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1.
This paper reports the results of the electrical conductivity measurements for polycrystalline specimens of undoped and Cr-doped CoO in the ranges of p(O2) (10−5 – 105 Pa) and temperature (1223 – 1373 K). The experimental data are considered in terms of the effect of Cr on semiconducting properties of CoO. It is shown that Cr results in a decrease of the reciprocal of the p(O2) exponent of electrical conductivity, however, the obtained experimental values are substantially lower than those predicted by defect chemistry. The activation energy of the electrical conductivity remains independent of p(O2) and Cr content (at the level of about 0.5 eV) except strongly reduced CoO, at p(O2)=2.10−4 Pa, of which the activation energy is substantially higher. Thermopowervs p(O2) exhibits maximum at p(O2)=10 Pa (except of thermopower data for Cr-doped CoO at the highest temperature). The experimental data are considered in terms of the effect of both p(O2) and Cr on semiconducting properties.  相似文献   

2.
Electrical conductivity and thermoelectric power are measured on a single crystal of Gd3.0Sc1.8Ga3.2O12 (GSGG) between 1273 and 1673 K. The measurements are made both in air and in controlled atmospheres, and PO2 varies from 10?1.68 to 10?5.6 MPa. The data indicate GSGG may well be a mixed conductor in this temperature and PO2 range, with n-type electronic conductivity and ionic transport on the oxygen sublattice. Changes in temperature induce long-lived disequilibrium in electrical conductivity of GSGG (over 30 h at T < 1373 K) that can be explained by temperature dependent cation redistribution. The effective activation energy for equilibrium electrical conductivity is Ea = 2.40 ± 0.05 eV, as opposed to values of Ea between 1.8 and 2.2 eV during actual temperature changes. An additional contribution in the equilibrium Ea, due to thermally activated cation redistribution, can account for the higher value seen.  相似文献   

3.
Nanostructures based on iron oxides in the form of thin films were synthesized while laser chemical vapor deposition (LCVD) of elements from iron carbonyl vapors (Fe(CO)5) under the action of Ar+ laser radiation (λL = 488 nm) on the Si substrate surface with power density about 102 W/cm2 and vapor pressure 666 Pa. Analysis of surface morphology and relief of the deposited films was carried out with scanning electron microscopy (SEM) and atomic force microscopy (AFM). This analysis demonstrated their cluster structure with average size no more than 100 nm. It was found out that the thicker the deposited film, the larger sizes of clusters with more oxides of higher oxidized phases were formed. The film thickness (d) was 10 and 28 nm. The deposited films exhibited semiconductor properties in the range 170-340 K which were stipulated by oxide content with different oxidized phases. The width of the band gap Eg depends on oxide content in the deposited film and was varied in the range 0.30-0.64 eV at an electrical field of 1.6 × 103 V/m. The band gap Eg was varied in the range 0.46-0.58 eV at an electrical field of 45 V/m. The band gap which is stipulated by impurities in iron oxides Ei was varied in the range 0.009-0.026 eV at an electrical field of 1.6 × 103 V/m and was varied in the range 0-0.16 eV at an electrical field 45 V/m. These narrow band gap semiconductor thin films displayed of the quantum dimensional effect.  相似文献   

4.
The structure, phase composition, morphology, and electrical conductivity of Ni-Cu alloy ultrathin films having a thickness of d = 1?10 nm and a Cu concentration of 10–95 at % have been studied. All films are shown to be fcc Ni-Cu alloys; they have an island structure with an island size of 1.5–2 nm in the as-deposited films and of about 20 nm in the films annealed to 700 K. The electrical conductivity of the films depends on their thickness and morphology. For films with d ≈ 1 nm, the electrical conductivity is thermally activated with an activation energy E a ≈ 0.086?0.095 eV. Films with d > 3 nm exhibit the metallic temperature dependence of electrical conductivity with a positive temperature coefficient of resistivity.  相似文献   

