The measurement of energy spectra of neutral particles in low energy ion scattering

An apparatus is described for low energy (0.1–10 keV) ion scattering (LEIS) experiments. A time of flight (TOF) spectrometer is incorporated in the system to be able to measure the energy of particles in the neutral state after scattering. The energy resolution ΔE/E of the TOF spectrometer is discussed and found to be 0.5% (FWHM). This is sufficient for our scattering experiments. An electrostatic analyzer (ESA) is used to measure the energy of scattered ions [ΔE/E=0.5% (FWHM)]. Experiments show that in general the ion dose needed to obtain a TOF spectrum (2×10¹⁰ ions/cm²) is much smaller than the dose needed for an ESA-spectrum (6×10¹³ ions/cm²). The ion spectra measured with the TOF spectrometer, by subtracting the neutral yield from the total yield, as well as with the ESA are found to agree quite well. This provides a way to calibrate the TOF spectrometer. The determination of the ion fraction of scattered particles is discussed [10 keV⁴⁰Ar⁺ on Cu(100), scattering angle 30°]. It is shown that the TOF spectrometer is able to measure light recoil particles (e.g. hydrogen) from a heavy substrate. In the analysing system is, in addition to the TOF spectrometer, also incorporated a stripping cell to measure the energy of neutral scattered particles. An energy spectrum of neutral scattered particles measured with both methods is shown.     

Energy and charge distribution of helium atoms reflected from a Cu surface under grazing incidence

The energy and charge distributions of helium ions and atoms reflected from a Cu surface at grazing incidence have been measured at the energies 250 and 300 keV. The dependence of the relative number of helium atoms in the scattered beam on the scattering angle at incidence angles less than 2° and scattered particle energies below 150 keV has been discovered. It is shown that, for a theoretical estimation of the charge fractions of particles reflected from the target surface, charge-exchange cross sections used in calculations must be corrected when solids are considered instead of gases.     

Sputtering yields for light ions as a function of angle of incidence

The sputtering yield of Ni, Mo, and Au have been measured at oblique angles of incidence for H⁺-, D⁺-, and⁴He⁺-ion irradiation in the energy region from 1 to 8 keV. The yields were determined from the weight loss of the targets. For Ni and Mo the dependence of the sputtering yield on the angle of incidence was found to be much stronger for H⁺- and D⁺-ion than for⁴He⁺-ion irradiation. In all cases the maximum in the yield was found at angles of incidence ϑ≧80°, where ϑ is the angle measured from the surface normal. Furthermore the ratio of the maximum yield to the yeild at normal incidence increases with increasing surface binding energy of the target material as well as with increasing ion energy in the energy region inveestigated. The results are discussed qualitatively in view of a model for the sputtering mechanism for light ions.     

Ion channeling in natural and synthetic beryl crystals

The transmission of ions by channeling through natural beryl and synthetic emerald has been studied extensively. The transmission ratios depend upon the angle of incidence with a full half width of less than 0.32°. While the maximum ratio obtained up to now is only 4×10⁻⁴ for 350 keV protons through a crystal of 21 μm thickness, the energy of the transmitted ions is high, the loss being in the order of a few keV/μm. About 60–80% of the particles emerging from the rear surface are ionized. By varying the ion species transmission could be observed up to atomic number 9. It is assumed that the transmission is facilitated by the existence of an electron free channel core. Higher transmission ratios can be expected for sufficiently perfect crystals.     

Argon (10 keV) scattered from structures,induced by bombarding a Cu(100) surface; ionization and neutralization

The ion fractions, η⁺, of 10 keV argon particles, scattered from a damaged copper surface, are measured with a time of flight spectrometer. The damage was introduced by bombardment with argon ions. The scattering angle was 30°. The results for different angles of incidence, ψ, are reported. For Ψ < 10° the ion fraction is relatively high (～27% for Ψ = 4°) and decreases as Ψ increases. For Ψ = 15° the value of η⁺ is 7%, whereas for 21° < Ψ < 27° the value of η⁺ appears to be constant (～14%). An explanation is given by assuming interatomic ionization as well as neutralization processes along the trajectory of the scattered particles. The number of step-atoms, induced by ion bombardment, is estimated to be about 2 × 10¹⁴/cm².     

Interaction of low energy (5–10 keV) argon atoms and ions with a Cu(100) surface; Ion fraction,ionization and neutralization

The ion fractions η⁺ of low energy (5–10 keV) argon particles scattered from a Cu(100) surface, are measured with a time of flight spectrometer. Neutral as well as charged projectiles are used. The scattering angle θ is 30°. The results for different angles of incidence ψ and crystal directions are reported. For scattering in the 〈100〉 direction, with a ψ-value of 15° and a primary energy E₀ of 5 and 10 keV, the ion fractions for the quasi single scattering peak, η⁺_QS, are 1.5 and 6.1% respectively. When E₀ is between 5 and 10 keV a reionization process with a constant reionization probability occurs during the violent interaction. This process, but also neutralization along the outgoing trajectory, determines η⁺_QS. With ions as projectiles, an energy difference of about 16 eV is observed between the quasi single scattering peaks in the spectra of all scattered particles and of ions only. The ion fraction for the quasi double scattering peak, η⁺_QD. depends largely upon E₀, indicating that the efficiency of the reionization process increases with E₀. A qualitative discussion of the data is given, using the reionization process and the interatomic neutralization processes along the trajectory of the scattered particles.     

