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Measurement of electrodynamic parameters of superconducting films in the far-infrared and submillimeter frequency ranges |
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| Authors: | B P Gorshunov G V Kozlov A A Volkov S P Lebedev I V Fedorov A M Prokhorov V I Makhov J Schützmann and K F Renk |
| Institution: | (1) General Physics Institute, USSR Academy of Sciences, Vavilov St. 38, 117942 Moscow, Russia;(2) Research Institute of Physical Problems, 103460 Moscow, Russia;(3) Institut für Angewandte Physik, Universität Regensburg, W-8400 Regensburg, Germany |
| Abstract: | Possibilities of determing the complex conductivity of thin super-conducting films using far-infrared and submillimeter reflectivity and transmissivity techniques are discussed. It is shown that within the framework of standard approaches a satisfactory accuracy is available only for the imaginary part of the conductivity (dielectric permittivity). Different resonator methods are suggested for measuring the real part of the conductivity. Data for superconducting NbN films at frequencies 3 – 25 cm–1 are presented. |
| Keywords: | Superconducting thin films far-infrared and submillimeter waves optical constants |
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