5.
The extensive investigation of the annealing effect in nitrogen atmosphere on the structural optical and electrical properties of chemically deposited CdS films on SnO2 has been performed. The as-deposited film shows 2.45 eV band gap (Eg) and decreases with increasing annealing temperature. The film annealed at 623 K having pure hexagonal phase (a = 4.14 Å, c = 6.71 Å for [1 0 0] plane) and Eg = 2.36 eV shows 10 times higher conductivity for all temperature range, and shows two different activation energies Ea = 0.114 eV and Ea = 0.033 eV for the temperature range 395 K ≤ T ≤ 515 K and 515 K ≤ T ≤ 585 K, respectively. The structural parameters such as dislocation density, strain and optical parameters such as absorption and extinction coefficient are calculated and compared for all the films.  相似文献   

6.
La2O3 (2 wt%)-doped (Bi0.5Na0.5)0.94Ba0.06TiO3 (abbreviated as BNBT6) lead-free piezoelectric ceramics were synthesized by conventional solid-state reaction. X-ray diffraction (XRD) patterns indicated that La2O3 has diffused into the lattice of BNBT6 ceramics and formed a solid solution with a pure perovskite structure. Addition of La2O3 decreased the piezoelectric properties and electrical conductivity. It was used to study the electrical conductivity of the La2O3-doped BNBT6 lead-free piezoelectric ceramics combined with electrical modulus and impedance plots at the temperature range over 788–873 K. The values of activation energy derived from the electrical impedance and modulus were found to be 0.51 and 0.50 eV, respectively. The discrepancy between activation energy of relaxation frequency and the activation energy (0.25 eV) of dc electrical conductivity might have been due to a short-range migration or hopping of single ionized oxygen vacancy and a long-range migration or hopping of charge carriers over the whole disordered system, respectively.  相似文献   

7.
The optical absorption of the As-prepared and annealed As45.2Te46.6In8.2 thin films are studied. Films annealed at temperatures higher than 453 K show a decrease in the optical energy gap (Eo). The value of Eo increases from 1.9 to 2.43 eV with increasing thickness of the As-prepared films from 60 to 140 nm. The effect of thickness on high frequency dielectric constant (?) and carrier concentration (N) is also studied. The crystalline structures of the As45.2Te46.6In8.2 thin films resulting from heat treatment of the As-prepared film at different elevated temperatures is studied by X-ray diffraction. An amorphous-crystalline transformation is observed after annealing at temperatures higher than 453 K. The electrical conductivity at low temperatures is found due to the electrons transport by hopping among the localized states near the Fermi level. With annealing the films at temperatures higher than 473 K (the crystallization onset temperature) for 1 h, the electrical conductivity increases and the activation energy decreases, which can be attributed to the amorphous-crystalline transformations.  相似文献   

8.
《Solid State Ionics》2006,177(11-12):1015-1020
The electrical properties of CeNbO4+δ have been investigated at 1073–1223 K in the oxygen partial pressure range 10 17 to 0.36 atm. The conductivity and Seebeck coefficient behaviour indicates that, at oxygen chemical potentials close to atmospheric, tetragonal CeNbO4+δ possesses a mixed ionic and p-type electronic conductivity. The ion transference numbers under the p(O2) gradient of 0.93/0.21 atm, measured by the modified e.m.f. technique, are close to 0.4 decreasing in more reducing environments. The variations of partial ionic and electronic conductivities can be described in terms of the oxygen intercalation into the scheelite-type lattice, which results in increasing concentrations of both dominant charge carriers, oxygen interstitials and holes, when p(O2) increases. Reduction leads to p(O2)-independent electrical properties, followed by a drastic decrease in the conductivity at oxygen pressures below 10 15–10 9 atm due to a reversible transition into the monoclinic phase. Contrary to the zircon-type CeVOδ, no traces of the parent binary oxides were detected in the reduced cerium niobate.  相似文献   

9.
采用反应磁控溅射方法,在(0001)蓝宝石单晶衬底上,制备了纳米多晶Gd2O3掺杂CeO2(GDC)氧离子导体电解质薄膜,采用X射线衍射仪(XRD)、原子力显微镜(AFM)对薄膜物相、结构、粗糙度、表面形貌等生长特性进行了表征,利用交流阻抗谱仪测试了GDC薄膜不同温度下的电学性能;实验结果表明,GDC薄膜为面心立方结构,在所研究的衬底温度范围内,均呈强(111)织构生长;薄膜表面形貌随衬底温度发生阶段性变化:衬底温度由室温升高到300℃时, 关键词: 2O3掺杂CeO2电解质薄膜')" href="#">Gd2O3掺杂CeO2电解质薄膜 反应磁控溅射 生长特性 电学性能  相似文献   

