HFCVD系统中衬底温度场及气相空间场的数值分析

探讨了典型气氛中热丝辐射、气体热传导与对流、化学反应生热等因素对衬底温度的影响,建立了三维热丝辐射和二维热流耦合有限元模型,研究了各工艺参数对衬底温度场及气相空间场的影响.结果表明H2占主导地位的气氛中衬底表面的氢原子重组放热对衬底温度有较大影响,氩气气氛中原子重组放热对衬底温度影响很小;热丝温度对衬底温度的影响最大;进气口到衬底的距离及进气口气体流速对衬底附近的流场影响最大,适当提高进气口到衬底的距离有助于提高衬底附近流场均匀性,增大进气速度有助于突破热障提高衬底表面流速,但同时加剧了衬底附近流场的不均匀性.     

整体硬质合金铣刀上制备CVD金刚石涂层的系统三维流场研究

本文通过建立整体硬质合金立铣刀上制备CVD金刚石涂层时CVD沉积系统流场的三维模型,研究了进气口分布对该系统流场均匀性的影响,优化了进气口的分布;在仿真的基础上开展了整体硬质合金立铣刀上制备CVD金刚石涂层的验证实验,采用SEM和Raman对制备的CVD金刚石涂层进行了分析测试.结果表明:优化后的流场可以用于制备高质量的CVD金刚石涂层,且批量制备出的在衬底不同位置上的铣刀表面CVD金刚石涂层的质量均匀一致.     

模具法制备CVD金刚石热沉片的温度场与流场研究

本文通过有限元仿真研究了模具法制备CVD金刚石热沉片的温度场和流场,并对制备参数进行了优化.实验与仿真的结果均表明,进气量的大小对衬底附近流场的均匀性影响显著,热丝温度、热丝间距以及热丝到衬底的距离对衬底的平均温度影响显著,热丝间距和热丝温度对衬底温度的均匀性影响显著;模具法制备的CVD金刚石复制了模具型腔,保证了热沉片的结构完整性和尺寸精度,最终制备了精度较高的小型CVD金刚石热沉片.     

HFCVD系统中衬底接触热阻的研究

建立了热丝CVD大面积金刚石膜沉积的衬底温度场模型,对影响衬底温度场的接触热阻及其他相关沉积参数进行了模拟计算。根据实验结果,对接触热阻的计算公式进行了修正。当ζ=0.75时,计算结果和实验结果基本上吻合。在仿真条件下,考虑衬底三维热传导以及热丝温度的不均匀分布使衬底温度场的均匀性明显优于纯热辐射下的温度场。这些计算结果为制备大面积高质量的金刚石薄膜提供了理论基础。     

HFCVD法沉积金刚石薄膜中热丝优化方法

本文探讨了在HFCVD(hot filament chemical vapor deposition)沉积金刚石薄膜中热丝数量、位置等几何参数对温度场和辐射场的影响.利用系统热传递模型和计算机辅助的数值解方法得到了该方法沉积大面积金刚石薄膜中衬底表面温度分布和热辐射能量密度分布.发现金刚石薄膜的均匀性受热辐射能量密度分布影响较大.进一步给出了沉积面积为100mm×100mm的金刚石薄膜的最佳参数.     

大面积球面金刚石膜的均匀沉积研究

利用直流电弧等离子体喷射法沉积装置在底径65 mm、高5 mm的Mo球面衬底上制备出厚度大于500 μm金刚石膜.用千分尺测量膜径向厚度以判断膜厚均匀性,用SEM观察膜的表面形貌,用拉曼谱仪测量膜的表面纯度,通过分析电镜形貌和拉曼谱峰的分布特点来判断金刚石膜的质量均匀性.结果表明,在优化工艺条件下,直流电弧等离子体喷射法设备可以在球面Mo衬底上生长出厚度和质量都比较均匀的半透光的自支撑球面金刚石厚膜.     

W18Cr4V高速钢衬底CVD金刚石涂层沉积技术研究

研究了通过热丝CVD法在施加了Ni-P/Cu复合中间过渡层的W18Cr4V高速钢衬底表面进行金刚石涂层的沉积技术以及不同压力条件对沉积出的CVD金刚石涂层质量的影响.最后通过扫描电镜分别对Cu、Ni-P以及不同反应压力下沉积的金刚石涂层的表面形貌进行了检测分析,通过XRD、拉曼光谱仪、洛氏硬度仪对金刚石涂层性能进行检测分析.结果表明:Ni-P/Cu复合中间过渡层可以明显的抑制Fe、Co的催石墨化作用.在此基础上通过沉积参数的优化,在W18Cr4V高速钢衬底表面成功沉积出高质量的CVD金刚石涂层.压力为4 kPa条件下沉积的CVD金刚石涂层较5 kPa的金刚石颗粒晶型明显、分布致密.     

