光学仪器 眼镜、放大镜、显微镜、望远镜

TH742．9 2006065459液相型AFM的研制与金属腐蚀原位研究=AFM in liquid and on-spot study of metal corrosion[刊,中]/林晓峰(浙江大学现代光学仪器国家重点实验室．浙江,杭州(310027)),章海军…//光电子·激光．—2006,17(5)．—638-640介绍了新型液相型原子力显微镜(AFM)的工作原理、系统结构和独特性能,讨论了该AFM在金属腐蚀研究中的应用。利用液相型AFM对碳钢在NaCl溶液及Pb在     

用于Raman光谱与微纳米结构同步检测的Raman-AFM系统研究

研究和发展了一种将微区拉曼(Raman)光谱检测与原子力显微镜(AFM)微纳米扫描成像相结合的新型Raman-AFM技术。设计了Raman光谱与AFM扫描成像的原位检测探头;研制出相应的Raman-AFM系统;利用该系统,对ZnO纳米颗粒和TiO2纳米薄膜开展了微区Raman光谱与微纳米结构的检测实验。研究表明,所获得的Raman光谱检测结果与理论值良好吻合,同时,AFM扫描检测得到的图像很好地表征了样品的微纳米结构,从而实现了微区Raman光谱与AFM图像的原位及同步检测,验证了这一技术的可行性,为Raman光谱技术与微纳米技术领域的实际应用提供了技术基础。     

基于压电陶瓷迟滞特性模型的原子力显微镜仿真平台研究

将基于双二次拉格朗日插值方法的压电陶瓷迟滞非线性Preisach模型,加到原子力显微镜(AFM)仿真平台中,实现在任意加压情况下由于迟滞效应所产生的图像畸变的仿真,更准确地反映原子力显微镜的扫描结果,使得学生在仿真实验中能更好地掌握AFM实验的真实情况.为了校正样品图像的畸变,提出搜索求逆算法,并利用此算法对Preisach模型进行精确求逆,通过改变输入电压抵消了压电陶瓷迟滞效应带来的非线性特性.仿真结果表明,该方法有效地校正了样品图像的畸变.     

新型原子力显微镜的研制及其应用

研制了一种新型卧式原子力显微镜(AFM)系统.本文介绍卧式AFM的工作原理及其简要结构,讨论反馈控制电路系统的优化设计,阐述Windows/Dos兼容的图象扫描、处理和显示软件.基于原子力曲线的测定,利用AFM对纳米金刚石薄膜和多孔氧化铝进行了扫描检测.实验表明,该AFM系统具有十分良好的图象重复性、稳定性和衬比(度),仪器的横向分辨率优于3nm,纵向分辨率可达1nm,最大扫描范围达到5μm×5μm.这些性能为卧式AFM在更广泛的纳米技术领域的应用奠定了基础.     

原子力显微镜的压电陶瓷非线性及图象畸变的校正

研制了卧式原子力显微镜(AFM)系统,讨论压电陶瓷的非线性及AFM图象畸变的软件校正方法.提出利用光束偏转法精确测定XY扫描器压电陶瓷的伸长量与控制电压之间的相互关系,得到压电陶瓷的非线性曲线;根据非线性的偏离程度,通过扫描软件对X和Y方向的扫描电压作逐点补偿,据此有效地校正图象畸变.并给出分别用未校正软件与校正软件扫描获得的部分样品的AFM图象.     

扫描探针显微学中的云纹方法

在扫描探针显微镜（SPM）的扫描过程中，由SPM的扫描线与物质表面周期性晶格结构进行干 涉可以形成纳米云纹图像.采用高取向热解石墨（HOPG）和云母作为试件，分别对扫描隧道 显微镜（STM）和原子力显微镜（AFM）云纹进行了研究，实验结果与理论分析完全一致.SPM 纳米云纹法在纳米测量和表征方面具有较大的应用前景. 关键词： 云纹 SPM 晶格栅线 纳米测量     

基于局部梯度特征的红外微扫描成像技术研究

从空间邻近度和像素相似性角度出发,提出了微扫描和基于梯度特征加权插值技术相结合的方法.该方法利用320×240凝视型红外焦平面探测器,在DSP+FPGA硬件平台上得以实现.实验证明：与经典微扫描技术相比,它既能提高图像空间分辨率,抑制噪音,又能较好地增强红外图像的边缘.     

