数字光弹性中五步彩色相移法及其应用

把相移法与光学彩色信息图像处理技术相结合,提出全场数字化确定主方向角的光弹性五步彩色相移法。其主要优点是采用最简单的白光平面偏振仪光学系统,由数码照相机采集五幅等色线与等倾线相互耦合的彩色条纹图,经计算机进行处理后,就可以得到[O～π／2]范围内单纯连续的等倾角相图;为了减少测量误差,在相移法中引入背景光强参与运算。对实验中存在的三种主要误差因素进行了定量分析,给出了具体的误差控制指标。用对径压缩圆盘问题的理论仿真模拟结果、基本实验和复杂平面及空间实际问题进行检验和对比,表明本方法是正确可行的。     

全场数字化测量光弹性等倾角的五步彩色相移法

通过把相移法与光学彩色信息图像处理技术相结合 ,提出了一种确定全场光弹性等倾角的五步彩色相移法。模型置于白光照射下 ,在起偏镜与分析镜不同设置的平面偏振光场中 ,用彩色数码照相机分别采集五幅等色线与等倾线相耦合的条纹图 ,根据相移法基本原理 ,就可以确定在 0～π/2范围内的等倾角。经过对径压缩圆盘的检验 ,实验结果与理论完全相符。该方法改进了单色光相移法的不足 ,对实验应力分析及其在工程结构强度设计中的应用将起积极的促进作用     

Whole-field determination of isoclinic parameter by five-step color phase shifting and its error analysis

Combining color imaging with phase shifting, a technique named five-step color phase shifting is presented to determine the whole-field isoclinic parameter. Relevant theory is derived and explicit conditions for directly determining the isoclinic parameter in the range of [0,π/2] are given. The unloaded light intensity of the model is systematically studied. A color camera recorded five isoclinic images coupled with isochromatics from a plane polariscope with five different settings, respectively. Experiments have been carried out with a circular disk under diametral compression and errors have been analyzed and estimated. This technique utilizes white light, which avoids undefined isoclinics near the locations where the isochromatics exist and will have active effect on experimental stress analysis and structural strength design.     

Numerical analysis of phase-stepping interferometric photoelasticity for plane stress separation

A phase-stepping method for interferometric photoelasticity is proposed to determinate whole-field plane stress components. Isopachic phase can be obtained by rotating polarizer, second quarter-wave plate and analyzer at definite optical arrangements. On the other hand, isochromatic and isoclinic phases can be determined in a circular polariscope arrangement. Furthermore, a load-stepping method is adopted to overcome the wrong mathematic sign of the isochromatics in the ambiguity regions and the influence of initial interferometric fringes on the isopachics. Light intensities and phase-stepping formula for the proposed method are derived using Jones calculus. Simulation of a circular disk under diametral compression demonstrates the feasibility of the proposed method.     

Photoelastic Analysis with a Single Tricolor Image

A new approach to simultaneous measurement of isochromatics and isoclinics from a single image using a tricolor light, called as the tricolor photoelastic technique, is proposed in order to enable and facilitate the analysis of time varying phenomena. Not only an apparatus of experiment but the whole analysis system and procedure are developed. Using a color digital camera and a tricolor light source under linear polarization, fringe order and the principal direction of birefringence are obtained from a piece of color image data by a single shot using the method proposed. It is emphasized that this method can be applicable to time varying phenomena in which good repeatability and reproducibility of experiments are not expected, since multiple exposures are not necessary for sufficient data acquisition in the completion of stress analysis.     

Extraction of isotropic points using simulated isoclinics obtained by photoelasticity-assisted finite element analysis

A method for extracting isotropic points in structures using simulated isoclinics obtained from a combination of photoelastic experiments and finite element analysis (FEA) is presented. This method is divided into two parts. The first part involves the confirmation of the boundary condition necessary for FEA using isochromatics obtained by photoelastic experiments. The second part involves the determination of isotropic points using simulated isoclinics obtained by FEA under the boundary condition confirmed by photoelastic experiments. This method is applied to a ring and T-shaped plates subjected to a compressive load. The results show that the isotropic points in the ring and T-shaped plates could be accurately and easily extracted by this method.     

快速测量扭曲向列相液晶盒盒厚

提出了一种利用圆偏光仪测量扭曲向列相液晶盒盒厚的新方法,即:圆偏光仪组成为两端是一对起偏器和检偏器,中间放置一对四分之一波片.起偏器和检偏器平行或垂直放置,其中一个四分之一波片的快轴和起偏器透光轴成45°,另一个四分之一波片的快轴和起偏器透光轴成－45°.液晶盒样品直接插入到两四分之一波片中间,无需调整方向.不同于旋转液晶盒或偏振片寻找输出光强最大值或最小值的方法,圆偏光仪测量盒厚不需要旋转任何光学元件或液晶盒观测输出光强的变化,只需要观测检偏器在平行和垂直方向的两个强度值,能够实现快速测量,简洁而且有效.     

