Effects of gold‐induced crystallization process on the structural and electrical properties of germanium thin films

Gold‐induced (Au‐) crystallization of amorphous germanium (α‐Ge) thin films was investigated by depositing Ge on aluminum‐doped zinc oxide and glass substrates through electron beam evaporation at room temperature. The influence of the postannealing temperatures on the structural properties of the Ge thin films was investigated by employing Raman spectra, X‐ray diffraction, and scanning electron microscopy. The Raman and X‐ray diffraction results indicated that the Au‐induced crystallization of the Ge films yielded crystallization at temperature as low as 300°C for 1 hour. The amount of crystallization fraction and the film quality were improved with increasing the postannealing temperatures. The scanning electron microscopy images show that Au clusters are found on the front surface of the Ge films after the films were annealed at 500°C for 1 hour. This suggests that Au atoms move toward the surface of Ge film during annealing. The effects of annealing temperatures on the electrical conductivity of Ge films were investigated through current‐voltage measurements. The room temperature conductivity was estimated as 0.54 and 0.73 Scm⁻¹ for annealed samples grown on aluminum‐doped zinc oxide and glass substrates, respectively. These findings could be very useful to realize inexpensive Ge‐based electronic and photovoltaic applications.     

Thermal Decomposition Studies of Organoplatinum Films

 This study examines the thermal decomposition of 1,5-cyclooctadiene platinum (II) chloride organometallic films, deposited by thermal evaporation. The thin film samples were annealed both in air and hydrogen with well-controlled temperature regimes. After annealing, the decomposed thin films were examined by AFM and STM scanning probe, XPS and TEM microbeam analytical techniques. The experimental results confirm that the thermal decomposition products on silicon substrates are composed predominantly of metallic platinum. Annealing in hydrogen can reduce substantially the decomposition temperature of the material from around 250 to 160 °C but the surface morphology of the decomposed films is significantly different to those annealed in air. The metallic nature of the thermally decomposed films was confirmed by bonding configuration recognition, electronic property probing and microstructure analysis.     

Nanostructuring at the surface of low‐energy lead‐implanted silicon by electron beam annealing

Low‐energy lead ion implantation and high‐temperature electron beam annealing were used to study the potential of producing Pb nanostructures on Si. Pb⁺ ions were implanted at high dose into p‐type (100) Si to the depth of 8.0 nm. The implanted samples were annealed under high vacuum conditions with an electron beam at 200–700 °C for 15 s. Rutherford Backscattering Spectrometry (RBS) shows rapid out‐diffusion of Pb atoms above 400 °C. However, some Pb atoms are still present in the near‐surface region after annealing the implanted samples at 700 °C. Lead nanostructures were found on samples annealed above 300 °C. Annealing the samples at 450 °C causes the formation of nanostructures as tall as 4.1 ± 0.1 nm. Many of these are arranged in ‘web‐like’ strings that extend over micrometer distances. Occasionally, much larger nano‐features (as wide as 500 nm in diameter, average height of 1.5 nm) appear in the centre of the strings. Annealing samples well above the melting point of lead results in randomly distributed small nanometer‐sized Si nano‐dots. Copyright © 2008 John Wiley & Sons, Ltd.     

Microstructure of nickel nanoparticles embedded in carbon films: case study on annealing effect by micromorphology analysis

The presented study is aimed at analyzing the surface texture of amorphous hydrogenated carbon layers containing nickel nanoparticles (Ni‐NPs@a‐C:H) within their structure, which were deposited by Radio Frequency (RF) sputtering and RF‐Plasma Enhanced Chemical Vapor Deposition (RF‐PECVD) methods on glass substrates. Prepared films were then used as research material following their annealing at two different temperatures of 250 °C and 350 °C in an inert argon atmosphere. Series of height samples were taken with the help of atomic force microscopy (AFM) operating in a non‐contact mode and examined in order to determine their fractal characteristics. Raw AFM data were first plane‐fitted to remove the surface bow exhibiting the so‐called residual surface, and then numerically processed to calculate the Areal Autocorrelation Function (AACF), which was later used to compute the Structure Function (SF). The log–log plots of the latter served for calculation of fractal properties of surfaces under investigation, including fractal dimension D, and pseudo‐topothesy K. The analysis of 3‐D surface texture helps to understand their essential characteristics and their implications as well as graphical models and their implementation in computer simulation. Copyright © 2016 John Wiley & Sons, Ltd.     

