Ultrafast beam-deflection method and its application for measuring the transient refractive index of materials期刊界 All Journals 搜尽天下杂志传播学术成果专业期刊搜索期刊信息化学术搜索

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Ultrafast beam-deflection method and its application for measuring the transient refractive index of materials

Authors:	H-S Albrecht P Heist J Kleinschmidt D V Lap

Institution:	(1) Institut für Optik and Quantenelektronik, Friedrich-Schiller-Universität Jena, Max-Wien-Platz 1, D-07743 Jena, Germany;(2) Max-Planck-Arbeitsgruppe Röntgenoptik, Friedrich-Schiller-Universität Jena, Max-Wien-Platz 1, D-07743 Jena, Germany;(3) Lambda Physik GmbH, Hans-Böckler-Strasse 12, D-37079 Göttingen, Germany

Abstract:	We represent an ultrafast beam-deflection method as a simple and powerful tool for the time-resolved measurement of induced changes of the refractive index in the order of n=10^–5. The method is applied for measuring the changes of components of the refractive index parallel and perpendicular to the pump-pulse polarization on a femtosecond time scale. Fused silica and CS₂ are used as samples for demonstrating our method.

Keywords:	42 60 42 65
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