Real-time measurement of retardation of eighth-wave plate independent of fast-axis direction

A real-time measurement method for the retardation of an eighth-wave plate is proposed. The collimated laser beam is split using a Glan Taylor polarizer with two side escape windows. The reflected sub-beam is detected using a detector, whereas the transmitted sub-beam passes through the quarter-wave plate and the eighth-wave plate of interest. Then, it is reflected by the mirror and passes reversely through the eighth-and quarter-wave plates. Finally, it is analyzed using the Glan Taylor polarizer and detected using another detector. With two detection signals, the retardation is resolved and found to be independent of the fast-axis direction, initial intensity, and circuit parameters. In the experiment, a crystal quartz sample is measured at different fast-axis angles. The standard deviation of the retardation is 0.9 o . The usefulness of the method is verified.     

Polarization eigenmodes of a QHQ retarder — some new features

A detailed analysis of the polarization eigenmodes of a QHQ retarder (a half-wave plate sandwiched between two identical quarter-wave plates) is presented. These are shown to be discontinuous as a function of the orientation of the half-wave plate, as a function of the wavelength of incident light and as a function of the retardation of the middle waveplate.     

Wavelength dependence of the phase retardation of a quarter-wave plate

We describe an optical heterodyne polarization interferometer that can be efficiently used for the precision measurement of the change in the state of polarization of a light wave induced by polarizing optical devices. This technique is used to measure the change with wavelength of the phase retardation of a quarter-wave plate. A theoretical derivation is presented to permit computation of the wavelength dependence of the phase shift induced by a quarter-wave plate.     

两种亚波长金属波片的透射特性对比

综合等效介质理论和表面等离子激元(SPP)Bloch模型,对比分析了两种新的亚波长光栅结构:二维矩形金属光栅和二维椭圆柱金属光栅。利用时域有限差分(FDTD)算法,对比分析了两种结构的透射率及其相位延迟与入射光波长及偏振角变化的关系,尤其两种结构实现λ/4波片功能所对应的透射特性。仿真结果表明,当入射光偏振角为75°时,两种结构均可实现λ/4波片功能,此时二维矩形和椭圆柱金属光栅的透射率分别为0.77和0.67,表明二维矩形金属光栅比椭圆柱光栅具有更好的透射效果。对应550～800nm的入射波长,两种光栅在各自允许的入射偏振角范围内均表现了较为平坦的宽带透射特性。     

腔内波片产生的Nd∶YAG激光纵模分裂规律研究

简要介绍了激光纵模分裂的基本原理，研究了腔内含有1个和2个1/4波片时产生Nd∶YAG激光纵模分裂的规律。实验结果表明：在1064nm Nd∶YAG激光的腔内放置一个1/4波片时，每一激光纵模分裂为2个正交的线偏振模，在波片表面垂直于激光光线的条件下，纵模分裂量（即频率差或波长差）恰好等于激光纵模间隔的一半；当在Nd∶YAG激光腔内沿垂直光线方向平行放置2个1/4波片时，也能产生纵模分裂现象，其纵模分裂量取决于2波片快（慢）轴之间的夹角。在0°～ 90°范围内调节角度，可使纵模分裂量在一个激光纵模间隔内线性调谐。实验结果与理论分析相吻合。     

Novel method for measurement of retardance of a quarter-wave plate

A novel and simple method used for measurement of retardance of a quarter-wave plate employing two polaroids and a right-angle prism is reported. The theoretical analysis of the principle is given taking the Jones matrix as a mathematical tool. The uncertainty of the method is theoretically analyzed. An application example is also given. The measured result of the example is verified with a test. The main advantage of this method is that it can completely determine the retardance value, which overcomes the shortcomings of the existing methods reported before for determining only the multi-value function values, such as cosine or tangent value of the retardance. In addition, this method is also accurate, easy to operate and can also be used for the retardance measurement of other retardation plates.     