Self-induced transparency and self-induced darkening with a nonlinear frequency-doubling polarization interferometer

It is shown that the system polarizer-frequency-doubling crystal(s)-analyzer has a nonlinear transmission for the fundamental wave. The intensity-dependent transmission of this device is due to the nonlinear phase shift that the fundamental beam obtains in the nonlinear crystal as a result of cascaded second-order processes. Depending on the mutual orientation of the polarizer and the analyzer such effects as self-induced transparency and self-induced darkening can be realized.     

洛匈棱镜的正反向特性

给出了洛匈棱镜正、反向使用时分束角的精确表达式。从理论上证明,对任意合理的结构角及主折射率值来说,洛匈棱镜反向使用时的分束角小于正向使用时的分束角。研究了在锥光入射条件下洛匈棱镜中的e光和o光的传播方向、折射率、主平面、偏振方向等问题。证明了洛匈棱镜正向使用时第二块晶体中无偏折的光波只含有o光,参考圆圆周上各点光波的主平面相互平行,通过一个检偏器后可以实现消光;洛匈棱镜反向使用时,第二块晶体无偏折的光波同时包含了o光和e光,参考圆圆周上各点光波的主平面沿参考圆的径向,e光和o光的偏振方向分别沿径向和垂直于径向,通过检偏器后形成锥光干涉现象,不能消光。     

Measurement of surface figure of plane optical surfaces with polarization phase-shifting Fizeau interferometer

A Fizeau interferometer based set up for measurement of surface forms of plane optical surfaces has been discussed. Phase shifting interferometry has been applied using polarization phase shifter. A linearly polarized (632.8 nm) He–Ne laser has been used as the source. Light reflected from the object and the reference/master surfaces are made circularly polarized in opposite senses by means of two properly oriented quarter wave retardation plates placed at appropriate positions, one inside and other outside the interference cavity of the interferometer, and phase shifts are introduced between the object and the reference/master waves by varying angular orientation of a polarizer/analyzer. Final result is made free from any residual wave-front aberrations introduced by the (intra-cavity) wave plate by subtracting phase values obtained by PSI technique between a high optical quality master surface and the reference surface from that obtained for the test object surface with respect to the same reference surface for each point of the interference field. Results are shown for a plane surface.Advantages of the technique presented are linearity and high accuracy in phase stepping, no perturbation of the interference cavity during the phase shifting and possibility of real time or dynamic interferometry.     

Photoelastic investigation of interfacial fracture between orthotropic and isotropic materials

Static and dynamic fracture of interfaces between orthotropic and isotropic materials were studied using photoelasticity. In this study, a bi-material specimen made of PSM-1^® and Scotchply^® 1002, a unidirectional glass fiber reinforced epoxy composite, was used. Two fiber orientations, fibers parallel to the interface (α=0°) and fibers perpendicular to the interface (α=90°) were considered. Center crack bi-material specimens having different crack lengths were loaded quasi-statically and the full-field isochromatics were recorded using a digital camera. The complex stress intensity factor corresponding to each crack length was calculated from the isochromatics and the values were compared to that obtained from boundary collocation method. Dynamic interfacial fracture was studied with an edge crack bi-material geometry for the two different fiber orientations. The isochromatics around the propagating crack were recorded using a digital high-speed camera. The fracture parameters such as crack speed, complex stress intensity factor and energy release rate were extracted from the isochromatics using the asymptotic stress field equations. The complex stress intensity factor obtained from the static experiments was in close agreement with that calculated using the boundary collocation method. The results also indicated that the fiber orientation with respect to the interface influences the fracture parameters for stationary and propagating cracks.     

偏振干涉成像光谱仪中偏振化方向对调制度的影响

论述了自行研制的偏振干涉臧像光谱仪的原理,分析了其分光机理和成像原理;实在 重就起偏器、分析器的偏振化方向对干涉图调制度的影响进行了分析和计算,推导了偏振化方向偏离理想方向时调制度偏角的变化关系,给出和讨论了调制度随偏 角变化的空间曲面以及最大调制离（Ｖ＝１）和最小调制度（Ｖ＝０）时偏振器偏振化方向的空间取向。     

四区域法消除偏振棱镜缺陷对波片相位延迟测量的影响

在起偏器-待测波片-检偏器系统基础卜提出一种四区域测量波片相位延迟量的方法.调整待测波片和检偏器的方位角,获得相应的四组光强值,通过线性运算得到待测波片的相位延迟量,完全消除了起偏器和检偏器不完全消光带来的误差.由于测量系统中不存在标准波片或其他相位调制元件,允许测量波长仅受偏振棱镜和探测器的限制,因此四区域法可适用于很大波长范围内的波片测量.以λ/4波片为例,理论分析了测量系统利用四区域测量法后的仪器误差为σφ≤士3.49065×10-3rad(约0.2°),精度比原算法提高约1个数量级.实验验证了四区域法能有效提高系统精度.     

