Ion-erosion induced surface nanoporosity and nanotopography on Si

The low-energy ion-bombardment induced surface nanotopography and the nanopatterning of Si has been simulated by atomistic simulations using an approach based on molecular dynamics (MD). In order to speed up simulations a reasonable cutoff in simulation time and increased cooling rates for keeping in hand the system temperature have been used. We get an unexpectedly rich variety of disordered nanopatterns formed by the self-organization of the crater rims and adatoms islands generated by the individual ion impacts. Our results reveal that the low-energy (0.5 keV impact energy) ion-sputtered Si surface is not smooth at the sub-20 nm length scale and deep nanoholes rule the landscape. Moreover substantial nanoporosity is found beneath the surface with the size range of a few nanometer. Scanning tunneling microscopy (STM) images are also shown obtained for low-fluence ion-sputtering of Si at 2 keV impact energy at 30° angle of incidence. STM images reveal similar features obtained by computer simulations: nanoholes can be seen with a few nanometer diameter. The overall topography landscape as well as the rms surface roughness also show similar features for the images obtained by STM or MD at 2 keV impact energy. The applied approach could make it possible the simulation of nanotopographic images at the molecular dynamics level of theory and could help resolve scanning probe microscopy images in the sub-20 nm length scale regime.     

Visualized investigation of yeast transformation induced with Li+ and polyethylene glycol

The effects of Li⁺ and polyethylene glycol (PEG) on the genetic transformation of Saccharomyces cerevisiae were investigated by using fluorescence microscopy (FM) to visualize the binding of plasmid DNA labeled with YOYO-1 to the surface of yeast cells, scanning electron microscopy (SEM) and atomic force microscopy (AFM) to image the change in surface topography of yeast cells, coupled with transformation frequency experiments. The results showed that under the same conditions, the transformation frequencies of yeast protoplasts were much higher than those of intact yeast cells. PEG was absolutely required for the binding of DNA to the surface of intact yeast cells or yeast protoplasts, and had no effect on the surface topography of intact yeast cells or yeast protoplasts. In the presence of PEG, Li⁺ could greatly enhance the binding of plasmid DNA to the surface of intact yeast cells, increase their transformation frequency, and affect their surface topography. On the other hand, no effect on the DNA binding to the surface of protoplasts and no increase in the number of transformants and no surface topography changes were found upon the treatment with Li⁺ to protoplasts. In the present work, the effects of Li⁺ and PEG on yeast genetic transformation were directly visualized, rather than those deduced from the results of transformation frequencies. These results indicate that cell wall might be a barrier for the uptake of plasmid DNA. Li⁺ could increase the permeability of yeast cell wall, then increase the exposed sites of DNA binding on intact yeast cells. The main role of PEG was to induce DNA binding to cell surface.     

扫描离子电导显微镜的原理及应用

扫描离子电导显微镜(SICM)是一种扫描探针显微技术,通过测定超微玻璃管探针的离子电流,它能够非接触地扫描样品表面,进而研究样品的形貌及性质。SICM具有成像分辨率高、探针易于制备和对被成像物体无损伤等特点,特别适用于研究生理条件下的活体细胞,是一种与扫描电化学显微镜及原子力显微镜互补的扫描探针显微镜技术。SICM能够对软界面及表面,如活细胞表面的显微结构,进行高分辨率成像;并能够与其它技术联用,研究细胞形貌与功能的关系;还能控制沉积特定分子,实现纳米尺度的显微操作与加工。本文对SICM的发展历史、仪器构造、基本原理及应用进行了综述。     

Measuring surface topography with scanning electron microscopy. I. EZEImage: a program to obtain 3D surface data.

Scanning electron microscopy (SEM) is widely used in the science of materials and different parameters were developed to characterize the surface roughness. In a previous work, we studied the surface topography with fractal dimension at low scale and two parameters at high scale by using the variogram, that is, variance vs. step log-log graph, of a SEM image. Those studies were carried out with the FERImage program, previously developed by us. To verify the previously accepted hypothesis by working with only an image, it is indispensable to have reliable three-dimensional (3D) surface data. In this work, a new program (EZEImage) to characterize 3D surface topography in SEM has been developed. It uses fast cross correlation and dynamic programming to obtain reliable dense height maps in a few seconds which can be displayed as an image where each gray level represents a height value. This image can be used for the FERImage program or any other software to obtain surface topography characteristics. EZEImage also generates anaglyph images as well as characterizes 3D surface topography by means of a parameter set to describe amplitude properties and three functional indices for characterizing bearing and fluid properties.     

