原子力显微镜高次谐波幅度对样品弹性性质表征的研究

轻敲模式下原子力显微镜微悬臂探针在接近其基态共振频率的外加驱动下振荡, 其末端针尖周期性靠近、远离样品, 产生于针尖与样品非线性相互作用过程中的高次谐波信号包含更多的待测样品表面纳米力学特性等方面的信息. 通过理论分析、计算, 系统地研究了针尖与样品接触时间受样品弹性模量的影响, 以及高次谐波幅度与接触时间的关系, 获得了通过高次谐波幅度区分待测样品表面弹性性质差异的规律. 并在自制的高次谐波成像实验装置上, 得到了与理论预期一致的实验结果. 关键词： 轻敲模式原子力显微镜 接触时间 高次谐波幅度 弹性模量     

原子力显微术轻敲模式中探针样品接触过程及相位衬度研究

借助简单的有阻尼受迫振子模型，研究了原子力显微术轻敲模式中探针与样品接触时间t_c、样品的表面形变D_z和相位衬度对探针设置高度z_c及样品杨氏模量E_s的依赖关系.结果发现,t_c与D_z均随E_s及z_c的增大而减小，同时探针与样品作用过程伴随很小的能量耗散.对轻敲过程中相移量φ的研究表明，E_s较大的样品有较小的φ，且φ随 关键词： 原子力显微术 轻敲模式 相位衬度     

原子力显微镜扫描成像DNA分子

采用Mg2+处理DNA、APTES或戊二醛修饰云母表面、DNA拉直方法制备了λ-DNA及DNA-组蛋白复合物样品.室温下原子力显微镜以轻敲模式在空气中扫描样品成像.实验结果表明:AFM扫描成像的效果与样品的制备方法有关,同时也受操作因素影响.     

Al(111)表面单个Al原子的操纵── W针尖与Al原子的相互作用

为了较清楚地阐明扫描隧道显微镜针尖在样品表面原子操纵中的具体作用，根据第一性原理的离散变分理论计算，采用“团簇模型”研究了在无外加电场下，W针尖与样品Al(111)表面Al原子的相互作用．结果表明：随着W针尖与样品表面接近到一定程度（针尖与样品表面的距离S≤10a.u.(0.53nm))时，由于针尖原子与样品表面原子的相互作用，使位于针尖正下方的表面Al原子在脱离表面时感受到一稳定的势阱，即在无外场的情况下，当W针尖与样品Al(111)表面接近到一定程度时，由于针尖的吸引作用，将使针尖正下方的Al原子自动离开样品表面而移向W针尖，实现Al(111)表面单个Al原子的操纵． 关键词：     

试样激励下轻敲模式原子力声显微镜的非线性动力学特性

利用Euler-Bernoulli梁理论和DMT针尖-样品作用力模型建立了试样激励下轻敲模式原子力声显微镜(AFAM)系统的动力学方程,并应用非线性动力学分析方法对AFAM微悬臂梁的振动特性进行研究。通过合理改变超声激励幅值、超声激励频率和针尖-样品初始间距等模型参数模拟得到微悬臂梁的超谐波、次谐波、准周期和混沌振动现象,采用时间序列、频谱、相空间、Poincare截面和Lyapunov指数等方法对不同非线性振动特性进行表征。通过分析不同模型参数条件下微悬臂梁针尖-样品作用力特性,探索了微悬臂梁不同非线性振动现象的产生机制。此外,研究了AFAM微悬臂梁运动的分岔特性,发现当超声激励幅值和针尖-样品初始间隙连续变化时,周期、准周期和混沌运动交替出现。研究结果对AFAM系统非线性动力学行为分析和混沌振动控制提供了理论参考。      

