光电探测器特性在TDLAS气体检测中的影响

在应用可调谐二极管激光吸收光谱(TDLAS)技术进行气体检测时,气体检测精度受系统各功能模块性能的影响,针对这个问题研究了系统中光电探测器的输出电流噪声谱密度和响应度两种特性。推导出了探测器输出电流表达式,得出了输出电流噪声谱密度特性与激光器相对强度噪声(RIN)有关的结论,并通过实验验证了TDLAS系统中激光器RIN的存在。通过仿真,研究了RIN对探测器输出电流的影响,给出了不同条件时的电流噪声谱密度曲线。为避免环境温度的变化影响光电探测器响应度,采用一种实时校正方法,给出了其原理及校正公式。以氨气为检测对象,运用该方法对氨气浓度曲线进行校正。     

基于数字平板探测器的高能X射线成像实验研究

为了将数字平板探测器应用到高能X射线成像无损检测,通过实验研究了平板探测器的噪声和动态范围。设计了基于平板探测器的高能X射线成像系统。通过实验研究了电子直线加速器对数字平板探测器图像采集的束流触发同步问题。     

红外探测器模拟器中多通道数模转换输出不一致性校正

针对多通道数模转换电路输出不一致性问题,将两点非均匀性校正算法引入到不一致性问题中,提出了一种不一致性两点校正模型。通过分析红外探测器模拟器输出信号的样本数据,获得不一致性校正因子,并在现场可编程门阵列核心处理器中实现了该不一致性校正模型。利用红外探测器模拟器模拟320×256中波红外制冷探测器的输出信号,获得不一致性校正前后的图像。通过比较分析表明:校正前图像列平均灰度最大起伏量为15,校正后为5,相对改善了约66.7%。     

基于动态电流的锥束CT环状伪影校正方法

为了去除平板探测器中坏点和响应不一致探元引起的环状伪影对X射线计算机断层成像(CT)质量的影响,利用探元响应与管电流的线性相关关系,提出了一种基于探测器校正的环状伪影去除方法。检测出不同管电流下响应恒定的探元后,分别计算每个探元响应与管电流的相关系数,并检测出响应随机变化和迅速达到最大的探元,将检测出的探元记入坏点模板并进行校正。以单个管电流下所有探元响应的均值为基准,计算同一组管电流下各探元响应曲线方程与基准曲线方程的转化关系,得到探测器的一致性校正参数矩阵。依据坏点模板和一致性校正参数对各探元的输出响应进行校正。实验结果表明,该方法能够有效去除环状伪影,并改善图像信噪比。解决了现有坏点检测方法中阈值选择困难的问题,可适用于多种类型的探测器。     

基于BP网络的图像增强器像元通道不一致性校正研究

像元通道响应不一致性是影响图像增强器检测能力的重要因素,因而有必要对不一致性进行校正。首先分析了传统的不一致性校正方法的缺点,然后提出了一种基于BP神经网络的像元通道响应不一致性的校正方法。该方法利用BP神经网络良好的非线性映射能力,对每一个像元通道进行输入-输出特性的反非线性逼近,同时利用实验数据进行了神经网络的训练。对比了校正前后的图像及标准差。     

射线平板探测器成像系统的数理模型

非晶硅X射线数字平板探测器是目前唯一可取代胶片照相的新型技术,对其成像特性的研究已成为高像质的DR和三维CT检测技术的基础。目前X射线成像系统均是以线性时不变理论作为分析基础的。基于X射线平板探测器成像系统、成像机理和几何参数建立了成像系统的点扩展函数(PSF)。用圆柱体等效二维PSF模型,使成像系统退化为比例系统,从而把复杂的反卷积运算转化成用代数方程来求解,能够快速实现通过探测器输出图像来估计透照工件的二维输入图像。此模型的建立为在实际检测中利用输出的图像通过线性变换得到输入估计。在DR系统中,基于上述数理模型建立了灵敏度模型,利用输出场强可以很好的再现输入场强。     

X射线图像增强器像元响应不一致性的分析及校正

X射线图像增强器像元响应不一致性是评定图像质量的重要指标,它将影响设备的探测能力和分类级别,因而很有必要对不一致性的进行校正。通过对不一致性产生机理的理论分析,建立了图像增强器的每个像元通道光电响应的对数曲线模型。基于该模型,提出了一种改进的两点校正算法。该算法首先将非线性响应转化为线性响应,然后用基于最小二乘的多点校正算法对线性数据进行校正。校正前后的图像及标准差给出了对比,实验结果表明了该校正方法的有效性。     

CT扫描系统中成像系统响应的不一致性对重建图像质量的影响

在 CT扫描系统中 ,成像系统响应的不一致性将导致所获取的投影中存在趋势项 ,这将引起 CT重建图像质量的下降。分析了成像系统响应不一致性产生的原因及其对 CT重建图像的影响 ,提出了不一致性校正方法 ,并通过实验进行了验证。     

