Inelastic scattering processes in GaAs/n-AlGaAs selectively doped heterojunctions with InGaAs quantum dots

Inelastic scattering processes of the two-dimensional electron gas (2DEG) in both normal and inverted n-AlGaAs/GaAs heterojunction FET structures have been studied, for the case where InGaAs dots are embedded in the vicinity of GaAs channel. By analyzing the magnetoresistance data, the inelastic scattering time τ_in is determined as a function of the concentration N_2D of 2D electrons and shown to be reduced by 10–40% by the presence of InGaAs dots. By investigating a GaAs/n-AlGaAs inverted heterojunction FET with embedded InGaAs dots, we have varied the percentage P_oc of charged dots filled with an electron and found that τ_in decreases as P_oc increases, indicating that the inelastic scattering rate of 2DEG by charged dots is higher than that by the neutral ones.     

The effect of interface roughness scattering on low field mobility of 2D electron gas in GaN/AlGaN heterostructure

We report the results of our experimental and theoretical studies concerning the temperature dependence of electron mobility in a two dimensional electron gas (2DEG) confined at the GaN/AlGaN interface. Experimental mobility of about at 3.8 K remains almost constant up to lattice temperature , it then decreases rapidly down to about at . The results are discussed using a theoretical model that takes into account the most important scattering mechanisms contributing to determine the mobility of electrons in 2DEG. We show that the polar optical phonon scattering is the dominant mechanism at high temperatures and the acoustic deformation potential and piezoelectric scatterings are dominant at the intermediate temperatures. At low temperatures, the Hall mobility is confined by both the interface roughness (IFR) and ionised impurity scattering. The correlation length (Λ) and lateral size (Δ) of roughness at the GaN/AlGaN heterointerface have been determined by fitting best to our low-temperature experimental data.     

Al0.22Ga0.78N/GaN二维电子气中的弱局域和反弱局域效应

通过磁输运测量研究了Al_0.22Ga_0.78N/GaN二维电子气的电子相干散射中的弱局域和反弱局域化现象.在外加弱磁场的情况下，该系统表现出正-负磁阻的变化，说明在Al_0.22Ga_0.78N/GaN异质结中存在晶体场引起的电子自旋-轨道散射.同时讨论了二维电子气中不同的散射时间对温度的依赖关系，实验得到的非弹性散射时间与温度成反比，表明非弹性散射机理主要来源于小能量转移的电子-电子散射. 关键词： 二维电子气 弱局域 磁阻     

Optically induced current oscillation in a modulation-doped field-effect transistor embedded with InAs quantum dots

The output characteristics of a modulation-doped GaAs/AlGaAs field-effect transistor with InAs quantum dots (QDs) embedded in the barrier layer (QDFET) have been studied at low temperature. Optically induced current oscillation in the output current–voltage (I–V) curves has been found under the near-infrared light illumination. It is ascribed to the recombination of real space transferred electrons and photoexcited holes captured by the QDs. Furthermore, InAs QDs layer can also capture electrons and act as a nano-floating gate, which causes a bistability in the two-dimensional electron gas (2DEG) conductance. Our results suggest that the QDFET is a promising candidate for developing phototransistor or logic circuits.     

Electron heating in a submicron-size n GaAs wire

We have studied electron heating in a submicron-size GaAs wire from 4.2 K to 50 K. We find that the energy relaxation rate for the electrons is of the form τ_E⁻¹ = α + βT_eⁿ where α, β are constants and T_e is the electron temperature. We associate the temperature-independent term with a quasi-elastic surface scattering process in which an electron losses 1% of its energy at each collision. The temperature dependent term may be due to electron-phonon scattering. It is possible to fit the data to 2 < n < 3.     