Experimental measurement of effective atomic number of composite materials for Compton effect in the <Emphasis Type="Italic">γ</Emphasis>-ray region 280–1115 keV by a new method

In this paper, we report a new method to determine the effective atomic number, Z _eff, of composite materials for Compton effect in the γ-ray region 280–1115 keV based on the theoretically obtained Klein–Nishina scattering cross-sections in the angular range 50°–100° as well as a method to experimentally measure differential incoherent (Compton) scattering cross-sections in this angular range. The method was employed to evaluate Z _eff for different inorganic compounds containing elements in the range Z = 1–56, at three scattering angles 60°, 80° and 100° at three incident gamma energies 279.1 keV, 661.6 keV and 1115.5 keV and we have verified this method to be an appropriate method. Interestingly, the Z _eff values so obtained for the inorganic compounds were found to be equal to the total number of electrons present in the sample as given by the atomic number of the elements constituting the sample in accordance with the chemical formula of the sample. This was the case at all the three energies.     

Angular distribution and differential sputtering yields for low-energy light-ion irradiation of polycrystalline nickel and tungsten

Angular differential and total sputtering yields of polycrystalline nickel and tungsten have been measured for 1 and 4 keV H⁺ and 4 keV He⁺ ion bombardment at incidence angles between 0° and 80°. The differential sputtering yields (dY/dΩ) were determined with the aid of the collector technique, whereas the total yieldY was determined from the weight loss of the target during irradiation. Asymmetric angular distributions are observed at oblique angles of incidence, the emission maximum being shifted in forward direction (with respect to the incident ions). Even more pronounced than the change in shape of the emission distribution is an increase in the differential yield:dY/dΩ rises with increasing incidence angle over the whole range of ejection angles, the increase being most prominent in the direction of primary recoil emission. This effect is therefore ascribed to emission of surface atoms in direct projectile-surface atom collisions. On short term leave from Institut für Plasmaphysik der Kernforschungsanlage Jülich GmbH, D-5170, Jülich, Fed. Rep. Germany.     

Phase analysis of elastic <Emphasis Type="Italic">p</Emphasis><Superscript>6</Superscript>Li scattering at astrophysical energies

Based on new experimental investigations of elastic p ⁶Li scattering at energies 500–1150 keV and angles 30–170°, a phase analysis is performed and interaction potentials for p ⁶Li-system in ^2,4S- and ²P-states are constructed.     

Phase anlysis of elastic р 12С scattering for astrophysical energies

Based on experimental research of elastic р ¹²С scattering for energies of 200–1110 keV (in the center-of-mass system) and angles of 10–170°, the phase analysis of the р ¹²С system in the S-state is performed and the interaction potential is constructed. Translated from Izvestiya Vysshikh Uchebnykh Zavedenii, Fizika, No. 11, pp. 21–27, November, 2008.     

Angular dependence of the scattered ion yields in 4He+ → Cu scattering spectrometry

Assuming long range charge exchange mechanisms and neglecting shadowing effects, theory predicts the variation of the scattered ion yield with the scattering angle θ and the incidence angle ψ for some well defined experimental conditions. Such measurements were performed for ⁴He⁺ scattering on polycrystalline copper at incident energies ranging from 0.5 to 1.25 keV and at scattering angles from 20° to 130°. It is suggested that shadowing effects should be taken into account in order to explain the observed behaviour.     

Low energy (E0 < 10 keV) atom and ion scattering of neon from a Cu(100) surface; Ionization and neutralization

The ion fractions η⁺ of low energy (5–10 keV) neon particles scattered from a Cu(100) surface are measured with a time of flight spectrometer. These fractions are obtained for neutral as well as charged projectiles and for different crystal directions. The scattering angle θ was 30°. For a primary energy E₀ of 5 keV neutral projectiles have a value for η⁺ which is 30 times lower than for charged projectiles; these values are 0.15 and 4.5% respectively. For E₀ = 10 keV the values of η⁺ are about the same (~22%). Energy differences up to 22 eV, depending on E₀, are observed between the single scattering peaks in the ion spectra of charged and neutral projectiles but also between the single scattering peak in the spectra of all scattered particles and of ions, with ions as projectiles. A qualitative discussion of these data is given, involving charge transfer processes of noble gas particle and target atom. The data suggest that these neutralization processes can be described more adequately with interatomic neutralization processes along the trajectory than with Auger neutralization by conduction electrons.     