Ag涂层内凹弧形针尖增强喇曼散射效应仿真研究

设计了一种表面镀有Ag涂层且具有内凹弧度的圆锥形钨(W)针尖,运用时域有限差分法建立了针尖-球形样品结构的针尖增强喇曼散射模型,研究了针尖增强效应及参数优化配置.采用波长632.8nm光源斜入射激励方式,对模型的针尖增强喇曼散射效应进行电磁场仿真计算,获得了模型在不同光源入射角度、样品粒径、针尖-样品间距下的增强电场强度和针尖增强喇曼散射增强因子.研究结果表明:当光源入射角为72°、样品粒径约为140nm、针尖-样品间距达到2nm时可产生最大的增强因子,达到104量级.该结果为制备高增强效率的探针针尖,及其在高空间分辨率和高检测灵敏度喇曼光谱仪中的实用化提供了参考依据.     

SFM/SNOM结合的扫描探测显微镜

采用光纤探针的扫描近场光学显微镜 (SNOM)存在某些弱点 ,如探针特别脆 ,不易贴近样品表面扫描 ,探针的转输效率低等。近年来发展了将SFM /SNOM结合起来的扫描探测显微镜。利用微加工工艺技术 ,将小孔集成在悬臂探针中 ,使探针既能批量制备 ,又具有很好的重复性。探针悬臂在垂直于样品表面方向上的弹性常数较小 ,针尖不易损坏。在接触模式中利用这种SFM /SNOM组合探针可将样品的形貌像、摩擦力和光学透射像等信息同时记录下来。对于综合研究样品表面的介观性质十分有利。     

原子力显微镜探针耦合变形下的微观扫描力研究

原子力显微镜(AFM)的微探针系统是典型的微机械构件，它在接触扫描过程处于耦合变形状态.采用数值模拟方法探究恒力模式下探针耦合变形对微观扫描力信号、微观形貌信号的影响.研究表明，AFM的恒力模式扫描中，法向扫描力并不是恒定大小，与轴向扫描力存在耦合作用，在粗糙峰峰值增加阶段，二力均增加；在粗糙峰峰值减小阶段，二力均减小；该耦合作用随形貌坡度、针尖长度等增加而加强.微观形貌的测试信号和横向扫描侧向力信号受探针耦合变形影响较小，但侧向力与形貌斜率密切相关，且其极值点与形貌极值点存在位置偏差，这些结果均与原子力 关键词： 原子力显微镜 探针悬臂梁 耦合变形 扫描力     

隧道声显微镜的几种模式及理论研究

讨论了隧道声显微镜（TAM）的三种工作模式，即相互作用力-隧道间距模式、改进的STM测量模式和AFM测量模式，研究了它们的工作机理。建立了一个探针-样品相互作用的模型，理论分析了相互作用力与隧道间距的关系，计算结果与实验结果一致，该结果对于研制TAM实验系统和探针制备等具有指导意义．     

基于扫描电子显微镜的碳纳米管拾取操作方法研究

碳纳米管场效应管是未来纳米器件的发展方向,而制造纳米器件的前提是拾取碳纳米管,基于扫描电子显微镜(SEM)的微纳机器人操作系统能够实现碳纳米管拾取操作.本文建立拾取操作中碳纳米管与原子力显微镜(AFM)探针间范德瓦耳斯力力学模型,不同接触状态下范德瓦耳斯力越大越有利于拾取碳纳米管.在SEM视觉反馈图像中建立相对坐标系,首先提出倾角变值方法检测碳纳米管与AFM探针的接触状态,然后运用动态差值方法识别碳纳米管与AFM探针空间位姿并校正碳纳米管位姿,最后自下而上拾取碳纳米管.实验结果表明:拟合直线倾角变值较大时碳纳米管与AFM探针发生接触,动态差值变化为零时碳纳米管与AFM探针为空间线接触,在完全线接触模型下选择合适的接触角度、接触长度和拾取速度能够成功拾取碳纳米管.     