TDI CCD像元响应不一致性校正算法

线阵TDI CCD遥感相机的不一致性校正对获取高质量的图像来说具有重要意义。主要对TDI CCD像元响应不一致性的校正算法及其硬件实现进行了深入的研究。对CCD的噪声特性进行了详细的分析,给出了像元响应不一致性(PRNU:Pixel-response non-uniformity)的退化模型及校正算法,并对其计算精度进行了分析,在硬件电路上对校正算法进行了验证,详细分析了影响校正效果的各种因素。实测结果表明,校正后图像的信噪比得到显著提高。     

射线面阵探测器成像系统校正研究

基于线性、移不变理论,对射线面阵探测器成像的特性和系统成像所呈现出亮度不均匀的原因进行分析研究.通过分析线性系统成立的假设条件,给出了对实际成像中各像元点阵的偏置、灵敏度进行逐点校正的公式.在实验室,对基于PaxScan2520 面阵探测器的成像系统进行成像校正研究,取得了满意的效果,噪声得到有效的抑制,成像的不一致性得到改善.当检测较厚工件或工件厚度变化较大时,系统成像超出其线性范围,给出了二次校正的方法和公式,也取得了满意的效果.     

High‐energy X‐ray diffraction using the Pixium 4700 flat‐panel detector

The Pixium 4700 detector represents a significant step forward in detector technology for high‐energy X‐ray diffraction. The detector design is based on digital flat‐panel technology, combining an amorphous Si panel with a CsI scintillator. The detector has a useful pixel array of 1910 × 2480 pixels with a pixel size of 154 µm × 154 µm, and thus it covers an effective area of 294 mm × 379 mm. Designed for medical imaging, the detector has good efficiency at high X‐ray energies. Furthermore, it is capable of acquiring sequences of images at 7.5 frames per second in full image mode, and up to 60 frames per second in binned region of interest modes. Here, the basic properties of this detector applied to high‐energy X‐ray diffraction are presented. Quantitative comparisons with a widespread high‐energy detector, the MAR345 image plate scanner, are shown. Other properties of the Pixium 4700 detector, including a narrow point‐spread function and distortion‐free image, allows for the acquisition of high‐quality diffraction data at high X‐ray energies. In addition, high frame rates and shutterless operation open new experimental possibilities. Also provided are the necessary data for the correction of images collected using the Pixium 4700 for diffraction purposes.     

锥束CT平板探测器成像的余晖建模与校正方法

锥束CT具有高效率和高精度的显著特点, 在医学成像与工业无损检测等领域已得到广泛应用, 但余晖的存在降低了CT图像的质量. 本文借鉴余晖多指数衰减模型的思想, 结合平板探测器输出信号的实际衰减规律, 提出了一种新的基于多指数拟合的余晖衰减建模及校正方法. 首先进行了基于平板探测器的锥束CT成像实验, 结果表明平板探测器各像素的余晖衰减规律具有良好的一致性, 且余晖衰减规律与初始灰度的大小无关; 其后根据建立的余晖衰减模型实现了余晖的快速校正, 并分析比较了余晖校正前后投影图像和切片图像质量, 表明余晖校正后的零件轮廓清晰度得到了显著提升. 该方法无需获取探测器闪烁体成分及其衰减时间常数, 便于实际锥束CT成像系统的余晖检测与校正. 关键词： 余晖 平板探测器 锥束CT 多指数衰减     

Enhancements in full‐field PIXE imaging—Large area elemental mapping with increased lateral resolution devoid of optics artefacts

The combination of a pn‐junction charge‐coupled device‐based pixel detector with a poly‐capillary X‐ray optics was installed and examined at the Helmholtz‐Zentrum Dresden‐Rossendorf. The set‐up is intended for particle‐induced X‐ray emission imaging to survey the trace elemental composition of flat/polished geological samples. In the standard configuration, a straight X‐ray optics (20 μm capillary diameter) is used to guide the emitted photons from the sample towards the detector with nearly 70 000 pixels. Their dimensions of 48 × 48 μm² are the main limitation of the lateral resolution. This limitation can be bypassed by applying a dedicated subpixel algorithm to recalculate the footprint of the photon's electron cloud in the detector. The lateral resolution is then mainly determined by the capillary's diameter. Nevertheless, images are still superimposed by the X‐ray optics pattern. The optics' capillaries are grouped in hexagonal bundles resulting in a reduced transmission of X‐rays in the boundary regions. This influence can be largely suppressed by combining a series of short measurements at slightly shifted positions using a precision stage and correcting the image data for this shifting. The use of a subpixel grid for the image reconstruction allows a further increase of the spatial resolution. This approach of image‐stacking and multiframe super‐resolution in combination with the subpixel correction algorithm is presented and illustrated with experimental data. Additionally, a flat‐field correction is shown to remove the remaining imaging inhomogeneity caused by non‐uniform X‐ray transmission. The described techniques can be used for all X‐ray spectrometry methods using an X‐ray camera to obtain high‐quality elemental images.     

