石英晶体双折射率紫外至近红外波段色散特性实验的研究

介绍了偏光干涉测量石英晶体双折射率色散特性及其相关数据处理方法。利用偏光干涉光谱极值点的精确判断,完成极值点波长对应的材料的双折射率的测量,获得了紫外至近红外光波段石英晶体的最大双折射率与波长关系离散的数据曲线,经多项式拟合数据处理,进而得到任意波长的双折射率函数关系式。此方法对其它各向异性晶体材料的双折射率色散特性的研究同样适应。     

测量晶体最大双折射率温度系数的偏光干涉法

介绍了测量晶体的最大双折射率温度系数的偏光干涉法. 利用分光光度计测量出不同温度下晶体波片的偏光干涉谱. 通过对不同温度下谱线极值点所对应波长的精确判断,准确计算出相应的最大双折射率,并由曲线拟合得到最大双折射率温度系数的表达式. 测量的双折射率精度可达到10-5.     

石英波片偏光干涉谱的研究

根据石英晶体双折射率的色散特性,对石英波片的偏光干涉谱进行了理论分析和数值模拟,提出了一种石英波片延迟量和厚度的偏光干涉标定法。即由偏光干涉谱,可以得出石英波片在200~2000 nm宽光谱范围内的延迟量;通过对长波段的偏光干涉谱极值波长的精确判断,可以准确地计算出该石英波片的厚度。利用Lambda900紫外-可见-近红外分光光度计对一片石英波片的偏光干涉谱进行了测量。在波长精度为0.1 nm的情况下,测量的厚度精度为0.1μm。误差分析结果表明,通过提高光谱的最小分辨力及选择较长的光谱波段进行测量计算,可以有效地降低误差。     

椭偏法测量云母波片相位延迟量及双折射率(英文)

为了得到云母波片的相位延迟量和双折射率随波长的变化关系,利用椭偏光谱仪连续测量了云母波片在400～770nm光谱范围内的延迟量.在对云母波片进行校准后,测量的数据被光电探测器收集并输送到计算机,根据输出的数据可以得到云母波片的相位延迟量随波长的变化.利用测得的延迟量计算出了云母波片在一定光谱范围内的双折射率,得到了云母波片的双折射率色散曲线,并通过拟合得到了双折射率色散公式.该方法能测量任意波片的相位延迟量,并且具有测量方便、周期短、精度高等特点.     

椭偏法测量云母波片相位延迟量及双折射率

为了得到云母波片的相位延迟量和双折射率随波长的变化关系,利用椭偏光谱仪连续测量了云母波片在400~770 nm光谱范围内的延迟量.在对云母波片进行校准后,测量的数据被光电探测器收集并输送到计算机,根据输出的数据可以得到云母波片的相位延迟量随波长的变化.利用测得的延迟量计算出了云母波片在一定光谱范围内的双折射率,得到了云母波片的双折射率色散曲线,并通过拟合得到了双折射率色散公式.该方法能测量任意波片的相位延迟量,并且具有测量方便、周期短、精度高等特点.     

石榴石外延膜色散关系的确定和膜厚的测量

本文提出了确定石榴石外延膜的色散关系和测量膜厚的一种方法。充分利用分光光度计获得的透射光谱,在波长大于2μm,因而膜和衬底的吸收及色散近于可忽略时,由透过率的极值计算得到相应波长下膜的折射率。按干涉条件计算并推定出所有干涉极值的干涉级数,进而算出各干涉极值波长下膜的折射率。最后用最小二乘法求得科希色散公式的系数,从而得到该膜的色散关系。利用此色散关系就可计算膜厚。 关键词：     

一种新型的基于四孔单元光子晶体光纤的设计与分析

设计了一种基于四孔单元的光子晶体光纤,它可以满足光通信系统中高双折射率、负色散和低限制损耗的要求,比起通常的三角结构光纤有着更高的双折射率,并且结构制作也较简单。采用全矢量有限元法和各项异性完美匹配层法对所设计的光纤进行了仿真研究。仿真结果表明:该光纤在1.55μm波长处可获得10~(-2)数量级的双折射率,在较宽广的波段范围具有大的负色散,限制损耗低于10~(-9)dB/m;该光纤在保偏光纤、单极化单模光纤、色散补偿光纤等方面具有重要的应用。     