Contact mechanics analysis of oscillatory sliding of a rigid fractal surface against an elastic–plastic half-space

Oscillatory sliding contact between a rigid rough surface and an elastic–plastic half-space is examined in the context of numerical simulations. Stick-slip at asperity contacts is included in the analysis in the form of a modified Mindlin theory. Two friction force components are considered – adhesion (depending on the real area of contact, shear strength and interfacial adhesive strength) and plowing (accounting for the deformation resistance of the plastically deformed half-space). Multi-scale surface roughness is described by fractal geometry, whereas the interfacial adhesive strength is represented by a floating parameter that varies between zero (adhesionless surfaces) and one (perfectly adhered surfaces). The effects of surface roughness, apparent contact pressure, oscillation amplitude, elastic–plastic properties of the half-space and interfacial adhesion on contact deformation are interpreted in the light of numerical results of the energy dissipation, maximum tangential (friction) force and slip index. A non-monotonic trend of the energy dissipation and maximum tangential force is observed with increasing surface roughness, which is explained in terms of the evolution of the elastic and plastic fractions of truncated asperity contact areas. The decrease of energy dissipation with increasing apparent contact pressure is attributed to the increase of the elastic contact area fraction and the decrease of the slip index. For a half-space with fixed yield strength, a lower elastic modulus produces a higher tangential force, whereas a higher elastic modulus yields a higher slip index. These two competing effects lead to a non-monotonic dependence of the energy dissipation on the elastic modulus-to-yield strength ratio of the half-space. The effect of interfacial adhesion on the oscillatory contact behaviour is more pronounced for smoother surfaces because the majority of asperity contacts deform elastically and adhesion is the dominant friction mechanism. For rough surfaces, higher interfacial adhesion yields less energy dissipation because more asperity contacts exhibit partial slip.     

How to measure energy dissipation in dynamic mode atomic force microscopy

When studying a mechanical system like an atomic force microscope (AFM) in dynamic mode it is intuitive and instructive to analyse the forces involved in tip–sample interaction. A different but complementary approach is based on analysing the energy that is dissipated when the tip periodically interacts with the sample surface. This method does not require solving the differential equation of motion for the oscillating cantilever, but is based entirely on the analysis of the energy flow in and out of the dynamic system. Therefore the problem of finding a realistic model to describe the tip–sample interaction in terms of non-linear force–distance dependencies and damping effects is omitted. Instead, it is possible to determine the energy dissipated by the tip–sample interaction directly by measuring such quantities as oscillation amplitude, frequency, phase shift and drive amplitude. The method proved to be important when interpreting phase data obtained in tapping mode, but is also applicable to a variety of scanning probe microscopes operating in different dynamic modes. Additional electronics were designed to allow a direct mapping of local energy dissipation while scanning a sample surface. By applying this technique to the cross-section of a polymer blend a material specific contrast was observed.     

Detection of single-electron charging in an individual InAs quantum dot by noncontact atomic-force microscopy

Single-electron charging in an individual InAs quantum dot was observed by electrostatic force measurements with an atomic-force microscope (AFM). The resonant frequency shift and the dissipated energy of an oscillating AFM cantilever were measured as a function of the tip-back electrode voltage, and the resulting spectra show distinct jumps when the tip was positioned above the dot. The observed jumps in the frequency shift, with corresponding peaks in dissipation, are attributed to a single-electron tunneling between the dot and the back electrode governed by the Coulomb blockade effect, and are consistent with a model based on the free energy of the system. The observed phenomenon may be regarded as the "force version" of the Coulomb blockade effect.     

纳米沟槽表面黏着接触过程的分子动力学模拟研究

采用大规模分子动力学方法研究了刚性球型探头与具有不同纳米沟槽基体表面的黏着接触过程,探讨了表面沟槽结构对载荷-位移曲线、接触引力和拉离力以及材料转移的影响规律.研究结果表明:在相同的压入深度下,与原子级光滑表面的黏着接触过程相比,刚性探头与具有纳米沟槽结构基体表面的接触压力较小,接触加载过程中的引力作用范围较大,并伴随载荷的多次跳跃,且接触引力和拉离力均有减小;当沟槽深度相同时,随着沟槽宽度的增大,接触引力和拉离力逐渐减小,当沟槽宽度逐渐接近探头与光滑表面的接触直径时,接触引力和拉离力又逐渐增大,趋于接近探头与光滑表面的接触过程;当沟槽宽度相同时,随着沟槽深度的增大,接触引力相对减小,拉离力变化不大.     