Holographic photo-elasticity: independent observation of the isochromatic and isopachic fringes for a single model subjected to only one process

A simple holographic recording of a photo-elastic object under stress allows the isochromatics to be observed. The isopachics are obtained by double-exposure interferometry: a second traverse of the wavefront through the object after a 90° rotation of its polarization by a Faraday cell eliminates the unwanted isochromatics.     

Method for measuring retardation of a quarter-wave plate based on normalized secondary harmonic component

A method for measuring retardation of a quarter-wave plate based on normalized secondary harmonic component is proposed, and the measuring principle is analyzed. The optical measuring system is composed of a laser, a polarizer, a phase modulator, the quarter-wave plate to be measured, an analyzer and a detector. The azimuths of the transmission axes of the polarizer and the analyzer with respect to the modulating axis of the phase modulator are +45°, 0°, respectively. The retardation of the quarter-wave plate is calculated precisely using the normalized secondary harmonic components prior to and after 22.5° rotation of the quarter-wave plate. In this method, the major axis position of the quarter-wave plate is not required to be known in advance, and the measured retardation is independent of the intensity fluctuation of the light source. The feasibility of the method is verified by the experiments.     

Ellipsometric configurations using a phase retarder and a rotating polarizer and analyzer at any speed ratio

In this paper,we propose an ellipsometer using a phase retarder and rotating polarizer and analyzer at a speed ratio 1:N.Different ellipsometric configurations are presented by assuming N = 1,2,and 3.Moreover,two values of the offset angle of the retarder are considered for each ellipsometric configuration.The Mueller formalism is employed to extract the Stokes parameters,from which the intensity received by the detector is obtained.The optical properties of c-Si are calculated using all configurations.A comparison between different configurations is carried out considering the effect of the noise on the results and the uncertainties in the ellipsometric parameters as functions of the uncertainties of the Fourier coefficients.It is found that the alignment of the phase retarder has a crucial impact on the results and the ellipsometric configuration with speed ratio 1:1 is preferred over the other configurations.     

Achromatic polarimeter

A polarimeter for measuring complete state of polarization of light in a wide spectral range is investigated. The light beam to be analyzed propagates through a continuously rotating first-phase plate; then through a continuously rotating second-phase plate; and, passing through a stationary linear polarizer, is incident on a detector. The time dependence of the intensity of the light beam that propagated though the polarizer is recorded. Fourier analysis of the periodic time dependence of the intensity yields the state of polarization of the light, which is characterized by four Stokes parameters. It is shown that the relation between the rotational velocities of the two phase plates and their thicknesses can be chosen such that the working range of the polarimeter would be limited only by the transparency range of the birefringent material of the phase plates, the working range of the linear polarizer, and that of the detector.     

New formulas for phase retardance measurements of birefringent plates

Two simple formulas are introduced that allow for simultaneous determination of the phase retardances of two birefringent plates from a single pair of readings of the polarizer and the analyzer at extinction. These formulas are of great importance since they furnish the basis of a model for a simple, timesaving and accurate method for calibrating phase plates in the Senarmont compensator arrangement without requiring an exact λ/4 plate and with almost direct results. The Poincaré sphere representation of polarization states is used to illustrate the model.     

基于弹光调制的红外光谱吸收法在室内VOC检测中的研究

为了保证静态干涉系统在气体定性定最分析方面稳定性高、抗干扰能力强的特点,设计了基于弹光调制实现光程静态扫描的干涉检测系统.系统由红外激光器、起偏器、弹光调制器、检偏器及CCD组成.通过弹光调制器使弹光晶体的主折射率随调制信号周期性的变化,从而产生周期性变化的光程差.通过对调制相位变化的计算,可知得到调制度随晶体长度、调...     

Simple method for simultaneous determination of the phase retardation and fast axis of a wave plate

A simple method for simultaneous determination of the phase retardation and fast axis of a wave plate is presented. In this method, double light path compare system is adopted to achieve better accuracy. In the main optical path, laser beam passes successively through a polarizer, a wave plate to be measured, an analyzer, and then is incident on a detector. In the reference optical path, another detector is used to monitor the fluctuation of the light source. With rotation of the wave plate, the maximum and minimum output light intensity, rotation angle of the wave plate are detected in the main light path; corresponding light intensity are simultaneously detected in the reference light path. Based on the light intensity and the rotation angle, the phase retardation and fast axis of the wave plate can be determined simultaneously. The main advantage of this method is its simplicity of apparatus, easy operation, low cost, and high accuracy. We believe that the method reported in this paper should be a useful approach to measure a wave plate without requiring any complex and expensive components.