Combined X‐ray diffraction and alpha particle X‐ray spectrometer analysis of geologic materials

The shallow interrogation depth of the lightest elements (Na, Mg, Al, and Si) detected by the particle‐induced X‐ray emission branch of the Curiosity Rover's alpha particle X‐ray spectrometer suggests that the X‐rays of these elements very likely emerge from a single mineral grain. This reality violates the assumption of atomic homogeneity at the micron scale made in both existing spectrum‐reduction approaches for the alpha particle X‐ray spectrometer. Consequently, analytical results for these elements in igneous geochemical reference materials exhibit deviations from certified concentrations in a manner that can be related to the total alkali‐silica diagram. A computer code is introduced here to provide quantitative prediction of these deviations using the mineral abundances determined from X‐ray diffraction. The latter are converted to area coverage fractions to represent the sample surface, and a fundamental parameters computation predicts the elemental X‐ray yields from each mineral and sums these. In this process, the chemistry of each individual mineral has to be varied by an iterative simplex approach; X‐ray yields are computed and compared with the peak areas from the fit of the bulk sample. When the difference between mineral yields and peak areas for each element are minimized, the mineral formulae are set and elemental X‐ray yields provided. The ratio between the summed mineral X‐ray yields and the corresponding yields based on the homogeneity assumption may then be compared directly with the concentration deviations measured in our earlier work. For several rock types, good agreement is found, thereby consolidating our understanding of the effects of sample mineralogy on alpha particle X‐ray spectrometer results. Copyright © 2017 John Wiley & Sons, Ltd.     

Deconvolution of distinct lithology chemistry through oversampling with the Mars Science Laboratory Alpha Particle X‐Ray Spectrometer

The Alpha Particle X‐Ray Spectrometer (APXS) determines the chemical composition of Martian rocks and soils on‐board both active National Aeronautics and Space Administration (NASA) rovers using X‐ray emission spectroscopy through complementary particle‐induced X‐ray emission (PIXE) and X‐ray fluorescence (XRF) excitation methods. A single APXS spectrum represents the sum of the signals from within the instrument's field of view (FOV). In the past, features smaller than the FOV have been investigated through repeated measurements with stepwise lateral offsets. These lateral offsets allow for empirically extracting, through elemental correlations, distinct compositions of different features. Here, we present a novel analytical method for deconvolving the endmember chemistry of visually distinct components through oversampling and the integrated analysis of the elemental data and supporting images. We discuss specifically the method's application to three targets investigated by the Mars Science Laboratory rover Curiosity during its traverse, as well as the added information that can be gained from this method in the future. Copyright © 2016 John Wiley & Sons, Ltd.     

Comparison of trace elements analysis of nephrite samples from different deposits by PIXE and ICP‐AES

Comparing values of trace elements determined by external‐beam proton‐induced X‐ray emission (PIXE) and inductively coupled plasma atomic emission spectrometry (ICP‐AES) is important to find the provenience of raw materials of ancient nephrite artifacts, because most previous elemental characterizations of nephrite minerals were obtained by ICP‐AES, but PIXE presents the possibility of nondestructive analysis for largely and integrally ancient nephrite artifacts. In this work based on 12 nephrite minerals, it shows that the distribution of trace elements of nephrite samples both in PIXE and ICP‐AES data are generally consistent, although large differences exist in some elements. According to the trace elements, the two types of nephrite mineralization origins can be distinguished, determined by PIXE and ICP‐AES, respectively. Moreover, depending on the PIXE and ICP‐AES data, Sr can be regarded as fingerprint element of Xiaomeiling nephrite minerals, and the differentiation of Sr content between Xiaomeiling nephrite minerals and ancient nephrite artifacts from Liangzhu culture (3300–2300 bc ) is clear evidence that the raw materials of the artifacts are not from Xiaomeiling deposit. The nephrite minerals from Wenchuan deposit can be distinguished from other samples because of their high values of Mn/Fe. Therefore, the PIXE can be used with ICP‐AES to judge mineralization mechanism and find fingerprint elements of raw materials of ancient nephrite artifacts. Copyright © 2012 John Wiley & Sons, Ltd.     

