| GJB151B CS115的电路仿真分析(一)--校准设备指标需求分析北大核心CSCD |
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| 引用本文： | 崔志同,陈伟,董亚运,聂鑫,吴伟,秦锋.GJB151B CS115的电路仿真分析(一)--校准设备指标需求分析北大核心CSCD[J].强激光与粒子束,2022,34(2):023002-1-023002-6. |
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| 作者姓名： | 崔志同 陈伟 董亚运 聂鑫 吴伟 秦锋 |
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| 作者单位： | 西北核技术研究所 强脉冲辐射环境模拟与效应国家重点实验室，西安 710024 |
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| 基金项目： | 国家重点实验室基金项目(SKLIPR1901)。 |
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| 摘 要： | GJB151B CS115给出了开展脉冲传导敏感度试验的校准平台构成和校准波形标准,但未明确校准平台各设备(脉冲源、电流注入环、校准夹具等)的具体指标需求。为解决这一问题,本文在前期脉冲电流注入电路仿真研究工作的基础上,构建了校准平台的时域电路模型,通过逐一改变模型参数的方法,仿真分析了脉冲源内部回路电感、电流注入环等效电感/电阻/电容等对校准波形前沿、半宽以及平顶降的影响,得出了平台各设备应达到的技术指标。该工作是对GJB151B CS115的有益补充,为搭建CS115试验平台,开展电子设备脉冲传导敏感度试验提供了技术支撑。
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| 关 键 词： | 电磁脉冲 CS115 传导敏感度 电流注入 |
| 收稿时间： | 2021-09-10 |
Circuit Simulation of GJB151B CS115 Part I: The analysis of calibration equipment indicators |
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| Cui Zhitong,Chen Wei,Dong Yayun,Nie Xin,Wu Wei,Qin Feng.Circuit Simulation of GJB151B CS115 Part I: The analysis of calibration equipment indicators[J].High Power Laser and Particle Beams,2022,34(2):023002-1-023002-6. |
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| Authors: | Cui Zhitong Chen Wei Dong Yayun Nie Xin Wu Wei Qin Feng |
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| Affiliation: | State Key Laboratory of Intense Pulsed Radiation Simulation and Effect, Northwest Institute of Nuclear Technology, Xi’an 710024, China |
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| Abstract: | The composition and waveform of the calibration platform were defined in GJB151B CS115 for pulsed conducted sensitivity test, but the specific requirements for each device (pulse generator, current injection probe, calibration clamp, etc.) in the calibration platform are still not clear. To solve this problem, a time domain circuit model of the calibration platform was developed according the previous research on circuit simulation of pulsed current injection. By adjusting the parameters respectively, influences on the rise time and fall time of the calibration waveform caused by the inner inductance of the pulse generator and equivalent elements of the injection probe are simulated. Finally, the technical indicators for each device in the platform are obtained. This work is an essential supplement to GJB151B CS115 and is helpful to set up CS115 test platform for conducted immunity of electronic equipment test. |
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| Keywords: | electromagnetic pulse CS115 conducted immunity current injection |
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