纳米铜薄膜塑性变形中空位型缺陷形核与演化的分子动力学研究

本文采用分子动力学方法模拟了纳米单晶铜薄膜在单向拉伸载荷作用下的塑性变形过程, 重点分析了空位型缺陷的形核过程和演化机理. 在模拟过程中, 采用镶嵌原子势描述原子间的相互作用. 模拟结果表明纳米铜薄膜中塑性变形起源于位错的表面形核, 而空位型缺陷的形核及演化都与晶体内部的位错运动密切相关. 空位型缺陷通常从位错割阶及层错交截处开始形核, 以单空位、层错四面体和不规则空位团等形式存在. 关键词： 纳米薄膜 塑性变形 空位 层错四面体     

单晶铜纳米线屈服机理的原子模拟研究

采用分子静力学方法模拟了〈100〉单晶铜纳米线的拉伸变形过程,研究了纳米线屈服的机理. 结果表明：1） 纳米线初始屈服通过部分位错随机激活的{111}〈112〉孪生实现,后继屈服通过{111}〈112〉部分位错滑移实现;2） 纳米线变形初期不同滑移面上的部分位错在两面交线处相遇形成压杆位错,变形后期部分位错在刚性边界处塞积,两者都阻碍位错滑移,引起一定的强化作用. 关键词： 纳米线 屈服 位错 分子静力学     

单晶Cu(001)薄膜塑性变形的分子动力学模拟

使用分子动力学方法,模拟研究了单晶Cu(001)薄膜在双向等轴拉伸应变下的塑性变形行为.当应变超过一定值时,样品通过产生位错、层错及孪晶而发生塑性变形.当应变相对较低时,不全位错首先在薄膜表面形核并在密排面上滑移,留下堆积层错;当应变增加时,位错在表面与内部同时成核生长,层错数量也随之增加.分析了相邻滑移面上的位错之间相互作用形成孪晶的微观过程.材料内部形成大量堆积层错及孪晶后,较大孪晶的密排面上的原子也会发生滑移,形成孪晶内部的层错结构以释放残余应力.     

纳米单晶铜中孔洞拉伸变形的分子动力学模拟

用分子动力学方法模拟了拉伸状态下纳米单晶铜中孔洞的力学行为.通过与无孔纳米单晶铜块体弹性性能的比较,可知小孔使纳米单晶铜的弹性模量显著下降.弹性阶段,有孔单晶铜中无位错产生;超过其弹性极限后,位错线从四周向有孔单晶铜内部发射,位错滑移为其主要变形机制.     

孔洞和空位对单晶铝力学性能影响的分子动力学研究

采用分子动力学方法模拟含孔洞的单晶铝单轴拉伸过程,研究晶向、孔洞体积分数、空位体积分数等对孔洞生长的影响.结果表明：对于不同的晶向,决定孔洞生长变形的微观机制不同.[010]晶向单轴拉伸情况下,形变机制主要是｛111｝面位错引起的堆垛层错;[111]晶向单轴拉伸情况下,形变机制主要是位错的移动、堆积与发射.此外,孔洞及空位的体积分数对[010]、[111]晶向的孔洞生长过程也有着明显的影响.总的来说,随着孔洞或者空位体积分数的增加,材料的杨氏模量变小,屈服强度、屈服应变下降.     

〈111〉晶向冲击加载下单晶铜中纳米孔洞增长的早期动力学行为

利用分子动力学方法模拟计算了单晶铜中纳米孔洞在沿〈111〉晶向冲击加载下增长的早期过程.测量发现不同加载强度下等效孔洞半径随时间近似成线性变化.观测到单孔洞增长的两种位错生长机理：加载强度较低时，只在沿着冲击加载方向的孔洞顶点附近区域有位错的成核和运动；而随着加载强度超过一定阈值，在沿冲击加载和其垂直方向的孔洞顶点区域都观察到位错的成核和运动.在前一种机理作用下，孔洞只沿加载方向增长；在后一种机理作用下，孔洞同时沿加载和垂直于加载方向增长.分析孔洞表面原子的位移历史，发现沿加载及与其垂直方向的孔洞顶点沿径向的速度基本恒定，由此提出了一个孔洞生长模型，可以解释孔洞增长的线性生长规律. 关键词： 纳米孔洞 分子动力学 冲击加载 位错     