Photoelastic stress pattern analysis using Fourier transform with carrier fringes: influence of quarter-wave plate error

The Fourier transform method, widely applied in photomechanics for the automated analysis of interferometric fringe patterns, has been recently extended to the photoelastic isochromatic fringe patterns analysis. Unfortunately, its use in photoelasticity involves some limitations that have not been completely highlighted in literature. This work deals with the influence of the quarter-wave plate tolerance on the evaluation of the retardation. Both theoretical and experimental analyses have shown that the quarter-wave plate error does not affect the retardation only if the principal stress directions in the model and in the carrier are aligned. In general, instead, the tolerance of the quarter-wave plates leads to an amplification of the retardation error due to the influence of the isoclinics with a subsequent restriction of the field in which the method can be applied. For instance, using common quarter-wave plates and tolerating a maximum retardation error of about 0.03 fringe order, than the Fourier transform method cannot be applied as a full-field technique but only in the model zones in which the misalignment between the principal stresses in the model and in the carrier is less than 15°.     

Achromatic half-wave combination of birefringent plates

Half-wave retarders are primarily used in rotating the plane of polarization of polarized light. These retarders usually exhibit strong wavelength dependence. In this paper, the design and characteristics of an achromatic half-wave plate, formed by a cascaded system of birefringent plates, have been studied. Pancharatnam proposed a combination of three retarders in series and discussed the possibility of fabricating reasonably good achromatic quarter-wave plate with a suitable combination of their retardance. The system studied here is similar in construction to Pancharatnam configuration and behaves as an achromatic half-wave plate over a wide spectral range. The proposed configuration exhibits a maximum variation of only about ±1.4 degree over the entire wavelength range of 500–750 nm. In our analysis we have used Jones matrix formalism for the derivation of the general expression for the equivalent retardation and the azimuth of the combination.     

可变波片构造等效线性可转波片的研究

利用四元数理论分析了可变延迟波片,并依此由可变延迟波片组合构造了等效可转线性半波片和四分之一波片.提出由可变延迟波片按可转波片控制算法设计偏振控制器,以避免可变延迟波片偏振控制器所需的复位重置过程.仿真结果显示,按此构想得到的四波片控制器,能把任意偏振态转换为固定线偏振输出,其光强波动小于1%,相移范围不超过2π,控制过程不需要附加复位操作,其相移变化平缓.     

Terahertz achromatic quarter-wave plate

Phase retarders usually present a strong frequency dependence. We discuss the design and characterization of a terahertz achromatic quarter-wave plate. This wave plate is made from six birefringent quartz plates precisely designed and stacked together. Phase retardation has been measured over the whole terahertz range by terahertz polarimetry. This achromatic wave plate demonstrates a huge frequency bandwidth (upsilonmax/upsilonmin approximately 7), and therefore can be applied to terahertz time domain spectroscopy and polarimetry.     

A High-Precision Quasi-optical Polarizer for Zeeman Splitting Observations

A series of grooved dielectric quarter-wave plates was made for radio astronomical Zeeman splitting observations at millimeter wavelengths. To meet the stringent requirements on reflection and polarization purity, a design method was formulated based on optimization of multiple reflections. The method solves the problem of achieving low reflections for both polarization components while attaining high purity of circular polarization. Several plates have been manufactured, tested, and used successfully for astronomical observations.     

The influence of the quarter wave plates in automated photoelasticity

During the last decades, several methods have been proposed to automate photoelastic analyses. Some procedures are based on the circularly polarised light by using quarter wave plates. However, quarter wave plates are typically matched for a specific wavelength, and an error is introduced at different wavelengths. The error of quarter wave plates affects the measurement of isochromatic and isoclinic data. In this paper, the influence of the errors of quarter wave plates in some of the most common automated photoelastic methods is reviewed. The errors in the photoelastic data are given and the procedures to reduce, or eliminate, them are also suggested.     

半外腔微片Nd∶YAG正交偏振激光器及其在精密测角中的应用

设计了一种半外腔微片Nd∶YAG正交偏振双频激光器。把2个1/4波片置于激光谐振腔内,一个静止,一个作360°旋转,旋转引起2个1/4波片快轴之间的角度变化被激光器转化成激光2个频率之差的变化,从而输出可调谐的双频激光。采用琼斯矩阵对光在腔内的本征模进行分析,给出了双频频差的理论解释。讨论了一种体积小、分辨率高和可整周测量的新型Nd∶YAG激光测角仪的潜在前景。     

The new circular heterodyne interferometer with electro-optic modulation for measurement of the optical linear birefringence

We present a new circular heterodyne interferometer with electro-optic modulation for measurement of the optical linear birefringence. It enables the measurement of not only the phase retardation but also the principal angle. The measurement procedure is carried out in two steps. In the first step of measurements, we use the electro-optic modulated circular heterodyne interferometer and the phase-lock technique to precisely measure the principal axis angle. After rotating the analyzer in the setup, the phase retardation is determined also by the phase-lock technique. The compact configuration requires only a photodetector and two simple phase-lock extractions to determine the principal axis angle and the phase retardation. The validity of the proposed design is demonstrated by measurement of the principal axis angle and phase retardation of a quarter-wave plate sample. The root-mean-square resolutions for the principal axis angle and phase retardation are found to be 0.0396° and 0.0796°, respectively, with corresponding dynamic ranges of 0–180° and 0–180°.     

