Lateral force microscopy in low normal force limit

We have studied frictional force between SiN tip and Si surface by using lateral force microscopy. The cantilever we have used has very low stiffness of 0.006 N/m, and the normal force acting on the surface was much lower than the attractive force such as van der Waals force. In this low normal force limit, it was found that the frictional force did not depend on the normal force. We suggest a calibration method to estimate the attractive force from the lateral force data in this limit. The estimated attractive force between Si sample and SiN tip with radius of 10 nm was 0.4 nN in flat region and 0.65 nN at the corner of a rectangular hole.     

Pseudo-non-contact AFM imaging?

Recent non-contact atomic force microscopy studies have demonstrated that imaging of single atom defects is possible. However, the imaging mechanism was unclear. Long-range forces of attraction, which are normally associated with non-contact mode, are not known to produce sufficient lateral resolution to image atoms. In this study, we suggest a mechanism that could be responsible for the resolution achieved. We use realistic interatomic interaction parameters to do numerical simulations. These simulations are in good agreement with experimental data. As a result, we are able to ‘separate' the attractive and repulsive forces acting between the AFM tip and the sample surface. Calculations indicate that the force responsible for image contrast in the experimental studies mentioned above, is in most cases the repulsive contact force, and not the long-range attractive force. We check our conclusions against a variety of interatomic interaction parameters and our results remain valid for any reasonable set of such parameters, including the power law of the attractive potential N<9.     

Imitation of non-contact mode while scanning in the presence of an electric double layer?

Non-contact atomic force microscopy (NCAFM) minimizes the physical interaction between the AFM tip and the surface of interest. Several recent studies have reported observation of single atom defects using this technique. The repulsive force is presumably the primary interatomic force (cf. our paper on pseudo-non-contact mode in this issue) responsible for the reported atomic resolution in these studies. The combination of these factors, minimal tip–sample deformation and repulsive force interaction, are responsible for the observation of the single atom defects. In the present study, we show that similar resolution can be achieved utilizing the same two factors but which employs scanning in a surfactant. The method decreases the tip–sample interaction by eliminating the attractive forces between the tip and sample. The surfactant solution induces an electrical double-layer (EDL) on the surface of the tip and sample. This EDL creates additional repulsion that is distributed over a large area, and hence does not contribute noticeably to the image contrast during scanning. However, it does compensate for the high pressures normally experienced by the tip in the absence of surfactant. In addition, the presence of the EDL enhances tip stability during the image scan. This method has been tested on surfaces of such minerals as mica, chlorite, and anhydrite.     

A new approach to the evaluation of Casimir and van der Waals forces in the transition region

This paper studies the incorporation of Casimir and van der Waals forces applied to a nanostructure with parallel configuration. The focus of this study is in a transition region in which Casimir force gradually transforms into van der Waals force. It is proposed that in the transition region, a proportion of both Casimir and van der Waals forces, as the interacting nanoscale forces, can be considered based on the separation distance between upper structure and substrate during deflection. Moreover, as the separation distance descends during deflection, the nanoscale forces could transform from Casimir to a proportion of both Casimir and van der Waals forces and so as to van der Waals. This is also extended to the entire surface of the nanostructure in such a way that any point of the structure may be subjected to Casimir, van der Waals or a proportion of both of them about its separation distance from the substrate. Therefore, a mathematical model is presented which calculate the incorporation of Casimir and van der Waals forces considering transition region and their own domination area. The mechanical behavior of a circular nano-plate has been investigated as a case study to illustrate how different approaches to nanoscale forces lead to different results. For this purpose, the pull-in phenomena and frequency response in terms of magnitude have been studied based on Eringen nonlocal elasticity theory. The results are presented using different values of the nonlocal parameter and indicated in comparison with those of the classical theory. These results also amplify the idea of studying the mechanical behavior of nanostructures using the nonlocal elasticity theory.     

Dynamic scanning force microscopy at low temperatures on a van der Waals surface: graphite (0001)

The (0001) surface of highly oriented pyrolytic graphite is studied by scanning force microscopy in both contact and dynamic mode. Low temperatures were necessary for the dynamic mode measurements in order to achieve the required signal to noise ratio. At 22 K, atomic scale structures with 2.46 Å periodicity and trigonal symmetry of the individual maxima were obtained in both modes. Since graphite exhibits a van der Waals surface in good approximation, this result shows that comparatively weak forces of van der Waals type are sufficient for successful imaging in the dynamic mode on the atomic scale. However, since the positions of the observed maxima correspond to the ones found by scanning tunneling microscopy and contact scanning force microscopy, but not to the positions of the carbon atoms, it also opens new questions on the imaging mechanism in the dynamic mode.     

