Effect of structure doping profile on the current switching-off process in power semiconductor opening switches

Using a physicomathematical model, the process of current breaking in power semiconductor opening switches was investigated in p ⁺-p-n-n ⁺ structures with different doping profiles. The model takes account of the actual doping profile of a structure, diffusion and drift of current carriers in a strong electric field, recombination via deep impurities and Auger recombination, and impact ionization in a dense plasma. The calculation of the electrical circuit of an opening switch is based on solution of Kirchhoff’s equations. It has been shown that in the nanosecond regime of breaking superhigh current densities with densities of the interrupted currents from a few to tens of kA/cm², the dominant factor in the current breaking process is the width of the p-region in the initial doping profile of a structure. An increase in the p-region width from 100 to 200 μm makes the velocity of the excess plasma front propagating in the p-region in the reverse pumping stage higher by a factor of 5–7. Higher propagation velocity of the plasma front makes the current breaking process more intensive, which is manifested in the shorter current breaking time and higher overvoltage across the opening switch.     

半导体断路开关电路-流体耦合数值模拟

为了研究掺杂结构为p+-p-n-n+的半导体断路开关的ns脉冲截断机理,根据流体力学方程和全电流方程推导出半导体断路开关内部载流子运动满足的电流-电压关系表达式,提出了一种外电路方程和载流子流体力学方程联立求解的1维耦合数值模型。采用该模型对半导体断路开关的ns脉冲截断过程进行了数值模拟,模拟结果表明:在截断过程中,n-n+结处的载流子数密度首先开始明显降低,并出现高电场,随后p+-p结处也出现类似现象,随着载流子的抽取,高电场区域向p-n结处快速移动,最终在p-n结处完成截断,而基区载流子数密度在截断前后无明显变化。     

Theoretical concepts of operation of a semiconductor detector based on a <Emphasis Type="Italic">p-n</Emphasis> junction

Collected charge originating in a semiconductor detector of the p⁺-n-n⁺ type as a result of interaction with a monoenergetic electron beam with energies in the range from 7 to 25 keV is calculated. Generation of electron-hole pairs (EHPs) is calculated using the Monte Carlo method. In the context of the diffusion-drift model, an analytic expression for the contribution of generated EHPs to the detected signal is derived. It is shown that the losses of charge to recombination in the course of transport significantly affect the shape of detected signal. The comparison of simulated energy spectra with experimentally measured spectra shows good agreement between theory and experiment. Thus, the basics of a theoretical approach that makes it possible to calculate the operational characteristics of semiconductor detectors are developed; as a result, the parameters of these detectors can be optimized in designing the practically important semiconductor proportional detectors to be used in analytical methods.     

Luminescence of direct-and indirect-gap electron-hole plasma in TlBr

Luminescence of TlBr crystals highly excited by a nanosecond pulsed-dye laser (3.4 eV) at the bath temperature ∼ 8.5 K was studied. Two emission lines labeled A (∼ 2.98 eV) and B (∼ 2.62 eV) were found, which show typical behavior of the electron-hole plasma recombination radiation. The A-line is assigned to the recombination of e-h pairs in the direct gap (X⁺₆−X^-₃) and the B-line to the simultaneous recombination in the indirect gap (X⁺₆−R^-₆). Condensation of carriers into an electron-hole liquid was not observed.     

Pulse characteristics of Hg0.8Cd0.2Te n +-p junctions

The pulse characteristics of Hg_0.8Cd_0.2Te n ⁺-p junctions are investigated. It is shown that the shape of the voltage pulse appearing in a junction on passage of a forward (reverse) current is determined by the recombination (generation) of nonequilibrium electrons in the hole region. An increase in the current pulse causes the appearance of an electric field, which draws electrons into the interior of the base region, and leads to variation of their lifetime because of the complex structure of the n ⁺-p junction. Zh. Tekh. Fiz. 67, 130–133 (July 1997     

Anomalous plasma diffusion transverse to high magnetic fields in InSb

Investigations on the ambipolar diffusion of an electron-hole plasma transverse to a magnetic field have been carried out in InSb. A plasma layer, produced at the surface of the sample by a short laser pulse, was moved through the sample in crossed electric and magnetic fields by the Lorentz force. From the broadening of the plasma layer we found at 80K an enhanced diffusion coefficient which decreased proportional to 1/B for magnetic fields higher than 1T, constrary to the expected classical 1/B ² dependence. Furthermore, the diffusion coefficient was strongly dependent on the electric field. The ambipolar drift velocity, measured simultaneously showed a classical behaviour. Together with the enhanced diffusion we observed instabilites in the electric potential. The instability threshold decreased towards the cathode.     