基于马赫-曾德干涉仪的色散转折效应及其传感性能模拟研究

设计了工作在近红外波段的硅基马赫-曾德尔干涉仪(MZI)折射率传感器。理论和仿真模拟分析表明,通过改变MZI的结构参数可以对输出干涉谱的色散转折特性进行调控,经过优化后色散转折点(DTP)所对应的波长可以调至近红外波段(1550 nm),通过改变MZI周围的环境折射率(SRI)可以使折射率灵敏度达到37500 nm/RIU。由于DTP两侧的干涉条纹对外界折射率响应有相反的特性,将干涉波谷的相对漂移量作为检测对象,能够将灵敏度提高2倍,即75000 nm/RIU。不同于常规基于光栅和波导耦合构架的DTP传感器,所设计的DTP结构中两个干涉模式互不相关且均可独立调控,并可根据需要灵活调控色散转折波长。     

一种基于模间干涉的亚波长直径光纤气体折射率传感

设计了一种基于模间干涉的亚波长直径光纤气体折射率传感方案,并分析了其测量灵敏度.将标准单模光纤和一段仅传输基模与二阶模的无包层亚波长直径光纤结合形成传感头,通过分析传感头外气体折射率的变化对两个模式干涉谱峰值移动的影响,研究了这种传感器的折射率测量灵敏度.结果表明,这种传感器的灵敏度高于利用折射率引导型光子晶体光纤的基于模间干涉的折射率传感器.因为没有气体向微孔扩散的过程,这种基于模间干涉的亚波长光纤折射率传感器可用于实时探测.     

温度可控极高负色散光子晶体光纤的研究

设计了一种温度调控的液晶填充光子晶体光纤,利用有限元法对光子晶体光纤的色散补偿特性进行数值模拟.从理论上分析了各结构参数对光子晶体光纤色散产生的影响,并进行结构参数优化.通过调节液晶折射率,将色散补偿位置精确调节至1 550nm处,负色散峰值为-426 000ps·nm~(-1)·km~(-1),2m长液晶填充光子晶体光纤可以补偿50 000m的标准单模光纤(G652).模拟结果显示,色散补偿波长随填充液晶有效折射率指数发生变化,通过温度调节可以实现1 533nm~1 552nm波长内的定量控制.     

Temperature sensing using the spectral interference of polarization modes in a highly birefringent fiber

The spectral interference of polarization modes in a highly birefringent (HB) fiber to measure temperature is analyzed theoretically and experimentally. A tandem configuration of a birefringent delay line and a sensing HB fiber is considered and the spectral interferograms are modelled for the known birefringence dispersion of the HB fiber under test. As the delay line, a birefringent quartz crystal of a suitable thickness is employed to resolve a channeled spectrum. The channeled spectra are recorded for different temperatures and the polarimetric sensitivity to temperature, determined in the spectral range from 500 to 850 nm, is decreasing with wavelength. It is demonstrated that the temperature sensing is possible using the wavelength interrogation, i.e., the position of a given interference maximum is temperature dependent. The temperature sensitivity of the HB fiber under test is −0.25 nm/K and the resolution is better than 0.5 K.     

高双折射光子晶体光纤中均匀布拉格光栅的特性

研究了具有高双折射的光子晶体光纤(HB PCF)中均匀布拉格光栅(FBG)的光谱特性。利用紧凑的超格子模型,对光子晶体光纤的传输特性进行分析,研究正向传输和反向传输的模式之间的耦合规律,从而研究写入光子晶体光纤中的均匀布拉格光栅的特性。首先给出具有C6v对称性的零双折射光子晶体光纤中光纤布拉格光栅的布拉格波长λB随光纤结构参量的变化规律;然后分析一种高双折射光子晶体光纤中的光纤布拉格光栅的光谱特性,高双折射使两个不同偏振态的反射峰分开较大;最后分析了一种常用的双模双折射光子晶体光纤中光纤布拉格光栅的光谱特性,LP01模和LPe11模的两个偏振态对应的反射谱都由于高双折射而分开。     

V型高双折射光子晶体光纤超连续谱产生的实验研究

高非线性高双折射光子晶体光纤是超连续谱产生的最有效介质之一, 因此本文选取V型光子晶体光纤作为研究对象. 通过多极理论数值模拟的结果, 确定V型光纤具有高双折射、高非线性等特性. 通过实验手段, 发现入射光中心波长和光纤的双折射效应对产生的超连续谱有很大的影响: 当入射光波长处于光子晶体光纤大的反常色散区时, 脉冲相对展得比较宽, 长轴要比短轴方向的超连续谱更宽, 频谱成分更加丰富. 在同一波长下光偏振方向越接近45°时, 超连续谱谱宽范围越大. 随着入射脉冲功率的增加, 超连续谱展得越宽, 但是当功率比较大时会达到功率饱和. 关键词： 光子晶体光纤 高双折射 多极理论 超连续谱     

