某型激光测距系统可靠性预计

在试验数据有限的情况下，通过分析激光测距系统工作模式和建立系统可靠性模型解决了小批量、复杂的某型激光测距系统可靠性评价问题。根据以前相似产品的试验数据，采用相似电路法对系统可靠性进行预计。根据激光晶体、染料片、全反射镜、聚光腔等元器件的寿命，对激光器寿命进行预计，并在实际使用中得到了验证。这对系统设计和使用具有重要参考作用。     

复合随机Duffing系统可靠性分析

基于参数α=2的Gegenbauer正交多项式展开方法,研究了大变异系数情况下复合随机强Duffing体系的可靠性分析问题.应用随机空间的正交多项式展开方法,Edgeworth级数逼近技术求取了强非线性随机振动系统响应的前四阶矩以及概率密度函数.基于首次超越模型,讨论了复合随机强Duffing体系的可靠性分析问题.提出了系统动态可靠度与系统平均可靠度的区别、联系以及各自特点,发展了可靠度数值计算公式.分析计算结果与Monte-Carlo模拟结果较好符合,表明该方法的正确与有效. 关键词： 随机Duffing方程 动态可靠度 平均可靠度 Gegenbauer正交多项式     

人体模式静电对GaN基蓝光LED载流子运动及其可靠性的影响

对GaN基蓝光发光二极管(LED)分别施加-400,-800,-1 200,-1 500 V的反向人体模式静电打击,每次静电打击后,测量LED样品电学参数和光学参数的变化,从理论上分析了静电对LED可靠性的影响。实验发现:对GaN基蓝光LED进行人体模式下的静电打击后,其I-V特性曲线发生变形,光通量减小,老化时性能衰减的速率加快,这是由于受静电打击后在LED芯片内部产生了二次缺陷和熔融通道。对LED在不同温度下进行了I-V特性曲线的测量。实验结论认为未受静电打击的LED中浅能级离化占主导地位,受静电打击的LED中深能级离化占主导地位。静电引起的失效机理可以概述为二次缺陷和熔融通道的产生、深浅能级载流子的运动和辐射复合、非辐射复合之间的转变等因素引起的LED性能退化。     

基于粒子群优化的网络动态可靠性分析

时变性是节点和网络的典型特征。针对时变可靠性问题主要是基于上穿率法进行分析,传统的上穿率法分析方法通过时间离散,然后采用FORM法计算其瞬时可靠度,进而计算上穿率。对于功能函数非线性程度较高时,FORM求解精度降低。本文采用pso算法改进上穿率法,首先在离散时间之后,通过pso算法求解瞬时可靠度指标,然后计算上穿率进行时变可靠性分析,并通过实例与上穿率法及Monte-Carlo方法进行对比,本文提出的方法可以提高计算精度。     

改进TOPSIS法的装备可靠性评估方法

装备的可靠性是完成遂行任务必备条件,对装备可靠性进行评估可为任务决策提供理论支持。目前关于装备可靠性评估方面的研究大多数都是基于概率统计学的,而概率统计的准确性受限于样本的大小,从而使得基于概率统计学的装备可靠性评估因装备样本的大小而产生不可避免的或大或小误差。为解决这一评估受样本大小制约的问题,引入逼近理想点（TOPSIS）法。同时,针对TOPSIS法受主观因素影响较大的问题,修定了该法评估指标权重及理想解的确定方法,并在评估结果中引入了“合格分数线”的概念,使得评估结果等级划分有了量化依据,从而体现出了客观性和科学性,然后构建了某装备基于该改进TOPSIS法的可靠性评估模型。最后,通过示例分析,利用MATLAB计算验证了本文方法的正确性,评估结果可为装备的使用者或指挥者提供决策依据。     

Design of double-coated optical fibers to minimize long-term axial-strain-induced microbending losses

The design of double-coated optical fibers to minimize long-term axial-strain-induced microbending losses is investigated. The microbending loss is dominated by the compressive radial stress at the interface between the glass fiber and primary coating. To know the long-term axial-strain-induced microbending losses in double-coated optical fibers, the stresses in fibers are analyzed by the viscoelastic theory. To minimize these long-term microbending losses, the thickness and Young's modulus of the secondary coating should be decreased if the strength of coating is satisfied. Meanwhile, the Poisson's ratio of the primary coating should be increased, but the Young's modulus of the primary coating and relaxation time of the secondary coating should be decreased. Alternatively, the radius and relaxation time of the primary coating exist their optimum values. The long-term axial-strain-induced microbending losses in single-coated optical fibers are also discussed.     