Distance dependence of noncontact-AFM image contrast on Si(111) × –Ag structure

Atomic resolution imaging of the Si(111) × R30°–Ag surface was investigated using a noncontact atomic force microscopy (NC-AFM) in ultrahigh vacuum. NC-AFM images showed three types of contrasts depending on the distance between an AFM tip and a sample surface. When the tip–sample distance was about 1–3 Å, the images showed the honeycomb arrangement with weak contrast. When the tip–sample distance was about 0–0.5 Å, the images showed the periodic structure composed of three bright spots with relatively strong contrast. On the other hand, the contrasts of images measured at the distance of 0.5–1 Å seemed to be composed of the above-mentioned two types of contrasts. By comparing the site of bright spots in the AFM images with honeycomb-chained trimer (HCT) model, we suggested the following models: when the tip is far from the sample surface, tip–sample interaction force contributing to imaging is dominated by physical bonding interaction such as Coulomb force and/or van der Waals (vdW) force between the tip apex Si atoms and Ag trimer on the sample surface. On the other hand, just before the contact, tip–sample interaction force contributing to imaging is dominated by chemical bonding such as the force due to hybridization between the dangling bond out of the tip apex Si atom and the orbit of Si–Ag covalent bond on the sample surface.     

True atomic resolution imaging of surface structure and surface charge on the GaAs(110)

We demonstrated a novel method to detect the van der Waals and the electrostatic force interactions simultaneously on an atomic scale, which is based on frequency modulation detection method. For the first time, the surface structure and the surface charge at atomic-scale point defects on the GaAs(110) surface have been simultaneously resolved with true atomic resolution under ultra-high vacuum condition. From the bias voltage dependence of the image contrast, we can verify that the sign of the atomically resolved surface charge at the point defect was positive.     

Tip and surface properties from the distance dependence of tip-surface interactions

Macroscopic "background" interactions, such as van der Waals and electrostatic forces, determine the frequency change in non-contact atomic force microscopy (NC-AFM). We demonstrate that by analysing the distance dependence of these interactions one can extract more information about the tip radius, charge and chemical composition, as well as about the surface charging and conductivity. For this purpose we calculate the interaction of different NC-AFM tips with a charged and neutral CaF₂ (111) surface and with an ideal metal surface. Force versus distance curves demonstrate a remarkably different behaviour, especially at long distances, dependent on whether the tip is conductive, oxidised or charged. Comparison with experimental curves proves that this analysis can predict tip properties.     

Electrostatic and van der Waals forces in the air contact between the atomic force microscope probe and a conducting surface

Electrostatic and van der Waals forces of interaction between commercial probes of atomic force microscopes (AFMs) and conducting surfaces under atmospheric conditions are measured using contact atomic force microscopy. An algorithm of statistical processing of the initial photocurrent-displacement dependences is developed, which makes it possible to transform these dependences into the force-distance dependences. The Hamaker constant at the platinum (probe)-graphite (sample) contact is determined. It is shown that the measurement of electrostatic forces makes it possible to determine geometrical parameters of the AFM probe and to independently calibrate the stiffness of the cantilever.     

Application of atomic force microscopy to microbial surfaces: from reconstituted cell surface layers to living cells.

The application of atomic force microscopy (AFM) to probe the ultrastructure and physical properties of microbial cell surfaces is reviewed. The unique capabilities of AFM can be summarized as follows: imaging surface topography with (sub)nanometer lateral resolution; examining biological specimens under physiological conditions; measuring local properties and interaction forces. AFM is being used increasingly for: (i) visualizing the surface ultrastructure of microbial cell surface layers, including bacterial S-layers, purple membranes, porin OmpF crystals and fungal rodlet layers; (ii) monitoring conformational changes of individual membrane proteins; (iii) examining the morphology of bacterial biofilms, (iv) revealing the nanoscale structure of living microbial cells, including fungi, yeasts and bacteria, (v) mapping interaction forces at microbial surfaces, such as van der Waals and electrostatic forces, solvation forces, and steric/bridging forces; and (vi) probing the local mechanical properties of cell surface layers and of single cells.     

