Electrical conductivity and colour centres in Tl-doped KCl crystal

The electrical conductivity and optical absorption of potassium chloride crystals doped with different concentrations of thallium have been measured before and after X-irradiation. The optical absorption spectrum exhibits the characteristic Tl⁺ ion band at 247 nm. The extrinsic conductivity and the absorption coefficient at 247 nm increase with impurity addition upto a certain concentration. Further increase in impurities decreases them. Room temperature X-irradiation decreases the Tl⁺ ion band and produces the F band. F centre concentration is higher in lightly doped crystal compared to pure or heavily doped KCl. These results have been interpreted in terms of formation of interstitial potassium ions and positive ion vacancies in the Tl-doped KCl lattice due to large ionic radius of Tl⁺ ions. The impurity ions precipitate into TlCl phase when the doping is heavy.     

高电导a-Si:H:Y合金的电输运特性

本文报道由rf溅射技术将稀土元素Y掺入非晶硅,当掺Y浓度为20％左右时,获得了室温直流电导率为2×10¹Ω^-1·cm^-1的a-Si:H:Y合金膜。测量表明该合金膜是n型。变温电导测量指出,在测量温度范围内lnσ与l/T的关系可拟合于两条直线。对于衬底温度为260℃,290℃和330℃溅射的合金膜,其转折点分别出现在～70℃,～75℃和～90℃。这表明a-Si:H:Y合金膜存在两种电传导机制:在室温附近电子在Y施主杂质带内跳跃传导,在高温情况下电子在导带延展态内传导。并且得到Y施主杂质带中心处于导带E_c以下0.06—0.07eV。 关键词：     

Extrinsic luminescence of BaF2: R 3+ crystals ( R 3+ = La3+, Y3+, Yb3+)

This paper reports on a study of cross-luminescence in barium fluoride crystals doped by a variety of impurities (K⁺, Cd²⁺, Y³⁺, Yb³⁺, La³⁺). It is shown that doping of the crystal with a trivalent impurity gives rise to the formation of an additional cross-luminescence band peaking at 7.5 eV, the intensity of this band increasing with increasing impurity concentration. Original Russian Text ? A.S. Myasnikova, E.A. Radzhabov, A.V. Egranov, 2008, published in Fizika Tverdogo Tela, 2008, Vol. 50, No. 9, pp. 1582–1584.     

Fundamental reflection spectrum and the electronic band structure of chlorine-doped CdTe

The effect of chlorine impurity on the fundamental reflection spectrum and the electronic band structure of cadmium telluride crystals has been studied. At the impurity concentration N _Cl>5.0×10¹⁹ cm^?3, a peak appears in the reflectance spectra. This peak is due to electron transitions at the X point of the Brillouin zone from the upper split valence band to Cl levels lying 0.05 eV above the Γ minimum of the conduction band. The other features in the reflectance spectra and band structure are explained as being due to the effect of spin-orbit splitting at the X point and to indirect electronic transitions from the Cl levels to the Γ minimum.     

Effects of alloying on the band structure of gold: Piezoreflectance measurements on some AuCo and AuV alloys

Piezoreflectance measurements have been made on a series of gold cobalt and gold vanadium alloys with impurity concentrations of up to 4% using a strain amplitude of 4 × 10^?4 at a frequency of 68 kHz. The spectra show that the main interband transitions occur at 2.4, 3.5 and 4.5 eV. The deformation potentials with impurity concentration have been found for these transitions. An additional interband transition was found to occur at an energy of 1.8eV and this was enhanced significantly with impurity concentration. This may be due to the impurity causing a broadening of the d bands and hence a smearing of the interband threshold or alternatively it may be caused by a d band to Fermi level transition along the Δ direction close to the X point.     

Near band-edge luminescence of semi-insulating undoped gallium arsenide at high levels of excitation

The dependences of the maximum and the half-width of near band-edge photoluminescence of semi-insulating undoped-GaAs crystals at 77 K on the concentration of background acceptor impurities and the level of excitation in the range from 3×10²¹ to 6×10²² quantum/(cm² s) are investigated. The observed dependences are explained by formation of the density tails of states as a result of fluctuations of impurity concentration and participation of localized states of the donor impurity band in radiative transitions. Reduction of many-particle interaction at increasing of N can be connected with increasing of shielding of charge carriers by atoms of impurity.     