Low temperature electron mobility in Ga0.5In0.5P/GaAs quantum well structures

We analyse the low temperature subband electron mobility in a Ga_0.5In_0.5P/GaAs quantum well structure where the side barriers are delta-doped with layers of Si. The electrons are transferred from both the sides into the well forming two dimensional electron gas (2DEG). We consider the interface roughness scattering in addition to ionised impurity scattering. The effect of screening of the scattering potentials by 2DEG on the electron mobility is analysed by changing well width. Although the ionized impurity scattering is a dominant mechanism, for small well width the interface roughness scattering happens to be appreciable. Our analysis can be utilized for low temperature device applications.      

Controlling the charging energy of arrays of tunnel junctions

We describe a new technique to control in situ charging energy of systems of coupled metallic or superconducting islands. To illustrate the technique, we have fabricated two-dimensional arrays of Al islands on GaAs/AlAs heterostructures. Each island is coupled to its nearest-neighbor by a submicron Al/AlO_x/Al tunnel junction and to the three-dimensional electron gas (3DEG) located below the surface of the heterostructure by a capacitance C_g. We vary C_g, which dominates the charging energy of the array, by depleting the electrons in the 3DEG by means of a negative voltage applied to the array. With the array driven normal by a magnetic field, a decrease in C_g increases in both the offset voltage and the period of the Coulomb blockade oscillations.     

Vertical transport and relaxation mechanisms in δ-doping superlattices

We report on electron transport in growth direction and relaxation mechanisms in δ-doped GaAs-superlattices. In order to investigate pure electron transport, n-type δ–n–i–p–i structures sandwiched between two n⁺-cladding layers have been investigated, with doping induced barrier heights ΔV smaller than the band gap energy E_g of the host material. An exponential increase of the current is expected with increasing bias due to tunneling through a decreasing barrier. At elevated temperatures, thermally activation over the barriers becomes possible. A simple WKB-model describes the experimental data reasonably well. Moreover, a current step appears in the I–V characteristics at a critical field which is clearly below the breakthrough value. Opto-electrical measurements confirm the existence of holes in the structure at fields larger than the critical field. A model is presented which explains the photocurrent and electroluminescence measurements consistently. The key mechanism is based on a few ballistically traveling electrons that can gain enough energy for interband avalanche multiplication.     

Study of the glass transition order parameter in amorphous polybutadiene by incoherent neutron scattering

The temperature dependent elastic incoherent scattering from a glass forming polybutadiene was studied using high resolution neutron spectroscopy. This elastic scattering measures directly the non-ergodicity order parameter of the glass transition. We observed an anomalous decrease of this scattering setting in around 30 K below the thermodynamic glass transition,T _g , the temperature dependence of which is in agreement with the square root ofT prediction of the mode coupling approach. The critical temperature of 220 K lies about 30 K aboveT _g . The missing elastic intensity reappears as inelastic scattering in the 1 meV range. Within the eV resolution of the backscattering spectrometer no quasielastic scattering can be detected up to 20 K aboveT _g . The observed inelastic scattering may be interpreted as resulting from a continous shift of the density of states towards low frequencies as a consequence of a general softening of the structure.     

Landau levels in a novel two-dimensional electron system interacting with charged quantum dots

Landau levels have been theoretically investigated in a two-dimensional electron gas near a quantum dot (QD) layer. By a diagrammatical method, we have formulated the self-energy for the Landau level and deduced its relation to the AC conductivity σ_loc(ω) in the QD layer. As an example, we have examined the density of states in the case where σ_loc(ω) is described by Aω^S(S=0.8). It is found that the Landau levels are broadened due to the interaction with the localized electrons in the QDs.     

Electron-electron scattering and nonequilibrium noise in sharvin contacts

We consider wide ballistic microcontacts with electron-electron scattering in the leads and calculate electric noise and nonlinear conductance in them. Due to a restricted geometry the collisions of electrons result in a shot noise even though they conserve the total momentum of electrons. We obtain the noise and the conductivity for arbitrary relations between voltage V and temperature T. The positive inelastic correction to the Sharvin conductance is proportional to T at low voltages eV ≪ T, and to |V| at high voltages. At low voltages the noise is defined by the Nyquist relation and at high voltages the noise is related with the inelastic correction to the current by the Schottky formula S _in = 2eI _in.     

