Solid state features of electrocrystallized tungstate films

X-ray diffraction, scanning electron microscopy, and infra-red spectroscopy are applied to study the evolution of films electrodeposited from acidic tungstate solutions. Structural inhomogeneity is found to be responsible for the difference in rechargeability of films of different thickness. Voltammetric responses demonstrate pronounced sensitivity to the nature of crystalline phases, thus throwing light on the defects of the lattice features of nonstoichiometric W(V)–W(VI) oxides. One crystalline phase observed in the films under study and attributed to the layered nonstoichiometric oxohydroxide was never reported for oxotungstate films fabricated by other techniques. This phase is believed to be special to electrocrystallized films and to keep some structural features of dissolved isopolytungstate molecular precursors.Dedicated to Prof. G.Horanyi with the highest respect to his experimental talents, remarkable papers and important contributions in various fields of modern electrochemistry.