Photoluminescence of Mn doped epitaxial GaAs

We have measured the near band edge photoluminescence of Mn doped liquid phase epitaxially grown GaAs. The photoluminescence spectra at 2°K shows, at low excitation intensities, a structure of up to eight sharp peaks (widths .2 to 1.0 meV) between 1.517 and 1.512 eV, besides the lower energy bands near 1.41 eV due to the deep Mn acceptor level and the usual donor-acceptor bands around 1.47 eV. Attempts to relate the sharp lines to the Mn electronic states, introduced by doping, were unsuccessful. It is our belief that the presence of this particular impurity in our samples allows for whatever states are responsible for the sharp line structure, to reveal themselves in the emission spectrum. A most unespected result is that near band edge sharp line luminescence is observed for impurity concentration as high as 10¹⁸cm^-3.     

Exciton spectra and electrical conductivity of epitaxial silicon-doped GaN layers

Optical spectra and electrical conductivity of silicon-doped epitaxial gallium nitride layers with uncompensated donor concentrations N _D — N _A up to 4.8 × 10¹⁹ cm^?3 at T ≈ 5 K have been studied. As follows from the current-voltage characteristics, at a doping level of ～3 × 10¹⁸ cm^?3 an impurity band is formed and an increase of donor concentration by one more order of magnitude leads to the merging of the impurity band with the conduction band. The transformation of exciton reflection spectra suggests that the formation of the impurity band triggers effective exciton screening at low temperatures. In a sample with N _D — N _A = 3.4 × 10¹⁸ cm^?3, luminescence spectra are still produced by radiation of free and bound excitons. In a sample with N _D — N _A = 4.8 × 10¹⁹ cm^?3, Coulomb interaction is already completely suppressed, with the luminescence spectrum consisting of bands deriving from impurity-band-valence band and conduction-band-valence band radiative transitions.     

Generation Kinetics of Nonequilibrium Charge Carriers in Crystals with Deep Impurities Involving Two-Center Transitions between Band and Impurity States

A new and efficient mechanism of nonlinear photoexcitation of a transparent crystal with deep impurity centers is proposed. It is hypothesized that the energy of a quantum of light is smaller than the energy gap between the bottom of the conduction band and the impurity level, but is larger than the gap between the impurity level and the top of the valence band. The kinetics of nonlinear cascade generation of nonequilibrium charge carriers is considered taking into account two-center processes in which the energy transfer and the photon absorption occur in one and the same elementary event. The dependences of the quasi-equilibrium concentrations of nonequilibrium charge carriers in the bands and of the occupancy of impurity states on the laser-radiation intensity are obtained. It is shown that the generation process of nonequilibrium electron–hole pairs is of a threshold nature. Depending on the concentration of impurity centers, the threshold intensities can be ~10⁵–10⁷ W/cm², while the setting time of the quasi-equilibrium occupancies of electronic states is ~10–0.1 ns.     

Superconductivity in heavily vacant diamond

Using first principle electronic structure calculations we investigated the role of substitutional doping of B, N, P, Al and vacancies (V) in diamond (X_αC_1-α). In the heavy doping regime, at about ∼1-6% doping an impurity band appears in the mid gap. Increasing further the concentration of the impurity substitution fills in the gap of the diamond host. Our first principle calculation indicates that in the case of vacancies, a clear single-band picture can be employed to write down an effective one band microscopic Hamiltonian, which can be used to further study various many-body and disorder effects in impurity band (super)conductors.     

Recombination mechanism of photoluminescence in InN epilayers

We report an investigation of the recombination mechanism for photoluminescence (PL) in InN epilayers grown by molecular beam epitaxy and metal-organic chemical vapor deposition with a wide range of free electron concentrations from 3.5×10¹⁷-5×10¹⁹ cm⁻³. We found that the PL spectra are strongly blueshifted with increasing excitation intensity. For all the samples studied, the exponent of the relationship between the integrated PL intensity and the excitation intensity is very close to unity and independent of the temperature. By assuming Gaussian fluctuations of the random impurity potential, calculation based on the ‘free-to-bound’ recombination model can be used to interpret our results very well and it correctly reproduces the development of the total PL peak shift as a function of carrier concentration. It is concluded that the PL transition mechanism in InN epifilms can be characterized as the recombination of free electrons in the conduction band to nonequilibrium holes in the valence band tail.     

