Characterisation and ac-electrical investigation of sublimated bis(dimethylglyoximato)palladium(II) thin films

Thin films of bis(dimethylglyoximato)palladium(II) complex of polycrystalline structure were prepared by sublimation in a vacuum at 140 °C, on glass and p-Si substrates. The films were characterised by spectral optical absorption, energy dispersion X-ray fluorescence (EDXRF), and X-ray diffraction (XRD) methods. After characterisation, metal-insulator (complex)-semiconductor MIS devices were fabricated to measure the frequency dependence of ac-conductivity in a range of 5-100 kHz. Data of ac-measurements follow the correlated barrier-hopping CBH model, from which one of the fundamental absorption peaks, the minimum hopping distance, and other parameters of the CBH model were determined, connecting and relating the optical, structural, and electrical measurements. The dielectric properties of the complex were studied through Debye model, from which the relaxation time for the dipoles (2.45 × 10⁻⁶ s) and the molecular dipole moment (3.63 × 10⁻³⁰ C m ) were determined.