不同增感对AgCl乳剂中光电子时间行为的影响

借助微波吸收介电谱检测技术，对AgCl立方体乳剂中光电子的时间行为进行了检测，同时获得了自由光电子与浅束缚光电子在不同增感条件下的时间分辨谱。实验结果表明：化学增感时由于硫加金增感中心的浅电子陷阱作用有效地抑制了空穴与光电子之间的复合，化学增感使得光电子的衰减相对未增感的减缓、衰减时间得到延长;光谱增感时由于染料J聚集体增加了卤化银晶体中添隙银离子的浓度、促进了光电子与添隙银离子之间的结合，光谱增感使得光电子的衰减相对未增感的加剧、衰减时间变短;化学与光谱共同增感使光电子的衰减时间在光谱增感的基础上得到了延长，且硫加金化学增感中心的浅电子陷阱效应在光谱增感的基础上更明显。

Effect of Different Sensitization on the Photoelectron Time Action in AgCl Emulsion

The temporal behaviors of free photoelectrons and shallow-trapped electrons were measured in the cubic AgCl emulsion with the microwave absorption and dielectric spectrum detection technique. The results indicate that the chemical sensitization makes the photoelectron decay, slower than that of the unsensitized AgCl emulsion, and the decay time is prolonged in the sulfur-plus-gold sensitized emulsion, because the shallow electron trap effect of sulfur-plus-gold sensitization center restrains the recombination of photoelectron and hole. The photoelectron decay is pricked up and the decay time is shorter in sensitized emulsion than that in the unsensitized AgCl emulsion, because the J-aggregates increase the interstice silver ion density in the AgCl microcrystal and accelerate the recombination of interstice silver ions and electrons. The decay time of photoelectron in chemistry-and-spectra sensitized emulsion is also prolonged, and the shallow electron trap effect of chemical sensitization center is more distinct under the condition of spectra sensitization.