A facile approach for quantifying the density of defects (edge plane sites) of carbon nanomaterials and related structures

A facile methodology based on cyclic voltammetry is presented allowing the density of defects, viz edge plane like-sites/defects of carbon nanomaterials to be readily quantified. The approach is based on the construction of carbon nanomaterial paste electrodes which is measured using cyclic voltammetry and a standard electrochemical redox probe. This protocol allows a quantitative relationship between the heterogeneous electron-transfer rate and the density of defects to be readily determined and also provides researchers with a methodology to quantify the density of defects for comparative purposes.