Influence of different mass absorption coefficient datasets on PIXE yields

Tabulated mass absorption coefficient data from the XCOM, Chantler and ion beam analysis (IBA) Handbook are compared, and differences are shown against X‐ray energy and target atomic number. Over the X‐ray energy range 1–40 keV systematic differences of several tens of percent are noted between these datasets, particularly for the earlier IBA Handbook dataset. The influence of these different mass absorption coefficients on the X‐ray yields for thick target proton‐induced X‐ray emission (PIXE) are investigated and compared as a function of X‐ray energy and target atomic number. For contemporary experimental PIXE users trying to work quantitatively over a broad range of elements and X‐ray energies, differences between PIXE results obtained using these three separate mass attenuation coefficient datasets can be larger than the typical accuracy limits of ±3% to ±5%. There are systematic differences in the mass attenuation coefficients of 5–10% between the XCOM and Chantler, while the differences for the IBA Handbook dataset can be larger (up to 40% and greater) at high X‐ray energies. At this time, we recommend the dataset of Chantler as it is more recent, and the synchrotron experimental results seem to favour it over the older XCOM and IBA Handbook data. Copyright © 2013 John Wiley & Sons, Ltd.     

Powdered rock versus solid rock comparisons in particle-induced X-ray emission measurements for planetary geochemical exploration

Grain size is an important consideration in the determination of the bulk chemistry of Martian rocks and unconsolidated materials in situ by the alpha particle X-ray spectrometer (APXS), deployed on the NASA-led Mars Science Laboratory mission. We used 2.5 MeV protons to emulate the particle-induced X-ray emission (PIXE) branch (5 MeV alphas) of the APXS. Seven polished rock slabs (igneous and sedimentary), ranging from fine- to coarse-grained, were analyzed by PIXE in their original form, then milled to powders and pressed into pellets for further analysis. The summed area (160 mm²) over 10 interrogated regions on each slab is comparable to the area interrogated on the APXS; analysis of two pellets per rock, each using a 16 mm² region, was found to be appropriate. The mean pellet/slab concentration ratio for Na, Mg, Al, Si, K, Ca, and Fe was close to 1.0 for fine-grained samples, but changed by ±10% for the coarser cases. The variability among PIXE concentration values across the 10 rock regions increased monotonically with coarseness in the rock slabs. Comparison of overall PIXE concentrations with values measured by borate-fusion WDXRF provides further quantitative support to the direct comparison of pellet and slab PIXE concentrations. This work affirms the use of the APXS on fine-grained Martian materials but recommends larger interrogation areas (including rastering) when analyzing coarser-grained materials. It also demonstrates that the presence of relatively large mineral grains (phenocrysts) or rock/mineral fragments within fine-grained materials can contribute to greater error for specific elements associated with those phenocrysts/fragments.     

Calibration of the MER α‐particle x‐ray spectrometer for detection of ‘invisible’ OH and H2O possibly present in Martian rocks and soils

An existing Monte Carlo code was modified and extended to predict the intensity ratio of elastically and inelastically scattered plutonium Lα x‐rays incident on rock samples in the Mars Exploration Rover's α‐particle x‐ray spectrometer (APXS) device. The systematics of the scatter ratio as a function of effective sample atomic number are explored. The simulated Rayleigh/Compton ratios (R/C)_sim are compared with measured ratios (R/C)_meas that are obtained by fitting APXS spectra of geochemical reference materials using an x‐ray fluorescence version of GUPIX. The quantity K = (R/C)_meas/(R/C)_sim is then plotted against the mean atomic number of the sample to provide a calibration for known samples. Departures of K values of unknown samples from this calibration may then be attributed to the presence of light, ‘invisible’ elements in the sample. This work is part of an ongoing project aimed at developing methods to quantify bound water in Martian rocks analyzed by the present and the next generation APXS instruments. Copyright © 2006 John Wiley & Sons, Ltd.     

An upgraded external beam PIXE setup for multielemental analysis of atmospheric aerosol samples

The external beam particle‐induced X‐ray emission (PIXE) setup has been upgraded by introducing a new silicon drift detector with the aim of obtaining better minimum detection limits (MDLs) at the 2 × 1.7 MV Tandetron accelerator of the Beijing Normal University in China. The upgraded external beam PIXE setup is equipped with two silicon drift detectors for PIXE analysis of low and high Z elements. A surface barrier detector for Rutherford backscattering spectrometry monitors beam and helium flow. Two kinds of aerosol filter samples (quartz fiber filters and Teflon filters) were studied. A 200‐μm thick Mylar absorber in front of the medium‐high energy X‐rays detector was adopted, and it got the best MDLs for atmospheric aerosol samples analysis. Multielemental analysis of quartz fiber filter aerosol samples was achieved. For more accurate and better MDLs of low Z elements in PIXE analysis, it is necessary to keep sufficient helium flow behind the thin samples.     

