Search for uranium in high purity silicon |
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Authors: | W. D. James C. E. Thompson |
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Affiliation: | (1) Center for Trace Characterization Texas A&M University College Station, Texas, USA;(2) Burroughs Corporation San Diego, California, USA |
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Abstract: | Detection of small quantities of uranium in silicon wafers has been carried out by neutron activation followed by observation of fission product140La. Irradiations of about one week were made at a flux of 6·1014n cm−2 s−1 and the activity of the 1596 keV line was determined. Counting rates of as low as 1 count per minute have been observed. This indicates uranium concentrations of about 5·1010 atoms per cubic centimeter of silicon or about 0.01 mg/g, assuming activity from other fissionable nuclides to be negligible. |
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