体心立方Ta的广义面错能及在Ⅱ型裂纹尖端初始塑性研究中的应用

基于嵌入原子势考察体心立方(bcc)金属Ta的广义层错能和广义孪晶能并获得广义层错能和广义孪晶能曲线. 研究表明,bcc Ta的广义层错能曲线与面心立方金属的广义层错能曲线有明显差异,Ta的广义层错能曲线不存在明显的能量极小值,位错主要以全位错的形式发射. 不同原子厚度的广义孪晶能曲线表明4个原子层的孪晶能曲线开始出现亚稳定的能量极小值,5个原子层的孪晶能曲线出现稳定的能量极小值. 为进一步验证广义层错能和广义孪晶能曲线揭示的塑性变形机理,采用准连续介质力学多尺度方法研究Ⅱ型裂纹尖端的初始塑性变形过程. 关键词： 广义层错能 广义孪晶能 体心立方金属钽 Ⅱ型裂纹     

面心立方晶体外延膜沉积生长中失配位错的结构与形成过程

用分子动力学方法对5%负失配条件下面心立方晶体铝薄膜的原子沉积外延生长进行了三维模拟.铝原子间的相互作用采用嵌入原子法(EAM)多体势计算.模拟结果再现了失配位错的形成现象.分析表明，失配位错在形成之初即呈现为Shockley扩展位错，即由两个伯格斯矢量为〈211〉/6的部分位错和其间的堆垛层错组成，两个部分位错的间距、即层错宽度为1.8 nm,与理论计算结果一致；外延晶体薄膜沉积生长中，位错对会发生滑移，但其间距保持稳定.进一步观察发现，该扩展位错产生于一种类似于“局部熔融-重结晶”的表层局部无序紊乱- 关键词： 失配位错 外延生长 薄膜 分子动力学 铝     

堆垛层错和温度对纳米多晶镁变形机理的影响

本文采用分子动力学模拟方法研究了在拉伸载荷下,堆垛层错和温度对纳米多晶镁力学性能的影响,在模拟中,采用嵌入原子势描述镁原子之间的相互作用．计算结果表明：在纳米晶粒中引入堆垛层错能明显增强纳米多晶镁的屈服应力,但堆垛层错对纳米多晶镁杨氏模量的影响很小;温度为300．0K时,孪晶在晶粒交界附近形成,孪晶随着拉伸应变的增加而逐渐生长．当拉伸应变达到0．087时,一种基面与X—Y面成大约35°角且内部包含堆垛层错的新晶粒成核并快速增长．也就是说,孪晶和新晶粒的形成和繁殖是含堆垛层错的纳米多晶镁在300．0K温度下的主要变形机理．模拟结果也显示,当温度为10．0K时,位错的成核和滑移是含堆垛层错的纳米多晶镁拉伸变形的主要形式．     

强流脉冲电子束辐照诱发金属纯镍中的空位簇缺陷

利用强流脉冲电子束(high-current pulsed electron beam,HCPEB)技术对多晶纯Ni进行了辐照处理,采用透射电子显微镜详细分析了辐照诱发的缺陷结构.HCPEB辐照后,纯镍表层积聚了幅值极大的残余应力,沿{111}晶面形成了稠密的位错墙及孪晶结构,另外还形成了大量的包括位错圈、堆垛层错四面体(SFT)及孔洞在内的空位簇缺陷.SFT缺陷的数量远高于其他空位簇缺陷,其周围区域位错密度很低.孔洞缺陷主要出现在SFT密集区域.HCPEB瞬间的加热和冷却诱发的幅值极大的应力和极高的应变 关键词： 强流脉冲电子束 多晶纯Ni 空位簇缺陷 堆垛层错四面体     

Effects of surface charges on phonon properties and thermal conductivity in GaN nanofilms

Surface charges can modify the elastic modulus of nanostructure, leading to the change of the phonon and thermal properties in semiconductor nanostructure. In this work, the influence of surface charges on the phonon properties and phonon thermal conductivity of GaN nanofilm are quantitatively investigated. In the framework of continuum mechanics,the modified elastic modulus can be derived for the nanofilm with surface charges. The elastic model is presented to analyze the phonon properties such as the phonon dispersion relation, phonon group velocity, density of states of phonons in nanofilm with the surface charges. The phonon thermal conductivity of nanofilm can be obtained by considering surface charges. The simulation results demonstrate that surface charges can significantly change the phonon properties and thermal conductivity in a GaN nanofilm. Positive surface charges reduce the phonon energy and phonon group velocity but increase the density of states of phonons. The surface charges can change the size and temperature dependence of phonon thermal conductivity of GaN nanofilm. Based on these theoretical results, one can adjust the phonon properties and temperature/size dependent thermal conductivity in GaN nanofilm by changing the surface charges.     