Hexagonal boron nitride film substrate for fabrication of nanostructures

The fabrication of material with an atomic scale manipulation requires the suitable advanced substrate for epitaxial growth without the effect by the substrate lattice structure. Hexagonal boron nitride (h-BN) can be the advanced substrate for atomic manipulation due to van der Waals’ gap with little attractive force along to c axis. We have successfully synthesized h-BN layer on the co-deposited Cu/BN film by surface segregation phenomena using helicon wave plasma enhanced radio frequency (rf) magnetron sputtering system. Auger electron spectroscopy (AES) and X-ray photon spectroscopy (XPS) analysis showed that the h-BN composite segregated on the surface of Cu/BN film covered over 95% of the film annealed at 900 K for 30 min. Atomic forces microscopy (AFM) and scanning tunneling microscopy (STM) analysis showed that attractive force on the film surface is uniformly distributed to an extent of 2nN and that the h-BN surface can be a good electric insulator like sintered h-BN plate.     

Modeling and simulating of V-shaped piezoelectric micro-cantilevers using MCS theory considering the various surface geometries

Atomic force microscopy (AFM) is widely used as a tool in studying surfaces and mechanical properties of materials at nanoscale. This paper deals with mechanical and vibration analysis of AFM vibration in the non-contact and tapping modes for V-shaped piezoelectric micro-cantilever (MC) with geometric discontinuities and cross section variation in the air ambient. In the vibration analysis, Euler-Bernoulli beam theory based on modified couple stress (MCS) theory has been used. The governing equation of motion has been derived by using Hamilton's principle. By adopting finite element method (FEM), the MC differential equation has been solved. Damping matrix was considered in the modal space. Frequency response was obtained by using Laplace transform, and it has been compared with experimental results. Newmark algorithm has been used based on constant average acceleration to analyze time response of MC, and then time response results in the vibration mode, far from the sample surface have been compared with experimental data. In vicinity of sample surface, MC is influenced by various nonlinear forces between the probe tip and sample surface, including van der Waals, contact, and capillary forces. Time response was examined at different distances between MC base and sample surface, and the best distance was selected for topography. Topography results of different types of roughness showed that piezoelectric MC has been improved in the air ambient. Topography showed more accurate forms of roughness, when MC passes through sample surface at higher frequencies. The surface topography investigation for tapping and non-contact modes showed that using of these two modes are suitable for topography.     

基于扫描电子显微镜的碳纳米管拾取操作方法研究

碳纳米管场效应管是未来纳米器件的发展方向,而制造纳米器件的前提是拾取碳纳米管,基于扫描电子显微镜(SEM)的微纳机器人操作系统能够实现碳纳米管拾取操作.本文建立拾取操作中碳纳米管与原子力显微镜(AFM)探针间范德瓦耳斯力力学模型,不同接触状态下范德瓦耳斯力越大越有利于拾取碳纳米管.在SEM视觉反馈图像中建立相对坐标系,首先提出倾角变值方法检测碳纳米管与AFM探针的接触状态,然后运用动态差值方法识别碳纳米管与AFM探针空间位姿并校正碳纳米管位姿,最后自下而上拾取碳纳米管.实验结果表明:拟合直线倾角变值较大时碳纳米管与AFM探针发生接触,动态差值变化为零时碳纳米管与AFM探针为空间线接触,在完全线接触模型下选择合适的接触角度、接触长度和拾取速度能够成功拾取碳纳米管.     

亚微米燃烧源颗粒物间的相互作用研究

采用微观可视化的高速摄像技术直接观察了燃烧源亚微米颗粒物间的相互作用形态,发现了亚微米颗粒间存在“吸引-旋绕-排斥”形态的相互作用。通过颗粒受力分析,认为传统所考虑的曳力、重力、库仑力、范德华力不能解释这种相互作用．根据亚微米颗粒荷电的不均匀性特征提出颗粒静电力应包括净电荷库仑力和感应偶极子间作用力两部分．感应偶极子间作用力是近程力,具有径向和周向两个方向,在颗粒比较接近的时候迅速增大,并能导致颗粒之间相互旋绕和排斥。该力与上述几种力综合起来可以很好地解释实验发现的这种颗粒相互作用形态。     

Mechanical effect of van der waals interactions observed in real time in an ultracold Rydberg gas

We present time-resolved spectroscopic measurements of Rydberg-Rydberg interactions between two Rydberg atoms in an ultracold gas, revealing the pair dynamics induced by long-range van der Waals interactions between the atoms. By detuning the excitation laser, a specific pair distribution is prepared. Penning ionization on a microsecond time scale serves as a probe for the pair dynamics under the influence of the attractive long-range forces. Comparison with a Monte Carlo model not only explains all spectroscopic features but also gives quantitative information about the interaction potentials. The results imply that the interaction-induced ionization rate can be influenced by the excitation laser. Surprisingly, interaction-induced ionization is also observed for Rydberg states with purely repulsive interactions.     