Determination of Pb,Zr, Ti,Sr, Cr,Nb and La in lead zirconate titanate ceramics by particle‐induced X‐ray emission

A particle‐induced X‐ray emission (PIXE) technique has been used in the determination of the principal components Pb, Zr and Ti and the substituting elements Sr, Cr, Nb and La in lead zirconate titanate ceramics. In general, precision of analysis was concentration dependent from each element under study. For Pb, precision varied between 0.13% and 0.16%, at higher concentration of 59.32–64.5%. It was around 6–9% for Sr, Cr and Nb at concentrations of 1% or lower. Particular attention was devoted to the estimation of the analysis trueness. With this purpose, three methods were applied: (1) comparison of PIXE and inductively coupled plasma optical emission spectrometry concentrations, (2) recovery study and (3) comparison with a laboratory standard. Trueness of analysis was around 100 ± 10% for the evaluated elements Pb, Zr, Ti, Sr and Cr. The expected stoichiometry and elemental composition homogeneity of a wide group of produced ceramics were confirmed by the PIXE technique. Copyright © 2012 John Wiley & Sons, Ltd.     

Comparison of the detection limits in the analysis of some medium atomic number elements measured with a portable XRF and an external proton beam PIXE spectrometer system

A portable X‐ray fluorescence (XRF) spectrometer system was constructed using an Amptek Mini‐X X‐ray tube and an X‐123 compact spectrometer. The spectrometer is optimised for the best limits of detection. Its analytic properties are tested and compared with an analogous laboratory‐based instrument, an external beam proton‐induced X‐ray emission spectrometry (PIXE) setup. Depending on elements in question the thick target detection limits of this portable XRF device are comparable or even lower than the PIXE setup. Copyright © 2011 John Wiley & Sons, Ltd.     

ED‐XRF set‐up for size‐segregated aerosol samples analysis

The knowledge of size‐segregated elemental concentrations in atmospheric particulate matter (PM) gives a useful contribution to the complete chemical characterisation; this information can be obtained by sampling with multi‐stage cascade impactors. In this work, samples were collected using a low‐pressure 12‐stage Small Deposit Impactor and a 13‐stage rotating Micro Orifice Uniform Deposit Impactor^?. Both impactors collect the aerosol in an inhomogeneous geometry, which needs a special set‐up for X‐ray analysis. This work aims at setting up an energy dispersive X‐ray fluorescence (ED‐XRF) spectrometer to analyse quantitatively size‐segregated samples obtained by these impactors. The analysis of cascade impactor samples by ED‐XRF is not customary; therefore, as additional consistency test some samples were analysed also by particle‐induced X‐ray emission (PIXE), which is more frequently applied to size‐segregated samples characterised by small PM quantities. A very good agreement between ED‐XRF and PIXE results was obtained for all the detected elements in samples collected with both impactors. The good inter‐comparability proves that our methodology is reliable for analysing size‐segregated samples by ED‐XRF technique. The advantage of this approach is that ED‐XRF is cheaper, easier to use, and more widespread than PIXE, thus promoting an intensive use of multi‐stage impactors. Copyright © 2011 John Wiley & Sons, Ltd.     

Quantitative major and trace elemental mapping by PIXE of concretionary pyrite from the Witwatersrand Basin,South Africa

Several concretionary pyrite grains displaying multiple, massive sulphide or silicate inclusion‐rich, annuli from two gold‐bearing reef horizons (Ventersdorp Contact Reef, Kimberley Reefs) in different parts of the Witwatersrand Basin were analysed by particle‐induced X‐ray emission (PIXE) and electron microprobe analysis (EMPA) for their major and trace element compositions. Both PIXE spot analysis and mapping of the distributions of major and trace elements were carried out, and EMPA was employed to obtain major element abundances for matrix corrections of PIXE analysis. Spatial analysis by PIXE is excellent in comparison with EMPA, as PIXE detection limits are lower by 1–2 orders of magnitude at comparable, short‐duration counting times (12 h for 4096 pixel analyses by PIXE). EMPA was successful in the identification of individual zones, for example on the basis of locally enriched minor elements Ni or As. This technique also provided essential standard‐based control on major element abundances for the standardless PIXE dynamic analysis. The compositional results obtained on concretionary pyrite grains by PIXE are distinctly different for each analysed grain, in terms of relative enrichment of certain minor and trace elements in specific zones. Gold was detected locally in the interiors of grains and/or along grain margins. The different results are discussed with regard to their possible meaning related to the origin of gold mineralization in the Witwatersrand ore deposit. Copyright © 2004 John Wiley & Sons, Ltd.     