Spin-dependent recombination in a silicon p-n junction

Like the spin-denendent photoconductivity in pure silicon, the current of a silicon n⁺-p junction is found to be affected by electron spin resonance. The experiment shows that the same centers are responsible for the recombination in the diode and in pure silicon, that only the recombination in the space-charge region of the junction is spin-dependent and that the effect in this region is very large. A tentative model for the electron-hole recombination in silicon is proposed.     

Frequency and density dependent radiative recombination processes in III–V semiconductor quantum wells and superlattices

In this paper we review the radiative recombination processes occurring in semiconductor quantum wells and superlattices under different excitation conditions. We consider processes whose radiative efficiency depends on the photogenerated density of elementary excitations and on the frequency of the exciting field, including luminescence induced by multiphoton absorption, exciton and biexciton radiative decay, luminescence arising from inelastic excitonic scattering, and electron-hole plasma recombination.

Semiconductor quantum wells are ideal systems for the investigation of radiative recombination processes at different carrier densities owing to the peculiar wavefunction confinement which enhances the optical non-linearities and the bistable behaviour of the crystal. Radiative recombination processes induced by multi-photon absorption processes can be studied by exciting the crystal in the transparency region under an intense photon flux. The application of this non-linear spectroscopy gives direct access to the excited excitonic states in the quantum wells owing to the symmetry properties and the selection rules for artificially layered semiconductor heterostructures.

Different radiative recombination processes can be selectively tuned at exciting photon energies resonant with real states or in the continuum of the conduction band depending on the actual density of photogenerated carriers. We define three density regimes in which different quasi-particles are responsible for the dominant radiative recombination mechanisms of the crystal: (i) The dilute boson gas regime, in which exciton density is lower than 10¹⁰ cm^-2. Under this condition the decay of free and bound excitons is the main radiative recombination channel in the crystal. (ii) The intermediate density range (n < 10¹¹ cm^-2) at which excitonic molecules (biexcitons) and inelastic excitonic scattering processes contribute with additional decay mechanisms to the characteristic luminescence spectra. (iii) The high density range (n ?10¹² cm^-2) where screening of the Coulomb interaction leads to exciton ionization. The optical transitions hence originate from the radiative decay of free-carriers in a dense electron-hole plasma.

The fundamental theoretical and experimental aspects of the radiative recombination processes are discussed with special attention to the GaAs/Al _x Ga_1-x As and Ga _x In_1-x As/Al _y In_1-y As materials systems. The experimental investigations of these effects are performed in the limit of intense exciting fields by tuning the density of photogenerated quasi-particles and the frequency of the exciting photons. Under these conditions the optical response of the quantum well strongly deviates from the well-known linear excitonic behaviour. The optical properties of the crystal are then no longer controlled by the transverse dielectric constant or by the first-order dielectric susceptibility. They are strongly affected by many-body interactions between the different species of photogenerated quasi-particles, resulting in dramatic changes of the emission properties of the semiconductor.

The systematic investigation of these radiative recombination processes allows us to selectively monitor the many-body induced changes in the linear and non-linear optical transitions involving quantized states of the quantum wells. The importance of these effects, belonging to the physics of highly excited semiconductors, lies in the possibility of achieving population inversion of states associated with different radiative recombination channels and strong optical non-linearities causing laser action and bistable behaviour of two-dimensional heterostructures, respectively.     

Delayed breakdown diode and its optimal design for solid state picosecond closing switch

We study a Si-based diode with a p⁺nn⁺ structure for picosecond semiconductor closing switch and discuss the physical process, which underlies the operation principle of high-power closing switch based on a delayed breakdown diode (DBD). From the results of numerical simulations and theoretical analysis, single device has demonstrated reliable operation at 2.3 kV, 89 ps risetime, and high output dV/dt(30 kV/ns). As a contribution to the optimal design, some conclusions about trade-off are drawn by changing structure parameters and physical parameters.     

