X-ray emission spectroscopy with EPMA applied to high Tc Superconductors using new spectrometer crystals |
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Authors: | Kottmann A. Lamparter P. Steeb S. |
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Affiliation: | (1) Max-Planck-Institute for Metal Research, Institute for Materials Science, D-70174 Stuttgart, Federal Republic of Germany |
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Abstract: | The High Temperature Superconductors are characterized by a very anisotropical structure and by typical arrangements of Cu- and O-atoms within CuO2-planes. In studying the electronic structure of these compounds there is a strong demand for high resolution valence band spectroscopy. Using an electron probe microanalyzer we study the X-ray emission of O-Kga and Cu-L emerging from polycrystalline YBa2Cu3O7 and Tl2Ba2Ca2Cu3O10. The O-K emission band is analyzed using a chlinochlore crystal in (001) orientation (2d = 28.4 Å). For the Cu-L emission band we use a beryl crystal in (10¯10) orientation (2d = 15.9 Å). Furthermore, orientation dependent X-ray emission spectroscopy of single-crystalline YBa2Cu3O7 and Tl2Ba2Ca1Cu2O8 specimens was performed. We present the partial O-K spectra which represent the O-2p ( = x, y, z) electronic densities of states of the valence band and compare them with calculated data. |
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Keywords: | high-Tc superconductors electron probe microanalyzer polarized X-ray emission partial density of states spectrometer crystals |
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