范德瓦尔斯磁性材料CrOCl变磁性相变的磁力显微镜研究

近年来,二维范德瓦尔斯磁性材料因为在自旋电子学的应用前景而吸引了广泛的关注.CrOCl是一种范德瓦尔斯磁性材料,理论预言其单层具有高达160 K的居里温度,因此吸引了广泛的关注。为了更好的理解这一材料的磁性,我们利用磁力显微镜研究了CrOCl变磁性相变中磁畴结构随磁场的变化。实验发现,在2K下CrOCl样品表面出现随磁场变化的方格条纹,给出了变磁性相比中反铁磁相和铁磁相竞争的图样,并通过二维快速傅里叶变换证实了CrOCl磁性的各向异性。我们的结果为后续研究CrOCl薄层的磁性提供了参考依据。     

Sensing dipole fields at atomic steps with combined scanning tunneling and force microscopy

The electric field of dipoles localized at the atomic steps of metal surfaces due to the Smoluchowski effect were measured from the electrostatic force exerted on the biased tip of a scanning tunneling microscope. By varying the tip-sample bias the contribution of the step dipole was separated from changes in the force due to van der Waals and polarization forces. Combined with electrostatic calculations, the method was used to determine the local dipole moment in steps of different heights on Au(111) and on the twofold surface of an Al-Ni-Co decagonal quasicrystal.     

Force spectroscopy of bonds that form between a Staphylococcus bacterium and silica or polystyrene substrates

Inter- and intra-molecular forces are the driving forces responsible for the creation of an interface between a microorganism and a naturally occurring mineral or man-made material. We have used atomic force microscopy to directly measure forces between a Staphylococcus aureus bacterium and each of two materials (silica and polystyrene) in an electrolyte solution. Force “spectra” were collected by placing a glass or polystyrene bead (10 μm diameter) in contact with a living cell and then pulling the two surfaces apart. An attractive, adhesion force was observed in approximately 40 and 50% of the measurements for silica and polystyrene, respectively. The strength of the adhesion bond was 38 ± 4 pN (10⁻¹² N) and 52 ± 9 pN for glass and polystyrene, respectively. The origin of the attractive interaction appears to be non-specific (e.g., van der Waals force) although a small number (2–3%) of force spectra contained distinct sawtooth like profiles indicative of a protein bond between S. aureus and glass or polystyrene.     

Molecular forces caused by the confinement of thermal noise

We have investigated spontaneous surface instabilities of very thin polymer films. Film stability and the wavelength of the dominating unstable mode were found to depend sensitively on the media adjacent to the film. Our experimental results cannot be explained by van der Waals interactions alone. To account for the presence of an additional destabilizing force, we propose that the geometrical confinement of thermally excited acoustic waves gives rise to a force that is strong enough to destabilize thin films. This thermoacoustic effect is of similar magnitude as van der Waals forces.     

Ultrasonic resonance regulated near-field scanning optical microscope and laser induced near-field optical-force interaction

We have developed a novel sample-tip regulation for a near-field optical microscope: an ultrasonic resonance regulation method. The regulation range is from 0 to 50 nm. It shows not only stability, simplicity in construction, but also versatility in vacuum, magnetic field, and low temperature environments. The main advantage of this technique is that it is a non-optical detecting scheme, which is very important for near-field spectroscopy. Such construction can also be used as a force microscope to study the topography of insulating samples. The laser light induced force interaction in the near-field range has been observed for the first time, showing that aided by laser radiation, the shear force between sample and tip can be changed depending on the type of sample. This can be interpreted as the light induced optical tip-sample interaction of light pressure effect. The van der Waals dispersion energy and the optical binding energy induced by laser beam between dielectric tip and samples play important role. The effect confirms a theoretical prediction. This new technique and phenomenon will add new aspects to near-field optics.