Computer simulation of the small-signal admittance and negative resistance of double avalanche region IMPATT diodes

A generalized small-signal computer simulation of double avalanche region (DAR) n ⁺-p-v-n-p ⁺ Si and InP IMPATT diodes has been carried out for different frequencies and current densities taking both drift and diffusion of charge carriers into account. The simulation results show that both symmetrically and asymmetrically doped devices based on Si and InP exhibit discrete negative conductance frequency bands separated by positive conductance frequency bands. The magnitudes of both negative conductance and negative resistance of InP devices are larger than those of Si devices in case of symmetrical and asymmetrical diodes. Further, the negative resistance profiles in the depletion layer of these diodes exhibit a single peak in the middle of the drift layer in contrast to double peaks in double drift region diodes.     

Renormalized diffusion coefficients for electron-hole plasmas in crossed fields

The diffusion and drift of an excess plasma in a semiconductor is described with magnetohydrodynamic two-fluid equations including the fluctuating electric field produced by the equilibrium plasma in the sample. Using the weak coupling limit an equation of motion for the mean density of the excess plasma is established with renormalized drift and diffusion coefficients. With the aid of the fluctuation dissipation theorem these coefficients are expressed in terms of the dielectric function and discussed in detail for stable systems. The renormalized diffusion coefficient differs from the bare one by an additional term with thet ^–3/2-long time dependence. It is shown that this term in addition represents an anomalous diffusion rate proportionalB ^–1 which overweights the classical ambipolar diffusion for sufficiently strong fields, but decreases with increasing external electric field. The results are compared with experimental data.     

Photoluminescence and electric conductivity in germanium at low temperatures

We have studied the exciton and electron-hole droplet (EHD) luminescence in optically irradiated germanium at temperatures between 1.8 and 4.2 K in the presence of an electric field. Simultaneously the electric conductivity was measured. The sample material was high-purity Ge (N _A –N _D =7·10¹⁰ cm^–3) andp-doped Ge withN _A =3·10¹⁴ cm^–3. In the high-purity Ge samples the exciton and EHD-luminescence intensity decreased nearly linearly as a function of the applied electric current, whereas the dependence upon the electric field was more complicated. Our results could be explained by a model in which carrier annihilation at the contacts following a rapid drifting process plays a dominant role (drift model). In thep-doped Ge samples the current-dependence of the luminescence intensity was qualitatively similar. However, here the drift model is not strictly valid any more because of the reduced carrier mobility and the generation of additional carriers by impurity impact ionization. During variation of the electric field, the luminescence intensity and the electric current show hysteresis. Here the capture of the moving carriers by the EHD appears to play an important role, in addition to the EHD-nucleation process.     

Instability of photoexcited electron-hole plasma in short semiconductor structures

The instability of the electron-hole plasma produced by continuous photoexcitation in short semiconductor structures is investigated theoretically. The applied electric field is considerably disturbed by photogenerated charge carriers. At a sufficiently intensive photogeneration plasma instability occurs. The frequency of current oscillations due to the instability, as shown by numerical simulation for a GaAs structure, is in the range of 10¹¹–10¹²s^–1.     

The energy of thermal electrons in electron beam created helium discharges

We have measured the electron energy of the thermal group of electrons in both longitudinal and transverse electron beam created helium glow discharges. The measurement technique employs the ratio of intensities of spectral lines in the 2s³S?np³P He I series. Values of kT_e between 0.07 and 0.11 eV were obtained. These energies are typical of the beam-generated electric field free plasmas. The competitive loss of helium ions by recombination and by charge transfer in a He?Hg electron beam created plasma is calculated. The results are applied to the Hg⁺ laser pumping scheme using a electron beam created He?Hg plasma.     

The influence of tunneling effects on the efficiency of heterojunction solar cells

A theoretical model is developed which presents the transport properties through the space charge region of ap ⁺ n heterojunction solar cell, whereby not only recombination through interface states but also tunneling through potential barriers is taken into account. It is investigated whether tunneling can give rise to optimum heterojunction structures which have better efficiencies that without tunneling. It is found that only if the strongly doped semiconductor has an optimum bandgap and the weakly doped semiconductor a larger bandgap, tunneling can make the structure optimum. In all other cases of optimum structures, tunneling deteriorates the efficiency. Work supported by the Energy R. D. programmes of the Commission of European Communities and the Belgian Ministry of Science.     