Superhydrophilic/superhydrophobic surfaces fabricated by spark‐coating

In this study, the authors researched the preparations of superhydrophilic/superhydrophobic surfaces on commercial cup stock polyethylene coated papers by using sparked aluminum nanoparticles deposited on substrates through a sparking process. In this stage, the surface was porous and showed superhydrophilic properties. The samples were then annealed in air at various temperatures and some transformed to superhydrophobicity. It is well known that a suitable roughness in combination with low surface energy has been required to obtain superhydrophobic surfaces. Therefore, it is believed that during annealing process, when polyethylene is diffused from the substrate through the nanoparticle films and the superhydrophobic characteristics were created. The scanning electron microscope images showed that the film surfaces had a fluffy structure for both the as‐deposited and the annealed samples. However, the atomic force microscopy phase images showed completely different surface properties. Moreover, the X‐ray photoelectron spectroscopy spectra showed different surface chemical compositions. The experimental results revealed that the working temperature to produce superhydrophobic surfaces depended on the sparked film thickness. Furthermore, in order to prove the assumption explained above, glass and poly (methyl methacrylate) were also used as substrates.     

X‐ray diffraction study of low‐energy carbon‐ion implanted Si(001)

In the search for Si‐ and C‐based crystalline phases in low‐energy ion implanted and electron‐beam annealed Si surface layers, X‐ray diffraction (XRD) measurements were performed at grazing incidence on samples of large SiC nanocrystals grown on a 90 nm thick Si layer containing C atoms. Diffraction patterns and reciprocal space maps did not reveal XRD patterns originating from the nanocrystals or the implanted layer, but did show that distortions of the Si crystal structure were introduced into the implanted layer. After annealing, the strain in the implanted layer is reduced, possibly by carbon atoms that have moved to locations close to dislocations and dislocation loops. This investigation underpins the growth theory of the SiC nanocrystals on Si, with carbon atoms migrating to form the nanostructures. Copyright © 2007 John Wiley & Sons, Ltd.     

The effect of thermal annealing on the microstructure and mechanical properties of magnetron sputtered hydrogenated amorphous carbon films

Hydrogenated amorphous carbon films were deposited by magnetron sputtering of a carbon target in a methane/argon atmosphere. A postdeposition annealing at 300 °C was performed and the microstructure, bonding structure and mechanical properties of the as‐deposited and annealed films were analyzed and compared directly by high‐resolution transmission electron microscopy, micro‐Raman spectroscopy, XPS, and nanoindentation. The results showed that the carbon films are quite stable upon annealing, since there are only minor changes in microstructure and chemical bonding in the amorphous matrix. The hardness of the films remained unaffected, but the elastic properties were somewhat deteriorated. In comparison to the outcomes of our previous work on the growth of fullerene‐like hydrogenated carbon films, we can state that the formation of fullerene‐like carbon structures requires different sputtering process conditions, such as a higher ion energy and/or different sputtering target. Copyright © 2011 John Wiley & Sons, Ltd.     

Influence of the annealing conditions on the polarization and electromechanical response of high‐energy‐electron‐irradiated poly(vinylidene fluoride trifluoroethylene) copolymer

In this study, we investigated the influence of annealing conditions before irradiation on the ferroelectric and electromechanical properties of uniaxially stretched high‐energy‐electron‐irradiated poly(vinylidene fluoride trifluoroethylene) (HEEIP) copolymer (68/32 mol %) films. For films annealed at one fixed temperature before the irradiation (one‐step annealing), the highest crystallinity, which was highly desirable for enhancing the electromechanical response, was obtained only for films annealed between 132 and 136 °C. In addition, annealing over 10 h in this temperature window resulted in a large increase in the crystal lamellar thickness, which was required for reducing the polarization hysteresis to a minimum in the HEEIP samples. For improvements in the mechanical qualities of the uniaxially stretched films, a two‐step annealing procedure was investigated; that is, before the irradiation, the films were first annealed at a lower temperature to release the mechanical stress in the films due to the stretching and then were annealed in the high‐temperature window to raise the crystallinity and crystalline size. The experimental results indicated that this approach could produce uniaxially stretched HEEIP films with much improved mechanical qualities. Furthermore, the uniaxially stretched HEEIP films with this two‐step annealing exhibited the same electromechanical response as or an even higher one than that from the one‐step‐annealed HEEIP films. © 2003 Wiley Periodicals, Inc. J Polym Sci Part B: Polym Phys 41: 797–806, 2003     

50 keV H+ ion beam irradiation of Al doped ZnO thin films: Studies of radiation stability for device applications