Estimation of trace elements in some medicinal plants used in anti‐cancer drugs by PIXE

A trace elemental analysis was carried out in various parts of 12 anticancer medicinal plants, using the PIXE (particle‐induced X‐ray emission) technique. A 3‐MeV proton beam was used to excite the samples, and spectra were recorded using a Si (Li) detector. Data analysis was done using the GUPIX software. The elements Cl, K, Ca, Ti, V, Mn, Fe, Ni, Cu, Zn, Br and Sr were identified, and their concentrations estimated. The results of the present study provide justification for the usage of these medicinal plants in the development of anticancer drugs. Copyright © 2012 John Wiley & Sons, Ltd.     

The new PIXE‐alpha spectrometer for the analysis of Roman nummi surfaces

The particle‐induced X‐ray emission (PIXE)‐alpha portable spectrometer of the Laboratori Nazionali del Sud has been upgraded to improve X‐ray energy resolution and efficiency. A value of 124 eV at Mn Κα‐line and a factor of 3 were, respectively, achieved. These enhanced capabilities allowed the thin surface examination of 5 Roman nummi, in which previous near‐surface X‐ray fluorescence measurements revealed traces of mercury. In particular, the new version of the PIXE‐alpha spectrometer has allowed the distinction of the 2.19 keV Hg M‐line from the 2.30 keV S K‐line and the 2.34 keV Pb M‐line. Subsequent elemental association has demonstrated a correlation between surface mercury and silver. Copyright © 2012 John Wiley & Sons, Ltd.     

Combined PIXE and X‐ray diffraction analysis of accretionary lapilli from the Cretaceous/Paleogene boundary El Guayal Section,Tabasco, Mexico

By employing the techniques, X‐ray powder diffraction (XRPD) and particle‐induced X‐ray emission (PIXE), it could be obtained in a simply way an overall vision of the structure and chemical composition of a spheroid (lapillus) collected in the K/Pg deposit located at the place called El Guayal in Tabasco, Mexico. The XRPD analysis indicates the presence of an amorphous and four crystalline phases (quartz, calcite, ankerite, and montmorillonite) in the spheroid. None sulfur crystalline phases were detected. PIXE results show the presence of different atoms in a weight percentage that follows the sequence: Si > Al > Ca > Fe > Sr > Cu > Ti > Mn > Y > Rb > Zn > Pb. None of platinum group elements were detected. PIXE analysis by of the lapillus shows the presence of the most abundant atoms in the Earth's crust, but in this case, the relative abundance Fe‐Ca is inverted, and the Sr/Rb proportion is considerably higher than that observed in the crust. Additionally, nor sulfur or any of the platinum group elements was detected in the lapillus. Except for the case of trace elements detected, in general, no characteristic pattern is observed in the distribution of the most abundant elements. Copyright © 2015 John Wiley & Sons, Ltd.     

Experimental study of the efficiency of a SDD X‐ray detector by means of PIXE spectra

The efficiency of a silicon drift detector with ultrathin window was studied for energies between 0.27 and 25 keV. Experimental values of the X‐ray yields from samples of known stoichiometry were obtained by impact of 2 MeV protons. By using theoretical calculations of these yields the relative efficiency of the detector was evaluated. The results are compared with efficiency values obtained from the window transmission and the detector quantum efficiency. A quantitative analysis of a particle induced X‐ray emission spectrum for a reference sample was performed in order to evaluate the consistency of the data presented in this work. Copyright © 2013 John Wiley & Sons, Ltd.     

PIXE analysis of a painting by Giorgio Vasari

Among ion beam analysis (IBA) techniques, particle induced x‐ray emission (PIXE) is the most widely used in the field of cultural heritage, providing the elemental composition of materials in a non‐invasive and non‐destructive way. This paper reports on the analysis by PIXE performed at one of the external beamlines of the 3 MV Tandetron accelerator of the LABEC laboratory (Istituto Nazionale di Fisica Nucleare (INFN)—Florence) on a wood painting by Giorgio Vasari, belonging to the altar‐piece ‘Pala Albergotti’ (church of Sts Flora and Lucilla, Arezzo). The measurements were taken in the framework of a campaign of scientific investigations, promoted by the Soprintendenza of Arezzo, preliminary to the restoration of the whole altar‐piece. PIXE was used to identify the elemental composition of the original materials and to characterise the alteration layer visible on the surface of the painting. Measurements on the same spot with proton beams of different energies (differential PIXE) also allowed us to get information on the depth distribution of elements and on the structure of layers without the need of picking up samples. Copyright © 2009 John Wiley & Sons, Ltd.     

