| Abstract: | In condensed matter, optical properties can be described by a dielectric function (DF), and the structures observed in spectra are then related to the poles and zeros of the DF. As an example, model functions are calculated by a fit to measured spectroscopic data for polystyrene and silica. The first material shows weak, narrow bands and the latter strong, broad bands and a negative real part of the DF.Based on these model DFs, spectra are simulated which are expected to be obtained by “conventional” methods such as transmittance or reflectance measurements, or by “unconventional” methods such as reflectance at oblique incidence, diffuse reflectance, photoacoustic spectroscopy and attenuated total reflectance. A variety of simulated, typical spectra are plotted as a small “atlas”. Conditions are discussed that allow a straightforward procedure for interpreting the spectra quantitatively, i.e., the evaluation of the resonance frequency and the concentration of the oscillators under consideration.It is shown that for systems characterized by weak, narrow oscillator lines, mostly an intuitive interpretation is possible, looking only at the position and strength of “lines” in the spectra. Materials showing strong polar vibrations, however, require more sophisticated procedures for interpreting the spectra. |