ToF-SIMS measurements with topographic information in combined images

In 2D and 3D time-of-flight secondary ion mass spectrometric (ToF-SIMS) analysis, accentuated structures on the sample surface induce distorted element distributions in the measurement. The origin of this effect is the 45° incidence angle of the analysis beam, recording planar images with distortion of the sample surface. For the generation of correct element distributions, these artifacts associated with the sample surface need to be eliminated by measuring the sample surface topography and applying suitable algorithms. For this purpose, the next generation of ToF-SIMS instruments will feature a scanning probe microscope directly implemented in the sample chamber which allows the performance of topography measurements in situ. This work presents the combination of 2D and 3D ToF-SIMS analysis with topographic measurements by ex situ techniques such as atomic force microscopy (AFM), confocal microscopy (CM), and digital holographic microscopy (DHM). The concept of the combination of topographic and ToF-SIMS measurements in a single representation was applied to organic and inorganic samples featuring surface structures in the nanometer and micrometer ranges. The correct representation of planar and distorted ToF-SIMS images was achieved by the combination of topographic data with images of 2D as well as 3D ToF-SIMS measurements, using either AFM, CM, or DHM for the recording of topographic data.     

Using wavelets to analyze AFM images of thin films: surface micelles and supported lipid bilayers

This paper presents micro- and nanoanalysis of thin films based on images obtained by atomic force microscopy (AFM). The analysis exploits the discrete wavelet transform and the resulting wavelet spectrum to study surface features. It is demonstrated that the wavelet technique can characterize micro- and nanosurface features and distinguish between similar surface structures. The use of a feature extraction method is shown. The method involves the separation of certain frequency content from the original AFM images and analyzing the data independently to gain quantitative information about the images. By using the feature extraction method, soft surfaces in water are analyzed and nanofeatures are measured. The packing of surface micelles of sodium dodecyl sulfate on a self-assembled monolayer is analyzed. The characteristics of pore formation, due to penetration of the antibacterial peptide protegrin, into a solid-supported lipid bilayer are quantified. The sizes of the pores are obtained, and it is observed that the line tension of the pores reduces the fluctuations of the lipid bilayer.     

Single-molecule chemistry and physics explored by low-temperature scanning probe microscopy

It is well known that scanning probe techniques such as scanning tunnelling microscopy (STM) and atomic force microscopy (AFM) routinely offer atomic scale information on the geometric and the electronic structure of solids. Recent developments in STM and especially in non-contact AFM have allowed imaging and spectroscopy of individual molecules on surfaces with unprecedented spatial resolution, which makes it possible to study chemistry and physics at the single molecule level. In this feature article, we first review the physical concepts underlying image contrast in STM and AFM. We then focus on the key experimental considerations and use selected examples to demonstrate the capabilities of modern day low-temperature scanning probe microscopy in providing chemical insight at the single molecule level.     

CHEMICAL MORPHOLOGY IN GRAFTING ACRYLAMIDE TO POLYETHYLENE

The scanning force microscopy (SFM)/chemical force microscopy (CFM) were used to study the growth of grafted polyacrylamide (PAM) chains onto polyethylene (PE)-film with varying grafting time.Results from the CFM reveal reduced interaction between the probe and areas with grafted-PAM on the surface.The topography and the friction trace- minus-retrace (TMR) images are complementary to one another resulting from the reduced interaction of the probe that has specificity to chemical domains.     

扫描探针显微镜在纳米加工中的应用

扫描探针显微镜不仅能对材料表面形貌进行原子级观测，还能够对单个的分子、原子及纳米粒子进行操纵。本文综述了扫描探针显微镜在纳米加工中对自组装单层膜的扫描探针刻蚀以及“蘸写笔”两方面的应用情况。     

Dielectrophoretic force microscopy of aqueous interfaces

A novel scanning probe microscopy technique has allowed dielectrophoretic force imaging with nanoscale spatial resolution. Dielectrophoresis (DEP) traditionally describes the mobility of polarizable particles in inhomogeneous alternating current (ac) electric fields. Integrating DEP with atomic force microscopy allows for noncontact imaging with the image contrast related to the local electric polarizability. By tuning the ac frequency, dielectric spectroscopy can be performed at solid/liquid interfaces with high spatial resolution. In studies of cells, the frequency-dependent dielectrophoretic force is sensitive to biologically relevant electrical properties, including local membrane capacitance and ion mobility. Consequently, dielectrophoretic force microscopy is well suited for in vitro noncontact scanning probe microscopy of biological systems.     