Negative stiffness of the FeAl intermetallic nanofilm

Uniaxial tension of the nanofilm of the FeAl intermetallic alloy has been simulated by the molecular dynamics method. It has been found that the nanofilm is elastically deformed by 37%. There is a region in the stress-strain curve, where the strain increases with a decrease in the tensile stress, which indicates the negative stiffness of the nanofilm in this region. The uniform strain with a decrease in the tensile stress is unstable thermodynamically, which leads to the appearance domains with different elastic strains in the nanofilm. The deformation in the unstable region develops due to the domain-wall motion; as a result, the domains with a higher strain grow at the expense of the domains with a lower strain. A similar deformation mechanism was recently described by Savin with coworkers for the DNA molecule.     

Fabrication of triazinedithiol functional polymeric nanofilm by potentiostatic polymerization on aluminum surface

The functional polymeric nanofilm of 6-(N-allyl-1,1,2,2-tetrahydroperfluorodecyl)amino-1,3,5-triazine-2,4-dithiol monosodium (AF17N) was prepared on pure aluminum surface by potentiostatic polymerization at different potentials. The thickness and weight of polymeric nanofilm increased proportionally to electro-polymerization potential following linear equation. The chemical structure of nanofilm was characterized by Fourier transform-infrared (FT-IR) spectroscopy and X-ray photoelectron spectroscopy (XPS). Adsorption peaks in FT-IR and C1s, N1s, S2p, F1s and Al2p peaks in XPS spectra indicated that the polymeric nanofilm was poly(6-(N-allyl-1,1,2,2-tetrahydroperfluorodecyl)amino-1,3,5-triazine-2,4-disulfide) (PAF17). The morphologies of polymeric nanofilm were also observed by atomic force microscopy (AFM). All the results showed that the optimal electro-polymerization potential and time were 8 V and 20 s, respectively. Uniform and compact nanofilm of PAF17 could be obtained under these conditions. It is expected that this technique will be applied in the preparation of lubricating, dielectric and hydrophobic surface on aluminum substrate.     

金属纳米薄膜在石墨基底表面的动力学演化

采用分子动力学方法研究了金属Au和Pt纳米薄膜在石墨(烯)基底表面的动力学演化过程,探讨了金属薄膜和石墨(烯)基底间的相互作用对金属纳米薄膜在固态基底表面的去湿以及脱附的动力学演化的影响.研究结果表明,在高温下,相同层数的Au和Pt纳米薄膜在单层石墨基底表面上存在不同的去湿现象,主要表现为厚度较小的Pt纳米薄膜在去湿过程中有纳米空洞形成,而同样厚度的Au薄膜在去湿过程中没有形成空洞.Au和Pt两种金属薄膜在高温下都去湿形成纳米液滴,这些液滴最终都以一定的速度脱离基底.在模拟的薄膜厚度范围内(0.2—2.3 nm),Au和Pt纳米液滴脱离基底的速度随厚度增加表现出不同的变化规律.Pt纳米液滴的脱离速度随薄膜初始厚度的增加先增加后减少,而Au脱离速度随厚度的增加先减少,达到一个临界厚度后脱离速度突然迅速增加.利用薄膜与基底间相互作用的不同导致去湿过程中的黏滞耗散不同,定性分析了这种变化规律的原因.此外,进一步研究还发现金属液滴的脱离时间与薄膜厚度和模拟温度的依赖关系,发现脱离时间随薄膜厚度的增加而增加,随模拟温度的升高而减小.这些研究结果可以为金属镀膜、浮选、表面清洁、器件表面去湿等工业生产过程提供理论指导.     

Defects and separation of amorphous nanofilms from crystalline substrates

The conditions of separation of an amorphous nanofilm from a crystalline substrate are theoretically studied in terms of a disclination-dislocation model for a crystal-glass interface. In this model, such an interface is characterized by a high density of disclinations and dislocations. A criterion for the separation of an amorphous nanofilm from a crystalline substrate is obtained. The critical nanofilm thickness above which a film begins to separate is calculated as a function of the characteristics of the disclination-dislocation system and the dilatation misfit.     

