| High-Sensitivity Sensor Based on Surface Plasmon Resonance Enhanced Lateral Optical Beam Displacements |
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| 作者姓名： | 杨晓燕 刘德明 谢文冲 李春芳 |
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| 作者单位： | [1]Institute of Optoelectronics Science and Engineering, Huazhong University of Science and Technology, Wuhan 430074 [2]Institute of Electronic Science and Engineering, National University of Defense Technology, Changsha 410073 [3]Department of Physics, Shanghai University, Shanghai 200436 |
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| 基金项目： | Supported in part by the Pre-research Special Project in Important Fundamental Research of China under Grant No 2005CCA04200. |
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| 摘 要： | We present a new optical sensor based on surface plasmon resonance （SPIt） enhanced lateral optical beam displacements. Compared with the traditional SPIt methods, the new method provides higher sensitivity to the sensor system. Theoretical simulations show that the refractive index （RI） detection sensitivity of the SPR sensor based on the displacement measurement has a strong dependence on the thickness of the metal film. When the optimal thickness of the metal film is selected, the RI resolutlon of the SPIt sensor is predicted to be 2.2 × 10^-7 refractive index units （RIU）. Furthermore, it is found that the incidence angle can be used as a parameter to adjust the operating range of the sensor to different refractive index ranges.
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| 关 键 词： | 高灵敏度传感器 表面细胞质 基因组 光学传感器 |
| 收稿时间： | 2006-7-20 |
| 修稿时间： | 2006-07-20 |
High-Sensitivity Sensor Based on Surface Plasmon Resonance Enhanced Lateral Optical Beam Displacements |
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| YANG Xiao-Yan,LIU De-Ming,XIE Wen-Chong,LI Chun-Fang.High-Sensitivity Sensor Based on Surface Plasmon Resonance Enhanced Lateral Optical Beam Displacements[J].Chinese Physics Letters,2007,24(2):458-461. |
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| Authors: | YANG Xiao-Yan LIU De-Ming XIE Wen-Chong LI Chun-Fang |
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| Affiliation: | 1institute of Optoelectronics Science and Engineering, Huazhong University of Science and Technology, Wuhan 430074 ;2Institute of Electronic Science and Engineering, National University of Defense Technology, Changsha 410073 ; 3Department of Physics, Shanghai University, Shanghai 200436 |
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| Abstract: | We present a new optical sensor based on surface plasmon resonance (SPR) enhanced lateral optical beam displacements. Compared with the traditional SPR methods, the new method provides higher sensitivity to the sensor system. Theoretical simulations show that the refractive index (RI) detection sensitivity of the SPR sensor based on the displacement measurement has a strong dependence on the thickness of the metal film. When the optimal thickness of the metal film is selected, the RI resolution of the SPR sensor is predicted to be 2.2×10-7 refractive index units (RIU). Furthermore, it is found that the incidence angle can be used as a parameter to adjust the operating range of the sensor to different refractive index ranges. |
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| Keywords: | 42 79 -e 78 20 Bh 73 20 Mf |
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