Uniformity analysis in nanocrystalline silver thin films using fuzzy inference system

An automatic and efficient technique to analyze the uniformity of nanoscale images using wavelets, feature similarity index measure (FSIM) and fuzzy inference system is reported. It has been successfully tested on scanning electron micrographs of nanocrystalline silver thin films. Thin films are prepared using on‐axis and off‐axis pulse laser deposition (PLD) technique. It is found that the film prepared using on‐axis PLD is more uniformly distributed and has smoother texture compared with that of the off‐axis technique. In order to analyze the images quantitatively, they are transformed to the wavelet domain to extract the localized frequency variations and a uniformity measure is derived using a fuzzy inference system for quantitatively analyzing the uniformity of each image. The surface plot of the FSIM values of the image is found to be an efficient tool for nanoscientists to evaluate the smoothness of the thin film surfaces. This study is expected to help the nanoscientists to understand these nanostructures in detail. Copyright © 2014 John Wiley & Sons, Ltd.     

Single-photon atomic force microscopy

In the last few years, an array of novel technologies, especially the big family of scanning probe microscopy, now often integrated with other powerful imaging tools such as laser confocal microscopy and total internal reflection fluorescence microscopy, have been widely applied in the investigation of biomolecular interactions and dynamics. But it is still a great challenge to directly monitor the dynamics of biomolecular interactions with high spatial and temporal resolution in living cells. An innovative method termed “single-photon atomic force microscopy” (SP-AFM), superior to existing techniques in tracing biomolecular interactions and dynamics in vivo, was proposed on the basis of the combination of atomic force microscopy with the technologies of carbon nanotubes and single-photon detection. As a unique tool, SP-AFM, capable of simultaneous topography imaging and molecular identification at the subnanometer level by synchronous acquisitions and analyses of the surface topography and fluorescent optical signals while scanning the sample, could play a very important role in exploring biomolecular interactions and dynamics in living cells or in a complicated biomolecular background.     

Investigations of local electrical surface characteristics by dynamical scanning force microscopy

A technique is presented that allows to obtain information about sample surface topography and local electrical surface properties simultaneously. A scanning electrical force microscope is used for that purpose which is based on an atomic force microscope (AFM) working in the dynamical mode. Different information channels contained in the cantilever excitation spectrum are separated by a lock-in technique. The physical content of the technique is discussed in detail and the influence of surface topography on the non-topographic imaging is demonstrated. Finally, the real advantages of cross-sectional sample preparation (as known from electron microscopy) for this kind of scanning probe microscopy with respect to various applications is presented.     

Scanning Probe Microscopy beyond Imaging: A General Tool for Quantitative Analysis

A simple, fast and general approach for quantitative analysis of scanning probe microscopy (SPM) images is reported. As a proof of concept it is used to determine with a high degree of precision the value of observables such as 1) the height, 2) the flowing current and 3) the corresponding surface potential (SP) of flat nanostructures such as gold electrodes, organic semiconductor architectures and graphenic sheets. Despite histogram analysis, or frequency count (Fc), being the most common mathematical tool used to analyse SPM images, the analytical approach is still lacking. By using the mathematical relationship between Fc and the collected data, the proposed method allows quantitative information on observable values close to the noise level to be gained. For instance, the thickness of nanostructures deposited on very rough substrates can be quantified, and this makes it possible to distinguish the contribution of an adsorbed nanostructure from that of the underlying substrate. Being non‐numerical, this versatile analytical approach is a useful and general tool for quantitative analysis of the Fc that enables all signals acquired and recorded by an SPM data array to be studied with high precision.     

Wavelet analysis on photoacoustic spectra of degraded PVC

Wavelet transform (WT) is introduced successfully to filter simultaneously the noise and the base line in complicated photoacoustic (PA) spectra. As the noise is often at very high frequency and the base line at very low frequency, WT can fully demonstrate its capability of decomposing the signal according to the frequency. After wavelet transform, the relative strength of photoacoustic bands can be easily determined. Thus, WT can be expected as a powerful method in PA spectroscopy for analyzing the formation of polyenes with various conjugated numbers during degradation process. Received: 13 May 1997 / Revised: 17 September 1997 / Accepted: 25 September 1997     

