Towards X-ray induced transient grating methods for nanometer scale dynamics: Diffraction on transient structures induced by extreme ultraviolet radiation from FLASH |
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Authors: | A?F?hlisch M?Beye H?Redlin S?Düsterer |
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Institution: | (1) Institute for experimental physics, Hamburg University, Luruper Chaussee 149, 22761 Hamburg, Germany;(2) Hamburger Synchrotron Strahlungslabor at Deutsche Elektronen Synchrotron HASYLAB/DESY, Notkestr. 85, 22607 Hamburg, Germany |
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Abstract: | Using the high brilliance femtosecond soft X-ray pulses from the Free-Electron LASer at Hamburg (FLASH) the X-ray induced
transient optical reflectivity change of GaAs has been established as a versatile method for femtosecond X-ray/optical cross-correlation
1].
As the underlying physical mechanism is the X-ray induced dynamics within solids, we present in this work a feasibility study
how transient grating methods could be used to study nanometer scale dynamics in materials, such as the radical diffusion
parameters in photoresist materials for EUV lithography. |
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