Thickness dependent magnetic and structural properties of Co films grown on GaAs (100)

The structural, magnetic and transport properties measurements carried out on Co thin films deposited by electron beam evaporation on GaAs substrate as a function of layer thickness ranging from 50 Å to 1000 Å are presented here. Structural measurements show the film to be amorphous in nature at lower thickness which becomes crystalline at higher thickness. Magnetic measurements show an increase in saturation magnetization (M_S) with film thickness. M_S values are found to vary from 521 emu/cm³ to 1180 emu/cm³ for thicknesses ranging from 50 Å to 1000 Å. The coercivity and saturation field value shows a systematic decrease up to 600 Å thickness and increase thereafter. Various microstructural parameters were also calculated using GIXRR technique. A clear grain growth is observed in AFM technique with film thickness and its influence on transport properties was also seen. Different surface morphology and magnetic domain structures were obtained on different thin film samples by AFM and MFM techniques, respectively. XPS measurements reveal formation of CoAs phase at the interface between Co and GaAs. All these results are discussed and interpreted in detail in this communication.     

Dependence of magnetic anisotropy of the La0.67Ca0.33MnO3 films on substrate and film thickness

Strain in the La_0.67Ca_0.33MnO₃ films has been tuned by varying substrate and film thickness, and its effects on magnetic anisotropy are studied based on the measurements of isothermal magnetization. Measuring the strain in the films by the out-of-plane lattice parameter (c), we found a strong dependence of the magnetic anisotropy constant (Ku) on strain. Ku decreases linearly from ∼−1.1×10⁶ erg/cm³ for c=0.763 nm to 1.2×10⁶ erg/cm³ for c=0.776 nm, corresponding to a change from tensile strain to compressive strain. Positive Ku signifies a uniaxial anisotropy with the easy axis perpendicular to the film plane, while negative Ku demonstrates an anisotropy of the easy plane character. Smaller or larger c leads a decrease or increase in Ku, which indicates the presence of other effects in addition to those associated with strain. Three distinctive processes for the magnetization are observed along the hard magnetic axis of the films on (001)SrTiO₃, suggesting a possibility of strain relaxation even in ultra-thin films.     

Thickness induced magnetic anisotropic properties of Tb-Fe-Co thin films

The influence of Tb₂₅Fe₆₁Co₁₄ thin film thicknesses varying from 2 to 300 nm on the structural and magnetic properties has been systematically investigated by using of X-ray diffraction, scanning electron microscopy, transmission electron microscopy, magnetization, and magneto-optic Kerr effect microscopy measurements. Thin film growth mechanism is pursued and controlled by ex-situ X-ray refractometry measurements. X-ray diffraction studies reveal that the Tb₂₅Fe₆₁Co₁₄ films are amorphous regardless of thin films thicknesses. The magnetic properties are found to be strongly related to thickness and preferred orientation. With an increase in film thickness, the easy axis of magnetization is reversed from in-plane to out-of-plane direction. The change in the easy axes direction also affects the remanence, coercivity and magnetic anisotropy values. The cause for the magnetic anisotropy direction change from in-plane to out-of-plane can be related to the preferred orientation of the thin film which depends on the large out-of-plane coercivity and plays an important role in deciding the easy axes direction of the films. According to our results, up to the 100 nm in-plane direction is dominated over the whole system under major Fe-Fe interaction region, after that point, the magnetic anisotropy direction change to the out-of-plane under major Tb-Fe/Tb-Co interaction region and preferred orientation dependent perpendicular magnetic anisotropic properties become more dominated with 2.7 kOe high coercive field values.     

Modification of the “Transcritical” state in Ni<Subscript>75</Subscript>Fe<Subscript>16</Subscript>Cu<Subscript>5</Subscript>Mo<Subscript>4</Subscript> films produced by RF sputtering

The saturation magnetization, the perpendicular and rotational anisotropy constants, and the coercitivity of Ni₇₅Fe₁₆Cu₅Mo₄ thin magnetic films produced by rf sputtering are measured in the initial state and after annealing. A relation between the presence of perpendicular anisotropy and the “transcritical” state in the films is established. It is shown that, after additional thermal treatment, the magnetic softness of the films can be improved.     

Magnetic interface-anisotropy of amorphous iron in contact with nonmagnetic metals

The magnetic properties of very thin ferromagnetic Fe films (1–10 atomic layers) in contact with nonmagnetic amorphous metals are investigated. Apart from the demagnetization energy, which supports a magnetization in the film plane, an energy of magnetic anisotropy occurs in the interlayer, which has the tendency to turn the magnetization perpendicular to the surface. The anomalous Hall effect of the ferromagnetic films is used to investigate their magnetic properties. From the measurements we get the applied magnetic fieldB _s , which is necessary to turn the magnetization perpendicular to the film surface.B _s is, besides a constant term, proportional to 1/d, which is typical of surface effects and yields the energy of the interface anisotropy. The value of this energy is strongly dependent on the nonmagnetic metal and is smaller for the system Pb/Fe than for Sn/Fe. Furthermore, the experimental results show no drastic reduction of the atomic magnetic moment in the surface layer.     