高压双扩散漏端MOS晶体管双峰衬底电流的形成机理及其影响

利用0.15μm标准CMOS工艺制造出了工作电压为30V的双扩散漏端MOS晶体管(double diffused drain MOS, DDDMOS).观察到DDDMOS的衬底电流-栅压曲线(I_b-V_g曲线)有两个峰.通过实验和TCAD模拟揭示了DDDMOS衬底电流的形成机理,发现衬底电流第一个峰的成因与传统MOS器件相同;第二个峰来自于发生在漂移区远离沟道一侧高场区的碰撞离化电流.通过求解泊松方程和电流连续性方程,分析了器件的物理和几何参数对导致衬底电流重新上升的漂移区电场的影响.在分析了DDDMOS衬底电流的第二个峰形成机理的基础上,考察了其对器件的可靠性的影响. 关键词： 高压器件 衬底电流 可靠性     

Comparative analysis of influence of gamma radiation on programmable memory characteristics

The aim of this paper is to examine the reliability of erasable programmable read only memory (EPROM) and electrically erasable programmable read only memory (EEPROM) components subjected to the influence of gamma radiation. This problem is of considerable significance for both military industry and space technology. We present total dose results for the NM27C512 8F85 EPROM and M24128 – B W BN 5 T P EEPROM components. There is evidence that EPROM components radioactive reliability is better than that of EEPROM components. Furthermore, the changes EPROM's undergoes are reversible, so that after erasing process and reprogramming all EPROM components are fully functional. On the other hand, EEPROM's changes are irreversible and when subjected to the influence of gamma radiation, all EEPROM components become permanently nonfunctional. The obtained results are analyzed and explained via the interaction of gamma radiation with oxide layers.     

环圈光纤的失效预测

以光纤的机械可靠性为主线综述了光纤材料中固有裂纹的生长和传播所导致的光纤断裂机制.在该断裂力学的基础上推导了传统通信光纤在平直应用中的寿命预测模型.继而分析了处于弯曲构型中的传感环圈光纤表面的应力分布,然后在与传统理论相同的基本断裂机理下,类比于通信光纤可靠性模型的推导,据此应力分析给出了评估这种环圈光纤的机械可靠性的一般模型.进而从工程应用的角度简化了所推导出的一般模型,使之能够快速简单地给出环圈光纤失效概率的保守评估.在此简化模型的基础上,数值计算了目前常见的几种传感环圈中的光纤在服役期间的累积失效概率;其结果同时也显示了该环圈光纤的失效概率对光纤参量、环圈参量以及工艺参量的依赖关系.根据这一依赖关系,不仅可以快速评估在各种服役应力条件下具有不同寿命要求的光纤环圈的失效概率,同时也能对这些环圈的设计提供参考.     

《大学物理实验》试卷的分析

本文统计分析了１５８名学生《大学物理实验》的考试结果,对每道试题及整张试卷的信度、区分度、难度进行了计算分析,讨论了信度、区分度、难度之间的关系及具体取值范围．评估了各试题及整张试卷的质量,为《大学物理实验》试题库的建立、提高和完善提供了依据．     