基于扫描电子显微镜的碳纳米管拾取操作方法研究

碳纳米管场效应管是未来纳米器件的发展方向,而制造纳米器件的前提是拾取碳纳米管,基于扫描电子显微镜(SEM)的微纳机器人操作系统能够实现碳纳米管拾取操作.本文建立拾取操作中碳纳米管与原子力显微镜(AFM)探针间范德瓦耳斯力力学模型,不同接触状态下范德瓦耳斯力越大越有利于拾取碳纳米管.在SEM视觉反馈图像中建立相对坐标系,首先提出倾角变值方法检测碳纳米管与AFM探针的接触状态,然后运用动态差值方法识别碳纳米管与AFM探针空间位姿并校正碳纳米管位姿,最后自下而上拾取碳纳米管.实验结果表明:拟合直线倾角变值较大时碳纳米管与AFM探针发生接触,动态差值变化为零时碳纳米管与AFM探针为空间线接触,在完全线接触模型下选择合适的接触角度、接触长度和拾取速度能够成功拾取碳纳米管.     

铜箔上生长的六角氮化硼薄膜的扫描隧道显微镜研究

利用扫描隧道显微镜研究了采用化学气相沉积法在铜箔表面生长出的高质量的六角氮化硼薄膜. 大范围的扫描隧道显微镜图像显示出该薄膜具有原子级平整的表面, 而扫描隧道谱则显示, 扫描隧道显微镜图像反映出的是该薄膜样品的隧穿势垒空间分布. 极低偏压的扫描隧道显微镜图像呈现了氮化硼薄膜表面的六角蜂窝周期性原子排列, 而高偏压的扫描隧道显微镜图像则呈现出无序和有序排列区域共存的电子调制图案. 该调制图案并非源于氮化硼薄膜和铜箔衬底的面内晶格失配, 而极有可能来源于两者界面处的氢、硼和/或氮原子在铜箔表面的吸附所导致的隧穿势垒的局域空间分布.     

基于光学扫描全息密码术的多图像并行加密

对光学扫描全息术中的双光瞳做出改进,提出对多图像并行加密和任意层图像再现的新方法.将其中一个光瞳设置成环形光瞳,另一个光瞳处插入随机相位板,干涉形成环形随机相位板,实现对多层图像的快速扫描和并行加密,扫描信号通过计算机合成为加密全息图,在数字全息再现的过程中进行解密,实现对任意层图像的精准重建.该方法快捷高效、安全可靠,抗噪声能力强.利用相关系数评估了该方法的加密效果,并通过仿真实验验证了该方法的有效性和安全性.     

Hard disk magnetic domain nano-spatial resolution imaging by using a near-field scanning microwave microscope with an AFM probe tip

A near-field scanning microwave microscope (NSMM) incorporating an atomic force microscope (AFM) probe tip was used for the direct imaging of magnetic domains of a hard disk under an external magnetic field. We directly imaged the magnetic domain changes by measuring the change of reflection coefficient S₁₁ of the NSMM at an operating frequency near 4.4 GHz. Comparison was made to the magnetic force microscope (MFM) image. Using the AFM probe tip coupled to the tuning fork distance control system enabled nano-spatial resolution. The NSMM incorporating an AFM tip offers a reliable means for quantitative measurement of magnetic domains with nano-scale resolution and high sensitivity.     

Scanning near-field optical/atomic force microscopy for fluorescence imaging and spectroscopy of biomaterials in air and liquid: Observation of recombinantEscherichia coli with gene coding to green fluorescent protein

We have developed a system of scanning near-field optical/atomic force microscopy (SNOM/AFM) for fluorescence imaging and spectroscopy of biomaterials in air and liquid. SNOM/AFM uses a bent optical fiber simultaneously as a dynamic force AFM cantilever and a SNOM probe. Optical resolution of SNOM images shows about 50 nm in an illumination mode for a standard sample of a patterned chromium layer of 20 nm thickness on a quartz glass plate. The SNOM/AFM system contains a photon counting system and polychrometer/ICCD (intensified charge coupled device) system for observation of the fluorescence image and spectrograph of micro areas, respectively. The gene coding to green fluorescence protein (GFP) was cloned in recombinantEscherichia coli (E. coli). Topography, fluorescence image and spectrograph of recombinantE. coli by SNOM/AFM showed a difference in fluorescence in individualE. coli. Fluorescence activity of GFP can thus be used as a convenient indicator of transformation. SNOM/AFM is also applicable to observe immobilizedE. coli on a glass plate in water with a liquid chamber and may allow the viewing of observation of floating organisms.     

