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Dispersive processes of light-induced defect creation in hydrogenated amorphous silicon
Authors:K. Morigaki  K. Takeda  P. Roca i Cabarrocas
Affiliation:a Department of Electrical and Digital-System Engineering, Hiroshima Institute of Technology, Miyake, Saeki-ku, Hiroshima 731-5193, Japan
b Electro-Chemical and Cancer Institute, Kokuryo, Chofu, Tokyo 182-0022, Japan
c Physics Laboratory, Meikai University, Urayasu, Chiba 279-8550, Japan
d Laboratoire de Physique des Interfaces et des Couches Minces, CNRS UMR 7647, Ecole Polytechnique, Palaiseau Cedex 91128, France
Abstract:The growing curve of light-induced dangling bonds under illumination has been observed for various intensities of illumination in a-Si:H. It is fitted to a stretched exponential function and then two parameters β and τ involved in the function are estimated as a function of saturated dangling bond density View the MathML source. The experimental values of β, τ, and View the MathML source are compared with those calculated based on our model of light-induced defect creation in a-Si:H.
Keywords:61.43.-j   71.23.Cq   71.55.-i   73.61.Cw   76.30.-v
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