准备层温度对黄光LED光电特性和老化性能的影响

研究了InGaN/GaN超晶格准备层的生长温度对Si衬底GaN基黄光LED光电特性和老化性能的影响。研究发现准备层生长温度较高的样品外量子效率高于准备层生长温度较低的样品。500 mA电流下老化1000 h后,准备层生长温度较高的样品的光衰相对更大。老化前后100 K的电致发光光谱显示高温生长的样品老化后的空穴注入途径发生变化;老化后光衰大的样品非辐射复合中心增加的程度更大。荧光显微镜观察到两个样品老化前均出现大量暗斑,高温样品的颜色更深更黑,低温样品颜色则相对较浅且呈红色。老化后高温样品的暗斑数量有所增加,而低温样品数量变化不大,这可能也是导致超晶格温度高的样品光衰更大的原因之一。     

Compensation-rematch for the major components of C-ADS injector-I

The China-ADS project is a strategic plan launched by the Chinese Academy of Sciences to solve the nuclear waste problem and the resource problem for nuclear power in China. Under its long-term plan, it will last until about 2040. In order to achieve the extremely high reliability and availability required for the C-ADS accelerator, a fault tolerant strategy has been implanted. The failure effects of key elements such as the RF cavities and focusing elements in different locations of the injector-I part have been studied and schemes of compensation based on the local compensation-rematch method have been proposed. In addition, error analysis has been carried out to check the reliability of this method compared with the uncompensated situation, and it is found to be very effective. As the injector-I testing facility is coming into operation, it is possible to check and improve the compensation-rematch method with the beam testing experiment before the main linac operation.     

大功率半导体激光器可靠性研究和失效分析

对自主研发的975 nm波长的COS封装的大功率半导体单管激光器进行了10,12,14 A的电流步进加速应力试验,应用逆幂律模型和指数分布的理论对试验结果进行了分析,计算出在8 A的电流下,器件的平均寿命为28 999 h。研究了器件的失效形式和老化前后的温升、偏振度的变化,结果表明:失效形式主要有体内退化、腔面退化、与焊接有关的退化;老化后的器件的结温上升增多,偏振度下降10%左右。     

评估环圈光纤机械可靠性的模型

为评估应用于光纤陀螺和光纤电流传感器等传感领域的光纤环圈的机械可靠性,排除光纤涂覆和环圈灌胶等因素,必须评估所用光纤在弯曲状态下的机械可靠性.在已被广泛接受的均匀拉伸应力状态下通信光纤的机械可靠性模型基础上,根据这种环圈光纤在弯曲状态下的一般应力分布,对于绕环张力和弯曲应力同时存在的情形,建立了评估这种环圈光纤的机械可靠性的一种模型.该模型通过采用弯曲状态下光纤表面的最大弯曲应力值,和由于一般情况下弯曲中轴内侧的压缩应力远小于外侧拉伸应力的这一事实而忽略内侧的压缩应力,从而简化了弯曲应力的不均匀分布;同时通过该模型中所含的多个参量的选择给出了最为保守的结果.利用该模型进行的数值计算预测了采用不同直径的光纤分别绕制的不同环圈直径的环圈光纤在不同服役条件下的机械可靠性.结果表明,除了光纤半径和疲劳因子等这些光纤自身的固有因素外,绕环张力、环圈半径和筛选张力等工艺参量对环圈光纤的机械可靠性也是有重要影响.     

评估环圈光纤机械可靠性的模型

为评估应用于光纤陀螺和光纤电流传感器等传感领域的光纤环圈的机械可靠性,排除光纤涂覆和环圈灌胶等因素,必须评估所用光纤在弯曲状态下的机械可靠性.在已被广泛接受的均匀拉伸应力状态下通信光纤的机械可靠性模型基础上,根据这种环圈光纤在弯曲状态下的一般应力分布,对于绕环张力和弯曲应力同时存在的情形,建立了评估这种环圈光纤的机械可靠性的一种模型.该模型通过采用弯曲状态下光纤表面的最大弯曲应力值,和由于一般情况下弯曲中轴内侧的压缩应力远小于外侧拉伸应力的这一事实而忽略内侧的压缩应力,从而简化了弯曲应力的不均匀分布;同时通过该模型中所含的多个参量的选择给出了最为保守的结果.利用该模型进行的数值计算预测了采用不同直径的光纤分别绕制的不同环圈直径的环圈光纤在不同服役条件下的机械可靠性.结果表明,除了光纤半径和疲劳因子等这些光纤自身的固有因素外,绕环张力、环圈半径和筛选张力等工艺参量对环圈光纤的机械可靠性也是有重要影响.     