10.
In a dc glow discharge in oxygen, the concentrations of minor components of O2(a1Δg), O2(b1 Σg), O3, O(1D), as well as nagative ions and electrons have been measured. Balance equations have been derived which describe satisfactorily the stationary concentrations of these components as functions of gas pressure and discharge current. For the first time, the rate constants of important aeronomical reactions (a) O? + O2(a1Δg) → O3 + e, (b) O2? + O2(a1Δg) → 2O2 + e and (c) e + O3 → O2? +O have been measured as functions of gas temperature T and mean energies of ions Ei and electron E6: Ka = (2.5 ± 0.5) · 10?9 · (T/300)4 ± 0.4· (Ei/0.04)?2.6 ± 0.4 cm3/s for T = 385?605 K and Ei = 0.10 ? 0.66 eV; Kb = (1.0 ± 0.3) · 10?10 · (T/300)?2 ± 0.5 · (Ei/0.04)0.23 ± 0.05 cm3/s for T = 330?605 K and Ei = 0.09 + 1.5 eV; Kc for Ee = 0.8÷5 eV.  相似文献   

11.
The ac conductivity measurements have been carried out for the activated Ba/SrO cathode with additional 5% Ni powder for every 100 h acceleration life time at the temperature around 1125 K. The ac conductivity was studied as a function of temperature in the range 300-1200 K after conversion and activation of the cathode at 1200 K for 1 h in two cathodes face to face closed configuration. The experimental results prove that the hopping conductivity dominate in the temperature range 625-770 K through the traps of the WO3 associate with activation energy Ea = 0.87 eV, whereas from 500-625 K it is most likely to be through the traps of the Al2O3 with activation energy of Ea = 1.05 eV. The hopping conductivity at the low temperature range 300-500 K is based on Ni powder link with some Ba contaminants in the oxide layer stricture which indicates very low activation energy Ea = 0.06 eV.  相似文献   

12.
S. Nasri  M. Megdiche  K. Guidara  M. Gargouri 《Ionics》2013,19(12):1921-1931
The KFeP2O7 compound was prepared by the conventional solid-state reaction. The sample was characterized by X-ray powder diffraction. The AC electrical conductivity and the dielectric relaxation properties of this compound have been investigated by means of impedance spectroscopy measurements over a wide range of frequencies and temperatures, 200 Hz–5 MHz and 553–699 K, respectively. Both impedance and modulus analysis exhibit the grain and grain boundary contribution to the electrical response of the sample. The temperature dependence of the bulk and grain boundary conductivity were found to obey the Arrhenius law with activation energies Eg?=?0.94 (3)?eV and Egb?=?0.89 (1)?eV. The grain-and-grain boundary conductivities at 573 K are 1.07?×?10?4 and 1.16?×?10?5?1 cm?1). The scaling behavior of the imaginary part of the complex impedance suggests that the relaxation describes the same mechanism at various temperatures. The near value of the activation energies obtained from the equivalent circuit, conductivity data, and analysis of M″ confirms that the transport is through ion hopping mechanism.  相似文献   

13.
This work reports semiconducting properties of undoped polycrystalline TiO2 studied using the measurements of the electrical conductivity (EC) and thermopower as a function of oxygen partial pressure and temperature in the ranges of p(O2) between 10 Pa and 70 kPa and temperature 1173–1273 K. The width of the band gap, determined from the minimum of EC, is equal to 3.055±0.012 eV. It was found that the apparent concentration of negatively charged defects, involving both acceptor-type aliovalent ions and Ti vacancies, increases with temperature from 0.6 at% at 1173 K to the level of 0.9–1.4 at% at 1273 K. This effect is considered in terms of Schottky-type defects. It was observed that the minimum of EC at the n–p transition is lower than that for TiO2 single crystal thus suggesting that grain boundaries are responsible for the formation of conductivity weak links.  相似文献   