Akustische Rastermikroskopie als Methode zur Oberfl?chenuntersuchung

Summary Techniques of scanning acoustic microscopy generally rely on local variations of such solid state parameters influencing generation or propagation of acoustic waves. Depending on the manner of impressing acoustic waves into the sample various methods are distinguished. In conventional scanning acoustic microscopy ultrasound is generated by a lens-transducer arrangement outside the sample and focussed onto or below its surface. Changes in the propagation of this ultrasound wave, like absorption and reflexion or temporal propagation delays, enable analysis of the mechanical or elastic response. At very high frequencies and with additional time-resolving detection techniques applications of this technique to surface analysis become possible. Other scanning acoustic microscopes imply the generation of sound or ultrasound directly within the sample itself due to the impact of temporarily modulated particle or photon beams. These are presently laser, electron, or ion beams. With these methods the acoustic signal as detected by a transducer attached to the sample is on principle affected by propagation properties, too, but it is dominated by local changes of the generation process for the acoustic wave, mainly because the frequency ranges used presently are associated with very long acoustic wavelengths. Depending on the physical nature of the primary probe used many sound generation mechanisms are given resulting in a large amount of different applications. By adjusting the probe parameters in a suitable manner the sound generation process can be confined to the direct vicinity of the specimen surface, which makes this technique feasible for surface characterization. The principles of the various techniques are described, and their usability for surface analysis is discussed.     

In situ Surface Charge Density Visualization of Self-assembled DNA Nanostructures after Ion Exchange

The charge density of DNA is a key parameter in strand hybridization and for the interactions occurring between DNA and molecules in biological systems. Due to the intricate structure of DNA, visualization of the surface charge density of DNA nanostructures under physiological conditions was not previously possible. Here, we perform a simultaneous analysis of the topography and surface charge density of DNA nanostructures using atomic force microscopy and scanning ion conductance microscopy. The effect of in situ ion exchange using various alkali metal ions is tested with respect to the adsorption of DNA origami onto mica, and a quantitative study of surface charge density reveals ion exchange phenomena in mica as a key parameter in DNA adsorption. This is important for structure-function studies of DNA nanostructures. The research provides an efficient approach to study surface charge density of DNA origami nanostructures and other biological molecules at a single molecule level.     

分析化学计量学中的新方法─—小波分析

小波分析在分析信号处理中具有诸多显著的优点。本文介绍了小波分析的一般描述，综述了化学计量学在的小波新方法，并展望了小波分析在分析化学计量学中的应用前景。     

Application of integrated SECM ultra-micro-electrode and AFM force probe to biosensor surfaces

The integration of scanning electrochemical ultra-micro-electrode (UME) with atomic force microscope cantilever probe have been achieved by using a homemade photolithography system. A gold-film-coated AFM cantilever was insulated with photo resist coating and a pointed end of the AFM probe was opened by illuminating with maskless arbitrary optical micro-pattern generator. To realize precise control of probe sample distance constantly, the resulting scanning electrochemical microscopy (SECM)-AFM probe was operated using a dynamic force microscopy (DFM) technique with magnetic field excitation. From a steady-state voltammetric experiment, the effective electrode diameters of the probes thus prepared were estimated to be from 0.050 to 6.2 microm. The capability of this SECM-AFM probe have been tested using gold comb in the presence of Fe(CN)(6)(3-). The simultaneous imaging of the topography and electrochemical activity of the strip electrode was successfully obtained. We also used the SECM-AFM to examine in situ topography and enzymatic activity measurement. Comparison of topography and oxidation current profiles above enzyme-modified electrode showed active parts distribution of biosensor surface.     

Structure and chemistry of interfaces

It is most desirable to understand the structure and chemistry of the internal interfaces for all classes of materials since the materials' properties often depend on the properties of the interfaces which, in turn, are controlled by their structure and chemistry. In contrast to surface science, there exist only a few techniques for studying the structure and chemistry of internal interfaces. One of the most powerful techniques seems to be transmission electron microscopy (TEM) by which short segments of interfaces can be analyzed. In high-resolution electron microscopy (HREM) a direct image is formed of the projection of the interfaces. A simple analysis of HREM micrographs is not possible owing to the complex image forming processes within HREM. In addition to experimental investigations, calculations of the structures must be performed using material specific interatomic potentials. From the calculated structure, HREM images must be simulated for the specific imaging conditions. The experimental micrographs must be compared to simulated images. An agreement between experimental micrographs and the simulated images results in the best possible atomistic configuration. A quantitative measure for this agreement is the difference image, D, between the experimental micrograph and the simulated image. Best agreement is reached if only the noise is visible in the difference image D. Analytical electron microscopy with high-spatial resolution (typical probe size <0.05 nm) allows the identification of impurities segregated at the interface. However the limit of detectability depends sensitively on the combination between the different elements. Recently developed techniques on spatially resolved electron energy loss spectra give information on bonding and coordination. As an example, the different TEM techniques have been applied to the investigation of grain boundaries in -Al₂O₃. It should be emphasized, however, that the TEM techniques could also be applied to internal interfaces in different boundaries.