| 导波法测量吸收薄膜的复介电系数和厚度 |
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| 引用本文： | 蒋毅,曹庄琪,沈启舜,陈英礼. 导波法测量吸收薄膜的复介电系数和厚度[J]. 光学学报, 2000, 20(5): 42-646 |
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| 作者姓名： | 蒋毅 曹庄琪 沈启舜 陈英礼 |
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| 作者单位： | 上海交通大学应用物理系,上海,200030 |
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| 摘 要： | 具有吸收特性的波导薄膜，其衰减全反射（ＡＴＲ）峰的位置和形状包含了薄膜诸多特征多数的信息，在同时考虑棱镜的耦合和材料的吸收的基础上，本文用一阶微扰理论推导了微扰传播常数的解析公式，并且介绍了通过分析薄膜的衰减全反射峰来计算吸收薄膜的复介电系数和厚度的方法。
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| 关 键 词： | 导波法 吸收薄膜 复介电系数 衰减全反射 厚度 |
| 收稿时间： | 1998-11-19 |
Determination of the Complex Dielectric Coefficient and Thickness of Absorbing Films Using Guided Waves |
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| Jiang Yi,Cao Zhuangqi,Shen Qishun,Cheng Yingli. Determination of the Complex Dielectric Coefficient and Thickness of Absorbing Films Using Guided Waves[J]. Acta Optica Sinica, 2000, 20(5): 42-646 |
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| Authors: | Jiang Yi Cao Zhuangqi Shen Qishun Cheng Yingli |
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| Abstract: | The attenuated- total- reflections( ATR) of absorbing films contain much charac- teristic information aboutthe films.Taking considerations of the prism coupling and film ab- sorbing,the first- order perturbation theory is applied to deduce the simplified analytical ex- pressions of the perturbed propagation constants.Based on the theory,a method is intro- duced for determining the complex dielectric coefficients and thicknesses by detecting and an- alyzing the attenuated- total- reflections of absorbing films. |
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| Keywords: | guided wave absorbing film complex dielectric coefficient attenuated- to- tal- reflections |
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