The Hd-center interaction with a Rb+ ion during irradiation and thermal annealing in kBr

The role of Rb⁺ ions on defect formation in KBr has been studied. The impurity suppresses colorability due to X-raying at 6 K, but does not result in the formation of any centers characteristic to Rb⁺ ions at this temperature. A new optical absorption band peaked at 3.19 eV is produced only by thermal annealing of irradiated KBr:Rb. This band is annealed in parallel to the annealing of the F band in a stage at 55 K, obeying second-order rate equation with an activation energy of 0.102 eV. This band is ascribed to the H_A(Rb⁺)-center. Calculation is made on the elastic interaction energy between the H-center and a Rb⁺ ion, to show that the interaction along 〈110〉 is repulsive, whereas that along 〈001〉 is attractive. Based on this result of calculation, the structure and the formation mechanism of the H_A(Rb⁺) center, and origin of suppression of colorability at 6 K are discussed. The difference in the interaction of the interstitial atom with Rb⁺ during its dynamical motion and thermal motion is emphasized.     

Photoluminescence of a silver-doped glass

The absorption, emission and excitation spectra of Ag⁺ ions in a soda lime glass doped with two different concentration of silver are investigated. Absorption spectra exhibit a main broad band peaked at about 260 nm (4.77 eV) with a shoulder at about 227 nm (5.46 eV). The relative height of the shoulder depends on silver concentration in the glass. Emission spectra of Ag⁺ are dominated by an ultraviolet broad band at about 330 nm (3.76 eV). The excitation spectra for this emission show a preponderant broad band peaked at about 227 nm (5.46 eV) which coincides with peak position of the shoulder displayed in the optical absorption spectra. A weak broad featureless emission band centred at about 550 nm (2.25 eV) with an excitation peak at about 242 nm (5.12 eV) is tentatively related to an impurity from the host silica glass rather than originated in silver-type centres. Comparison of the luminescence decay curves for both emissions show substantial differences between them. Consequently, the emissions in the time-resolved spectra can easily be discriminated.     

Optical and electrical properties of GaN: Si-based microstructures with a wide range of doping levels

The optical and electrical properties of silicon-doped epitaxial gallium nitride layers grown on sapphire have been studied. The studies have been performed over a wide range of silicon concentrations on each side of the Mott transition. The critical concentrations of Si atoms corresponding to the formation of an impurity band in gallium nitride (～2.5 × 10¹⁸ cm^?3) and to the overlap of the impurity band with the conduction band (～2 × 10¹⁹ cm^?3) have been refined. The maximum of the photoluminescence spectrum shifts nonmonotonically with increasing doping level. This shift is determined by two factors: (1) an increase in the exchange interaction leading to a decrease in the energy gap width and (2) a change in the radiation mechanism as the donor concentration increases. The temperature dependence of the exciton luminescence with participating optical phonons has been studied. The energies of phonon-plasmon modes in GaN: Si layers with different silicon concentrations have been measured using Raman spectroscopy.     

Temperature dependence of transport characteristics of wurtzite GaN epilayers

We report electrical transport properties of intentionally and unintentionally doped wurtzite GaN epilayers within the temperature range of 3K up to 340 K. Specifically, temperature dependence of the carrier concentration, mobility and resistivity are investigated. Obtained data could only be explained on the basis of two-band model, namely, high mobility conduction band and low mobility impurity band. The threshold doping concentration for the dominance of the conduction band electrons is estimated to be about 10¹⁸ cm^–3.     