Optoelectrical investigations on MOS-sandwiches at low temperatures

MOS-structures are irradiated with light of energy from 1.5 to 6 eV at different temperatures (300, 77, 12 K) while the resulting photocurrent is measured. At high photon energies (hv>4 eV) the threshold energy and the scattering mean free path for electrons at the Si — SiO₂-interface are determined. They are independent from temperature. At low photon energies (hv<3 eV) electrons are released from traps with energy levels 1.2 and 1.9 eV below the Si-conduction band. The trap concentration is 4.8 10¹³ cm^–3. The capture cross section is measured in a rather direct way. The temperature and electrical field dependence of this cross section is explained by a trapping model.     

Scattering mechanisms in (Al, Ga)As/GaAs 2DEG structures

We have prepared a large number of high mobility two-dimensional electron gas (2DEG) structures, with undoped spacer thicknesses ranging from 9 to 3200Å. For samples with 400Å of (Al, Ga)As Si-doped at 1.3×10¹⁸ cm⁻³, there is a peak in the 4K mobility at spacers of 400–800Å, with a maximum value of 2×10⁶ cm² V⁻¹ s⁻¹. Increasing the thickness of the doped (Al, Ga)As to 500Å produced an increase in mobility to 3×10⁶ cm² V⁻¹ s⁻¹ for a 400Å space sample. We have compared these results with published analyses of scattering processes in 2DEG structures, and conclude that a combination of ionised impurity and acoustic phonon scattering gives a qualitative explanation of the behaviour, but that the experimental mobility values are generally higher than those predicted theoretically.     

Optically induced gate voltage spectroscopy in a GaAs/AlGaAs heterostructure

We report on measurements of optically induced gate voltage spectroscopy in a GaAs/AlGaAs heterostructure with a high mobility 2-dimensional electron gas (2DEG) in a thin (55 nm) GaAs layer. The optically induced gate voltage between the front gate and the 2DEG is sensitive to excess electron concentrations below 10⁷ cm⁻². In the gate voltage spectrum we observe a peak below the bandgap energy of GaAs, which is not observed in the photocurrent, luminescence or excitation spectra. Due to the extremely high sensitivity of this technique we attribute this below bandgap signal to very weak absorption lines below the GaAs bandgap energy by impurity bands or defect absorption. The fall-off of the below bandgap signal varies as exp (hω/E₀), where E₀ is an indicative for the quality of the heterostructure.     

Nickel carbonyl adsorption on the Ni(111) surface

Overlayers formed by the adsorption of Ni(CO)₄ in CO on the Ni(111) surface at 100 K were characterized using high resolution electron energy loss spectroscopy and thermal desorption spectroscopy. At temperatures below 135 K, molecular nickel carbonyl adsorbs on the CO saturated Ni(111) surface as suggested by several observations. Vibrational transitions characteristic of molecular Ni(CO)₄ are dominant. The energy dependence of both the elastic and inelastic electron scattering cross sections are dramatically altered by Ni(CO)₄ adsorption. All of the mass spectrometer ionization fragments typical of molecular Ni(CO)₄ are observed in the narrow thermal desorption peak at 150 K. The inelastic scattering cross sections for both adsorbed nickel carbonyl and adsorbed CO on the Ni(111) surface suggest that a nonresonant dipole scattering mechanism is dominant.     

