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垂直分割视场制作合成动态全息图 总被引:1,自引:0,他引:1
从理论上及实验上分析了利用垂直视场分割法制作合成动态全息图的方法。将二步彩虹全息术中的主全息图H1分成若干全息单元,在各单元中分别记录了物体一系列连续变化状态的二维图像,利用该主全息图制作像面全息图H2,从而获得合成动态全息图。该方法用银盐干版记录主全息图H1,节省了大量的曝光时间。 相似文献
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利用反射全息实现计算全息三维显示 总被引:4,自引:4,他引:0
计算全息和光学全息都可应用于三维显示,但各有自己的优势和缺陷.将计算全息和光学反射全息相结合,可以突破光学全息对记录物体的限制,进行虚拟物体或自然场景的全息图的制作,同时可以实现白光再现.本文首先用三维扫描仪获得实际物体的三维数据,用"点云算法"模拟得到其菲涅耳全息图透射率数据,采用计算全息打印机将其输出于全息记录介质,得到可光学再现的菲涅耳计算全息图H1.然后将H1作为光学全息的记录物体进行反射全息记录,将平面全息转化为体全息,实现了计算全息白光再现. 相似文献
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全息体视图(HS)是一种可加速计算的全息图,能够实现单色全息三维(3D)显示,将其与彩色彩虹全息相结合并实现允许多人围观的半周视彩色彩虹全息3D显示具有实际应用价值。在HS计算原理的基础上,设计单元全息图侧视角及视场角等参数,通过频域复用获得包含红色、绿色和蓝色信息的单元全息图的频谱,对频谱进行傅里叶逆变换后取实部得到该单元全息图,所有单元全息图的组合形成完整的半周视彩色彩虹HS。通过并行加速计算的方法实现分辨率为200800 pixel×200800 pixel、尺寸为64 mm×64 mm的高分辨率半周视彩色彩虹HS仅需15.15 min。采用反射照明的方式进行光学再现,实现了允许多人同时观看的清晰的彩色全息3D显示,其有望应用于3D军事地图、3D沙盘等领域。 相似文献
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曾雅楠汪飞雷海胡晓东胡小唐 《光学学报》2013,(10):75-79
为了扩大传统双波长数字全息显微技术在实时微结构表面形貌测试中的有效测量视场,提高实时响应速度并降低噪声,将传统双波长数字全息术和数字显微像面全息术相结合,提出了一种双波长数字显微像面全息方法。该方法在记录像面全息图后,无需进行衍射重构,直接在全息面提取相位和强度信息达到测量样本形貌的目的。基于该方法对微米级高度的台阶结构进行三维形貌测试,同时对比了传统双波长数字全息显微系统和机械探针轮廓仪的微台阶测试结果。从三者的对比分析中可知,双波长数字显微像面全息的这种测试技术是有效可行的,且具有单曝光、全视场,响应速度快以及噪声较低的特点,对于阶跃高度达到微米级的微器件形貌测试尤为适用。 相似文献
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全息透镜用于彩色胶片全息高密度存储 总被引:1,自引:0,他引:1
本文提出一种利用全息透镜实现彩色胶片全息高密度存储的方法。用红、绿、蓝三基色激光分别记录三个焦距相同的全息透镜,用三个全息透镜依次用三基色波长记录胶片的傅氏全息图,用原参考光照明再现,可合成彩色像。 相似文献
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透射型彩色全息图的拍摄与再现 总被引:2,自引:2,他引:0
提出一种透射型彩色全息图的拍摄与再现技术,所再现的图象可以突出物体的三维立体感和原有色彩.同时提出一种透射型彩色全息图的象素化显示方法,并用全息光栅作为全息光学元件(HOE)进行了实验验证,这种方法特别适合于大尺寸彩色全息图的显示,它将为显示全息的广泛应用和市场开发提供一种新的方法和途径. 相似文献
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Phase-only stereoscopic hologram calculation based on Gerchberg–Saxton iterative algorithm 下载免费PDF全文
A phase-only computer-generated holography(CGH) calculation method for stereoscopic holography is proposed in this paper.The two-dimensional(2D) perspective projection views of the three-dimensional(3D) object are generated by the computer graphics rendering techniques.Based on these views,a phase-only hologram is calculated by using the Gerchberg–Saxton(GS) iterative algorithm.Comparing with the non-iterative algorithm in the conventional stereoscopic holography,the proposed method improves the holographic image quality,especially for the phase-only hologram encoded from the complex distribution.Both simulation and optical experiment results demonstrate that our proposed method can give higher quality reconstruction comparing with the traditional method. 相似文献
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Akshay Sharma Gyanendra Sheoran Z.A. Jaffery Moinuddin 《Optics and Lasers in Engineering》2008,46(1):42-47
The basic problem in optical and digital holography is the presence of speckle noise in the reconstruction process, which reduces the signal-to-noise ratio (SNR). The presence of speckle noise is serious drawback in optical and digital holography since it substantially reduces the SNR in the reconstructed image. In this paper, we present wavelet filtering to improve SNR in the reconstructed images from digital holograms. Experimental results are presented. 相似文献
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γ-ray holography is a novel method for three-dimensional (3D) imaging of a local atomic structure, which utilizes the internal
reference idea of holography. The principles of this method will be presented with emphasis on the phase information gained
by means of complex holograms.
This revised version was published online in August 2006 with corrections to the Cover Date. 相似文献
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从线全息图分析彩虹全息 总被引:5,自引:3,他引:2
本文从彩虹全息固有的线全息图出发,不采用传统狭缝像的概念来分析彩虹全息的成像机理.论述了线全息图的宽度与再现像最小分辨距离及体视极限的关系;讨论了几种典型彩虹全息术中线全息图的特征及其对再现象的影响,提出并实现了不通过狭缝实像来观察再现像的新方法. 相似文献
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《Current Applied Physics》2015,15(11):1529-1533
In this paper, we carried out the two-dimensional (2D) strain measurement in sub-10 nm SiGe layer; images were obtained by dark-field electron holography (DFEH). This technique is based on transmission electron microscopy (TEM), in which dark-field holograms were obtained from a (400) diffraction spot. The measured results were compared to the X-ray diffraction (XRD) results in terms of the strain value and the depth of strain distribution in a very thin SiGe layer. Subsequently, we were able to successfully analyze the 2D strain maps along the [100] growth direction of the nanoscale SiGe region. The strain was measured and found to be in the range of 1.8–2.4%. The strain precision was estimated at 2.5 × 10−3. As a result, the DFEH technique is truly useful for measuring 2D strain maps in very thin SiGe layers with nanometer resolution and high precision. 相似文献