Thin-Film Flow Influenced by Thermal Noise |
| |
Authors: | Günther Grün Klaus Mecke Markus Rauscher |
| |
Institution: | 1. Institut für Angewandte Mathematik, Universit?t Bonn, Beringstr. 6, 53115, Bonn, Germany 2. Institut für Theoretische Physik, Universit?t Erlangen-Nürnberg, Staudtstr. 7/B3, 91058, Erlangen, Germany 3. Max-Planck-Institut für Metallforschung, Heisenbergstr. 3, 70569, Stuttgart, Germany 4. ITAP, Universit?t Stuttgart, Pfaffenwaldring 57, 70569, Stuttgart, Germany
|
| |
Abstract: | We study the influence of thermal fluctuations on the dewetting dynamics of thin liquid films. Starting from the incompressible
Navier-Stokes equations with thermal noise, we derive a fourth-order degenerate parabolic stochastic partial differential
equation which includes a conservative, multiplicative noise term—the stochastic thin-film equation. Technically, we rely
on a long-wave-approximation and Fokker–Planck-type arguments. We formulate a discretization method and give first numerical
evidence for our conjecture that thermal fluctuations are capable of accelerating film rupture and that discrepancies with
respect to time-scales between physical experiments and deterministic numerical simulations can be resolved by taking noise
effects into account. |
| |
Keywords: | wetting microfluidics thin film flow stochastic hydrodynamics |
本文献已被 SpringerLink 等数据库收录! |
|