Lyot型单色光退偏器设计与研究

为了实现单色线偏振光的退偏,在Lyot型退偏器的基础上,设计了一种新型退偏器。该器件由2个慢轴夹角为45的1/4波片组成,通过对透射光的叠加分析,发现该退偏器可将任意振动方位角的线偏振光转化为强度稳定的圆偏振光,并得到其退偏度表达式。针对633 nm波段,精选2个1/4波片制作样品,并测试其退偏度。测试结果表明:对不同方位角的线偏振光,退偏器退偏度超过94%,当微调入射角时,退偏度则达到97%以上。     

Plasmonic quarter-wave plate

Here we present a strategy for designing wave plates utilizing resonances of subwavelength apertures in metallic films. Specifically, we show that it is possible to tune the geometry in a periodic array of cross-shaped apertures in a silver film to produce a quarter-wave plate at a particular wavelength in the near-infrared. This is achieved by introducing an asymmetry into the lengths of the arms of the crosses.     

Method for measuring retardation of a quarter-wave plate based on normalized secondary harmonic component

A method for measuring retardation of a quarter-wave plate based on normalized secondary harmonic component is proposed, and the measuring principle is analyzed. The optical measuring system is composed of a laser, a polarizer, a phase modulator, the quarter-wave plate to be measured, an analyzer and a detector. The azimuths of the transmission axes of the polarizer and the analyzer with respect to the modulating axis of the phase modulator are +45°, 0°, respectively. The retardation of the quarter-wave plate is calculated precisely using the normalized secondary harmonic components prior to and after 22.5° rotation of the quarter-wave plate. In this method, the major axis position of the quarter-wave plate is not required to be known in advance, and the measured retardation is independent of the intensity fluctuation of the light source. The feasibility of the method is verified by the experiments.     

Compensated Polarization Scrambler for Raman Depolarization and Intensity Measurements on Microsamples

It has long been recognized ^1,2,3,4,5 in measuring relative intensities and depolarization ratios of Raman lines that prism and grating spectrometers have different transmittances for light polarized parallel (T_∥) and perpendicular (T_⊥) to the slit. Several methods have been used to give equal instrument response to parallel and perpendicular polarization. Stitt and Yost³ used a Nicol prism parallel to the high-transmittance direction of the spectrometer, combined with a rotatable mica half-wave plate to transmit either vector to the Nicol prism. This method has the advantage of having a higher spectrometer transmittance, but the mica plate gives exact half-wave retardation at only a single wavelength. A mica quarter-wave plate ^4,5 averages the transmittances of the spectrometer for the two polarization directions, but is also wavelength dependent. Virtually achromatic circular polarizers have been designed and constructed ^6,7, but these devices are too bulky and expensive for the clear apertures needed for fast spectrometers.     

光针扫描法检测光滑表面粗糙度

提出了一种用于光滑表面粗糙度测量的方法，利用两个标准参考面和两个偏振片实现对表面粗糙度的测量，通过两1／4波片克服光路可逆性的缺陷，给出了测量系统光路图，导出了该方法工作原理的数学表达式，并对该方法产生的测量不确定度进行了理论计算与计算机仿真，最后通过对一标准粗糙度样块进行测量，证明了该方案的可行性。结果表明实测值与样块厂家提供的标称值相符，并可实现0．2nm的测量精度。     

Polarization compensation: a passive approach to a reducing heterodyne interferometer nonlinearity

Cyclic errors that are due to optical leakage limit the precision of displacement measurements made with optical interferometers. A method for real-time estimation of leakage components is introduced and is used to implement a novel passive technique for suppression of cyclic nonlinearities that uses only adjustments of existing polarizers and quarter-wave plates. This approach is used to reduce the cyclic error from 3 nm to 300 pm for an interferometer operating at a wavelength of 1320 nm.