14.
Bulk magnetic susceptibility measurements have been made on the orthorhombic compounds CoPt3O6, MnPt3O6, and NiPt3O6, and the structurally related cubic phase Co0.37Na0.14Pt3O4, in the temperature range 300-4 K. These compounds, which are rather unusual in that they contain first-row transition metals in eight coordination, are all paramagnetic above 25 K and show Curie-Weiss behavior with effective magnetic moments μeff(Co) = 4.8 ± 0.2μBeff(Mn) = 5.8 ± 0.1 μB, μeff(Ni) = 3.9 ± 0.2 μB, and μeff(Co) = 4.2 ± 0.5 μB, respectively. The inverse susceptibilities of CoPt3O6 and MnPt3O6 exhibit deviations from Curie-Weiss behavior below 25 K, and a minimum is observed for CoPt3O6 at about 8K. Single-crystal electrical conductivity measurements along the c-axis (σ) in CoPt3O6 and MnPt3O6 show these materials to be semiconducting, but with relatively high conductivities and low activation energies σ (294 K) = 40 Ω?1-cm?1 and Ea = 0.07 eV for CoPt3O6 and σ (303 K) = 111Ω?1cm?1 and Ea = 0.02 eV for CoPt3O6. The results for CoPt3O6. MnPt3O6, and NiPt3O6are discussed in terms of their anisotropic structures, which favor magnetic coupling in one-dimension along linear arrays of eight-coordinated paramagnetic ions and one-dimensional electrical conduction along columnar stacks of planar PtO4 groups containing partially oxidized linear chains of platinum. One-dimensional electronic interactions in MPt3O6 compounds are suggested by metal-metal distances along the c-axis of 3&#x0303;.1 A for both the platinum and the 3d transition metal ions, compared to a distance of 6.1 A between the chains in the perpendicular plane. These materials and their electronic properties are compared with systems with well characterized examples of one-dimensional magnetic coupling and electrical conductivity.  相似文献   

15.
The variation in physical, optical and electrical properties has been investigated as a function of Bi2O3 content in 20CaO?·?xBi2O3?·?(80???x)B2O3 (0?≤?x?≤?60, in mol%) glasses. The samples were prepared by normal melt-quenching process, and the optical absorption and reflection spectra were recorded in the wavelength range of 400–950 nm. The fundamental absorption edge has been identified from the optical absorption spectra. The optical band gap, E g, for indirect allowed and indirect forbidden transitions has been determined from the available theories and its value lies between 1.80–2.37 eV and 1.08–2.19 eV, respectively. The theoretical fitting of the optical absorption indicates that the present glass system behaves as an indirect gap semiconductor. The origin of the Urbach energy, ΔE, has been associated with the phonon-assisted indirect transitions. The refractive index and optical dielectric constant have been evaluated from the reflection spectra. The density and molar volume are found to depend on the molar concentration of Bi2O3. The values of DC electrical conductivity have been measured from 373 to 623 K and the activation energy has been calculated. Theoretical optical basicity has been reported as a function of the Bi2O3 content. The variations have been discussed in terms of structural changes.  相似文献   

16.
A mixture of crystalline Co3O4/CoO nanorods with non-uniform dense distribution has been successfully synthesized by microwave hydrothermal technique. The synthesized nanorods have been characterized by several techniques such as X-ray diffraction (XRD), field emission scanning electron microscopy (FE-SEM), energy-dispersive X-ray spectroscopy (EDX), and Fourier transforms infrared spectroscopy (FT-IR). The results showed that the as synthesized specimens contained mixed crystalline Co3O4/CoO nanorods with an average length of around 80 nm and an average diameter of 42 nm. UV–Vis spectrum of the nanorods exhibited a strong UV emission. The band energy gap of the product was 1.79 eV which lies between the energy gap of CoO and that for Co3O4. The obtained carrier concentration is of the order 4.32 × 1027 m−3 and the dielectric constant is found to be 4.89. The electrical conductivity increases with increasing temperature and behaves as a semiconducting material with an activation energy of a bout 0.26 eV. This makes the as synthesized mixed Co3O4/CoO nanorods very useful for supercapacitor devices application. Magnetic hysteresis loops at room temperature of the as synthesized mixed oxides (Co3O4/CoO) nanorods exhibit typical soft magnetic behavior.  相似文献   