面向虚拟试验的可信度评估工具设计与实现

虚拟试验技术在航天领域得到了越来越广泛的应用,尤其是在多专业耦合仿真方面,但是面向虚拟试验的可信度评估工具方面的建设与研究未得到充分关注。针对虚拟试验分析阶段的工程需求,设计并实现了虚拟试验可信度评估工具,涵盖了评估对象管理、评估专家管理、指标体系构建、可信度评估等功能模块。此外,该工具还提供了虚拟试验与实物试验的数据库接口,有效了支撑虚实比对工作,进一步规范了虚拟试验的分析流程与分析内容,有效提升了工作效率。     

类金刚石薄膜光学常数拟合模型的合理性研究

由于椭偏光谱测量结果不能直接反映所测量样品材料的结构和光学性质，所以需要利用最小二乘法来拟合分析椭偏光谱数据得到光学常数。而椭偏光谱分析依赖于构建的模型，且可能存在多模型解，因此考虑模型的合理性就显得十分必要。本文采用椭偏法测量了类金刚石薄膜(DLC)的光学常数，分析并拟合了脉冲真空电弧离子技术镀制的类金刚石薄膜的椭偏光谱．获得了光学常数，并对拟合模型的合理性和测量结果的可靠性进行了分析。     

Accurate measurement and influence on device reliability of defect density of a light-emitting diode

A method of accurately measuring the defect density of a high-power light-emitting diode （LED） is proposed. The method is based on measuring the number of emitting photons in the magnitude of 105 under the injection current as weak as nA and calculating the non-radiative recombination coefficient which is related to defect density. Defect density is obtained with the self-developed measurement system, and it is demonstrated that defect density has an important influence on LED optical properties like luminous flux and internal quantum efficiency （IQE）. At the same time, a batch of GaN-based LEDs with the chip size of 1 minx 1 mm are selected to conduct the accelerated aging tests lasting for 1000 hours. The results show that defect density exhibits a greater variation and is more sensitive to LED reliability than luminous flux during aging tests. Based on these results, it is concluded that for the GaN-based LED with a chip size of 1 mm ~ I mm, if its defect density is over 1017/cm3, the LED device performance suffers a serious deterioration, and finally fails.     

Network connectivity entropy and its application on network connectivity reliability

The network structure entropy has served as one of the index measuring network heterogeneity, but it gives no considerations to the impact of isolated nodes on the network structure. In addition, the all-terminal reliability is zero and is unable to compare it between disconnected networks. Therefore, the concept of network connectivity entropy is suggested to remove the current bottleneck and helps facilitate new index in terms of network connectivity reliability. This study fully proves the rules as follows: when the edges of network are diminishing, the newly-established network connectivity reliability will remain unchanged or become weaker; conversely, when the edges of network are increasing, the network connectivity reliability will remain unchanged or become stronger. Thus, the proposed index of network connectivity reliability is proved reasonable. Furthermore, the impaired metro network of Nanjing city is exemplified to demonstrate the validity and practicability of network connectivity reliability. The result shows that this new approach is in good position to compute network connectivity reliability quickly and effectively, and also to compare it between different networks.     

Comparison of various automatic means for measuring mean fundamental frequency

The purpose of this paper was to evaluate the reliability of, and agreement among, six speech analysis systems in the determination of fundamental frequency. Five male and five female speakers provided oral reading and sustained vowel samples for analysis. Each sample was analyzed five times by each system. The results indicated high reliability for all of the systems for both sexes and both utterance types. Agreement among the systems was high for the male sustained vowels and the female oral reading samples. In contrast, poor agreement occurred among the systems for the male oral reading samples and the female sustained vowels. The findings indicate that the output of these automatic methods tends to be consistent over repeated trials within the systems in their extraction of fundamental frequency; however, agreement among these systems varies.