Fe3O4薄膜的电输运及光诱导特性研究

用脉冲激光沉积法在(111)Si衬底上成功制备了高度择优取向的Fe₃O₄薄膜.电阻-温度关系表明Fe₃O₄薄膜的Verwey转变(T_V)约在122 K,低温段(T_V)输运特征满足Mott变程跳跃模型,高温段(T>T_V)为小极化子输运.激光作用下的光电导实验发现,在整个温区表现为光致电阻率减小,而且低温段的电阻变化率比高温段要大很多.分析认为Fe₃O₄薄膜的光致电阻率变化主要与激光激发t_2g电子的转移有关. 关键词： 3O₄薄膜')" href="#">Fe₃O₄薄膜 小极化子 光诱导特性     

Classical in-plane negative magnetoresistance and quantum positive magnetoresistance in undoped InSb thin films on GaAs (1 0 0) substrates

Magnetoresistance (MR) effects have been investigated in perpendicular and parallel magnetic fields at 300, 80 K and liquid He temperatures for undoped InSb thin films 0.1–2.3 μm thick grown on GaAs(1 0 0) substrates by MBE. At high temperatures, the intrinsic carriers show the parabolic negative MR observable only in magnetic fields parallel to the film. The skipping-orbit effect due to surface boundary scattering in the classical orbits in the plane vertical to the film has been argued to be responsible for the negative MR. At low temperatures (T=80 K), the transport is dominated by the two-dimensional (2D) electrons in the accumulation layers at the InSb/GaAs(1 0 0) hetero interface; MR is positive and shows a logarithmic increase with anisotropy between parallel and perpendicular field orientation, arising from the 2D weak anti-localization (WAL) that reflects the interplay between the spin-Zeeman effect and strong spin–orbit interaction caused by the asymmetric potential at the interface (Rashba term). The zero-field spin splitting energy of Δ₀13 meV, the electron effective mass of m^*0.10m₀ seven times of the band edge mass in bulk InSb and the effective g-factor of |g^*|15 in the accumulation layer have been inferred from fits of MR for the 0.1 μm thick film to the 2D WL theory.     

Temperature dependent single photon emission in InP/GaInP quantum dots

Intensity correlation measurements on single InP/GaInP quantum dots (QDs) show antibunching at zero delay time, indicative of single photon emission. The antibunching time τ_R increases or decreases with temperature depending on the QD size as a result of the competition between: (1) thermal excitation of holes dominant in smaller QDs and (2) dark-to-bright exciton transition dominant in larger QDs. The antibunching minimum g⁽²⁾(0) remains below 0.2 up to 45 K.     

Optoelectrical investigations on MOS-sandwiches at low temperatures

MOS-structures are irradiated with light of energy from 1.5 to 6 eV at different temperatures (300, 77, 12 K) while the resulting photocurrent is measured. At high photon energies (hv>4 eV) the threshold energy and the scattering mean free path for electrons at the Si — SiO₂-interface are determined. They are independent from temperature. At low photon energies (hv<3 ev)=" electrons=" are=" released=" from=" traps=" with=" energy=" levels=" 1.2=" and=" 1.9=" ev=" below=" the=" si-conduction=" band.=" the=" trap=" concentration=" is=" 4.8="> 10¹³ cm^–3. The capture cross section is measured in a rather direct way. The temperature and electrical field dependence of this cross section is explained by a trapping model.     

DX-center energy calculation with quantitative mobility spectrum analysis in n-AlGaAs/GaAs structures with low Al content

Experimental Hall data that were carried out as a function of temperature (60–350 K) and magnetic field (0–1.4 T) were presented for Si-doped low Al content (x=0.14) n–Al_xGa_1−xAs/GaAs heterostructures that were grown by molecular beam epitaxy (MBE). A 2-dimensional electron gas (2DEG) conduction channel and a bulk conduction channel were founded after implementing quantitative mobility spectrum analysis (QMSA) on the magnetic field dependent Hall data. An important decrease in 2DEG carrier density was observed with increasing temperature. The relationship between the bulk carriers and 2DEG carriers was investigated with 1D self consistent Schrödinger–Poisson simulations. The decrement in the 2DEG carrier density was related to the DX-center carrier trapping. With the simulation data that are not included in the effects of DX-centers, 17 meV of effective barrier height between AlGaAs/GaAs layers was found for high temperatures (T>300 K). With the QMSA extracted values that are influenced by DX-centers, 166 meV of the DX-center activation energy value were founded at the same temperatures.