Thin films of Al doped ZnO (Al:ZnO) were deposited on two substrates (Si and glass) at room temperature and 300°C using DC magnetron sputtering. These films were bombarded with 50 keV H⁺ beam at several fluences. The pristine and ion beam irradiated films were analysed by X‐ray diffraction, Raman spectroscopy, scanning electron microscopy, and UV‐Vis spectroscopy. The X‐ray diffraction analysis, Hall measurements, Raman and UV‐Vis spectroscopy confirm that the structural and transport properties of Al:ZnO films do not change substantially with beam irradiation at chosen fluences. However, in comparison to film deposited at room temperature, the Al:ZnO thin film deposited at 300°C shows increased transmittance (from 70% to approximately 90%) with ion beam irradiation at highest fluence. The studies of surface morphology by scanning electron microscopy reveal that the ion irradiation yields smoothening of the films, which also increases with ion fluences. The films deposited at elevated temperature are smoother than those deposited at room temperature. In the paper, we discuss the interaction of 50 keV H⁺ ions with Al:ZnO films in terms of radiation stability in devices.     

Multitechnique characterization of thin films of immiscible polymer systems: PS–b‐PMMA diblock copolymers and PS–PMMA symmetric blends

Immiscible polymer systems are known to form various kinds of phase‐separated structures capable of producing self‐assembled patterns at the surface. In this study, different surface characterization methods were utilized to study the surface morphology and composition produced after annealing thin polymer films. Two different SIMS techniques—static time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) and dynamic nano‐SIMS—were used, complemented by x‐ray photoelectron spectrometry (XPS) and atomic force microscopy (AFM). Thin films (spin‐coated onto silicon wafers) of polystyrene (PS)–poly(methyl methacrylate) (PMMA) symmetric blends and diblock copolymers of similar molecular weight were investigated. Surface enrichment by PS was found on all as‐cast samples. The samples were annealed at 160 °C for different time periods, after which the blend and the copolymer films exhibited opposite behaviour as seen by ToF‐SIMS and XPS. The annealed blend surface presented an increase in the PMMA concentration whereas that of copolymers showed a decrease in PMMA concentration compared with the as‐cast sample. For blends, the nano‐SIMS as well as AFM images revealed the formation of phase‐separated domains at the surface. The composition information obtained from ToF‐SIMS and XPS, as well as the surface mapping by nano‐SIMS and AFM, allowed us to conclude that PS formed phase separated droplet‐like domains on a thin PMMA matrix on annealing. The three‐dimensional nano‐SIMS images showed that the PS droplets were supported inside a rim of PMMA and that these droplets continued from the surface like columnar rods into the film until the substrate interface. In the case of annealed copolymer samples, the AFM images revealed topographical features resembling droplet‐like domains on the surface but there was no phase difference between the domains and the matrix. In the case of copolymers, owing to the covalent bonding between the blocks, complete phase separation was not possible. The three‐dimensional nano‐SIMS images showed domain structures in the form of striations inside the film, which were not continuous until the substrate interface. Information from the different techniques was required to gain an accurate view of the surface composition and topographical changes that have occurred under the annealing conditions. Copyright © 2005 John Wiley & Sons, Ltd.     

Study of in-situ surface cleaning for Si and SiGe epitaxy on Si with a novel ion beam vapor/assisted deposition technique

Ion beam vapor deposition is a new technique to grow Si and SiGe layers on Si substrates at low temperatures. The in situ surface cleaning prior to the deposition is a crucial step in the epitaxial growth of Si and SiGe films and is achieved by Ar ion bombardment with substrates kept at ambient temperature. A high temperature annealing (800 °C) is needed to repair the damage caused by this bombardment. We studied the effects of ion beam energy and the substrate temperature during the in situ cleaning on the quality of the grown films. An ion beam energy of 150–200eV is found to be sufficient to clean the surface for epitaxial growth. While the films deposited on properly cleaned surfaces are epitaxially grown, the inadequately cleaned surface leads to the formation of polycrystalline layers especially at low substrate temperatures.     

Phase stabilization in nitrogen-implanted nanocrystalline cubic zirconia

The phase stability of nanocrystallites with metastable crystal structures under ambient conditions is usually attributed to their small grain size. It remains a challenging problem to maintain such phase integrity of these nanomaterials when their crystallite sizes become larger. Here we report an experimental-modelling approach to study the roles of nitrogen dopants in the formation and stabilization of cubic ZrO(2) nanocrystalline films. Mixed nitrogen and argon ion beam assisted deposition (IBAD) was applied to produce nitrogen-implanted cubic ZrO(2) nanocrystallites with grain sizes of 8-13 nm. Upon thermal annealing, the atomic structure of these ZrO(2) films was observed to evolve from a cubic phase, to a tetragonal phase and then a monoclinic phase. Our X-ray absorption near edge structure study on the annealed samples together with first-principle modelling revealed the significance of the interstitial nitrogen in the phase stabilization of nitrogen implanted cubic ZrO(2) crystallites via the soft mode hardening mechanism.     