硅纳米薄膜中声子弹道扩散导热的蒙特卡罗模拟

通过建立声子散射概率函数描述声子在输运过程中的散射,提出了一种模拟声子弹道扩散导热的蒙特卡罗方法,并将其应用于硅纳米薄膜中的稳态和瞬态弹道扩散导热过程的研究. 提出的蒙特卡罗方法对边界发射的声子束进行跟踪,根据散射概率函数模拟声子束在传播区域内经历的散射过程,并通过统计声子束的分布得到温度分布. 稳态导热过程的模拟发现,尺寸效应会引起边界温度跳跃,其值随着Knudsen数的增大而增大;计算的硅纳米薄膜的热导率随着厚度的增大而增大,与文献中的实验数据和理论模型相符. 通过瞬态导热过程的模拟得到了纳米薄膜内的温度分布随时间的变化,发现瞬态导热过程中的热波现象与空间尺度相关,材料尺寸越小,弹道输运越强,薄膜中的热波现象也越显著. 关键词： 纳米薄膜 弹道扩散导热 蒙特卡罗模拟 尺寸效应     

Optical properties of cadmium sulfide nanocrystal film prepared by electrochemical synthesis at liquid-liquid interface

Dendritic nanocrystalline CdS film was deposited at liquid-liquid interface of surfactants and an electrolyte containing 4 mmol L⁻¹ cadmium chloride (CdCl₂) and 16 mmol L⁻¹ thioacetamide (CH₃CSNH₂) with an initial pH value of 5 at 15 °C by electrochemical synthesis. The nanofilm was characterized by transmission electron microscopy (TEM), field emission scanning electron microscope (FE-SEM), atomic force microscopy (AFM), ultraviolet visible (UV-vis) absorption spectroscopy and fluorescence spectroscopy. The surface morphology and particle size of the nanofilm were investigated by AFM, SEM and TEM, and the crystalline size was 30-50 nm. The thickness of the nanofilm calculated by optical absorption spectrum was 80 nm. The microstructure and composition of the nanofilm was investigated by X-ray diffraction (XRD) and X-ray photoelectron spectroscopy (XPS), showing its polycrystalline structure consisting of CdS and Cd. Optical properties of the nanofilm were investigated systematically by UV-vis absorption and fluorescence spectroscopy. A λ_onset blue shift compared with bulk CdS was observed in the absorption spectra. Fluorescence spectra of the nanofilm indicated that the CdS nanofilm emitted blue and green light. The nanocomposites film electrode will bring about anodic photocurrent during illumination, showing that the transfer of cavities produces photocurrent.     

The melting behaviors of the Nb(1 1 0) nanofilm: a molecular dynamics study

By using molecular dynamics (MD) and the modified analytic embedded atom method (MAEAM), we have studied the melting point, the melting mechanism and the correspondingly dynamical behaviors of a Nb(1 1 0) nanofilm. Firstly, in accordance to the MD time dependence of the potential energy, the melting point of this nanofilm has been roughly estimated. Then, the melting mechanism of the nanofilm have been analyzed in detail with the application of the structure factor. The results clearly indicate that the melting transition of the 8th, 9th, and 10th atomic layer of the nanofilm has been characterized by the exponential, polynomial and linear sequence respectively when the thickness of the quasiliquid film attains to about 1.3 nm. Thirdly, the dynamical behaviors of the nanofilm melting, such as the melting front propagation velocity and the kinetic coefficient, which have also been analyzed, demonstrate that the melting front propagation velocity has linearly increased with the incremental temperature and the evaluated kinetic coefficient has approximately equaled 1.43m/(sK). Finally, by extrapolating the melting front propagation velocity to zero, we can accurately deduce the melting point of the Nb(1 1 0) nanofilm to 2568.3 K, which is much lower than the counterpart (2740 K) of the bulk niobium.     

Experimental Studies on Thermal and Electrical Properties of Platinum Nanofilms

We experimentally studied the in-plane thermal and electrical properties of a suspended platinum nanofilm in thickness of 15 nm. The measured results show that the in-plane thermal conductivity, the electrical conductivity and the resistance-temperature coefficient of the studied nanofilm are much less than those of the bulk material, while the Lorenz number is greater than the bulk value. Comparing with the results reported previously for the platinum nanofilm in thickness of 28 nm, we further find that the in-plane thermal conductivity, the electrical conductivity and the resistance-temperature coefficient decrease with the decreasing thickness of the nanotilm, while the Lorenz number increases with the decreasing thickness of the nanofilm. These results indicate that strong size effects exist on the in-plane thermal and electrical properties of platinum nanofilms.     

Size- and Temperature-Dependent Thermal Expansion Coefficient of a Nanofilm

The thermal expansion coefficient （TEC） of an ideal crystal is derived by using a method of Boltzmann statistics. The Morse potential energy function is adopted to show the dependence of the TEC on the temperature. By taking the effects of the surface relaxation and the surface energy into consideration, the dimensionless TEC of a nanofilm is derived. It is shown that with decreasing thickness, the TEC can increase or decrease, depending on the surface relaxation of the nanofilm.