Magnetization anisotropy of the Tm- and Fe-subsystems in Tm2Fe17

Magnetic and neutron diffraction measurements were carried out in order to study the spontaneous and induced spin-reorientation (SR) transition of the “easy axis–easy plane” type in the poly and single-crystalline samples of the hexagonal Tm₂Fe₁₇. We have determined the temperature dependence of the lattice parameters and the angle between the c-axis and the magnetic moment of the Tm-subsystem. We also find that the SR transition is accompanied by a large (about 20%) magnetization change of the Tm subsystem. In order to induce such a SR transition with the external magnetic field, μ₀H_cr=5 T is necessary to be applied along the hard-magnetization direction (the a-axis) at 4.2 K. The H_cr value decreases with an increasing temperature. The magnetization measurements demonstrate that at 10 K the saturation magnetization along the easy-magnetization direction (the c-axis) is smaller than that along the hard-magnetization direction. Based on this observation, we believe that Fe-subsystem of Tm₂Fe₁₇ is likely to have magnetization anisotropy.     

Collective magnetic response of inhomogeneous nanoisland FeNi films around the percolation transition

By using superconducting quantum interference device (SQUID) magnetometry, we investigated anisotropic high-field (H ? 7T) low-temperature (10 K) magnetization response of inhomogeneous nanoisland FeNi films grown by rf sputtering deposition on Sitall (TiO₂) glass substrates. In the grown FeNi films, the FeNi layer nominal thickness varied from 0.6 to 2.5 nm, across the percolation transition at the d _c ? 1.8 nm. We discovered that, beyond conventional spin-magnetism of Fe₂₁Ni₇₉ permalloy, the extracted out-of-plane magnetization response of the nanoisland FeNi films is not saturated in the range of investigated magnetic fields and exhibits paramagnetic-like behavior. We found that the anomalous out-of-plane magnetization response exhibits an escalating slope with increase in the nominal film thickness from 0.6 to 1.1 nm, however, it decreases with further increase in the film thickness, and then practically vanishes on approaching the FeNi film percolation threshold. At the same time, the in-plane response demonstrates saturation behavior above 1.5–2T, competing with anomalously large diamagnetic-like response, which becomes pronounced at high magnetic fields. It is possible that the supported-metal interaction leads to the creation of a thin charge-transfer (CT) layer and a Schottky barrier at the FeNi film/Sitall (TiO₂) interface. Then, in the system with nanoscale circular domains, the observed anomalous paramagnetic-like magnetization response can be associated with a large orbital moment of the localized electrons. In addition, the inhomogeneous nanoisland FeNi films can possess spontaneous ordering of toroidal moments, which can be either of orbital or spin origin. The system with toroidal inhomogeneity can lead to anomalously strong diamagnetic-like response. The observed magnetization response is determined by the interplay between the paramagnetic- and diamagnetic-like contributions.     

Effects of soft layer softness on the magnetic properties of perpendicular exchange-coupled nanocomposite films

The anisotropy of the soft layer in the Co_100−xPt_x/Co₇₁Pt₂₉ (x=0, 7 and 17) perpendicular exchange-coupled composite (ECC) films was varied by changing the Pt content. The effects of soft layer softness (thickness and anisotropy) on the coercivity and magnetization reversal mechanisms of ECC were studied. Results showed that both remanence ratio (M_r/M_s) and coercivity of the ECC films reduced with an increase in soft layer thickness. However, the rate of coercivity reduction reduced when soft layer anisotropy was increased simultaneously. This was confirmed by the following facts. For the ECC with Co soft layer, the magnetization reversal mechanism within the ECC grains changed from coherent rotation to domain wall motion when soft layer thickness was changed from 2 to 15 nm. The impact of soft layer thickness on the magnetization reversals of the ECC grains reduced with an increase in soft layer anisotropy. On the other hand, the change of soft layer easy axis direction could possibly change the reversal mechanism of the ECC grains. The above experimental results showed that the coercivity of ECC film was controlled by the reversal mechanism inside the ECC grains.     