Surface characterization of functional iron–gallium alloys annealed under different conditions

Fe–Ga alloys are functional magnetostrictive materials, which are promising for application in actuators and sensors. Because surface properties of these alloys such as corrosion resistance are important in technological applications, it is required to characterize the chemical composition and state of the surface of these alloys, which depend on annealing conditions. In this study, X-ray absorption spectroscopy (XAS) and secondary ion mass spectrometry (SIMS) were used to characterize surface layers formed on the Fe–Ga alloys annealed under different atmospheric conditions. The XAS spectra of the annealed sample showed that the amount of gallium in the surface layers increased due to annealing, whereas the XAS spectra of the as-polished alloys revealed that the amounts of iron and gallium arise from the bulk composition. The XAS spectra of the alloys annealed in argon–hydrogen with residual oxygen showed that gallium is increased for its preferential oxidation. SIMS depth profile also showed the enrichment of gallium on the surface and the inhomogeneous distribution of iron on the surface layers.     

The high‐temperature tribological properties of Si‐DLC films

The tribological properties of Silicon‐containing diamond‐like‐carbon (Si‐DLC) films, deposited by magnetron sputtering Si target in methane/argon atmosphere, were studied in comparison with diamond‐like‐carbon (DLC) films. The DLC films disappeared because of the oxidation in the air at 500 °C, whereas the Si‐DLC films still remained, implying that the addition of Si improved significantly the thermal stability of DLC films. Retarded hydrogen release from DLC film at high temperature and silicon oxide on the surface might have contributed to lower friction coefficient of the Si‐DLC films both after annealing treatment and in situ high‐temperature environment. Copyright © 2012 John Wiley & Sons, Ltd.     

Activation of nanoparticle Pt-Ru fuel cell catalysts by heat treatment: a 195Pt NMR and electrochemical study

(195)Pt NMR spectroscopic and electrochemical measurements were carried out on commercial Pt-Ru alloy nanoparticle samples to investigate the effect of high-temperature annealing in different vacuum/gas-phase environments. Samples annealed at 220 degrees C in Ar gas, or in a vacuum, did not show any demonstrable change in catalytic activity vs electrochemically reduced, room-temperature samples. In contrast, annealing at 220 degrees C in H(2) gas led to a 3-fold increase in reactivity toward methanol oxidation (per surface site). NMR experiments show that annealing at 220 degrees C (in both Ar and H(2)) leads to a slight reduction in the Fermi level local density of states (E(F)-LDOS) at the Pt sites, which we attribute to surface enrichment of Ru. This electronic effect alone, however, appears to be too small to account for the increase in the catalytic activity observed for the H-treated catalyst. By comparing the electrochemical and NMR data of the H- and Ar-treated samples, we conclude that annealing at 220 degrees C in the hydrogen atmosphere reduces surface Ru oxides into metallic Ru, and consequently, the presence of metallic Ru and its enrichment on the surface are essential for the enhanced catalytic activity. In contrast, heat treatment at 600 degrees C in both vacuum and argon atmosphere increases the particle size and reduces the amount of platinum on the nanoparticle surface, thereby increasing the surface Ru content beyond the optimum surface composition values. This causes a large reduction in catalytic activity. Our results suggest that optimizing the amount of surface Ru by heat treatment at temperatures near 200 degrees C, in a hydrogen atmosphere, can be utilized to produce Pt-Ru alloy nanoparticles with high methanol oxidation activity. Finally, our NMR and electrochemical data, taken together with the lattice parameter measurements, lead to a novel model of Pt-Ru alloy nanoparticles having a Ru-rich core and a Pt-Ru alloy overlayer.     

Enhanced surface sensitivity in secondary ion mass spectrometric analysis of organic thin films using size‐selected Ar gas‐cluster ion projectiles

A size‐selected argon (Ar) gas‐cluster ion beam (GCIB) was applied to the secondary ion mass spectrometry (SIMS) of a 1,4‐didodecylbenzene (DDB) thin film. The samples were also analyzed by SIMS using an atomic Ar⁺ ion projectile and X‐ray photoelectron spectroscopy (XPS). Compared with those in the atomic‐Ar⁺ SIMS spectrum, the fragment species, including siloxane contaminants present on the sample surface, were enhanced several hundred times in the Ar gas‐cluster SIMS spectrum. XPS spectra during beam irradiation indicate that the Ar GCIB sputters contaminants on the surface more effectively than the atomic Ar⁺ ion beam. These results indicate that a large gas‐cluster projectile can sputter a much shallower volume of organic material than small projectiles, resulting in an extremely surface‐sensitive analysis of organic thin films. Copyright © 2010 John Wiley & Sons, Ltd.     