Numerical investigation of the theta pinch in intrinsic indiumantimonide

The electron-hole plasma in intrinsic InSb at 300 K can be compressed by electric and magnetic fields. In the theta-pinch configuration one applies, by a capacitor discharge over a one-winding coil around the sample, a magnetic field (0, 0,B _z), which induces an electric field (0,E _φ, 0); both fields cause the ambipolar motion (v _r, 0, 0) of the plasma. We describe the electron-hole plasma by means of a magnetohydrodynamical two-fluid model. The resulting system of differential equations is solved numerically under the assumptions of scalar hydrodynamic pressure and field-independent mobilities. The influence of the plasma properties on the theta pinch is studied as well as the dependence on the experimental conditions like radius of the sample, maximum value and risetime of the magnetic field.     

Powerful diode nanosecond current opening switch made of <Emphasis Type="Italic">p</Emphasis>-silicon (<Emphasis Type="Italic">p</Emphasis>-SOS)

The nanosecond semiconductor diode-based opening switch (SOS-diode) capable of switching currents with densities up to several tens of kiloamperes per cubic centimeter represents a p⁺p’Nn⁺ silicon structure fabricated by the deep simultaneous diffusion doping (to about 200 μm) of n-Si by Al and B from one side and P from the other. In the SOS mode, first a short pulse of forward current passes through the diode and then a fast-growing pulse of reverse voltage is applied. A resulting pulse of reverse current carries away injected holes and thereby forms a plasma front in the p’ layer, which moves toward the p’N junction. When the hole concentration in the flow exceeds the dopant concentration in the p’ layer, a space charge region arises in this layer, the resistivity of the diode increases sharply, and the current switches to a load connected parallel to the diode. Early results concerning an alternative configuration of the SOS diode are presented. Here, the diode was made by the rapid simultaneous diffusion of B and P from the opposite sides of a p-Si wafer to a depth of 60-80 μm. If a short pulse of forward current is passed through such a p⁺pn⁺ structure and a pulse of reverse voltage is then applied, a plasma front arising in the p⁺ region moves toward the p⁺p interface through the heavily doped (i.e., low-resistivity) p⁺ region. Having crossed this interface, the front passes into a low-doped region, where the hole concentration in the flow becomes much higher than the dopant concentration and a space charge region causing the current to pass to the load forms at once. It is shown experimentally that, all other things being the same, the time of current breaking in the p-SOS-diode is roughly twice as short as in the conventional n-SOS-diode, switched currents are considerably lower, and the fabrication technique of p-SOS-diodes is much simpler. Ways of optimizing the design of the semiconductor structure of the p-SOS-diode to further raise the speed are outlined.     

Temperature dependence characterization of metal-insulator-nonuniformly-doped semiconductor solar cell

Four layered metal-insulator-pp⁺ semiconductor MIS solar cell device was simulated using a comprehensive numerical model. The semiconductor layer was assumed to be nonuniformly-doped in which additional drift electric field inside the semiconductor could be generated. The effects of the electrostatic and kinetic properties of the electronic states at the insulator-semiconductor interface were taken into account. The influences of the operating temperature on the device performance were studied in detail.     

The Numerical Simulation of the Nanosecond Switching of a <Emphasis Type="Italic">p</Emphasis>-SOS Diode

Abrupt high-density reverse current interruption has been numerically simulated for switching from forward to reverse bias in a silicon p⁺P₀n⁺ structure (p-SOS diode). It has been shown that the current interruption in this structure occurs as a result of the formation of two dynamic domains of a strong electric field in regions in which the free carrier concentration substantially exceeds the concentration of the doping impurity. The first domain is formed in the n⁺ region at the n⁺P⁰ junction, while the second domain is formed in the P⁰ region at the interface with the p⁺ layer. The second domain expands much faster, and this domain mainly determines the current interruption rate. Good agreement is achieved between the simulation results and the experimental data when the actual electric circuit determining the electron–hole plasma pumping in and out is accurately taken into account.     

Influence of random electric fields on luminescence yield and kinetics of insulators

In the present work we investigate theoretically the influence of random electric fields on electron-hole recombination in wide bandgap crystals. Effective Onsager radius and, therefore, electron-hole recombination rate are significantly modified by external electric fields. Electric field distribution functions for point defects and charged dislocations are evaluated analytically. Electron-hole recombination rate decreases with concentration of point defects and dislocations. In simple case of random fields created by charge carriers in highly excited regions the recombination rate is proportional to n 2/3 rather than n , where n is the concentration of excitations. Therefore modification of luminescence kinetics is most pronounced at initial stages of relaxation of highly excited regions.