the multivalence state of Co on the surface with an oxidation state of ≥ + 2. Scanning electron microscope (SEM) observation indicated that the surface morphology was changed from dendritic structure to lamellar at higher current density. The black cobalt film showed soft magnetic characteristicsand excellent optical properties to transform solar energy into thermal energy. Copyright © 2008 John Wiley & Sons, Ltd.     

Metallic Li in carbonaceous nanotubes grown by metalorganic chemical vapor deposition from a metalorganic precursor

Metallic Li in carbonaceous nanostructures was obtained in high concentration (as much as 33.4%) through metalorganic chemical vapor deposition involving certain lithium–aminoalkyl moieties, which are formed in situ , by decomposition of a precursor containing both cobalt and lithium. The bimetallic complex containing both lithium and cobalt was characterized by IR spectroscopy, mass spectroscopy, nuclear magnetic resonance spectroscopy, elemental analysis and thermogravimetric analysis. X‐ray photoelectron spectroscopy measurements performed on the as‐grown films demonstrate that lithium can be stable in metallic form in such a film. Results of X‐ray photoelectron spectroscopic analysis of the as‐grown films are presented as direct evidence of the formation and stabilization of metallic lithium in carbon nanotubes. Carbon nanotubes, encapsulating metallic lithium, can potentially act as a miniaturized nanobattery. Such a battery would be potentially useful in the next generation of communication and remote sensing devices, where a pulse of current is required for their operation. In addition, with metallic lithium, having an effective nuclear magnetic moment, such materials can be envisioned to show potential applications in devices based on nuclear magnetic resonances. Copyright © 2008 John Wiley & Sons, Ltd.     

100 keV H+ ion irradiation of as‐deposited Al‐doped ZnO thin films: An interest in tailoring surface morphology for sensor applications

We report the influence of 100 keV H⁺ ion beam irradiation on the surface morphology, crystalline structure, and transport properties of as‐deposited Al‐doped ZnO (Al:ZnO) thin films. The films were deposited on silicon (Si) substrate by using DC sputtering technique. The ion irradiation was carried out at various fluences ranging from 1.0 × 10¹² to 3.0 × 10¹⁴ ions/cm². The virgin and ion‐irradiated films were characterized by X‐ray diffraction, Raman spectroscopy, atomic force microscopy, and Hall probe measurements. Using X‐ray diffraction spectra, 5 points Williamson‐Hall plots were drawn to deduce the crystallite site and strain in Al:ZnO films. The analysis of the measurements shows that the films are almost radiation resistant in the structural deformation under chosen irradiation conditions. With beam irradiation, the transport properties of the films are also preserved (do not vary orders of magnitude). However, the surface roughness and the crystallite size, which are crucial parameters of the ZnO film as a gas sensor, are at variation with the ion fluence. As ion fluence increases, the root‐mean‐square surface roughness oscillates and the surface undergoes for smoothening with irradiation at chosen highest fluence. The crystallite size decreases initially, increases for intermediate fluences, and drops almost to the value of the pristine film at highest fluence. In the paper, these interesting experimental results are discussed in correlations with ion‐matter interactions especially energy losses by the ion beam in the material.     

Ultrathin Carbon Film Electrodes from Vacuum‐Carbonised Cellulose Nanofibril Composite

A novel way to produce ultrathin transparent carbon layers on tin‐doped indium oxide (ITO) substrates is developed. The ITO surface is coated with cellulose nanofibrils (from sisal) via layer‐by‐layer electrostatic binding with poly(diallyldimethylammonium chloride) or PDDAC acting as the binder. The cellulose nanofibril‐PDDAC composite film is then vacuum‐carbonised at 500 °C. The resulting carbon films are characterised by atomic force microscopy (AFM), small angle X‐ray scattering (SAXS), wide‐angle X‐ray scattering (WAXS), and Raman methods. Smooth carbon films with good adhesion to the ITO substrate are formed. The electrochemical characterisation of the carbon films is based on the oxidation of hydroquinone and the reduction of benzoquinone in aqueous phosphate buffer media. A modest effect of the cellulose nanofibril‐PDDAC film on the rate of electron transfer is observed. The effect of the film on the rate of electron transfer after carbonisation is more dramatic. For a 40‐layer cellulose nanofibril‐PDDAC film after carbonisation a two‐order of magnitude change in the rate of electron transfer occurs presumably due to a better interaction of the hydroquinone/benzoquinone system with the electrode surface.     

Poly(caprolactone triol) as plasticizer agent for cellulose acetate films: influence of the preparation procedure and plasticizer content on the physico‐chemical properties

The influence of the plasticizer content and film preparation procedure on the morphology, density, thermal and mechanical properties of cellulose acetate (CA) films plasticized with poly‐(caprolactone triol) (PCL‐T), were studied. Differential scanning calorimetry (DSC), thermal mechanical analysis (TMA), scanning electron microscopy (SEM), wide‐angle X‐ray diffraction (WAXD) and infrared spectroscopy (FT‐IR) techniques were used. The films were prepared by dry‐casting CA and CA/PCL‐T in acetone or acetone/water solutions, which produced transparent and opaque films, respectively. In contrast to the transparent films, which were dense, the opaque films presented a porous morphology. However, the presence of PCL‐T reduced the opaque film porosity, increasing, in consequence, its bulk density. The TMA results revealed that PCL‐T reduced the glass transition temperature more significantly in the transparent than in opaque films. Only the transparent CA/PCL‐T films presented a melting temperature, that reduced with higher concentrations of PCL‐T, suggesting a higher ordering (crystallinity) when the films were prepared in the absence of water, as observed from WAXD curves. The mechanical properties also showed that the transparent films were more soft and tough than the opaque films. In summary, PCL‐T was a good plasticizer agent for CA films due to the presence of hydrogen bonds between the components (FT‐IR spectra). The presence of water in the dry casting process has a significant effect mainly on film morphology and mechanical properties. Copyright © 2004 John Wiley & Sons, Ltd.