| Abstract: | The technique of phase-measuring profilometry is reviewed, whereby a sinusoidal grating structure is projected onto a diffuse three-dimensional surface, and the resulting deformed grating image is detected by a solid state array camera and processed by a microcomputer using interferometric phase measuring algorithms. The approach permits parallel acquisition and processing of large amounts of data with high accuracy and speed.Several systems are described, configured with telecentric laser light illumination or general white light diverging illumination, and capable of measurement from a single point of view or over full 360°. Each system consists of an optical projection assembly with phase-shifter, an imaging assembly with high density CCD camera and an IBM AT microcomputer with buffer and control cards.Applications to industrial inspection and medical diagnostics are presented. |