Y-type hexagonal ferrites containing zinc,copper and cadmium: Magnetic properties and cation distribution

A complete magnetic and Mössbauer characterization has been worked out for the Y-type hexaferrites series with (Ba, Sr)₂Me₂Fe₁₂O₂₂ (Me = Zn, Cu, Cd) composition. The data relative to the dependence of the saturation magnetization, anisotropy, Curie temperature and cation distribution on composition and temperature could be logically interpreted as leading to the following conclusions. The magnetic order in Zn₂-Y is characterized by the presence of a “random flip” for which a quantitative model has been developed. The substitution of zinc with cadmium increases the spin flip, which, on the other hand, is reduced or eliminated by substitution of zinc with copper or of barium with strontium: the possibility of partially controlling the value of the saturation magnetization will follow. Also the planar anisotropy of Zn₂-Y can be controlled and finally turned into an axial one by substituting zinc with copper.     

Effect of the effective anisotropy field of soft layer on magnetic properties of soft/hard stacked media

Magnetic properties of soft/hard stacked perpendicular magnetic recording media were investigated using a two-moment model with taking account of demagnetizing energy. Demagnetizing energy of the soft layer may improve the uniformity of magnetic properties of the composite media and also decrease the interlayer thickness, although weaken the thermal stability a little. The application of high saturation magnetization (M_s) soft magnetic material as the soft layer may compensate for the undesirable contribution while maintaining its benefits.     

Soft magnetization of a semi-hard/soft magnetic bilayer produced by oblique-incidence evaporation

The possibility of achieving soft magnetization in semi-hard magnetic films such as Fe, Fe_93.5Si_6.5, Fe₅₀Co₅₀ and Fe₇₀Co₃₀ is investigated by depositing films on an Fe₂₀Ni₈₀ underlayer by oblique-incidence evaporation. The magnetic anisotropy of the underlayer is strengthened to a depth of several lattice parameters by vapor deposition of the film at an oblique angle to the substrate surface. This method also allows magnetic anisotropy to be induced in strongly isotropic semi-hard magnetic overlayers to a thickness of a few thousands Angstroms. The coercive force of bilayer films measured along the hard-axis is reduced remarkably by this process, and the strength of the anisotropy field is demonstrated to be readily controllable. When magnetic anisotropy exists in both magnetic layers, a significant change is observed in the magnetization processes of the semi-hard magnetic layer and the coercive forces in the hard magnetization direction is dramatically reduced. Soft magnetization of the semi-hard magnetic layer cannot be achieved when magnetic anisotropy exists in only one of the magnetic layers.     

Magnetic properties of a Pt/Co2FeAl/MgO structure with perpendicular magnetic anisotropy

Microstructures and magnetic properties of Ta/Pt/Co 2 FeAl（CFA）/MgO multilayers are studied to understand perpendicular magnetic anisotropy（PMA） of half-metallic full-Heusler alloy films.PMA is realized in a 2.5-nm CFA film with B2-ordered structure observed by a high resolution transmission electron microscope.It is demonstrated that a high quality interface between the ferromagnetic layer and oxide layer is not essential for PMA.The conversions between in-plane anisotropy and PMA are investigated to study the dependence of magnetic moment on temperature.At the intersection points,the decreasing slope of the saturation magnetization（M s） changes because of the conversions.The dependence of M s on the annealing temperature and MgO thickness is also studied.     

Thickness dependent magnetization dynamics of perpendicular anisotropy Co/Pd multilayer films

We present the measurements of the picosecond magnetization dynamics of Co/Pd multilayer films. The dynamic magnetization properties of sputtered multilayer films were analyzed as a function of Co layer thicknesses and applied bias field. Both the eigenfrequencies of the magnetization precession in the multilayers and the associated Gilbert damping exhibit extreme sensitivity to the magnetic layer thickness on an atomic monolayer scale. The eigenfrequency increases more than threefold when the Co thickness decreases from 7.5 to 2.8 Å, mainly due to the changes in effective saturation magnetization and perpendicular anisotropy constant. A concomitant 2.6-fold increase in the damping of the oscillations is observed and attributed to stronger interface dissipation in thinner Co layers. In addition, we introduce a quasi-1D micromagnetic model in which the multilayer stack is described as a one-dimensional chain of macrospins that represent each Co layer. This model yields excellent agreement with the observed resonance frequencies without any free parameters, while being much simpler and faster than full 3D micromagnetic modeling.     

Influence of the thickness on structural,magnetic and electrical properties of La0.7Ca0.3MnO3 thin film

We have studied the effect of thickness on the structural, magnetic and electrical properties of La_0.7Ca_0.3MnO₃ thin films prepared by pulsed laser deposition method using X-ray diffraction, electrical transport, magneto-transport and dc magnetization. X-ray diffraction pattern reflects that all films have c-axis epitaxial growth on LaAlO₃ substrate. The decrease in out-of-plane cell parameter specifies a progressive relaxation of in the plane compressive strain as the film thickness is increases. From the dc magnetization measurements, it is observed that ferromagnetic to paramagnetic transition temperature increases with increase in the film thickness. Magneto-resistance and temperature coefficient of resistance increases with film thickness and have maximum value near its metal to insulator transition temperature.     