Interference of white light in tandem configuration of birefringent crystal and sensing birefringent fiber

Spectral interference of white-light beams propagating through a tandem configuration of birefringent crystal and sensing birefringent fiber is analyzed theoretically and experimentally. The spectral interference law is expressed analytically under the condition of a Gaussian response function of a spectrometer taking into account the dispersion of birefringence in the crystal and in the fiber. Two types of spectral interferograms are modeled knowing dispersion characteristics of the sensing fiber and using a quartz crystal of the positive or a calcite crystal of the negative birefringence. The theoretical analysis is accompanied by two experiments employing a highly birefringent fiber and a birefringent quartz crystal of two suitable thicknesses. Within both experiments the spectral interference fringes are resolved in accordance with the theory with phases dependent on the fiber length.     

Optical path difference evaluation of the polarization interference imaging spectrometer

The optical path difference (OPD) of the static polarization interference imaging spectrometer and wide-field-of-view polarization interference imaging spectrometer are calculated and analyzed, simultaneously. The analysis results show that the actual total OPD contains two parts, the Savart polariscope introduces the first part, and the second part is introduced when imaging lens reunites two beams in its focal plane. Since the first part OPD accounts for about half of the actual total OPD, it has influences on the resulting spectrum and thus cannot be neglected. The influences of the uniaxial crystal dispersion on the OPD and resulting spectrum are analyzed, and the results show that the OPD decreased with the wavelength, the spectral resolution increased with the wavelength. There are no fixed spectral resolution over the entire detection spectral region, and the spectral resolution would become worse with the increase of the wavelength.     

Polarization-dependent two-color dispersion wave generation and evolution in polarization-maintaining photonic crystal fiber

We investigate the effect of the polarization state of the input pulses on the visible emissions in the anomalous dispersion region of polarization-maintaining photonic crystal fiber (PM-PCF), by using ～100 fs pump pulses whose central wavelength (1064 nm) is close to the second zero dispersion wavelength (1100 nm) of the fiber, where the soliton fission mechanisms play an important role. The experimental results show that the phase-matching two-color dispersive wave emission, one at 582 nm and the other at 600 nm, is polarization-dependent and frequency shift results from the different dispersion characteristics along the two orthogonal principal axes of PM-PCF. Furthermore, it is observed for the first time that the variation of the linear input polarization angles in 45° region almost has no influence on the output spectral profiles, and the break variation of the output spectrum exists when the angle between the polarization of the linear incident pulse and the fast-axis or the slow-axis of PM-PCF is 45°, which are attributed to the coupling between the two polarization modes in high birefringent PM-PCF.     

超短光脉冲在双折射光子晶体光纤中产生超连续谱的偏振特性数值分析

采用矢量耦合非线性薛定谔方程描述了超短光脉冲在双折射光子晶体光纤中的传输过程,并利用分步傅里叶方法求解该方程。数值模拟了中心波长为1550nm的超短光脉冲在不同色散参量的双折射光子晶体光纤中超连续谱的产生及其偏振特性。分析了光纤在不同色散区时,高阶色散和非线性效应对超连续谱及其偏振态的影响。结果表明,当超短光脉冲波长位于近光纤零色散点的反常色散区时,比其在光纤正常色散区和远离光纤零色散点的反常色散区更容易产生宽且平坦的超连续谱,所得到的光谱显示出了复杂的偏振态特性。     

A spectroscopic method for determining thickness of quartz wave plate

A spectroscopic method to determine thickness of quartz wave plate is presented. The method is based on chromatic polarization interferometry. With the polarization-resolved transmission spectrum (PRTS)curve, the phase retardation of quartz wave plate can be determined at a wide spectral range from 200 to2000 nm obviously. Through accurate judgment of extreme points of PRTS curve at long-wave band, the physical thickness of quartz wave plates can be obtained exactly. We give a measuring example and the error analysis. It is found that the measuring precision of thickness is mainly determined by the spectral resolution of spectrometer.