热丝化学气相法生长单晶金刚石颗粒的衬底温度场仿真及实验研究

本文使用金刚石磨料作为晶种颗粒,通过热丝化学气相法生长出单晶金刚石颗粒,并且建立三维的有限元模型,利用有限元仿真分析了生长过程中影响金刚石磨料生长速率以及沉积质量的各种因素,如热丝的排列方式,衬底的温度场,以及晶种的分布方式.通过固定在热丝CVD反应腔里的热电偶测量了实际的衬底温度分布,从而验证了仿真结果的正确性.另外,通过改变仿真模型优化了沉积单晶金刚石颗粒的工艺参数,获得适应于合成单晶金刚石颗粒的新技术,为化学气相沉积合成单晶金刚石颗粒奠定了基础,也为高温高压金刚石磨料品级的改进与提高提供了新途径.     

气体流量对TYUT型MPCVD装置沉积大面积金刚石膜的影响

使用自行研制的频率为2.45 GHz的TYUT型MPCVD装置,以H2和CH4为气源,在功率为8 kW、基片温度为1000℃、气体流量为100～800 sccm条件下,进行了直径为65 mm的大面积金刚石膜的沉积实验.使用扫描电镜、X射线衍射仪、数字千分尺和Raman光谱仪等仪器分别对金刚石膜的表面形貌、取向、厚度和品质进行了表征.实验结果表明,气体流量的变化会对金刚石膜的晶粒尺寸,晶体取向,沉积速率,厚度均匀性和品质产生较大的影响.气体流量在300～600 sccm范围内制备的金刚石膜才兼具晶粒尺寸均匀性好、表面缺陷少和品质高的优点.     

在以Cu/Re镀膜为过渡层的铁衬底上沉积金刚石膜

本文采用热丝ＣＶＤ法在以Ｃｕ／Ｒｅ镀膜为过渡层的铁衬底上沉积金刚石薄膜,研究了以Ｒｅ作为铁衬底上沉积金刚石膜的过渡层的制备工艺及其对沉积金刚石膜的影响。实验结果表明：在铁 底上难以直接镀上铼膜,但 铜上镀铼比铁衬底上镀铼要容易得多,且镀铼层质量好。以Ｃｕ／Ｒｅ复合膜为过渡层,以巴基管为成核剂可以在铁衬底上沉积出质量很好的金刚石膜。     

High-quality a-plane GaN grown with flow-rate modulation epitaxy on r-plane sapphire substrate

We use the flow-rate modulation epitaxy (FME) technique to improve the crystal quality of a pit-free a-plane GaN (1 1 2¯ 0) film grown on r-plane sapphire (1 1¯ 0 2) substrate. With the FME technique, the width of the rocking curve in X-ray diffraction measurement is significantly reduced. Also, the surface roughness in either atomic-force-microscopy scanning or -step profiling is decreased. Here, the FME technique means to alternatively turn on and off the supply of Ga atoms, while N atoms are continuously supplied without changing the flow rate. Under the used growth conditions, the optimized FME parameters include the on/off periods at 10/10 s. During the period of closing the flow of trimethylgallium (TMGa), the continuous supply of nitrogen can lead to the formation of stoichiometry structure under the high-Ga growth condition, which is required for pit-free growth. Also, during this period, Ga atoms can further migrate to result in a flatter surface. Therefore, the crystal quality of the a-plane GaN sample can be improved.     

The influence of N2 flow rate and substrate temperature on Ti1‐xAlxN thin films

Titanium aluminium nitride (Ti_1‐xAl_xN) films have been deposited on silicon (111) substrate at a N₂ flow rate of 2 sccm and 20 sccm and at a substrate temperature of 773 K and at a N₂ flow rate of 2 sccm and at a substrate temperature of 873 K by reactive DC magnetron sputtering technique. The effect of N₂ flow rate and substrate temperature on the grain size and surface roughness of the deposited films have been investigated. The films have been analysed by X‐ray diffraction (XRD) and atomic force microscopy (AFM). The films were found to be nanocrystalline. While the grain size of the films decreases with increasing N₂ flow rate and decreases with increasing substrate temperature, the surface roughness of the films decreases with increasing N₂ flow rate and increases with increasing temperature. (© 2008 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

Magnitude and polarity of strain-induced fields in pseudomorphic In0.22Ga0.8As quantum well structures on (112) GaAs substrates

When pseudomorphic (In,Ga)As/(Al,Ga)As heterostructures are grown on certain surfaces of the general crystallographic planes of GaAs denoted by (11l), the strain in the structures induces an electric field because of the piezoelectric nature of the III-V semiconductors. We report the experimental determination of the direction and magnitude of the strain-induced electric field by photoluminescence spectroscopy on one of these substrate surfaces: the one for which l = 2. We confirm that for the two surfaces of the (112) GaAs substrate, the induced field is directed out of the substrate for the A surface and toward the substrate for the B surface.     