Aging and cold crystallization of melt‐extruded poly(trimethylene terephthalate) films

We analyzed the thermal crystallization, glass‐transition behavior, and mechanical properties of melt‐extruded poly(trimethylene terephthalate) (PTT) films to investigate their physical aging and annealing effects. The physical aging and annealing of PTT films had an influence on the glass‐transition temperature, recrystallization behavior, and mechanical properties. When samples were aged at an ambient temperature, the crystallization temperature decreased largely within 5 h, the heat of crystallization increased, and the breaking stress and breaking elongation increased. The glass‐transition temperature of annealed samples, which was obtained from differential scanning calorimetry and dynamic mechanical measurements, increased with increasing annealing temperature below 80 °C but decreased above that temperature. In addition, the glass‐transition temperature and modulus of annealed samples were largely affected by the annealing time; in particular, they increased sharply within 1 h on annealing at 50 °C. Consequently, the change in the glass‐transition temperature on annealing was ascribed to the fact that the molecular constraint due to recrystallization and the mobility of rigid amorphous PTT chains competed with each other, being dependent on the annealing temperature. The mechanical properties of aged samples were closely related to their cold‐crystallization behavior. © 2001 John Wiley & Sons, Inc. J Polym Sci Part B: Polym Phys 39: 1920–1927, 2001     

Microstructure and Magnetic Properties of Ag/Fe/Ag Pseudo-Sandwich Nanogranular Films

"Nanogranular Ag/Fe/Ag films were prepared by magnetron sputtering from a silver and an iron target onto glass substrates at room temperature and subsequent in situ annealing. The structural and magnetic properties of the films were investigated as a function of silver layer thickness and annealing temperature. X-ray diffraction shows the Fe(110) peak is formed in all the samples. Vibrating sample magnetometer measurements indicate that the magnetic moments lie well perpendicular to the film plane. Coercivityreaches the maximum in the sample annealed at 500 oC for 30 min with 3 nm Ag layer. A scanning probemicroscope was used to scan surface morphology and magnetic domain structures. In as-deposited samplesthe average grain size and the average roughness is smaller than that the annealing samples. After annealing,the grain size is larger and the contrast of domains increases, but the domain size becomes smaller."     

Thermal behaviour of lyocell fibres

Fourier-transform infrared (FTIR) spectroscopy has been applied in combination with wide-angle X-ray diffraction and measurements of strength, fluidity, yellowness, birefringence, and moisture regain to detect microstructural changes in lyocell fibres, a regenerated cellulose fibre, subjected to direct heat and annealing treatments. TMA, and SEM were used to show the effect of direct heat and annealing on lyocell fibres. The FTIR spectroscopy results show that a decrease in intermolecular hydrogen bonding occurs at 70 and 80 °C for annealed and directly heated samples, respectively. The results demonstrate increase of the intensity of O–H stretching vibrations, this associated with hydrogen bonds reforming around 130 °C. Lyocell fibres shrink with direct heating in the temperature range 130–160 °C. The crystallinity decreases gradually with increasing temperature. There is no significant change in colour of the samples annealed up to 150 °C. A continuous increase in the fluidity occurs for the annealed samples in the range 150–230 °C. The tenacity and breaking extension of heated samples decrease with increasing temperature. The lower annealing temperatures cause no observable change in the smooth and void-free surface, but in the annealing temperature range 170–230 °C, substantial non-uniformity is apparent on the surface of the fibres.     

Characterization of silver selenide thin films grown on Cr‐covered Si substrates

Thermal stability of silver selenide thin films formed from the solid‐state reaction of Ag‐Se diffusion couples on Si substrates covered with a thin Cr film, is investigated. Glancing angle X‐ray diffraction (GXRD), XPS, atomic force microscopy (AFM) and Rutherford backscattering spectrometry (RBS) are used to characterize the as‐deposited films and those annealed at 100, 200, 300, and 400 °C. The results reveal the formation of polycrystalline orthorhombic silver selenide films that remain stable without compositional change upon thermal annealing, in marked contrast to the agglomeration exhibited by silver selenide films deposited on Si without Cr film. The improvement in the thermal stability is attributed to compressive stress relief by a grainy morphology with large surface area, the formation of which is promoted by partially oxidized Cr adhesion film. Copyright © 2008 John Wiley & Sons, Ltd.