Microwave magnetic properties of gadolinium-iron films

We have made ferromagnetic resonance measurements on Gd_1-xFe_x films, where x = 0 to 1. The saturation magnetization, g-value, the exchange stiffness constant, the magnetic damping parameter and some surface anisotropy parameters were determined. We find that the exchange decreases rapidly as the Fe content decreases. The g-values obey the Wangsness relation except near compensation. The exchange-conductivity linewidth broadening is minimal in this system.     

Effect of Cr on the magnetic properties of evaporated CoxCr1−x/Si(1 0 0) and CoxCr1−x/glass thin films

Series of Co_xCr_1−x thin films have been evaporated under vacuum onto Si(1 0 0) and glass substrates. Thickness ranges from 17 to 220 nm, and x from 0.80 to 0.88. Alternating gradient field magnetometer (AGFM) measurements provided saturation magnetization values ranging from 220 to 1200 emu/cm³. Values of squareness exceeding 0.8 have been measured. Coercive field may reach values up to 700 Oe, depending on the percentage of chromium, as well as the substrate nature and the direction of the applied magnetic field. The saturation magnetization value decreases as the Cr content increases. In order to study their dynamical magnetic properties, Brillouin Light Scattering (BLS) measurements have been performed on these samples. Stiffness constant value and anisotropy magnetic field were adjusted to fit the experimental BLS spectra. These results are analyzed and correlated.     

Magnetization processes of CuMn below the freezing temperature Tf

A simple classical model [5] that is based on a blocking of magnetic clusters in a uniaxial anisotropy field explains characteristic properties of magnetization processes of Cu(5–15 at.%) Mn as transition states between the “zero point magnetization” M₀ = M(T → OK) and the thermal equilibrium magnetization M_∞ = M(t → ∞, T). Further it shows two facts the experimental confirmations of which we report in this paper: (a) a magnetization decrease with increasing temperature in high fields and (b) a superposition rule for the magnetization processes in small fields and at low temperatures.     

Magnetization reversal in perpendicular exchange-biased multilayers

Co/Pt multilayers with perpendicular magnetic anisotropy exhibit an exchange bias when covered with an IrMn layer. The exchange bias field, which is about 7 mT for 3 Co/Pt bilayer repetitions and a Co layer thickness of 5 Å, can be increased up to 16.5 mT by the insertion of a thin Pt layer at the Co/IrMn interface. The interfacial magnetic anisotropy of the Co/IrMn interface (KSCo/IrMn =-0.09 mJ/m2) favours in-plane magnetization and tends to tilt the Co spins away from the film normal. Dynamical measurements of the magnetization reversal process reveal that both thermally activated spin reversal in the IrMn layer and domain wall nucleation in the Co/Pt multilayer influence the interfacial spin structure and therefore the strength of the perpendicular exchange bias field.     

真空磁场热处理温度对不同厚度的Ni88Cu12薄膜畴结构及磁性的影响

利用射频磁控共溅射方法,在Si衬底上制备了Ni88Cu12薄膜,并且研究了膜厚以及真空磁场热处理温度对畴结构和磁性的影响. X射线衍射结果表明热处理后的薄膜晶粒长大,扫描电子显微镜结果发现不同热处理温度下薄膜表现出不同的形貌特征.热处理前后的薄膜面内归一化磁滞回线结果显示,经过热处理的Ni88Cu12薄膜条纹畴形成的临界厚度降低,未热处理的Ni88Cu12薄膜在膜厚为210 nm时出现条纹畴结构,而经过300℃热处理的Ni88Cu12薄膜在膜厚为105 nm就出现了条纹畴结构.高频磁谱的结果表明,随着热处理温度的增加, Ni88Cu12薄膜的共振峰会有小范围的移动.     

Ferrimagnetic resonance spectra of magnetic bubble films at low microwave frequencies

Magnetic bubble films exhibit a number of ferrimagnetic resonance modes due to the spatial variation of the anisotropy. The resonance frequencies have been measured as a function of the applied bias fieldH ₀. In the lower field range the magnetization of the transient layer, which has negative anisotropy, is not yet parallel toH ₀. In this range the resonance frequencies are shifted to higher values due to pinning effects. In films grown by the vertical dipping method an additional layer on top of the transient layer is observed within which the magnetization rotates from the direction in the transient layer to that of the bulk of the film. In films grown by horizontal dipping no such layer could be detected. Each ferrimagnetic resonance mode excites transverse elastic waves in the film due to the magnetoelastic interaction and thus gives rise to elastic resonances of the whole crystal, film and substrate. These elastic resonances lead to a fine-structure of the ferrimagnetic resonances. The observed fine-structure vanishes periodically with frequency and from this behaviour the thickness of the magnetic film and of the transient layer has been determined.