17.
Single crystals of Cu7GeSe5I superionic conductor were grown by chemical transport. Their electrical conductivity in the frequency range 1.0×106–1.2×109 Hz and in the temperature range 196–295 K was measured. Cu7GeSe5I crystal is shown to exhibit a rather high electrical conductivity (σ295=64.0 S/m at 295 K) and a low activation energy (ΔEa=0.125 eV). Optical absorption edge of Cu7GeSe5I crystals in the temperature range 77–300 K was studied, the temperature dependences of the optical pseudogap and Urbach energy being obtained. The effect of different types of disordering on the Urbach absorption edge and electron–phonon interaction parameters was investigated.  相似文献   

18.
Different photo-assisted techniques were employed for chromium disilicide (CrSi2) semiconductor film fabrication. Flash evaporation of CrSi2 powder on the Si substrate heated to ∼740 K leads to the formation (according to XRD study) of amorphous films. Post-annealing at 920 K leads to the formation of polycrystalline CrSi2 phase. Crystallization is improved by further annealing with 1500 Q-Switched Nd:YAG laser pulses. Optical properties of the as deposited and annealed CrSi2 films have been investigated in the 240-1100 nm spectral range by using spectroscopic ellipsometry. The formation of CrSi2 semiconductor phase was additionally confirmed by the temperature dependence of electrical resistance of the films treated by Q-switched Nd:YAG laser. The band gap for intrinsic conductivity results Eg ≅ 0.2 eV. Backward laser-induced film transfer (LIFT) was also used for CrSi2 film deposition from bulk material on Si substrates. Pulsed CO2 laser was employed for this purpose, because of transparency of silicon at the 10.6 μm wavelength. Measurements of the electrical resistance of the deposited films as a function of temperature showed their semiconductor behavior (Eg = 6 × 10−4 eV). Chromium disilicide films were also deposited by congruent pulsed laser ablation deposition on Si substrates either at room temperature or heated to about 740 K. In this last case the deposit exhibits semiconducting properties with Eg ≅ 0.18 eV.  相似文献   

19.
《Solid State Ionics》2006,177(19-25):1985-1989
The application of the electrophoretic deposition (EPD) technique to the preparation of high quality electrolyte films for intermediate temperature solid oxide fuel cells (IT-SOFCs) was investigated. Films of La0.83Sr0.17Ga0.83Mg0.17O2.83 (LSGM) were deposited on Pt and La0.8Sr0.2MnO3 (LSM) substrates from suspensions in acetone/ethanol (3:1 by volume) mixture solvent and sintered at 1300 °C. Pt supported LSGM films, 10–20 μm thick, exhibited good adhesion to the Pt substrate, well-distributed microporosity and some surface roughness. LSM supported films exhibited cracking after sintering at 1300 °C for 3 h. Up to 900 °C the bulk conductivity of the Pt supported LSGM film showed the same behaviour of LSGM pellet (Ea = 0.93 eV and 0.99 eV, respectively). The LSGM film exhibited lower bulk electrical conductivity than the latter (4.1 × 10− 3 and 4.4 × 10− 2 Ω− 1 cm− 1, respectively, at 700 °C). This difference should be ascribed to the slight Ga depletion in the LSGM film. An important issue remains the selection of adequate electrode for LSGM electrolyte films.  相似文献   

20.
Crystals of cerium aluminate with perovskite structure were obtained using the cold-crucible technique. The electrical and optical properties of cerium aluminate were studied in air in the range 300–1300 K. The main characteristics of CeAlO3 at T=300 K are a follows: electrical conductivity σ=10?7 S/cm, dielectric permittivity ?=3000–10000 (both measured at a frequency of 1000 Hz), thermal band-gap width ΔE=2.3±0.5 eV, and optical width δE=2.65±0.25 eV, which decreases at a rate of ?0.62×10?3 eV/K with increasing temperature in the 300-to 1500-K interval.  相似文献   

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