Quantitative atomic force microscopy with carbon monoxide terminated tips

Noncontact atomic force microscopy (AFM) has recently progressed tremendously in achieving atomic resolution imaging through the use of small oscillation amplitudes and well-defined modification of the tip apex. In particular, it has been shown that picking up simple inorganic molecules (such as CO) by the AFM tip leads to a well-defined tip apex and to enhanced image resolution. Here, we use the same approach to study the three-dimensional intermolecular interaction potential between two molecules and focus on the implications of using molecule-modified AFM tips for microscopy and force spectroscopy experiments. The flexibility of the CO at the tip apex complicates the measurement of the intermolecular interaction energy between two CO molecules. Our work establishes the physical limits of measuring intermolecular interactions with scanning probes.     

Observations of fission-tracks in zircons by atomic force microscope

The fission-track (FT) method is a dating technique based on the observation of damage (tracks) by spontaneous fission of ²³⁸U left in a mineral. The date is calculated from the track density and the uranium concentration in the mineral. This is possible because the number of tracks is a function of uranium concentration and time since the start of track accumulation. Usually, the number of tracks is counted under an optical microscope after etching (chemical expansion of a track). However, as FT density per unit area rises, it becomes difficult to count the number of tracks. This is due to the fact that FTs overlap one another and are unable to be readily distinguished. This research examines the potential of atomic force microscope (AFM) for FT dating using zircons, which are likely to show higher FT density than other minerals due to their high U concentrations.To obtain an AFM image for a sample prepared for FT dating, removing the static electricity of the sample is essential to avoid an unexpected movement of the cantilever. A grain should be wider than about 30 μm to bring the cantilever on the mineral surface. Polishing with a fine grained compound is very important. There is not much difference in sharpness between images by AC mode (scanning with vibrating cantilever at a constant cycle) and Contact mode (scanning with the cantilever always in close contact with the surface). To confirm how tracks can be identified with the AFM, an AFM image was compared with an image obtained with the optical microscope. When change in the number of tracks and their shapes were observed through stepwise etching, the track expanded as the etching time increased. In addition, the etching rate was slower for large tracks than those for small tracks. This implied that the AFM can be used to observe etching of zircons with different degrees of nuclear fission damage. A track that could not be seen with the optical microscope due to insufficient etching could be observed by AFM methods, indicating the possibility of FT dating with high track densities using AFM after relatively short etching periods.     

新型AFM探针的制备及应用

采用熔拉 -腐蚀复合方法 ,将普通单模石英光纤制成直锥形光纤探针。利用自制工具将探针打弯 ,制成悬臂式光纤探针 ,在AFM上取得了较理想的测试结果。将自制光纤探针和商用硅材料探针获得的两种扫描图像进行了对比 ,分析了悬臂式光纤探针的特点     

Scanning transmitted and reflected light microscopy: a novel microscopy for visualizing biomaterials at interfaces

Two new types of light microscopy, scanning transmitted light and scanning reflected light microscopy (STLM and SRLM, respectively) were developed. STLM and SRLM are based on optical density recognition (ODR) of the scanned transmitted or reflected light, respectively, from the object to be visualized. The obtained image is a result of enhanced interference between the scanning and transmitted/reflected beams from the object. The new microscopy, in its initial phase, is ideally suited for monitoring macroscopic and sub-millimeter size self-assembly and for elucidating the connection between the macroscopic and nanoscopic worlds if combined with atomic force microscopy (AFM) or electron microscopy (EM). The method is demonstrated by monitoring the growth of 3D crystals from their original liquid phase. Some preliminary measurements carried out using the prototype of the new microscopy are presented and its current and future possible applications are described.     

High spatial resolution surface imaging and analysis of fungal cells using SEM and AFM

We review the use of scanning electron microscopy (SEM), atomic force microscopy (AFM) and force spectroscopy (FS) for probing the ultrastructure, chemistry, physical characteristics and motion of fungal cells. When first developed, SEM was used to image fixed/dehydrated/gold coated specimens, but here we describe more recent SEM developments as they apply to fungal cells. CryoSEM offers high resolution for frozen fungal samples, whereas environmental SEM allows the analysis of robust samples (e.g. spores) under ambient conditions. Dual beam SEM, the most recently developed, adds manipulation capabilities along with element detection. AFM has similar lateral and better depth resolution compared to SEM, and can image live cells including growing fungal hyphae. FS can analyze cell wall chemistry, elasticity and dynamic cell characteristics. The integration of AFM with optical microscopy will allow examination of individual molecules or cellular structures in the context of fungal cell architecture. SEM and AFM are complementary techniques that are clarifying our understanding of fungal biology.