Hole mobility in p-type HgTe

Experimental data concerning the electrical conduction and Hall coefficient in HgTe samples with acceptor states have been collected and analysed. In the analysis three ranges of acceptor concentration have been distinguished: a low concentration range up to about 5 × 10¹⁵ cm^?3 (pure samples), a high concentration range from 10¹⁶ to 10¹⁸ cm^?3 (p-like samples), and an extremely high concentration range above 10¹⁸ cm^?3 (p-type samples). In pure HgTe samples the holes are in the valence band, in p-like samples the “holes” are in the impurity band, and in p-type HgTe samples the holes are in a strong mixing impurity-valence band. The mobility of holes in the valence band is of the order of $\text{10}{}^5\text{cm}{}^2\text{Vs}$. The mobility of “holes” in the impurity band decreases with increasing impurity concentration from about $\text{5 × 10}{}^3\text{cm}{}^2\text{Vs}$ to $\text{125}\text{cm}{}^2\text{Vs}$. The mobility of holes in p-type HgTe samples is independent of the acceptor concentration and is equal to $\text{125}\text{cm}{}^2\text{Vs}$.     

n‐type conductivity in sublimation‐grown AlN bulk crystals

AlN crystals grown by physical vapour‐phase transport in the presence of a SiC doping source possess n‐type conductivity. The net donor concentration attains up to mid 10¹⁷ cm^–3. The investigation reveals shallow donors forming an impurity band and acceptor‐like electron traps at about 0.5 eV below the conduction band edge. Thermal electron emission from these traps is responsible for the observed n‐type conductivity. The shallow donors are suggested to be due to Si atoms on Al sites. The majority of them is assumed to be compensated by deep acceptors in the lower half of the band gap. (© 2007 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

High-energy frenkel cation exciton and specific features of its self-trapping in the CdI<Subscript>2</Subscript>-PbI<Subscript>2</Subscript> crystal system

It has been shown using atomic-force microscopy that the PbI₂ impurity is embedded in the CdI₂ crystal lattice in the form of nanocrystalline inclusions. The model of a high-energy cation exciton related to the ³ P ₂ state of a free Pb²⁺ ion has been considered for the impurity absorption (excitation) band at 3.23 eV. The resonance narrow photoluminescence bands with the split absorption band at 3.12 and 3.20 eV have been compared with the emission of a free Frenkel exciton. It has been demonstrated that, in the temperature range 25–45 K, there arises a self-trapped exciton state, and the main role in its formation is played by the bending vibrations of the CdI₂ crystal lattice. The potential barrier separating the self-trapped state from the free exciton is 23 meV. The photoluminescence band at 2.4 eV is assigned to the emission of the self-trapped high-energy cation exciton of PbI₂ in the CdI₂ crystal lattice.     

Electron statistics in CdF2 semiconductor crystals with DX centers

The degree of compensation and ionization energy of two-electron DX centers in CdF₂: In and CdF₂: Ga semiconductors are determined by studying the statistical distribution of electrons localized on impurity levels. The sharp temperature dependence of the concentration of neutral donors observed in CdF₂: Ga over the temperature range T = 250–400 K is explained by a high compensation degree, K ≥ 0.996. Thus, all Ga ions introduced into a CdF₂ crystal lattice during crystal growth form shallow donor levels. However, the concentration of Ga ions that can form bistable DX centers is rather low and is close to the concentration of electrons injected into the crystal during additive coloring. In CdF₂: In crystals, the degree of compensation is smaller than that in CdF₂: Ga but is sufficiently high and the number of bistable DX centers is not limited. It is concluded that an extremely narrow impurity band forms in the CdF₂: Ga semiconductor. For a total charged-impurity concentration of ～10²⁰ cm^?3, the width of the impurity band in CdF₂: Ga is not likely to exceed ～0.02 eV.     

Defect evolution and photoluminescence in anion-defective alumina single crystals exposed to high doses of gamma-rays

A method of luminescent UV and VUV spectroscopy was used to study the evolution of color centers in anion-defective alumina single crystals exposed to high doses of gamma-radiation. A sharp drop in the intensity of the emission bands and, therefore, the concentration of F⁺ and F-centers associated with the formation of aggregate F₂-type centers was found. The aggregate centers create an additional emission band in the range of (1.8–2.8) eV. When the crystals are exposed to middle and high doses, the photoluminescence (PL) intensity is the highest in the emission band of F₂²⁺-centers, which indicates a high concentration of the aggregates from singly charged oxygen vacancies (of F⁺-centers). When PL of the crystals exposed to high doses is excited with synchrotron radiation of the VUV range, a wide emission band in the red and near infrared (NIR) regions is registered. The centers related presumably to impurity defects, their aggregates and clusters consisting of several oxygen vacancies are responsible for this emission band.