Theoretical consideration of the growth kinetics for GaAs and GaSb

An extended MOMBE growth kinetics model is proposed, based on the Robertson model, to explain both the GaAs growth rate variation and modulated beam mass spectroscopy data reported by Martin and Whitehouse. In this model, we assume that (1) MEGa molecules react with ethyl-radicals to form DEGa, (2) excessive group-V molecules on the surface suppress the decomposition of DEGa and enhance the desorption of DEGa, (3) reaction of DEGa with ethyl-radicals to form TEGa is negligible, and (4) effective surface coverage of excessive group-V atoms during growth is determined by the double layer adsorption model including desorption parameters for group-V molecules. The first assumption (1) is found to be a dominant process to explain the behaviour of DEGa desorption at high temperatures. This model can reproduce the dependences of both growth rate and desorbing rate of Ga alkyls on substrate temperature during GaAs MOMBE growth. The use of Sb instead of As produces a significant change in the growth rate variation with substrate temperature and group-V flux for the growth of GaSb, in spite of the use of the same TEGa flow rate. This can be rationalized by the difference in the desorption parameters for Sb and As.     

Morphology of chemical vapor deposited titanium diboride

Titanium diboride has been chemical vapor deposited from TiCl₄, BCl₃, and H₃ gases on a heated graphite substrate. The morphologies of the deposits were correlated with the deposition parameters of substrate temperature, total pressure, B: Ti atomic ratio, Cl: H atomic ratio, and total flow rate. The diboride deposits exhibited a variety of morphologies which include coherent coatings with nodular or faceted surfaces, plate-like crystallites, dendritic crystallites, and irregularly shaped, faceted crystallites. The deposit morphology was found to be most sensitive to deposition temperature, B: Ti atomic ratio, and Cl: H atomic ratio. Variations in both the total pressure and total flow rate did not significantly affect the diboride morphology. All the TiB₂ deposits except those produced under a large excess of H₂ had a preferred orientation such that the hexagonal c-direction was parallel to the substrate surface.     

微波等离子CVD金刚石设备中基片加热材料的三维温度场型研究

在微波等离子CVD设备中,微波电磁场的不均匀分布将导致等离子球和基片的温度不均匀,从而降低CVD金刚石的质量,因而基片加热是需要的.材料的吸收微波能的能力同微波频率、电场强度、材料的介电常数和介电损耗及材料体积相关,材料的介电常数、介电损耗、导热率又同温度相关.基于热力学理论,本文用强吸收微波能的SiC材料作为了基片加热材料,放在微波等离子腔的基片下,研究三维轴对称温度场模型,该模型的基片加热材料的介电常数、介电损耗和体积随温度变化,获得了温度分布的解析式,计算结果显示该模型能得到直径76.2mm的均匀温度分布,温度变化少于10℃,因而可用于基片加热.     

大尺寸非规则碲锌镉晶片双面抛光技术

碲锌镉(CdZnTe)晶体性能优越，是高性能碲镉汞(HgCdTe)外延薄膜的首选衬底材料。双面抛光是一种加工质量较高的碲锌镉晶片表面抛光方式，其具有效率高、平整度好、晶片应力堆积少的优点。但当碲锌镉晶片尺寸增大后，其加工难度也随之上升，易出现碎片多、加工速率慢、表面平整度差等问题。本文开展了大尺寸非规则碲锌镉晶片双面抛光技术研究，深入分析了面积大于50 cm²的非规则碲锌镉晶片双面抛光工艺中，不同参数对抛光质量的影响，通过模拟并优化晶片运动轨迹，优化抛光液磨粒粒型、抛光压力、抛光液流量等抛光工艺参数，实现了具有较高抛光速率和较好表面质量的大尺寸非规则碲锌镉晶片双面抛光加工，对进一步深入研究双面抛光技术有着重要意义。     

Modelling of the isothermal melt flow due to rotating magnetic fields in crystal growth

The use of a rotating magnetic field promises the feature of a contactless flow control in crystal growth especially for configurations where an increase of the material transport in a definite way is desired. This paper gives the comparison of numerically calculated and experimentally obtained results on the flow due to a rotating magnetic field as well as numerical results on the influence of the field parameters (frequency, amplitude) on the fluid flow in the melt.     

分子束外延生长过程中GaAs(001)表面铝液滴的扩散成核过程

量子点的性质主要由其密度及尺寸参数控制,而原子在衬底上的成核运动又决定了量子点的密度、直径、高度等参数,因此研究原子的扩散成核过程对自组装制备量子点具有重要意义。本文通过分子束外延生长技术研究了GaAs(001)表面金属铝液滴的成核过程,发现衬底温度和金属铝沉积速率的变化直接影响了液滴的尺寸、密度以及形状等特征。根据经典成核理论分析GaAs(001)表面金属铝液滴空间分布与几何结构的演化规律,推导得出表面金属铝液滴密度与衬底温度、金属铝沉积速率的关系方程。在此基础上,进一步计算得出液滴形成过程中未成核态、临界成核态、成核态三种亚稳态所包含的最小原子数分别为1个、2个、5个。