Role of the mass attenuation coefficient database in standardization of a silicon drift X‐ray detector for PIXE analysis

A simple, inexpensive procedure is described for calibrating a silicon drift detector‐based PIXE system for the analysis of geological and other “thick‐target” materials. It rests on the use of single element, chemical compound, and National Institute for Standards and Technology multielement standards. Much less effort has been focussed on the impact of mass attenuation coefficients on PIXE's analytical accuracy than on ionization cross sections and fluorescence yields. The calibrated system enables us to investigate the effects of inserting different mass attenuation coefficient datasets into the GUPIX database. For the K X‐rays of light elements, accuracy is significantly improved by replacing the formerly used XCOM self‐attenuation coefficients by the corresponding FFAST values; this effect decreases rapidly with increasing atomic number. Similar improvement was found for L X‐rays of medium‐Z, but not for high‐Z atoms.     

Micro‐PIXE analysis of doped SiO2 fibres intended as TL dosimeters for radiation measurements

Sample elemental concentrations can be determined using the microbeam proton‐induced X‐ray emission (PIXE) technique, providing non‐destructive simultaneous low‐background multi‐element analysis. Present interest concerns analysis of Ge‐doped SiO₂ fibres intended as high spatial‐resolution thermoluminescence (TL) dosimeters for radiation measurements in place of their more typical applications in telecommunications. During fibres fabrication, defined amounts of the Ge dopant are added, the dopant more usually having a determining role in the transmission properties of the fibre. Characteristic X‐rays produced in PIXE analysis provide information on the relative distribution of elements within a sample, as in for instance Ge and Si concentrations, the Ge acting as point defect centres that promote TL. With the dopant tending to diffuse in and away from the fibre core, it is essential to define the sample matrix composition in order to accurately evaluate the X‐ray yield. This is determined in part using simultaneous Rutherford Back Scattering analysis. In present work, PIXE/Rutherford Back Scattering measurements have been employed to ascertain dopant concentrations of fibres that have been fabricated at the University of Malaya with a view to improving TL yield. Present results concern cylindrical fibres, nominally with 4%, 6% and 8% weight peak Ge concentrations and flat fibres of nominal 6% weight Ge concentration. For the cylindrical fibres, Ge dopant concentration has been found to be in the range of 2.41–4.56%, 6.44–8.29% and 10.27–12.25% weight, respectively, while for the flat fibres, the Ge concentration range is broader, at 0.07–6.55% weight. Copyright © 2014 John Wiley & Sons, Ltd.     

Trace element determinations in uranium by total reflection X‐ray fluorescence spectrometry using polychromatic X‐ray excitation

Suitability of polychromatic X‐rays has been assessed for the total reflection X‐ray fluorescence (TXRF) trace elemental determinations in aqueous solutions as well as uranium oxide certified reference materials. The method involves total reflection of X‐rays below a certain energy level on the TXRF sample support and exciting the analytes present in ng amount on these supports, measuring the TXRF spectra, processing the spectra, and finally determining the elemental concentrations. For uranium‐based samples, the samples were dissolved, main matrix uranium was separated from these solutions using solvent extraction, and trace elements were determined using aqueous phase following above approach. The method is simple and easier to implement compared with the monochromatic excitation but has similar or in some cases better detection limits compared with those obtained using monochromatic excitation. The details of the methodology, quality of analytical results, and detection limits are described and compared with those obtained using monochromatic excitation. Copyright © 2017 John Wiley & Sons, Ltd.     

Application of PIXE for the determination of transition elements in the grouping study of archaeological clay potteries

Trace element concentrations play an important role in grouping and provenance studies of archaeological artifacts. Particle‐inducedX‐ray emission (PIXE) using low energy proton beams (1.5 and 3 MeV) from a tandem particle accelerator was used to analyze the ancient clay potteries collected from an ancient Buddhist site in India. Concentrations of 13 elements, including eight transition elements, were determined. The concentrations of transition elements were used for the grouping study by statistical cluster analysis according to the similar and dissimilar elemental distribution within the samples. Two International Atomic Energy Agency Reference Materials (RMs) were analyzed to validate the PIXE method. Two samples were analyzed by both PIXE and instrumental neutron activation analysis (INAA) as a part of quality assurance. Grouping results were used for preliminary provenance study. Copyright © 2017 John Wiley & Sons, Ltd.