Extraction of cross-sections of inelastic scattering from energy spectra of reflected atomic particles

REELS spectra of the electrons reflected off niobium are measured with energy resolution <0.5 eV within the 5–40 eV energy range of the probing beam. The measurements were performed for the scattering angles θ = 45° and θ = 120° by means of two electron guns. The process of energy losses is described within the framework of a model with three different energy loss laws: surface, intermediate, and bulk layers are considered. Differential cross-sections of inelastic scattering are represented in the form of simple equations.     

Local anisotropy of cosmic rays with <Emphasis Type="Italic">E</Emphasis><Subscript>0</Subscript> ≥ 10<Superscript>17</Superscript> eV from Yakutsk EAS array data

The arrival directions of primary cosmic ray particles with energies E ₀ ≥ 10¹⁷ eV and zenith angles θ ≤ 60° recorded on the Yakutsk array over the period 1974–2009 are analyzed. These events are shown to have different anisotropies in different energy ranges.     

On the problem of the doppler spectrum of a microwave radar signal backscattered by the sea surface (transition region and bragg component)

We consider the problem of backscattering of a microwave radar signal by a perturbed water surface in the transition region of incidence angles (10°–25°). A theoretical model of the Doppler spectrum for the Bragg component of the reflected field is constructed within the framework of a two-scale model of the surface. Allowance for the large-scale component of waves indicates that the standard formulation of resonance scattering becomes invalid for small incidence angles. Large-scale waves restrict the power increase of the reflected signal prior to violation of the formal conditions for perturbation method applicability. It is shown that the new model is transformed to the known model of Doppler spectrum in the range of medium angles. Institute of Applied Physics, Russian Academy of Sciences, Nizhny Novgorod, Russia. Translated from Izvestiya Vysshikh Uchebnykh Zavedenii, Radiofizika, Vol. 40, No. 6, pp. 669–681, June, 1997.     

Simulation of Ion Paths in the Target Material for the Injection Complex of the BELA Facility

To realize the simulation experiments with the use of two ion beams at the injection complex of the BELA accelerator (Based on ECR ion source Linear Accelerator), it is necessary to determine the energy and irradiation angle of the beam of light ions which will be implanted into the region of radiation damage induced by heavy-ion beam. The depth of light-ion implantation is determined by the energy and kind of particles initiating the damage, as well as by their incidence angle. It is supposed that the incidence direction of heavy ions will coincide with the normal to the specimen surface. In our work, the necessary implantation zone for the iron ion beam with an energy of 3.2 MeV is located at depths of 300–800 nm. The simulation of the hydrogen and helium ion paths in the material of the iron target in the energy range from 150 to 600 keV at the angle to the normal from 0° to 65° is performed. The range of energies and irradiation angles for the hydrogen and helium ions are determined for the implantation into the radiation-induced defect-formation zone.     

Relativistic double differential cross sections for Compton scattering by bound electrons: Test at low photon energies and predictions at intermediate photon energies

Cross section profiles d²σ/dΩdω′ for Compton scattering of photons by bound electrons are calculated for all subshells of the atom. Results obtained from the form factor approximation and from a relativistic version of the impulse approximation are compared with experimental data for Cu and Pb at a scattering angle ofθ=145° and a photon energy of 662 keV. The impulse approximation proves to be superior to the form factor approximation and is used to predict cross section profiles for a primary energy of 50 MeV and different scattering angles and charge numbers. It is shown that only for the heaviest atoms and scattering angles belowθ=5° there is a non-negligible contribution of Compton scattering to the elastic peak.     

The scattering of hydrogen from a cesiated tungsten surface

The reflection of protons from a partially cesiated tungsten surface is studied in the energy domain between 100 and 2000 eV and in the angular domain between 75° and 85° with respect to the surface normal. The study is performed by measuring the angular and energy distribution of the scattered negative ions. The reflection can take place along two paths. One path is reflection from the cesium surface layer, the other one is reflection from the tungsten substrate. A dependence of the final charge state on the path is observed. It is inferred that this phenomenon is due to incomplete neutralization of the protons scattered from the cesium layer. The energy loss of the reflected ions cannot be accounted for by using only the binary collision model. Also the electronic stopping of the atoms by the metal electrons is shown to be an important energy loss mechanism. Total conversion measurements of H⁺ to H^- combined with the measurements of the negatively charged fraction of the scattered particles, as reported in the proceeding paper, yield the particle reflection coefficient as a function of the angle of incidence. These reflection coefficients show that for angles of incidence less than 75° already more than 50% of the particles do not reflect from the surface. Total conversion efficiency measurements with H^- ions as primary ions show that the influence of the initial charge state on the total conversion is very small.