Theoretical Study on the Capillary Force between an Atomic Force Microscope Tip and a Nanoparticle

Considering that capillary force is one of the most important forces between nanoparticles and atomic force microscope （AFM） tips in ambient atmosphere, we develop an analytic approach on the capillary force between an AFM tip and a nanoparticle. The results show that the capillary forces are considerably affected by the geometry of the AFM tip, the humidity of the environment, the vertical distance between the AFM tip and the nanoparticle, as well as the contact angles of the meniscus with an AFM tip and a nanoparticle. It is found that the sharper the AFM tip, the smaller the capillary force. The analyses and results are expected to be helpful for the quantitative imaging and manipulating of nanoparticles by AFMs.     

Analyses of vibration responses on nanoscale processing in a liquid using tapping-mode atomic force microscopy

An analytical solution of the vibration responses of biological specimens using atomic force microscopy (AFM), which often requires operation in a liquid, is developed. In this study, the modal superposition method is employed to analyze the vibration responses of AFM cantilevers in tapping mode (TM) operated in a liquid and in air. The hydrodynamic force exerted by the fluid on AFM cantilevers is approximated by additional mass and hydrodynamic damping. The tip–sample interaction forces were transformed into axial, distributed transversal, and bending loading, and then applied to the end region of the AFM through the tip holder. The effects of transverse stress and bending stress were adopted to solve the dynamic model. With this model, a number of simulations were carried out to investigate the relationship between the transient responses of the cantilever in a liquid and the parameters considered in nanoscale processing. The simulations show that the vibration of AFM cantilevers in a liquid has dramatically different dynamic characteristics from these of that in air. The liquid reduces the magnitude of the transversal response and reduces the cantilever resonances. Moreover, the magnitudes of response become larger with increasing intermolecular distances and smaller with decreasing tip length. The cantilever vibration amplitudes significantly depend on the damping constant and the mass proportionality constant.     

Determination of tip–sample interaction forces from measured dynamic force spectroscopy curves

The forces between a sharp tip and a sample are characteristic for different sample materials. A new method for quantifying the elastic tip–sample interaction forces from measured frequency vs. distance curves is presented. The dynamic force–spectroscopy curves investigated were obtained by dynamic force microscopy under ultrahigh vacuum (UHV) conditions for large vibration amplitudes with commercial levers/tips. The full non-linear force–distance relationship is deduced via a numerical algorithm, where the equation of motion describing the oscillation of the tip is solved explicitly. The elastic force distance dependence can be determined by fitting the results of a computer simulation to experimental frequency vs. distance data. The obtained force–distance curves can be compared quantitatively with theoretical models.     

纳米接触过程中黏着规律的变化

本文应用大规模分子动力学方法, 模拟了两种具有不同粗糙形貌的、刚性球形探头与弹性平面基体之间的纳米尺度接触, 计算了探头与基体之间的拉离力和黏着功, 研究了接触过程中界面黏着力随载荷的变化规律, 分析了接触界面原子的法向应力分布. 研究发现, 原子级光滑接触的黏着力随着载荷的增大而线性增大, 而原子级粗糙接触的黏着力-载荷曲线分为以不同斜率增长的两个阶段. 相比于原子级光滑探头, 原子级粗糙探头与基体之间具有较小的拉离力和黏着功, 却在接触过程中形成了较大的黏着力. 因此, 拉离力和黏着功不能表征出纳米接触过程中原子吸引作用对界面法向力的贡献大小.