A multiplexed high‐resolution imaging spectrometer for resonant inelastic soft X‐ray scattering spectroscopy

The optical design of a two‐dimensional imaging soft X‐ray spectrometer is described. A monochromator will produce a dispersed spectrum in a narrow vertical illuminated stripe (～2 µm wide by ～2 mm tall) on a sample. The spectrometer will use inelastically scattered X‐rays to image the extended field on the sample in the incident photon energy direction (vertical), resolving the incident photon energy. At the same time it will image and disperse the scattered photons in the orthogonal (horizontal) direction, resolving the scattered photon energy. The principal challenge is to design a system that images from the flat‐field illumination of the sample to the flat field of the detector and to achieve sufficiently high spectral resolution. This spectrometer provides a completely parallel resonant inelastic X‐ray scattering measurement at high spectral resolution (～30000) over the energy bandwidth (～5 eV) of a soft X‐ray absorption resonance.     

An estimation of EDXRF spectrometer properties,based on a two‐layer composite Si‐Ge detector

A mathematical model for the two‐layer composite Si‐Ge energy dispersive X‐ray detector is proposed, based on analyses of radiation and electron transport in the detector, and a mathematical model of an energy dispersive X‐ray fluorescent spectrometer with the detector is considered. The Monte Carlo method is applied to calculate probabilities of photon detection in different parts of the detector's response function. The composite detector with the time anti‐coincidence scheme is proposed; its first layer is Si detector, and the second layer is Ge detector. It is shown that this composite detector has some advantages, such as reduced Ge photo escape peaks intensities and efficiency of detection of high energy photons similar to efficiency of Ge detector. Applying the X‐ray detector for the energy dispersive X‐ray fluorescent spectrometer provides for a lower background level. Copyright © 2012 John Wiley & Sons, Ltd.     

A curved image‐plate detector system for high‐resolution synchrotron X‐ray diffraction

The developed curved image plate (CIP) is a one‐dimensional detector which simultaneously records high‐resolution X‐ray diffraction (XRD) patterns over a 38.7° 2θ range. In addition, an on‐site reader enables rapid extraction, transfer and storage of X‐ray intensity information in ≤30 s, and further qualifies this detector to study kinetic processes in materials science. The CIP detector can detect and store X‐ray intensity information linearly proportional to the incident photon flux over a dynamical range of about five orders of magnitude. The linearity and uniformity of the CIP detector response is not compromised in the unsaturated regions of the image plate, regardless of saturation in another region. The speed of XRD data acquisition together with excellent resolution afforded by the CIP detector is unique and opens up wide possibilities in materials research accessible through X‐ray diffraction. This article presents details of the basic features, operation and performance of the CIP detector along with some examples of applications, including high‐temperature XRD.     

Counting‐loss correction for X‐ray spectroscopy using unit impulse pulse shaping

High‐precision measurement of X‐ray spectra is affected by the statistical fluctuation of the X‐ray beam under low‐counting‐rate conditions. It is also limited by counting loss resulting from the dead‐time of the system and pile‐up pulse effects, especially in a high‐counting‐rate environment. In this paper a detection system based on a FAST‐SDD detector and a new kind of unit impulse pulse‐shaping method is presented, for counting‐loss correction in X‐ray spectroscopy. The unit impulse pulse‐shaping method is evolved by inverse deviation of the pulse from a reset‐type preamplifier and a C‐R shaper. It is applied to obtain the true incoming rate of the system based on a general fast–slow channel processing model. The pulses in the fast channel are shaped to unit impulse pulse shape which possesses small width and no undershoot. The counting rate in the fast channel is corrected by evaluating the dead‐time of the fast channel before it is used to correct the counting loss in the slow channel.     

Development of a two‐dimensional imaging system of X‐ray absorption fine structure

A two‐dimensional imaging system of X‐ray absorption fine structure (XAFS) has been developed at beamline BL‐4 of the Synchrotron Radiation Center of Ritsumeikan University. The system mainly consists of an ionization chamber for I₀ measurement, a sample stage, and a two‐dimensional complementary metal oxide semiconductor (CMOS) image sensor for measuring the transmitted X‐ray intensity. The X‐ray energy shift in the vertical direction, which originates from the vertical divergence of the X‐ray beam on the monochromator surface, is corrected by considering the geometrical configuration of the monochromator. This energy correction improves the energy resolution of the XAFS spectrum because each pixel in the CMOS detector has a very small vertical acceptance of ～0.5 µrad. A data analysis system has also been developed to automatically determine the energy of the absorption edge. This allows the chemical species to be mapped based on the XANES feature over a wide area of 4.8 mm (H) × 3.6 mm (V) with a resolution of 10 µm × 10 µm. The system has been applied to the chemical state mapping of the Mn species in a LiMn₂O₄ cathode. The heterogeneous distribution of the Mn oxidation state is demonstrated and is considered to relate to the slow delocalization of Li⁺‐defect sites in the spinel crystal structure. The two‐dimensional‐imaging XAFS system is expected to be a powerful tool for analyzing the spatial distributions of chemical species in many heterogeneous materials such as battery electrodes.     

低强度X射线影像仪的新发展

扼要介绍国内外Ｌｉｘｉｓｃｏｐｅ的概况。提出在国产系统中在Ｘ射线源前加置Ｘ射线准直器,Ｘ射线影像增强采用纤维光学输出窗和小孔径大面积微反,可以必普像质、扩大视场。